Photoluminescence and EBIC for Process Control and Failure Analysis in Si-Based Photovoltaics
Kittler, Martin, Arguirov, Tzanimir, Schmid, Reiner P., Seifert, Winfried
(ISBN:0-61503-041-7) ISTFA 2010, conference proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010 / S. 137 -142
https://opus4.kobv.de/opus4-UBICO/frontdoor/index/index/docId/16248

Efficient instantaneous optical switching, frequency conversion and simple logic operations on a femtosecond time scale
Reif, Jürgen, Schmid, Reiner P.
25th International Congress on High-Speed Photography and Photonics, 29 September - 4 October 2002, Beaune, France / ISBN: 0-8194-4744-7 / 2003 / S. 137-140 / SPIE proceedings series, 494
http://proceedings.spiedigitallibrary.org/proceeding.aspx?articleid=889727
http://dx.doi.org/10.1117/12.516816

All-Optical Full Logic Unit with Femtosecond Switching
Schmid, Reiner P., Reif, Jürgen
Second International Symposium on Laser Precision Microfabrication, 16 - 18 May 2001, Singapore ISBN:0-8194-4137-6 / 2002 / S. 460 / Proceedings of the SPIE ; 4426
http://dx.doi.org/10.1117/12.456869

Nonlinear optical characterization of the surface of silicon wafers: In-situ detection of external stress
Reif, Jürgen, Schmid, Reiner P., Schneider, Th., Wolfframm, Dirk
Solid-State Electronics 44 / ISSN: 0038-1101 / 2000 / 5 / S. 809-813
https://opus4.kobv.de/opus4-UBICO/frontdoor/index/index/docId/5073