weiterbildenden Studiengänge „Wirtschaftsrecht für Technologieunternehmen (M.B.L.)“ und „Forensic Sciences and Engineering (M.Sc.)“ angeboten. Teilnehmende der Medienrechtstage erhalten hierüber eine Bescheinigung
/news/artikel/12871-10-cottbuser-medienrechtstage-zu-fake-news-hate-speech-und-whistleblowing

) Digitale Gesellschaft (B.A.) Wirtschaftsrecht für Technologieunternehmen (M.B.L.) Forensic Sciences and Engineering (M.Sc.)
/news/artikel/23940-15-minuten-wissen-aktuelles-aus-wirtschaft-recht-und-gesellschaft

Temperature Fields and Cycles in Welding", International Congress „Mechanical Engineering Technolpgies’ 97”, Welding 3, Sofia 1997, 13-18 Michailov, V. G. u. Wohlfahrt, H.: "Modelling and Computation the [...] Journal of Materials Science and Technology 4 (1996), 3, 28-42 Georgiev, J., Petcjenyakow, I., Michailov, V. G., Thomas, K. u. Wohlfahrt, H.: "Nitrogen Solubility in 1.4306 and 1.4435 Austenitic Steels" [...] Michailov, V. G., Christov, St. u. Anestiev, L.: “Hydrogen Diffusivity, Permeability and Solubility in Plastic Deformed and Heat Treated STE 890 Steel”, Welding on the Threshold of XXI Century, 26-30 May 1999
/fg-fuegetechnik/publikationen/wissenschaftliche-veroeffentlichungen/1982-1999

Mizuno, N. Shiratori, T. Higashino, A. Togashi (eds.): Formal Description Techniques and Protocol Specification, Testing and Verification; Proceedings of the Joint Int. Conference FORTE/PSTV97; Osaka, Japan [...] Mizuno, N. Shiratori, T. Higashino, A. Togashi (eds.): Formal Description Techniques and Protocol Specification, Testing and Verification; Proceeding of the Joint Int. Conference FORTE/PSTV97; Osaka, Japan [...] Mizuno, N. Shiratori, T. Higashino, A. Togashi (eds.): Formal Description Techniques and Protocol Specification, Testing and Verification; Proceeding of the Joint Int. Conference FORTE/PSTV97; Osaka, Japan
/fg-rechnernetze/publikationen/archiv-2000-1989/1997

Oehmgen, G. Appel, D. Schmeißer, H. Lauer, P. Hausmann Materials Science and Engineering C 8-9 (1999) 509-512 Online (DOI) 99_03 Doping and defect inhomogeneities of polypyrrole tosylate films as revealed [...] G. Appel, D. Schmeißer Materials Science and Engineering C 8-9 (1999) 257-265 Online (DOI) 99_02 Polypyrrole doped with fluoro-metal complexes: thermal stability and structural properties A. Yfantis, [...] Mikalo, D. Schmeißer Vakuum in Forschung und Praxis 11-1 (1999) 37-41 Online (DOI) 99_07 The polaron and bipolaron contributions to the electronic structure of polypyrrole films G. Appel, O. Böhme, R.P. Mikalo
/fg-angewandte-physik/publikationen/zeitschriften-buecher-etc/1999

Batchelor, D. Schmeißer Journal Analytical and Bioanalytical Chemistry 374/4 (2002) 650-653 Online (DOI) 02_22 A vibrational study of the adsorption of glycine on clean and Na modified Si (100)-2x1 surfaces A [...] neural network with a two sensor system for monitoring of carbon dioxide and relative humidity K. Henkel, D. Schmeißer Analytical and Bioanalytical Chemistry 374/2 (2002) 329-337 Online (DOI) 02_07 PEEM: [...] d SiC(0001) surfaces as studied by PES and LEED N. Sieber, Th. Seyller, R. Graupner, L. Ley, R. Mikalo, P. Hoffmann, D. Batchelor, D. Schmeißer Materials Science Forum 389/3 (2002) 717-720 Online (DOI)
/fg-angewandte-physik/publikationen/zeitschriften-buecher-etc/2002

Photoelectron spectra of Al dopants in 4H-SiC D. Schmeißer, K. Irmscher, G. Wagner Materials Science & Engineering B 102 (2003) 284-288 Online (DOI) 03_17 The Pr 2 O 3 / Si (001) interface studied by synchrotron [...] heterostructures D. Schmeißer, K. Pressel, Y. Yamamoto, B. Tillack, D. Krüger Materials Science & Engineering B 101 (2003) 208-211 Online (DOI) 03_14 Organic Materials for Device Applications - Preface [...] 47 (2003) 1607-1611 Online (DOI) 03_16 The Pr 2 O 3 / Si (001) interface D. Schmeißer Materials Science in Semiconductor Processing 6 (2003) 59 - 70 Online (DOI) 03_15 Ge instabilities near interfaces
/fg-angewandte-physik/publikationen/zeitschriften-buecher-etc/2003

interface reactions and stability D. Schmeißer, J. Dabrowski, H.-J. Müssig Materials Science and Engineering B 109/1-3 (2004) 30-33 Online (DOI) 04_10 An FTIR study of the role of H 2 O and D 2 O in the aging [...] between Pr and SiO 2 studied by photoelectron spectroscopy and ab initio calculations G. Lupina, J. Dabrowski, P. Formanek, D.Schmeißer, R. Sorge, C. Wenger, P. Zaumseil, H.-J. Müssig Materials Science in S [...] R. Krenek, Y. Burkov, D. Schmeißer, S. Minko, M. Stamm Nano-Architectured and Nanostructured Materials: Fabrication, Control and Properties. pp 143-150. Wiley-VCH, Weinheim, 2004, ISBN 3-527-31008-8 Online
/fg-angewandte-physik/publikationen/zeitschriften-buecher-etc/2004

Security, Communications and Computers (ISCOCO), 542 (2005) Abstract Privacy and Convenient Up Time of Mobile Devices: An Antagonism? P. Langendörfer Proc. Research Trends in Science and Technology (RTST), Abstract [...] n (RFID) and Wireless Sensors, Kanpur, November 11-13, 2005, India Location Based Services and Requirements on Positioning and Communication R. Kraemer Workshop on Positioning, Navigation and Communication [...] (WPNC'05), Hannover, March 17, 2005, Germany Privacy and Convenient Up Time of Mobile Devices: An Antagonism? P. Langendörfer Research Trends in Science and Technology (RTST 2005), Beirut, March 07, 2005, Lebanon
/fg-systeme/publikationen/archiv/2005

2004, pp. 187-189 05_03 Interface reactivity of Pr and SiO 2 at 4H-SiC(0001) D. Schmeißer, G. Lupina, H.-J. Müssig Materials Science and Engineering B 118/1-3 (2005) 19-22 Online (DOI) 05_02 Oxynitride [...] Oxynitride on 4H-SiC (0001) P. Hoffmann, A. Goryachko, D. Schmeißer Materials Science and Engineering B 118/1-3 (2005) 270-274 Online (DOI) 05_01 Microphase separation in thin films of poly(styrene-block-4-vin [...] Si(001), Si(111) and SiC(0001) surfaces D.Schmeißer, P.Hoffmann, G.Beuckert In: E. Zschech, C. Whelan, T. Mikolajick (Eds.): Materials for Information Technology, Devices, Interconnects and Packaging, Series:
/fg-angewandte-physik/publikationen/zeitschriften-buecher-etc/2005