Characterization in Materials Science
(Offered each winter term even years)
| Degree Courses | ||
|---|---|---|
| B.Sc. Mechanical Engineering | M.Sc. Mechanical Engineering | |
| M.Sc. Manufacturing Technologies for Materials | Manufacturing Technologies for Materials (graduation abroad) | |
Content
In the lectures, theoretical contents are imparted, which are deepened and expanded in the exercises and supplemented by self-study.
The main contents include:
- Principles of scanning and transmission electron microscopy
- Phase identification with Electron diffraction
- Bright field and dark field imaging
- Secondary and backscattered electron contrast in the SEM determination of volume fractions etc.
- Measurement of the chemical composition with EDX
- Electron Backscatter Diffraction (EBSD)
- Phase identification by X-ray diffraction
- Rietveld analysis
- Texture measurements
Literature
[1] Lecture notes
Further self-study literature will be announced in the course.
| Proportion | Exam Performance | Credits |
|---|---|---|
| VL: 2 SWS UE: 2 SWS Self-Study: 120h | Oral exam á 30 min, Audit period: 01.02-31.03 | 6 Credits |