UBICO

Publications

Open list in UBICO

In situ X-ray photoelectron spectroscopy study of atomic layer deposited ceria on SiO2: substrate influence on the reaction mechanism during the early stages of growth

Author(s): Gertig, Max, Morales, Carlos, Henkel, Karsten, Flege, Jan Ingo
Type: Conference Proceeding no refering
Year of publication: 2024
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: Atomic layer deposition (ALD); X-ray photoelectron spectroscopy (XPS); in-situ; ceria
Source: Verhandlungen der DPG
URL: https://www.dpg-verhandlungen.de/year/2024/conference/berlin/part/o/session/67/contribution/7
: Verhandlungen der DPG

Oxide formation and oxide/metal interaction in CeOx/Ni(111)

Author(s): Guttmann, Dominic, Riedel, Björn, Sánchez-Barquilla, Raquel, Morales, Carlos, Flege, Jan Ingo
Type: Conference Proceeding no refering
Year of publication: 2024
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: Low-energy electron diffraction (LEED); ceria; X-ray photoelectron spectroscopy (XPS); ultraviolet photoelectron spectroscopy (UPS); oxidation states
Source: Verhandlungen der DPG
URL: https://www.dpg-verhandlungen.de/year/2024/conference/berlin/part/o/session/33/contribution/10
: Verhandlungen der DPG

Bare and Pd-doped ceria thin films prepared by ALD and EBE for hydrogen detection

Author(s): Kosto, Yuliia, Kapuscik, Paulina, Tschammer, Rudi, Guttmann, Dominic, Mankowska, Ewa, Matvija, Peter, Morales, Carlos, Mazur, Michał, Henkel, Karsten, Matolinova, Iva, Domaradzki, Jarosław, Flege, Jan Ingo
Type: Conference Proceeding no refering
Year of publication: 2024
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: Hydrogen sensor; Atomic layer deposition (ALD); ceria; Near-ambient pressure X-ray photoelectron spectroscopy (NAP-XPS)
Source: Verhandlungen der DPG
URL: https://www.dpg-verhandlungen.de/year/2024/conference/berlin/part/o/session/59/contribution/5
: Verhandlungen der DPG

The relation between substrate, Sm alloy, and surface sensitivity of ceria (111)- and (100)-oriented nano-islands on Ru(0001) and Cu(111)

Author(s): Sanchez-Barquilla, Raquel, Tschammer, Rudi, Buß, Lars, Morales, Carlos, Flege, Jan Ingo
Type: Conference Proceeding no refering
Year of publication: 2024
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: ceria; low-energy electron microscopy (LEEM); X-ray photoemission electron microscopy (XPEEM); samarium; metal substrate influence on reduction; orientation
Source: Verhandlungen der DPG
URL: https://www.dpg-verhandlungen.de/year/2024/conference/berlin/part/o/session/85/contribution/6
: Verhandlungen der DPG

Unraveling the effects of substrate interaction on the chemical properties of atomic layer deposited ultra-thin ceria layers

Author(s): Morales, Carlos, Kosto, Yuliia, Tschammer, Rudi, Henkel, Karsten, Flege, Jan Ingo
Type: Conference Proceeding no refering
Year of publication: 2024
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: Atomic layer deposition (ALD); ceria; interface reaction; morphology; reducibility; hydrogen detection
Source: Verhandlungen der DPG
URL: https://www.dpg-verhandlungen.de/year/2024/conference/berlin/part/o/session/49/contribution/8
: Verhandlungen der DPG

Atomic layer deposition of cerium oxide monitored by operando ellipsometry and in-situ X-ray photoelectron spectroscopy

Author(s): Tschammer, Rudi, Kosto, Yuliia, Morales, Carlos, Schmickler, Marcel, Henkel, Karsten, Devi, Anjana, Flege, Jan Ingo
Type: Conference Proceeding no refering
Year of publication: 2024
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: Atomic layer deposition (ALD); ceria; low-temperature deposition; operando spectroscopic ellipsometry; in-situ X-ray photoelectron spectroscopy; film thickness; oxidant choice; cerium oxidation state
Source: Verhandlungen der DPG
URL: https://www.dpg-verhandlungen.de/year/2024/conference/berlin/part/o/session/49/contribution/4
: Verhandlungen der DPG

MAPbCl3 Light Absorber for Highest Voltage Perovskite Solar Cells

Author(s): Zia, Waqas, Malekshahi Byranvand, Mahdi, Rudolph, Toby, Rai, Monika, Kot, Małgorzata, Das, Chittaranjan, Kedia, Mayank, Zohdi, Mohammadreza, Zuo, Weiwei, Yeddu, Vishal, Saidaminov, Makhsud I., Flege, Jan Ingo, Kirchartz, Thomas, Saliba, Michael
Type: Scientific Article ref.
Year of publication: 2024
: Perovskite solar cells; methylammonium lead trichloride (MAPbCl3); uniform film crystallization; manipulation of annealing atmospheres; trap-assisted recombination; microstructure
Source: ACS Energy Letters, S. 1017 - 1024
Volume: 9
ISSN: 2380-8195
DOI: https://doi.org/10.1021/acsenergylett.3c02777

Structure and Stability of Al-alloyed β-Ga2O3(100) surfaces

Author(s): Kao, Ming-Chao, Schewe, Lukas Paul, Akhtar, Arub, Rehm, Jana, Bin Anooz, Saud Bin, Galazka, Zbigniew, Popp, Andreas, Flege, Jan Ingo, Vonk, Vedran, Stierle, Andreas
Type: Conference Proceeding no refering
Year of publication: 2024
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: high-power applications; bandgap engineering; crystal quality; X-ray diffraction
Source: Verhandlungen der DPG, Berlin 2024
URL: https://www.dpg-verhandlungen.de/year/2024/conference/berlin/part/o/session/67/contribution/10
: Verhandlungen der DPG

Deposition of reduced ceria thin films by reactive magnetron sputtering for the development of a resistive gas sensor

Author(s): Nitsch, Paul-G., Ratzke, Markus, Pozarowska, Emilia, Flege, Jan Ingo, Alvarado Chavarin, Carlos, Wenger, Christian, Fischer, Inga Anita
Type: Conference Proceeding no refering
Year of publication: 2024
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: ceria; metalic cerium target; electrical conductivity; X-ray photoelectron spectroscopy (XPS); oxidation states; morphology
Source: Verhandlungen der DPG, Berlin 2024
URL: https://www.dpg-verhandlungen.de/year/2024/conference/berlin/part/ds/session/11/contribution/18
: Verhandlungen der DPG

Oxygen Storage by Tin Oxide Monolayers on Pt3Sn(111)

Author(s): Merte, Lindsay R., Braud, Nicolas, Buß, Lars, Bisbo, Malthe Kjær, Wallander, Harald J., Krisponeit, Jon-Olaf, Flege, Jan Ingo, Hammer, Bjørk, Falta, Jens, Lundgren, Edvin
Type: Scientific Article ref.
Year of publication: 2023
: Oxygen storage; low-energy electron microscopy (LEEM); microprobe low-energy electron diffraction (μ-LEED); scanning tunneling microscopy (STM); GOFEE algorithm
Source: The Journal of Physical Chemistry. C, S. 2988 - 2994
Volume: 127
Issue/Journal number: 6
ISSN: 1932-7447; 1932-7455
DOI: https://doi.org/10.1021/acs.jpcc.2c09041

In-situ growth characterization of 2D heterostructures: MoSe2 on intercalated graphene/Ru(0001)

Author(s): Buß, Lars, Braud, Nicolas, Ewert, Moritz, Jugovac, Matteo, Mentes, Tevfik Onur, Locatelli, Andrea, Falta, Jens, Flege, Jan Ingo
Type: Conference Proceeding no refering
Year of publication: 2023
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: MoSe2; low-energy electron microscopy (LEEM9; micro-diffraction
Source: Verhandlungen der DPG
URL: https://www.dpg-verhandlungen.de/year/2023/conference/skm/part/o/session/74/contribution/1

A super-cycle approach to atomic layer deposition of indium-gallium-zinc oxide at low temperature

Author(s): Mahmoodinezhad, Ali, Morales, Carlos, Kot, Małgorzata, Naumann, Franziska, Plate, Paul, Henkel, Karsten, Flege, Jan Ingo
Type: Conference Proceeding no refering
Year of publication: 2023
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: Indium gallium zinc oxide; Transparent conducting oxide; Plasma-enhanced atomic layer deposition; X-ray photoelectron spectroscopy; spectroscopic ellipsometry; nucleation delay
Source: Verhandlungen der DPG
URL: https://www.dpg-verhandlungen.de/year/2023/conference/skm/part/o/session/40/contribution/3

Reduction by H2 exposure at room temperature of ceria ultrathin films grown by atomic layer deposition

Author(s): Morales, Carlos, Kosto, Yuliia, Tschammer, Rudi, Henkel, Karsten, Flege, Jan Ingo
Type: Conference Proceeding no refering
Year of publication: 2023
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: Cerium oxide; atomic layer deposition; near-ambient pressure X-ray photoemission spectroscopy (NAPXPS); hydrogen detection
Source: Verhandlungen der DPG
URL: https://www.dpg-verhandlungen.de/year/2023/conference/skm/part/o/session/92/contribution/6

In-situ photoemission electron microscopy investigation of mono- and bilayer graphene growth on Ru(10-10)

Author(s): Schewe, Lukas, Sulaiman, Cathy, Buß, Lars, Ewert, Moritz, Flege, Jan Ingo
Type: Conference Proceeding no refering
Year of publication: 2023
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: photoemission electron microscopy (PEEM); graphene; ruthenium; growth characteristics
Source: Verhandlungen der DPG
URL: https://www.dpg-verhandlungen.de/year/2023/conference/skm/part/o/session/93/contribution/7

Hydrogen Gas Sensing Properties of Mixed Copper–Titanium Oxide Thin Films

Author(s): Mańkowska, Ewa, Mazur, Michał, Domaradzki, Jarosław, Mazur, Piotr, Kot, Małgorzata, Flege, Jan Ingo
Type: Scientific Article ref.
Year of publication: 2023
: mixed copper–titanium oxides; Cu2O; TiO2; (CuTi)Ox; hydrogen gas sensing; thin films; magnetron sputtering
Source: Sensors
Volume: 23
Issue/Journal number: 8
ISSN: 1424-8220
DOI: https://doi.org/10.3390/s23083822

Potential of La-Doped SrTiO3 Thin Films Grown by Metal–Organic Vapor Phase Epitaxy for Thermoelectric Applications

Author(s): Baki, Aykut, Abdeldayem, Mohamed, Morales, Carlos, Flege, Jan Ingo, Klimm, Detlef, Bierwagen, Oliver, Schwarzkopf, Jutta
Type: Scientific Article ref.
Year of publication: 2023
: metal−organic vapor phase epitaxy (MoVPE); SrTiO2; La doping; X-ray diffraction (XRD); atomicforce microscopy (AFM); photoemissionspectroscopy; Seebeck measurements; electrical conductivity
Source: Crystal Growth & Design, S. 2522 - 2530
Volume: 23
Issue/Journal number: 4
ISSN: 1528-7483; 1528-7505
DOI: https://doi.org/10.1021/acs.cgd.2c01438

Potential of La-doped SrTiO3 thin films grown by metal-organic vapor phase epitaxy for thermoelectric applications

Author(s): Abdeldayem, Mohamed, Baki, Aykut, Morales, Carlos, Flege, Jan Ingo, Klimm, Detlef, Fiedler, Andreas, Bierwagen, Oliver, Schwarzkopf, Jutta
Type: Conference Proceeding no refering
Year of publication: 2023
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: thermoelectric; metalorganic vapor phase epitaxy (MOVPE); X-ray diffraction (XRD); atomic force microscopy (AFM); X-ray photoemission spectroscopy (XPS)
Source: Verhandlungen der DPG
URL: https://www.dpg-verhandlungen.de/year/2023/conference/skm/part/ds/session/12/contribution/50

Spin-polarized very-low-energy electron diffraction from spin-orbit- and/or exchange-influenced targets

Author(s): Angrick, Christoph, Thiede, Christian, Reimann, Andre, Henriksen, Annika, Mutzke, Nicole, Ewert, Moritz, Buß, Lars, Falta, Jens, Flege, Jan Ingo, Donath, Markus
Type: Conference Proceeding no refering
Year of publication: 2023
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: spin-polarization analysis; very-low-energy electron diffraction
Source: Verhandlungen der DPG
URL: https://www.dpg-verhandlungen.de/year/2023/conference/skm/part/o/session/67/contribution/8

Unraveling van der Waals epitaxy: A real-time in-situ study of MoSe2 growth on graphene/Ru(0001)

Author(s): Buß, Lars, Braud, Nicolas, Ewert, Moritz, Jugovac, Matteo, Menteş, Tevfik Onur, Locatelli, Andrea, Falta, Jens, Flege, Jan Ingo
Type: Scientific Article ref.
Year of publication: 2023
: Graphene; transition metal dichalcogenides (TMDs); angle-resolved photoemission spectroscopy (ARPES); Heterostructures; low energy electron microscopy (LEEM); low energy electron diffraction (LEED)
Source: Ultramicroscopy
Volume: 250
ISSN: 0304-3991; 1879-2723
DOI: https://doi.org/10.1016/j.ultramic.2023.113749

Light Makes Right: Laser Polishing for Surface Modification of Perovskite Solar Cells

Author(s): Kedia, Mayank, Rai, Monika, Phirke, Himanshu, Aranda, Clara A., Das, Chittaranjan, Chirvony, Vladimir, Boehringer, Stephan, Kot, Małgorzata, Malekshahi Byranvand, Mahdi, Flege, Jan Ingo, Redinger, Alex, Saliba, Michael
Type: Scientific Article ref.
Year of publication: 2023
: Perovskite solar cells; laser polishing; perovskite/hole transport interface; surface defects; recombination losses
Source: ACS Energy Letters, S. 2603 - 2610
Volume: 8
ISSN: 2380-8195
DOI: https://doi.org/10.1021/acsenergylett.3c00469

Photosensitive and Rectifying Properties of Ga2O3 Described by Polaronic Screened Electrons and Internal Potentials

Author(s): Schmeißer, Dieter, Müller, Klaus, Henkel, Karsten
Type: Scientific Article ref.
Year of publication: 2023
: Resonant photoelectron spectroscopy; quantitative π-electron densities; multi-atomic quasi-particles; photosensitivity and rectifier devices
Source: Journal of Physical Chemistry C, S. 23077 - 23089
Volume: 127
Issue/Journal number: 47
ISSN: 1932-7447; 1932-7455
DOI: https://doi.org/10.1021/acs.jpcc.3c05785

Dynamic Behavior of Tin at Platinum Surfaces during Catalytic CO Oxidation

Author(s): Wallander, Harald J., Gajdek, Dorotea, Albertin, Stefano, Harlow, Gary, Braud, Nicolas, Buß, Lars, Krisponeit, Jon-Olaf, Flege, Jan Ingo, Falta, Jens, Lundgren, Edvin, Merte, Lindsay R.
Type: Scientific Article ref.
Year of publication: 2023
: operando; CO oxidation; platinum; tin; oxides; alloys; stepped surfaces
Source: ACS Catalysis, S. 16158 - 16167
Volume: 13
Issue/Journal number: 24
ISSN: 2155-5435
DOI: https://doi.org/10.1021/acscatal.3c04657

Unraveling the Role of Perovskite in Buried Interface Passivation

Author(s): Das, Chittaranjan, Roy, Rajarshi, Kedia, Mayank, Kot, Małgorzata, Zuo, Weiwei, Félix, Roberto, Sobol, Tomasz, Flege, Jan Ingo, Saliba, Michael
Type: Scientific Article ref.
Year of publication: 2023
: perovskite solar cells; interface; defects; photoemission spectroscopy
Source: ACS Applied Materials & Interfaces, S. 56500 - 56510
Volume: 15
Issue/Journal number: 48
ISSN: 1944-8244; 1944-8252
DOI: https://doi.org/10.1021/acsami.3c13085

Combination of Multiple Operando and In-Situ Characterization Techniques in a Single Cluster System for Atomic Layer Deposition: Unraveling the Early Stages of Growth of Ultrathin Al2O3 Films on Metallic Ti Substrates

Author(s): Morales, Carlos, Mahmoodinezhad, Ali, Tschammer, Rudi, Kosto, Yuliia, Alvarado Chavarin, Carlos, Schubert, Markus Andreas, Wenger, Christian, Henkel, Karsten, Flege, Jan Ingo
Type: Scientific Article ref.
Year of publication: 2023
: Atomic layer deposition (ALD); in-situ; operando; X-ray photoelectron spectroscopy; ellipsometry; quadrupol mass spectrometry (QMS)
Source: Inorganics
Volume: 11
Issue/Journal number: 12
ISSN: 2304-6740
DOI: https://doi.org/10.3390/inorganics11120477

Reaction Mechanism Development for Methane Steam Reforming on a Ni/Al2O3 Catalyst

Author(s): Richter, Jana, Rachow, Fabian, Israel, Johannes, Roth, Norbert, Charlafti, Evgenia, Günther, Vivien, Flege, Jan Ingo, Mauß, Fabian
Type: Scientific Article ref.
Year of publication: 2023
: kinetic reaction mechanism development; 1D modeling; reaction rates; methane steam reforming; fixed-bed reactor experiments; nickel catalyst
Source: Catalysts
Volume: 13
Issue/Journal number: 5
ISSN: 2073-4344
DOI: https://doi.org/10.3390/catal13050884

Activity of cerium oxide thin films prepared by atomic layer deposition using custom and commercial precursors

Author(s): Kosto, Yuliia, Morales, Carlos, Devi, Anjana, Henkel, Karsten, Flege, Jan Ingo
Type: Conference Proceeding no refering
Year of publication: 2023
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: Atomic layer deposition; Cerium oxide; hydrogen detection
Source: Verhandlungen der DPG
URL: https://www.dpg-verhandlungen.de/year/2023/conference/skm/part/o/session/42/contribution/4

Application of plasma enhanced atomic layer deposition process of alumina on perovskite film boosts efficiency of solar cells

Author(s): Kot, Małgorzata, Kedia, Mayank, Plate, Paul, Marth, Ludwig, Henkel, Karsten, Flege, Jan Ingo
Type: Conference Proceeding no refering
Year of publication: 2023
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: Plamsa-enhanced atomic layer deposition; Perovskite solar cells; Valence band maximum
Source: Verhandlungen der DPG
URL: https://www.dpg-verhandlungen.de/year/2023/conference/skm/part/hl/session/4/contribution/2

In-situ monolayer graphene growth on Ru(10-10): an electron microscopy study

Author(s): Sulaiman, Cathy, Schewe, Lukas, Buß, Lars, Ewert, Moritz, Flege, Jan Ingo
Type: Conference Proceeding no refering
Year of publication: 2023
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: photoemission electron microscopy (PEEM); graphene; ruthenium; low-energy electron microscopy (LEEM); low-energy electron diffraction (LEED)
Source: Verhandlungen der DPG
URL: https://www.dpg-verhandlungen.de/year/2023/conference/skm/part/o/session/64/contribution/8

The dependence of structure on thickness of NiO(100) films on Ag(100) studied by IV-LEED

Author(s): Lachnitt, Jan, Das, Shuvankar, Menon, Krishnakumar S. R., Mandal, Suman, Flege, Jan Ingo
Type: Conference Proceeding no refering
Year of publication: 2023
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: IV-LEED; X-ray photoelectron spectroscopy (XPS); NiO; Ag; density-functional theory (DFT)
Source: Verhandlungen der DPG
URL: https://www.dpg-verhandlungen.de/year/2023/conference/skm/part/o/session/92/contribution/4

In situ characterization of cerium oxide on Au(111) under reducing and oxidizing conditions by low-energy electron microscopy

Author(s): Tschammer, Rudi, Buß, Lars, Morales, Carlos, Senanayake, Sanjaya D., Falta, Jens, Flege, Jan Ingo
Type: Conference Proceeding no refering
Year of publication: 2023
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: low-energy electron microscopy; cerium oxide; reduction; reoxidation; low-energy electron diffraction (LEED)
Source: Verhandlungen der DPG
URL: https://www.dpg-verhandlungen.de/year/2023/conference/skm/part/o/session/78/contribution/9

WO3 Thin-Film Optical Gas Sensors Based on Gasochromic Effect towards Low Hydrogen Concentrations

Author(s): Mazur, Michał, Kapuścik, Paulina, Weichbrodt, Wiktoria, Domaradzki, Jarosław, Mazur, Piotr, Kot, Małgorzata, Flege, Jan Ingo
Type: Scientific Article ref.
Year of publication: 2023
: Tungsten oxide (WO3); gas impulse magnetron sputtering; thin film; gasochromic properties; optical properties; annealing; optical hydrogen gas sensor
Source: Materials
Volume: 16
Issue/Journal number: 10
ISSN: 1996-1944
DOI: https://doi.org/10.3390/ma16103831

Cleaning and tailoring the Pt3Sn(111) surface for surface experiments

Author(s): Braud, Nicolas, Buß, Lars, Lundgren, Edvin, Merte, Lindsay R., Wallander, Harald J., Krisponeit, Jon-Olaf, Locatelli, Andrea, Mentes, Tevfik Onur, Jugovac, Matteo, Flege, Jan Ingo, Falta, Jens
Type: Scientific Article ref.
Year of publication: 2023
: Pt3Sn; Low-energy electron microscopy (LEEM); Platinum; Tin; Cleaning; Alloy
Source: Surface Science
Volume: 732
ISSN: 0039-6028; 1879-2758
DOI: https://doi.org/10.1016/j.susc.2023.122281

Preparation and stability of the hexagonal phase of samarium oxide on Ru(0001)

Author(s): Pożarowska, Emilia, Pleines, Linus, Ewert, Moritz, Prieto, Mauricio J., Tănase, Liviu Christian, Souza Caldas, Lucas de, Tiwari, Aarti, Schmidt, Thomas, Falta, Jens, Krasovskii, Eugene, Morales, Carlos, Flege, Jan Ingo
Type: Scientific Article ref.
Year of publication: 2023
: Samarium oxide (Sm2O3); low-energy electron microscopy (LEEM); X-ray photoemission electron microscopy (XPEEM); Facets; Epitaxy; Hexagonal phase
Source: Ultramicroscopy
Volume: 250
ISSN: 0304-3991; 1879-2723
DOI: https://doi.org/10.1016/j.ultramic.2023.113755

Coordination Chemistry as a Universal Strategy for a Controlled Perovskite Crystallization

Author(s): Zuo, Weiwei, Malekshahi Byranvand, Mahdi, Kodalle, Tim, Zohdi, Mohammadreza, Lim, Jaekeun, Carlsen, Brian, Friedlmeier, Theresa Magorian, Kot, Małgorzata, Das, Chittaranjan, Flege, Jan Ingo, Zong, Wansheng, Abate, Antonio, Sutter-Fella, Carolin M., Li, Meng, Saliba, Michael
Type: Scientific Article ref.
Year of publication: 2023
: Perovskite solar cells; nucleation; dimethyl sulfide ()DMS) solvent; coordination chemistry
Source: Advanced Materials
Volume: 35
Issue/Journal number: 39
ISSN: 0935-9648; 1521-4095
DOI: https://doi.org/10.1002/adma.202302889

Are Ni/ and Ni5Fe1/biochar catalysts suitable for synthetic natural gas production? A comparison with γ-Al2O3 supported catalysts

Author(s): Gonzalez-Castãno, Miriam, Morales, Carlos, Navarro de Miguel, Juan Carlos, Boelte, Jens H., Klepel, Olaf, Flege, Jan Ingo, Arellano-García, Harvey
Type: Scientific Article ref.
Year of publication: 2023
: Biochar catalysts; Carbon catalysts; Ni catalysts; NiFe alloy; Bimetallic catalysts; Synthetic natural gas; CO2 methanation
Source: Green Energy & Environment, S. 744 - 756
Volume: 8
Issue/Journal number: 3
ISSN: 2468-0257
DOI: https://doi.org/10.1016/j.gee.2021.05.007

Tunable Carrier Type of a Semiconducting 2D Metal–Organic Framework Cu3(HHTP)2

Author(s): Gonzalez-Juarez, Maria de Lourdes, Morales, Carlos, Flege, Jan Ingo, Flores, Eduardo, Martin-Gonzalez, Marisol, Nandhakumar, Iris, Bradshaw, Darren
Type: Scientific Article ref.
Year of publication: 2022
: conducting; metal-organic frameworks; molecular doping; n-type; p-type
Source: ACS Applied Materials & Interfaces, S. 12404 - 12411
Volume: 14
Issue/Journal number: 10
ISSN: 1944-8244; 1944-8252
DOI: https://doi.org/10.1021/acsami.2c00089

Atomic Layer Engineering of Aluminum-Doped Zinc Oxide films for Efficient and Stable Perovskite Solar Cells

Author(s): Kruszyńska, Joanna, Ostapko, Jakub, Ozkaya, Veysel, Surucu, Belkis, Szawcow, Oliwia, Nikiforow, Kostiantyn, Hołdyński, Marcin, Tavakoli, Mohammad Mahdi, Yadav, Pankaj, Kot, Małgorzata, Kołodziej, Grzegorz Piotr, Wlazło, Mateusz, Satapathi, Soumitra, Akin, Seckin, Prochowicz, Daniel
Type: Scientific Article ref.
Year of publication: 2022
: atomic layer deposition; electron transporting layers; perovskites; solar cells; stability of perovskite solar cells
Source: Advanced Materials Interfaces
Volume: 9
Issue/Journal number: 17
ISSN: 2196-7350
DOI: https://doi.org/10.1002/admi.202200575

Toward controlling the Al2O3/ZnO interface properties by in situ ALD preparation

Author(s): Janowitz, Christoph, Mahmoodinezhad, Ali, Kot, Małgorzata, Morales, Carlos, Naumann, Franziska, Plate, Paul, Zoellner, Marvin Hartwig, Bärwolf, Florian, Stolarek, David, Wenger, Christian, Henkel, Karsten, Flege, Jan Ingo
Type: Scientific Article ref.
Year of publication: 2022
: ALD heterojunction; band alignement; ZnO; Al2O3; interface properties
Source: Dalton Transactions, S. 9291 - 9301
Volume: 51
ISSN: 1477-9234; 1477-9226
DOI: https://doi.org/10.1039/D1DT04008A

Band Bending at Hole Transporting Layer-Perovskite Interfaces in n-i-p and in p-i-n Architecture

Author(s): Das, Chittaranjan, Kedia, Mayank, Zuo, Weiwei, Mortan, Claudiu, Kot, Małgorzata, Flege, Jan Ingo, Saliba, Michael
Type: Scientific Article ref.
Year of publication: 2022
: band bending; hole transporting layer; perovskites; X-ray photoelectron spectroscopy (XPS)
Source: Solar RRL
Volume: 6
Issue/Journal number: 9
ISSN: 2367-198X
DOI: https://doi.org/10.1002/solr.202200348

On the transition from MoS2 single-layer to bilayer growth on the Au(111) surface

Author(s): Ewert, Moritz, Buß, Lars, Genuzio, Francesca, Menteş, Tevfik Onur, Locatelli, Andrea, Falta, Jens, Flege, Jan Ingo
Type: Conference Proceeding no refering
Year of publication: 2022
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: angle-resolved photoemission spectroscopy; low-energy electron microscopy; intensity-voltage; micro-spot low-energy electron diffraction; step bunches; single-terrace growth
Source: Verhandlungen der DPG
URL: https://www.dpg-verhandlungen.de/year/2022/conference/regensburg/part/o/session/65/contribution/3
: Verhandlungen der DPG

Application of atomic layer deposition and x-ray photoelectron spectroscopy in perovskite solar cells

Author(s): Kot, Małgorzata, Das, Chittaranjan, Kegelmann, Lukas, Köbler, Hans, Vorokhta, Mykhailo, Escudero, Carlos, Albrecht, Steve, Abate, Antonio, Flege, Jan Ingo
Type: Conference Proceeding no refering
Year of publication: 2022
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: atomic layer deposition; x-ray photoelectron spectroscopy; perovskite solar cells; aluminium oxide; iodine migration; long term stability; Frenkel defects
Source: Verhandlungen der DPG
URL: https://www.dpg-verhandlungen.de/year/2022/conference/regensburg/part/hl/session/5/contribution/4
: Verhandlungen der DPG

The relation between structure sensitivity and doping of ceria(111) vs. ceria(100)

Author(s): Pozarowska, Emilia, Pleines, Linus, Prieto, Mauricio J., Tănase, Liviu Christian, Souza Caldas, Lucas de, Tiwari, Aarti, Schmidt, Thomas, Falta, Jens, Morales, Carlos, Flege, Jan Ingo
Type: image
Year of publication: 2022
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: catalytic hydrogenation; Samarium alloying of cerium oxide; low-energy electron microscopy (LEEM); X-ray photoemission electron microscopy (PEEM); healing of oxygen vacancies
URL: https://www.dpg-verhandlungen.de/year/2022/conference/regensburg/part/o/session/52/contribution/11
: Verhandlungen der DPG

Reaction Mechanism and Kinetic Model of Fe Thin Film Transformation into Monosulfides (FeS): First Step of the Fe Films Sulfuration Process into Pyrite

Author(s): Morales, Carlos, Pascual, Antonio, Leinen, Dietmar, Flores, Eduardo, Muñoz-Cortes, Esmeralda, Leardini, Fabrice, Ares, José Ramón, Flege, Jan Ingo, Soriano, Leonardo, Ferrer, Isabel J., Sanchez, Carlos
Type: Scientific Article ref.
Year of publication: 2022
: Fe thin films; sulfuration; kinetics; transport properties; Kirkendall effect; Seebeck coefficient; resistivity
Source: The Journal of Physical Chemistry C, S. 13870 - 13883
Volume: 126
Issue/Journal number: 32
ISSN: 1932-7455; 1932-7447
DOI: https://doi.org/10.1021/acs.jpcc.2c02060

Phase Separation within Vanadium Oxide Islands under Reaction Conditions: Methanol Oxidation at Vanadium Oxide Films on Rh(111)

Author(s): Boehn, Bernhard von, Weißbach, Anton, Krisponeit, Jon-Olaf, Flege, Jan Ingo, Falta, Jens, Gregoratti, Luca, Amati, Matteo, Zeller, Patrick, Imbihl, Ronald
Type: Scientific Article ref.
Year of publication: 2022
: Methanol Oxidation; Vanadium Oxide; Photoemission electron microscopy (PEEM); Low-energy electron microscopy (LEEM),; Microspot-low-energy electron diffraction (μLEED); Microspot-X-ray photoelectron spectroscopy (μXPS)
Source: The Journal of Physical Chemistry C, S. 19101 - 19112
Volume: 126
Issue/Journal number: 45
ISSN: 1932-7455; 1932-7447
DOI: https://doi.org/10.1021/acs.jpcc.2c04174

Growth Mechanism of Single-Domain Monolayer MoS2 Nanosheets on Au(111) Revealed by In Situ Microscopy: Implications for Optoelectronics Applications

Author(s): Ewert, Moritz, Buß, Lars, Lauritsen, Jeppe V., Falta, Jens, Flege, Jan Ingo
Type: Scientific Article ref.
Year of publication: 2022
: in situ methods; low-energy electron microscopy and diffraction; molybdenum disulfide; 2D material; epitaxial growth mechanism; Au(111)
Source: ACS Applied Nano Materials, S. 17702 - 17710
Volume: 5
Issue/Journal number: 12
ISSN: 2574-0970
DOI: https://doi.org/10.1021/acsanm.2c03584

Atomic layer deposition and characterization of metal oxide thin films

Author(s): Mahmoodinezhad, Ali
Type: doctoralthesis
Year of publication: 2022
: Aluminum oxide; Cerium oxide; Indium gallium zinc oxide; Plasma-enhanced atomic layer deposition; Thermal atomic layer deposition; Aluminiumoxid; Ceroxid; Indium-Gallium-Zink-Oxid; Plasmaunterstützte Atomlagenabscheidung; Thermische Atomlagenabscheidung
DOI: https://doi.org/10.26127/BTUOpen-6134

In-situ characterization of cyclic reduction and reoxidation of CeOx(111) and CeOx(100) islands on Cu(111)

Author(s): Pleines, Linus, Buß, Lars, Menteş, Tevfik Onur, Genuzio, Francesca, Locatelli, Andrea, Falta, Jens, Flege, Jan Ingo
Type: Conference Proceeding no refering
Year of publication: 2022
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: methanol synthesis; low-energy electron microscopy (LEEM); X-ray absorption spectroscopy (XAS); partial reduction; reoxidation
Source: Verhandlungen der DPG
URL: https://www.dpg-verhandlungen.de/year/2022/conference/regensburg/part/o/session/69/contribution/10
: Verhandlungen der DPG

Imaging the Kirkendall effect in pyrite (FeS2) thin films: Cross-sectional microstructure and chemical features

Author(s): Morales, Carlos, Leinen, Dietmar, Flores, Eduardo, Muñoz-Cortes, Esmeralda, Leardini, Fabrice, Ares, José Ramón, Flege, Jan Ingo, Soriano, Leonardo, Ferrer, Isabel J., Sanchez, Carlos
Type: Scientific Article ref.
Year of publication: 2021
: Pyrite; Transmission electron microscopy (TEM); Cross-section; Kirkendall effect; Sodium doping
Source: Acta Materialia
Volume: 205
ISSN: 1359-6454; 1873-2453
DOI: https://doi.org/10.1016/j.actamat.2020.116582

Temperature–Pressure Hybrid Sensing All-Organic Stretchable Energy Harvester

Author(s): Ghosh, Sujoy Kumar, Sinha, Tridib Kumar, Xie, Mengying, Bowen, Christopher Rhys, Garain, Samiran, Mahanty, Biswajit, Roy, Krittish, Henkel, Karsten, Schmeißer, Dieter, Kim, Jin Kuk, Mandal, Dipankar
Type: Scientific Article ref.
Year of publication: 2021
: all-organic; piezoelectric; pyroelectric; energy harvester; sensor; healthcare monitoring
Source: ACS Applied Electronic Materials, S. 248 - 259
Volume: 3
Issue/Journal number: 1
ISSN: 2637-6113
DOI: https://doi.org/10.1021/acsaelm.0c00816

The role of two-dimensional pressure in sulfur intercalation underneath graphene on ruthenium

Author(s): Buß, Lars, Falta, Jens, Ewert, Moritz, Shao, Bin, Wehling, Tim Oliver, Flege, Jan Ingo
Type: image
Year of publication: 2021
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft e.V.
: Low energy elecron microscopy (LEEM); Low energy electron diffraction LEED; graphene; ruthenium; sulfur intercalation
URL: https://www.dpg-verhandlungen.de/year/2021/conference/surfacescience/part/o/session/105/contribution/3

Transitions from single-layer MoS2 to bilayer growth: A LEEM study

Author(s): Ewert, Moritz, Buß, Lars, Genuzio, Francesca, Menteş, Tevfik Onur, Locatelli, Andrea, Falta, Jens, Flege, Jan Ingo
Type: image
Year of publication: 2021
: Molybdenum disulfide (MoS2); Low energy electron microscopy (LEEM); Lowenergy electron diffraction; Angle-resolved photoelecton spectroscopy
URL: https://www.dpg-verhandlungen.de/year/2021/conference/surfacescience/part/o/session/105/contribution/12

XPS and UPS investigation of an ALD prepared Al2O3/ZnO heterojunction

Author(s): Janowitz, Christoph, Mahmoodinezhad, Ali, Naumann, Franziska, Plate, Paul, Henkel, Karsten, Flege, Jan Ingo
Type: image
Year of publication: 2021
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft e.V.
: X-ray photoelectron spectroscopy; ultraviolet photoelectron spectroscopy; atomic layer deposition; large bandgap materials; band offsets
URL: https://www.dpg-verhandlungen.de/year/2021/conference/surfacescience/part/o/session/74/contribution/4

Low-temperature atomic layer deposition of indium oxide thin films using trimethylindium and oxygen plasma

Author(s): Mahmoodinezhad, Ali, Morales, Carlos, Naumann, Franziska, Plate, Paul, Meyer, Robert, Janowitz, Christoph, Henkel, Karsten, Kot, Małgorzata, Flege, Jan Ingo
Type: image
Year of publication: 2021
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft e.V.
: Indium oxide; Plasma enhanced atomic layer deposition; Spectroscopic ellipsometry; X-ray photoelectron spectroscopy
URL: https://www.dpg-verhandlungen.de/year/2021/conference/surfacescience/part/o/session/74/contribution/8

Functional ultra-thin oxide films deposited by atomic layer deposition on structured substrates

Author(s): Morales, Carlos, Mahmoodinezhad, Ali, Schubert, Andreas Markus, Wenger, Christian, Henkel, Karsten, Flege, Jan Ingo
Type: Conference Proceeding no refering
Year of publication: 2021
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft e.V.
: Atomic layer deposition; sensors; structured substrates; in-situ X-ray photoelectron spectroscopy
Source: Verhandlungen der DPG - SurfaceScience21
URL: https://www.dpg-verhandlungen.de/year/2021/conference/surfacescience/part/o/session/74/contribution/5

Growth of samarium thin films and subsequent oxidation on polycrystalline copper

Author(s): Pozarowska, Emilia, Morales, Carlos, Flege, Jan Ingo
Type: image
Year of publication: 2021
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft e.V.
: in-situ X-ray photoelectron spectroscopy (XPS); samarium oxide; samarium oxidation
URL: https://www.dpg-verhandlungen.de/year/2021/conference/surfacescience/part/o/session/18/contribution/2

Spin-polarized VLEED from single-layer MoS2/Au(111): Investigation of spin-orbit-induced effects

Author(s): Angrick, Christoph, Henriksen, Annika, Mutzke, Nicole, Reimann, Andre, Ewert, Moritz, Buß, Lars, Falta, Jens, Flege, Jan Ingo, Donath, Markus
Type: image
Year of publication: 2021
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft e.V.
: Molybdenum disulfide (MoS2); very-low-energy electron diffraction (VLEED); spin-orbit interaction
URL: https://www.dpg-verhandlungen.de/year/2021/conference/surfacescience/part/o/session/78/contribution/3

Strongly Strained VO2 Thin Film Growth

Author(s): Fischer, Simon, Flege, Jan Ingo, Foerster, Michael, Aballe, Lucia, Falta, Jens, Krisponeit, Jon-Olaf
Type: image
Year of publication: 2021
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft e.V.
: vanadium oxide (VO2); strain; ruthenium oxide; Locally resolved electron spectroscopy; Low energy electron diffraction (LEED); MBE
URL: https://www.dpg-verhandlungen.de/year/2021/conference/surfacescience/part/o/session/74/contribution/3

Growth and characterization of ZnO thin films at low temperatures: from room temperature to -120 °C

Author(s): Morales, Carlos, Leinen, Dietmar, Campo, Adolfo del, Ares, José Ramón, Sánchez, Carlos, Flege, Jan Ingo, Gutiérrez, Alejandro, Prieto, Pilar, Soriano, Leonardo
Type: Scientific Article ref.
Year of publication: 2021
: zinc oxide (ZnO); thin films; morphology; scanning electron microscopy (SEM); DRX; optical properties; electrical properties
Source: Journal of Alloys and Compounds
Volume: 884
ISSN: 0925-8388; 1873-4669
DOI: https://doi.org/10.1016/j.jallcom.2021.161056

X‑ray Photoelectron Spectroscopy and Resonant X‑ray Spectroscopy Investigations of Interactions between Thin Metal Catalyst Films and Amorphous Titanium Dioxide Photoelectrode Protection Layers

Author(s): Richter, Matthias R., Cheng, Wen-Hui, Crumlin, Ethan J., Drisdell, Walter S., Atwater, Harry A., Schmeißer, Dieter, Lewis, Nathan S., Brunschwig, Bruce S.
Type: Scientific Article ref.
Year of publication: 2021
: X‑ray Photoelectron Spectroscopy; Resonant X‑ray Spectroscopy; titanium oxide; oxygen-evolution reaction; protection layer; interface interaction
Source: Chemistry of Materials, S. 1265 - 1275
Volume: 33
Issue/Journal number: 4
ISSN: 0897-4756; 1520-5002
DOI: https://doi.org/10.1021/acs.chemmater.0c04043

High temperature reduction and reoxidation of cerium oxide on Cu(111)

Author(s): Pleines, Linus, Buß, Lars, Menteş, Tevfik Onur, Genuzio, Francesca, Locatelli, Andrea, Flege, Jan Ingo, Falta, Jens
Type: image
Year of publication: 2021
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft e.V.
: Cerium oxide; H2 interaction; CO2 interaction; Low-energy electron microscopy (LEEM); X-ray absorption spectroscopy (XAS)
URL: https://www.dpg-verhandlungen.de/year/2021/conference/surfacescience/part/o/session/74/contribution/7

The Transition From MoS2 Single-Layer to Bilayer Growth on the Au(111) Surface

Author(s): Ewert, Moritz, Buß, Lars, Braud, Nicolas, Kundu, Asish K., Sheverdyaeva, Polina M., Moras, Paolo, Genuzio, Francesca, Menteş, Tevfik Onur, Locatelli, Andrea, Falta, Jens, Flege, Jan Ingo
Type: Scientific Article ref.
Year of publication: 2021
: molybdenum disulfide (MoS2); bilayer; in situ low-energy electron microscopy (LEEM); in situ photoemission microscopy (PEEM); micro-ARPES (angle-resolved photoelectron spectroscopy); Au step bunches
Source: Frontiers in Physics
Volume: 9
ISSN: 2296-424X
DOI: https://doi.org/10.3389/fphy.2021.654845

Sensitivity to crystal stacking in low-energy electron microscopy

Author(s): Jugovac, Matteo, Menteş, Tevfik Onur, Genuzio, Francesca, Lachnitt, Jan, Feyer, Vitaliy, Flege, Jan Ingo, Locatelli, Andrea
Type: Scientific Article ref.
Year of publication: 2021
: LEEM-I(V); Stacking fault; fcc; hcp; Ag(111)
Source: Applied Surface Science
Volume: 566
ISSN: 0169-4332; 1873-5584
DOI: https://doi.org/10.1016/j.apsusc.2021.150656

Sabatier-Based Direct Synthesis of Methane and Methanol Using CO2 from Industrial Gas Mixtures

Author(s): Müller, Klaus, Israel, Johannes, Rachow, Fabian, Schmeißer, Dieter
Editor(s): Ramirez Reina, Tomas, Odriozola, José Antonio, Arellano-Garcia, Harvey
Type: part of book (chapter)
Year of publication: 2021
Publisher name: Weinheim : Wiley-VCH
: Sabatier reaction; CO2 emission reduction; industrial CO2 sources
Source: Engineering Solutions for CO2 Conversion, S. 253 - 280
ISBN: 978-3-527-34639-4

Top-Down Approach to Study Chemical and Electronic Properties of Perovskite Solar Cells: Sputtered Depth Profiling Versus Tapered Cross-Sectional Photoelectron Spectroscopies

Author(s): Das, Chittaranjan, Zia, Waqas, Mortan, Claudiu, Hussain, Navid, Saliba, Michael, Flege, Jan Ingo, Kot, Małgorzata
Type: Scientific Article ref.
Year of publication: 2021
: chemical distributions; depth profiles; interfaces; perovskite solar cells; X-ray photoelectron spectroscopy
Source: Solar RRL
Volume: 5
Issue/Journal number: 10
ISSN: 2367-198X
DOI: https://doi.org/10.1002/solr.202100298

Low-temperature atomic layer deposition of indium oxide thin films using trimethylindium and oxygen plasma

Author(s): Mahmoodinezhad, Ali, Morales, Carlos, Naumann, Franziska, Plate, Paul, Meyer, Robert, Janowitz, Christoph, Henkel, Karsten, Kot, Małgorzata, Zoellner, Marvin Hartwig, Wenger, Christian, Flege, Jan Ingo
Type: Scientific Article ref.
Year of publication: 2021
: Indium oxide; Plasma-enhanced atomic layer deposition; X-ray photoelectron spectroscopy; Ellipsometry; X-ray diffraction; Electrical properties
Source: Journal of Vacuum Science and Technology A
Volume: 39
Issue/Journal number: 6
ISSN: 0734-2101; 1520-8559
DOI: https://doi.org/10.1116/6.0001375

Self-Assembled Monolayers from Symmetrical Di-Thiols: Preparation, Characterization and Application for the Assembly of Electrochemically Active Films

Author(s): Laroussi, Arwa, Kot, Małgorzata, Flege, Jan Ingo, Raouafi, Noureddine, Mirsky, Vladimir M.
Type: Conference Proceeding no refering
Year of publication: 2021
Publisher name: MDPI
: self-assembled monolayer; immobilization fashion; X-ray photoelectron spectroscopy; p-benzoquinone; electron transfer; cyclic voltammetry; NADH sensor
Source: Engineering Proceedings
DOI: https://doi.org/10.3390/I3S2021Dresden-10112

In situ real-time and ex situ spectroscopic analysis of Al₂O₃ films prepared by plasma enhanced atomic layer deposition

Author(s): Naumann, Franziska, Reck, Johanna, Gargouri, Hassan, Gruska, Bernd, Blümich, Adrian, Mahmoodinezhad, Ali, Janowitz, Christoph, Henkel, Karsten, Flege, Jan Ingo
Type: Scientific Article ref.
Year of publication: 2020
: Plamsa enhanced atomic layer deposition (PEALD); spectroscopic ellipsometry; X-ray photoelectron spectroscopy; real-time monitoring; aluminum oxide (Al₂O₃)
Source: Journal of Vacuum Science and Technology B
Volume: 38
Issue/Journal number: 1
ISSN: 0734-211X; 1071-1023; 2166-2746; 2166-2754
DOI: https://doi.org/10.1116/1.5122797

Impact of Alkali Treatments on the Surface and Interface Properties of Chalcopyrite Thin-Film Solar Cell Absorbers

Author(s): Yang, Penghui
Type: doctoralthesis
Year of publication: 2020
URN: urn:nbn:de:kobv:co1-opus4-51772

A Comparative Study of the ZnO Growth on Graphene and Graphene Oxide: The Role of the Initial Oxidation State of Carbon

Author(s): Gomez-Alvarez, Miguel Angel, Morales, Carlos, Méndez, Javier, Campo, Adolfo del, Urbanos, Fernando J., Díaz, Aarón, Reséndiz, Luis, Flege, Jan Ingo, Granados, Daniel, Soriano, Leonardo
Type: Scientific Article ref.
Year of publication: 2020
: graphene; graphene oxide; zinc oxide; intrefaces; mode of growth; x-Ray photoelectron spectroscopy (XPS); atomic force microscopy (AFM); factor analyis
Source: C - Journal of Carbon Research
Volume: 6
Issue/Journal number: 2
ISSN: 2311-5629
DOI: https://doi.org/10.3390/c6020041

Atomic Layer-Deposited Aluminum Oxide Hinders Iodide Migration and Stabilizes Perovskite Solar Cells

Author(s): Das, Chittaranjan, Kot, Małgorzata, Hellmann, Tim, Wittich, Carolin, Mankel, Eric, Zimmermann, Iwan, Schmeißer, Dieter, Nazeeruddin, Mohammad Khaja, Jaegermann, Wolfram
Type: Scientific Article ref.
Year of publication: 2020
: perovskite solar cells; iodine migration; stability; X-ray photoelectron spectroscopy (XPS); atomic layer deposition (ALD); aluminum oxide (Al2O3)
Source: Cell Reports Physical Science
Volume: 1
Issue/Journal number: 7
ISSN: 2666-3864
DOI: https://doi.org/10.1016/j.xcrp.2020.100112

In situ Near-Ambient Pressure X-ray Photoelectron Spectroscopy Reveals the Influence of Photon Flux and Water on the Stability of Halide Perovskite

Author(s): Kot, Małgorzata, Kegelmann, Lukas, Köbler, Hans, Vorokhta, Mykhailo, Escudero, Carlos, Kúš, Peter, Šmíd, Břetislav, Tallarida, Massimo, Albrecht, Steve, Abate, Antonio, Matolínová, Iva, Schmeißer, Dieter, Flege, Jan Ingo
Type: Scientific Article ref.
Year of publication: 2020
: field emission scanning electron microscopy (FESEM); Frenkel defects; near-ambient pressure X-ray photoelectron spectroscopy (NAP-XPS); perovskite; photon-induced degradation
Source: ChemSusChem, S. 5722 - 5730
Volume: 13
Issue/Journal number: 21
ISSN: 1864-5631; 1864-564X
DOI: https://doi.org/10.1002/cssc.202001527

Low-temperature growth of gallium oxide thin films by plasma-enhanced atomic layer deposition

Author(s): Mahmoodinezhad, Ali, Janowitz, Christoph, Naumann, Franziska, Plate, Paul, Gargouri, Hassan, Henkel, Karsten, Schmeißer, Dieter, Flege, Jan Ingo
Type: Scientific Article ref.
Year of publication: 2020
: Plamsa enhanced atomic layer deposition (PEALD); low-temperature growth; gallium oxide (Ga2O3); x-ray photoelectron spectroscopy; spectroscopic ellipsometry; capacitance voltage measurements
Source: Journal of Vacuum Science and Technology A
Volume: 38
Issue/Journal number: 2
ISSN: 0734-2101; 1520-8559
DOI: https://doi.org/10.1116/1.5134800

Adsorption of sulfur on Si(111)

Author(s): Schmidt, Thomas, Buß, Lars, Ewert, Moritz, Schönhoff, Gunnar, Wehling, Tim Oliver, Falta, Jens
Type: Scientific Article ref.
Year of publication: 2020
: Passivation; Low-energy electron diffraction; Scanning tunneling microscopy; Density functional theory; Auger electron spectroscopy
Source: Surface Science
Volume: 694
ISSN: 0039-6028; 1879-2758
DOI: https://doi.org/10.1016/j.susc.2019.121561

Self-Powered Human-Health Monitoring through Aligned PVDFNanofibers Interfaced Skin-Interactive Piezoelectric Sensor

Author(s): Maity, Kuntal, Garain, Samiran, Henkel, Karsten, Schmeißer, Dieter, Mandal, Dipankar
Type: Scientific Article ref.
Year of publication: 2020
: e-skin sensor; piezoelectric nanofibers; PVDF; flexible electrode; health-care monitoring; self-powered electronics
Source: ACS Applied Polymer Materials, S. 862 - 878
Volume: 2
Issue/Journal number: 2
ISSN: 2637-6105
DOI: https://doi.org/10.1021/acsapm.9b00846

Reaction dynamics of metal/oxide catalysts: Methanol oxidation at vanadium oxide films on Rh(111) from UHV to 10-2 mbar

Author(s): Boehn, Bernhard von, Penschke, Christopher, Li, Xiaoke, Paier, Joachim, Sauer, Joachim, Krisponeit, Jon-Olaf, Flege, Jan Ingo, Falta, Jens, Marchetto, Helder, Franz, Torsten, Lilienkamp, Gerhard, Imbihl, Ronald
Type: Scientific Article ref.
Year of publication: 2020
: Vanadium oxide; Methanol oxidation; Inverse catalyst; Restructuring; Near ambient pressure low-energy electron microscope; Heterogeneous catalysis; Pressure gap
Source: Journal of Catalysis, S. 255 - 264
Volume: 385
ISSN: 0021-9517; 1090-2694
DOI: https://doi.org/10.1016/j.jcat.2020.03.016

Self-assembled monolayers from symmetrical di-thiols: Preparation, characterization and application for the assembly of electrochemically active films

Author(s): Laroussi, Arwa, Kot, Małgorzata, Flege, Jan Ingo, Raouafi, Noureddine, Mirsky, Vladimir M.
Type: Scientific Article ref.
Year of publication: 2020
: self-assembled monolayer (SAM); cyclic voltammetry; impedance spectroscopy; X-ray photoelectron spectroscopy (XPS); kinetic capacitance; contact angle
Source: Applied Surface Science
Volume: 513
ISSN: 0169-4332; 1873-5584
DOI: https://doi.org/10.1016/j.apsusc.2020.145827

Massively Strained VO2 Thin Film Growth on RuO2

Author(s): Fischer, Simon, Krisponeit, Jon-Olaf, Foerster, Michael, Aballe, Lucia, Falta, Jens, Flege, Jan Ingo
Type: Scientific Article ref.
Year of publication: 2020
: strain engineering; vanadium dioxide (VO2); ruthenium dioxide (RuO2); reactive molecular beam epitaxy (MBE); low energy electron microscopy (LEEM); photoemission electron microscopy (PEEM); low energy electron diffraction (LEED); XPEEM; µLEED
Source: Crystal Growth & Design, S. 2734 - 2741
Volume: 20
Issue/Journal number: 4
ISSN: 1528-7483; 1528-7505
DOI: https://doi.org/10.1021/acs.cgd.0c00120

Thermal stability of CH3NH3PbIxCl3-x versus [HC(NH2)2]0.83Cs0.17PbI2.7Br0.3 perovskite films by X-ray photoelectron spectroscopy

Author(s): Kot, Małgorzata, Vorokhta, Mykhailo, Wang, Zhiping, Snaith, Henry J., Schmeißer, Dieter, Flege, Jan Ingo
Type: Scientific Article ref.
Year of publication: 2020
: Hybrid organic inorganic perovskite solar cells; X-ray photoelectron spectroscopy; Film degradation; Thermal stability
Source: Applied Surface Science
Volume: 513
ISSN: 0169-4332; 1873-5584
DOI: https://doi.org/10.1016/j.apsusc.2020.145596

The morphology of VO2/TiO2(001): terraces, facets, and cracks

Author(s): Krisponeit, Jon-Olaf, Fischer, Simon, Esser, Sven, Moshnyaga, Vasily, Schmidt, Thomas, Piper, Louis F. J., Flege, Jan Ingo, Falta, Jens
Type: Scientific Article ref.
Year of publication: 2020
: Vanadium dioxide (VO2); rutile TiO2(001); metal-to-insulator transition; morphology; crystallography; low-energy electron microscopy (LEEM); low-energy electron diffraction (LEED); scanning probe microscopy
Source: Scientific Reports
Volume: 10
ISSN: 2045-2322
DOI: https://doi.org/10.1038/s41598-020-78584-9

Quasicrystals and their Approximants in 2D Ternary Oxides

Author(s): Förster, Stefan, Schenk, Sebastian, Zollner, Eva Maria, Krahn, Oliver, Chiang, Cheng-Tien, Schumann, Florian O., Bayat, Alireza, Schindler, Karl-Michael, Trautmann, Martin, Hammer, René, Meinel, Klaus, Adeagbo, Waheed A., Hergert, Wolfram, Flege, Jan Ingo, Falta, Jens, Ellguth, Martin, Tusche, Christian, DeBoissieu, Marc, Muntwiler, Matthias, Gerber, Thomas, Widdra, Wolf
Type: Scientific Article ref.
Year of publication: 2020
: approximants; dodecagonal oxide quasicrystals; oxide quasicrystals; tiling statistics
Source: Physia Status Solidi B
Volume: 257
Issue/Journal number: 7
ISSN: 0370-1972; 1521-3951
DOI: https://doi.org/10.1002/pssb.201900624

Influence of In situ Synthesized Bismuth Oxide Nanostructures in Self-poled PVDF-based Nanogenerator for Mechanical Energy Harvesting Application

Author(s): Biswas, Anirban, Garain, Samiran, Maity, Kuntal, Henkel, Karsten, Schmeißer, Dieter, Mandal, Dipankar
Type: Scientific Article ref.
Year of publication: 2019
: Nanogenerators; energy harvesting; PVDF; bismuth oxide; Field-emission scanning electron microscopy (FESEM); X-ray photoelectron spectroscopy (XPS); X-ray diffraction (XRD); Fourier Transform Infrared Spectroscopy (FTIR)
Source: Polymer Composites, S. 265 - 274
Volume: 40
Issue/Journal number: S1
ISSN: 0272-8397; 1548-0569
DOI: https://doi.org/10.1002/pc.24628

Growth and structure of singly oriented single-layer tungsten disulfide on Au(111)

Author(s): Bignardi, Luca, Lizzit, Daniel, Bana, Harsh, Travaglia, Elisabetta, Lacovig, Paolo, Sanders, Charlotte E., Dendzik, Maciej, Michiardi, Matteo, Bianchi, Marco, Ewert, Moritz, Buß, Lars, Falta, Jens, Flege, Jan Ingo, Baraldi, Alessandro, Larciprete, Rosanna, Hofmann, Philip, Lizzit, Silvano
Type: Scientific Article ref.
Year of publication: 2019
: tungsten disulfide (WS2); Au (111); photoelectron spectroscopy; photoelectron diffraction; low-energy electron microscopy
Source: Physical Review Materials
Volume: 3
Issue/Journal number: 1
ISSN: 2475-9953
DOI: https://doi.org/10.1103/PhysRevMaterials.3.014003

Nucleation, morphology, and structure of sub‐nm thin ceria islands on Rh(111)

Author(s): Flege, Jan Ingo, Höcker, Jan, Sadowski, Jerzy T., Senanayake, Sanjaya D., Falta, Jens
Type: Scientific Article ref.
Year of publication: 2019
: ceria; Rh (111); low‐energy electron microscopy (LEEM); photoemission electron microscopy (PEEM); IV-LEEM
Source: Surface and Interface Analysis, S. 110 - 114
Volume: 51
Issue/Journal number: 1
ISSN: 0142-2421; 1096-9918
DOI: https://doi.org/10.1002/sia.6567

Comparison of plasma-enhanced atomic layer deposition AlN films prepared with different plasma sources

Author(s): Kot, Małgorzata, Henkel, Karsten, Naumann, Franziska, Gargouri, Hassan, Tarnawska, Lidia Lupina, Wilker, Viola, Kus, Peter, Pożarowska, Emilia, Garain, Samiran, Rouissi, Zied, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2019
: Plamsa-enhanced atomic layer deposition (PEALD); inductively coupled; capacitively coupled; plamsa source; ellipsometry; X-ray photoelectron spectroscopy (XPS); X-ray diffraction (XRD); Field emission scanning electron microscopy (FESEM); capacitance-voltage (CV); atomic force microscopy
Source: Journal of Vacuum Science and Technology A
Volume: 37
Issue/Journal number: 2
ISSN: 0734-2101; 1520-8559
DOI: https://doi.org/10.1116/1.5079628

Analysis of surface properties of Ti-Cu-Ox gradient thin films using AFM and XPS investigations

Author(s): Kotwica, Tomasz, Domaradzki, Jarosław, Wojcieszak, Damian, Sikora, Andrzej, Kot, Małgorzata, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2019
: surface; gradient distribution; thin film oxide
Source: Materials Science-Poland, S. 761 - 768
Volume: 36
Issue/Journal number: 4
ISSN: 0137-1339; 2083-1331; 2083-134X
DOI: https://doi.org/10.2478/msp-2018-0100

Dynamics of the Interaction Between Ceria and Platinum During Redox Processes

Author(s): Luches, Paola, Gasperi, Gabriele, Sauerbrey, Marc, Valeri, Sergio, Falta, Jens, Flege, Jan Ingo
Type: Scientific Article ref.
Year of publication: 2019
: cerium oxide; platinum; low‐energy electron microscopy (LEEM); low-energy electron diffraction (LEED); reduction
Source: Frontiers in Chemistry
Volume: 7
ISSN: 2296-2646
DOI: https://doi.org/10.3389/fchem.2019.00057

Out-of-plane electronic contributions in Bi-cuprates studied by resonant photoelectron spectroscopy at the Cu 2p edge

Author(s): Janowitz, Christoph, Schmeißer, Dieter
Type: Conference Proceeding no refering
Year of publication: 2019
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: high-temperature superconductors; resonant photoemission spectroscopy; single crystal; doping-induced charge density
Source: Verhandlungen der DPG, S. 403 - 403
URL: https://www.dpg-verhandlungen.de/year/2019/conference/regensburg/part/tt/session/49/contribution/19
: Verhandlungen der DPG (VI) ; 54,4

Unraveling the growth mechanism of single-domain molybdenum disulfide on Au(111)

Author(s): Ewert, Moritz, Buß, Lars, Moras, Paolo, Falta, Jens, Flege, Jan Ingo
Type: Conference Proceeding no refering
Year of publication: 2019
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: low-energy electron microscopy (LEEM); micro-diffraction (LEED); I(V)-LEEM; investigations of the electronic bandstructure using angle-resolved photoelectron spectroscopy
Source: Verhandlungen der DPG, S. 329 - 329
URL: https://www.dpg-verhandlungen.de/year/2019/conference/regensburg/part/o/session/35/contribution/6
: Verhandlungen der DPG (VI) ; 54,4

Intercalation dynamics of sulfur underneath graphene on Ru(0001)

Author(s): Buß, Lars, Falta, Jens, Flege, Jan Ingo
Type: Conference Proceeding no refering
Year of publication: 2019
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: low-energy electron microscopy (LEEM); micro-diffraction (µLEED)
Source: Verhandlungen der DPG, S. 315 - 315
URL: https://www.dpg-verhandlungen.de/year/2019/conference/regensburg/part/o/session/7/contribution/9
: Verhandlungen der DPG (VI) ; 54, 4

Growth of Epitaxial 3,4,9,10-Perylene Tetracarboxylic Dianhydride on Bi-Terminated Silicon

Author(s): Schmidt, Thomas, Ahrens, Christian, Flege, Jan Ingo, Jaye, Cherno, Fischer, Daniel A., Falta, Jens
Type: Scientific Article ref.
Year of publication: 2019
: dianhydride; Bi-terminated silicon; spot profile analysis of low-energy electron diffraction (SPA-LEED); X-ray photoemission spectroscopy (XPS); near-edge X-ray absorptionfine structure (NEXAFS); scanning tunneling microscopy (STM)
Source: Journal of Physical Chemistry C, S. 7097 - 7109
Volume: 123
Issue/Journal number: 12
ISSN: 1932-7447; 1932-7455
DOI: https://doi.org/10.1021/acs.jpcc.8b10396

Reduction and reoxidation of (111) and (100) oriented cerium oxide islands on Cu(111)

Author(s): Pleines, Linus, Genuzio, Francesca, Menteş, Tevfik Onur, Locatelli, Andrea, Falta, Jens, Flege, Jan Ingo
Type: Conference Proceeding no refering
Year of publication: 2019
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: conversion of CO2 to methanol; low-energy electron mircoscopy (LEEM); x-ray absorption spectroscopy (XAS); resonant photoelectron spectroscopy (resPES)
Source: Verhandlungen der DPG, S. 330 - 330
URL: https://www.dpg-verhandlungen.de/year/2019/conference/regensburg/part/o/session/37/contribution/10
: Verhandlungen der DPG (VI) ; 54,4

Surface reconstructions on VO2(110)

Author(s): Krisponeit, Jon-Olaf, Fischer, Simon, Flege, Jan Ingo, Falta, Jens
Type: Conference Proceeding no refering
Year of publication: 2019
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: metal-insulator transition; substrate-induced strain; X-Ray photoelectron spectroscopy; µLEED; surface reconstruction; surface oxygen content
Source: Verhandlungen der DPG, S. 330 - 330
URL: https://www.dpg-verhandlungen.de/year/2019/conference/regensburg/part/o/session/37/contribution/7
: Verhandlungen der DPG (VI) ; 54, 4

Depth profiling of PEALD-AlN films based on Al2p XPS peak decomposition

Author(s): Mahmoodinezhad, Ali, Pożarowska, Emilia, Henkel, Karsten, Schmeißer, Dieter, Flege, Jan Ingo
Type: Conference Proceeding no refering
Year of publication: 2019
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: X-Ray photoelectron spectroscopy (XPS); peak decomposition; plasma enhanced atomic layer deposition (PEALD); aluminium nitride (AlN)
Source: Verhandlungen der DPG, S. 157 - 157
URL: https://www.dpg-verhandlungen.de/year/2019/conference/regensburg/part/ds/session/14/contribution/25
: Verhandlungen der DPG (VI) ; 54, 4

Vanadium dioxide thin films on (100)- and (110)-oriented ruthenium dioxide islands

Author(s): Fischer, Simon, Foerster, Michael, Aballe, Lucia, Vonk, Vedran, Falta, Jens, Krisponeit, Jon-Olaf, Flege, Jan Ingo
Type: Conference Proceeding no refering
Year of publication: 2019
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: transition temperature; strain; synchrotron-based XPEEM; local X-Ray absorption spectroscopy (XAS); local X-Ray photoelectron spectroscopy (XPS)
Source: Verhandlungen der DPG, S. 330 - 330
URL: https://www.dpg-verhandlungen.de/year/2019/conference/regensburg/part/o/session/37/contribution/5
: Verhandlungen der DPG (VI) ; 54, 4

Tailoring optical and electrical properties of thin-film coatings based on mixed Hf and Ti oxides for optoelectronic application

Author(s): Obstarczyk, Agata, Kaczmarek, Danuta, Wojcieszak, Damian, Mazur, Michał, Domaradzki, Jarosław, Kotwica, Tomasz, Pastuszek, Roman, Schmeißer, Dieter, Mazur, Piotr, Kot, Małgorzata
Type: Scientific Article ref.
Year of publication: 2019
: Magnetron sputtering; Optical coatings; Electrical properties; Mixed oxides; HfO2; TiO2; High-k oxides; Amorphous thin films
Source: Materials and Design
Volume: 175
ISSN: 0264-1275
DOI: https://doi.org/10.1016/j.matdes.2019.107822

A Self-Powered Wearable Pressure Sensor and Pyroelectric Breathing Sensor Based on GO Interfaced PVDF Nanofibers

Author(s): Roy, Krittish, Ghosh, Sujoy Kumar, Sultana, Ayesha, Garain, Samiran, Xie, Mengying, Bowen, Christopher Rhys, Henkel, Karsten, Schmeißer, Dieter, Mandal, Dipankar
Type: Scientific Article ref.
Year of publication: 2019
: piezo- and pyro-electric hybrid nanogenerator; poly(vinylidenefluoride) (PVDF)/graphene oxide (GO) nanofibers; wearable pressure sensor; breathing sensor
Source: ACS Applied Nano Materials, S. 2013 - 2025
Volume: 2
Issue/Journal number: 4
ISSN: 2574-0970
DOI: https://doi.org/10.1021/acsanm.9b00033

Methanation of Coke Oven Gas with Nickel-based catalysts

Author(s): Müller, Klaus, Rachow, Fabian, Günther, Vivien, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2019
: Coke Oven Gas; CO₂ recycling; Power to Gas (PtG); Synthetic Natural Gas (SNG); e-methane; Sabatier-Reaction
Source: International Journal of Environmental Science, S. 73 - 79
Issue/Journal number: 4
ISSN: 2367-8941
URL: https://www.iaras.org/iaras/home/caijes/methanation-of-coke-oven-gas-with-nickel-based-catalysts; https://iaras.org/iaras/filedownloads/ijes/2019/008-0009(2019).pdf

Themed issue on electronic properties and characterisation of perovskites

Author(s): Kot, Małgorzata, Das, Chittaranjan, Baran, Derya, Saliba, Michael
Type: Scientific Article ref.
Year of publication: 2019
: perovskite solar cells; electronic properties of perovskites
Source: Journal of Materials Chemistry C, S. 5224 - 5225
Volume: 7
ISSN: 2050-7526; 2050-7534
DOI: https://doi.org/10.1039/c9tc90085c

Wafer-Scale Synthesis of Graphene on Sapphire: Toward Fab-Compatible Graphene

Author(s): Mishra, Neeraj, Forti, Stiven, Fabbri, Filippo, Martini, Leonardo, McAleese, Clifford, Conran, Ben R., Whelan, Patrick R., Shivayogimath, Abhay, Jessen, Bjarke S., Buß, Lars, Falta, Jens, Aliaj, Ilirjan, Roddaro, Stefano, Flege, Jan Ingo, Bøggild, Peter, Teo, Kenneth B. K., Coletti, Camilla
Type: Scientific Article ref.
Year of publication: 2019
: graphene on insulator; interface; metal free; sapphire; wafer scale
Source: Small
Volume: 15
Issue/Journal number: 50
ISSN: 1613-6810; 1613-6829
DOI: https://doi.org/10.1002/smll.201904906

Al2O3-Atomic Layer Deposited Films on CH3NH3PbI3 : Intrinsic Defects and Passivation Mechanisms

Author(s): Kot, Małgorzata, Henkel, Karsten, Müller, Klaus, Kegelmann, Lukas, Albrecht, Steve, Tsud, Nataliya, Kús, Peter, Matolinová, Iva, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2019
: charge donation and transfer cycles; covalent interfaces; defect monitoring; model of Al2O3–CH3NH3PbI3 interactions; resonant photoelectron spectroscopy
Source: Energy Technology, The Journal of Physical Chemistry C
Volume: 7
Issue/Journal number: 11
ISSN: 2194-4288; 2194-4296
DOI: https://doi.org/10.1002/ente.201900975

Point Defect-Mediated Interface Formation and Appearance of a Cooper Minimum for AlOₓ Atomic-Layer-Deposited Films on CH₃NH₃PbI₃

Author(s): Schmeißer, Dieter, Henkel, Karsten, Pożarowska, Emilia, Kegelmann, Lukas, Tsud, Nataliya, Kot, Małgorzata
Type: Scientific Article ref.
Year of publication: 2019
: Resonant photoelectron spectroscopy; Al₂O₃-CH₃NH₃PbI₃ interaction; Cooper minimum; point defects in CH₃NH₃PbI₃; electronic structure of CH₃NH₃PbI₃
Source: The Journal of Physical Chemistry. C, S. 23352 - 23360
Volume: 123
Issue/Journal number: 38
ISSN: 1932-7447; 1932-7455
DOI: https://doi.org/10.1021/acs.jpcc.9b05282

Amorphous Gadolinium Aluminate as a Dielectric and Sulfur for Indium Phosphide Passivation

Author(s): Dorp, Dennis H. von, Nyns, Laura, Cuypers, Daniel, Ivanov, Tsvetan, Brizzi, Simone, Tallarida, Massimo, Fleischmann, Claudia, Hönicke, Philipp, Müller, Matthias, Richard, Olivier, Schmeißer, Dieter, De Gendt, Stefan, Lin, Dennis H. C., Adelmann, Christoph
Type: Scientific Article ref.
Year of publication: 2019
: III−V; InP; sulfur passivation; atomic layer deposition; gadolinium aluminate; rare earth oxide; dielectric
Source: ACS Applied Electronic Materials, S. 2190 - 2201
Volume: 1
Issue/Journal number: 11
ISSN: 2637-6113
DOI: https://doi.org/10.1021/acsaelm.9b00388

One-Pot Synthesis of Copper Oxide Nanowires and PVDF/CuO Composite Films for Piezoelectric Energy Harvesting Application

Author(s): Garain, Samiran, Henkel, Karsten, Mandal, Dipankar, Schmeißer, Dieter
Type: conference publication
Year of publication: 2018
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: PVDF; electroactive phase; nanogenerators; energy storage
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft, Reihe 6, Band 53,3, S. 135
URL: https://www.dpg-verhandlungen.de/year/2018/conference/berlin/part/cpp/session/20/contribution/21

Aluminum nitride films prepared by plasma atomic layer deposition using different plasma sources

Author(s): Kot, Małgorzata, Naumann, Franziska, Garain, Samiran, Poźarowska, Emilia, Gargouri, Hassan, Henkel, Karsten, Schmeißer, Dieter
Type: conference publication
Year of publication: 2018
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: Aluminium nitride; plasma-enhanced atomic layer deposition (PEALD); ellispsometry; field emission scanning electron microscopy; atomic force microscopy; X-ray photoelectron spectroscopy; electrical characterization
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft, Reihe 6, Band 53,3, S. 170

Room temperature atomic layer deposition for perovskite solar cells

Author(s): Kot, Małgorzata, Kegelmann, Lukas, Kus, Peter, Tsud, Nataliya, Matolínová, Iva, Albrecht, Steve, Matolin, Vladimir, Schmeißer, Dieter
Type: conference publication
Year of publication: 2018
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: Perovskite solar cells; atomic layer deposition; X-Ray photoelectron spectroscopy (XPS); atomic force microscopy; field emission scanning electron microscopy; photo-conversion efficiency
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft, Reihe 6, Band 53,3, S. 174

Interface Potentials, Intrinsic Defects, and Passivation Mechanisms in Al₂O₃, HfO₂, and TiO₂ Ultrathin Films

Author(s): Schmeißer, Dieter, Kot, Małgorzata, Corrêa, Silma Alberton, Das, Chittaranjan, Henkel, Karsten
Editor(s): Wandelt, Klaus
Type: part of book (chapter)
Year of publication: 2018
Publisher name: Oxford : Elsevier
: Atomic layer deposition (ALD); Resonant photoelectron spectroscopy (resPES); Band scheme; Interface potential; Intrinsic charges; Intrinsic defects; Partial density of states (pDOS); Exciton; Polaron; Ligand-to-metal charge transfer; Aluminium oxide (Al₂O₃); Hafnium oxide (HfO₂); Titanium Oxide (TiO₂)
Source: Encyclopedia of Interfacial Chemistry: Surface Science and Electrochemistry, vol. 3.1, S. 162 - 171
ISBN: 978-0-12-809739-7; 978-0-12-814984-3
DOI: https://doi.org/10.1016/B978-0-12-409547-2.14119-8

Intrinsic defects and multiple-atom processes in the oxidic semiconductor Ga₂O₃

Author(s): Schmeißer, Dieter, Henkel, Karsten
Type: Scientific Article ref.
Year of publication: 2018
: resonat photoelectron spectroscopy (resPES); X-Ray absorption; gallium oxide (Ga₂O₃); intrinsic electronic defects; band scheme
Source: Journal of Applied Physics, S. 161596-1 - 161596-9
Volume: 123
Issue/Journal number: 16
ISSN: 0021-8979; 1089-7550
DOI: https://doi.org/10.1063/1.5010740

Significance of out-of-plane electronic contributions in Bi-cuprates studied by resonant photoelectron spectroscopy at the Cu2p-edge

Author(s): Janowitz, Christoph, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2018
: synchrotron radiation; polarization dependence; 3D hole doping; superconductor
Source: Superconductor Science and Technology
Volume: 31
Issue/Journal number: 4
ISSN: 0953-2048; 1361-6668
DOI: https://doi.org/10.1088/1361-6668/aaadf6

Long-term ambient surface oxidation of titanium oxynitride films prepared by plasma-enhanced atomic layer deposition: An XPS study

Author(s): Kot, Małgorzata, Łobaza, Justyna, Naumann, Franziska, Gargouri, Hassan, Henkel, Karsten, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2018
: atomic layer deposition (ALD); surface oxidation; X-Ray photoelectron spectroscopy (XPS); titanium oxynitride
Source: Journal of Vacuum Science and Technology A
Volume: 36
Issue/Journal number: 1
ISSN: 0734-2101; 1520-8559
DOI: https://doi.org/10.1116/1.5003356

Enhancement of Electroactive β-phase and Superior Dielectric Properties in Cerium Based Poly(vinylidene fluoride) Composite Films

Author(s): Garain, Samiran, Sen, Shrabanee, Henkel, Karsten, Schmeißer, Dieter, Mandal, Dipankar
Type: Scientific Article ref.
Year of publication: 2018
: PVDF; High amount of electroactive phase; Superior dielectric properties
Source: Materials Today: proceedings, S. 10084 - 10090
Volume: 5
Issue/Journal number: 3 part 3
ISSN: 2214-7853
DOI: https://doi.org/10.1016/j.matpr.2017.11.003

Evidence of Nitrogen Contribution to the Electronic Structure of the CH₃NH₃PbI₃ Perovskite

Author(s): Kot, Małgorzata, Wojciechowski, Konrad, Snaith, Henry J., Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2018
: methylammonium lead triiodide (CH₃NH₃PbI₃); electronic structure; perovskite solar cells; resonant X-ray photoelectron spectroscopy (resPES)
Source: Chemistry - A European Journal, S. 3539 - 3544
Volume: 24
Issue/Journal number: 14
ISSN: 0947-6539; 1521-3765
DOI: https://doi.org/10.1002/chem.201705144

Advancing semiconductor-electrocatalyst systems: application of surface transformation films and nanosphere lithography

Author(s): Brinkert, Katharina, Richter, Matthias, Akay, Ömer, Giersig, Michael, Fountaine, Katherine T., Lewerenz, Hans-Joachim
Type: Scientific Article ref.
Year of publication: 2018
: shadow nanosphere lithography (SNL); electrocatalyst nanostructures; Rh electrocatalysts; InP photocathodes
Source: Faraday Discussions, S. 523 - 535
Volume: 208
ISSN: 1359-6640; 1364-5498
DOI: https://doi.org/10.1039/C8FD00003D

Efficient Solar Hydrogen Generation in Microgravity Environment

Author(s): Brinkert, Katharina, Richter, Matthias, Akay, Ömer, Liedtke, Janine, Giersig, Michael, Fountaine, Katherine T., Lewerenz, Hans-Joachim
Type: Scientific Article ref.
Year of publication: 2018
Source: Nature Communications
Issue/Journal number: 9
ISSN: 2041-1723
DOI: https://doi.org/10.1038/s41467-018-04844-y

An (In Situ)² Approach: ALD and resPES Applied to Al₂O₃, HfO₂, and TiO₂ Ultrathin Films

Author(s): Henkel, Karsten, Kot, Małgorzata, Richter, Matthias, Tallarida, Massimo, Schmeißer, Dieter
Editor(s): Wandelt, Klaus
Type: part of book (chapter)
Year of publication: 2018
Publisher name: Oxford : Elsevier
: Atomic layer deposition (ALD); Resonant photoelectron spectroscopy (resPES); Band scheme; Partial density of states (pDOS); Intrinsic charges; Intrinsic defects; Aluminum oxide (Al₂O₃); Hafnium oxide (HfO₂); Titanium oxide(TiO₂)
Source: Encyclopedia of Interfacial Chemistry: Surface Science and Electrochemistry, Vol. 3.1, S. 18 - 26
ISBN: 978-0-12-809739-7; 978-0-12-809894-3
DOI: https://doi.org/10.1016/B978-0-12-409547-2.13852-1

Natural Sugar-Assisted, Chemically Reinforced, Highly Durable Piezoorganic Nanogenerator with Superior Power Density for Self-Powered Wearable Electronics

Author(s): Maity, Kuntal, Garain, Samiran, Henkel, Karsten, Schmeißer, Dieter, Mandal, Dipankar
Type: Scientific Article ref.
Year of publication: 2018
: natural piezoelectric material; sugar; PVDF; organic piezoelectric nanogenerator; high performance and durability; self-powered electronics
Source: ACS Applied Materials & Interfaces, S. 44018 - 44032
Volume: 10
ISSN: 1944-8244; 1944-8252
DOI: https://doi.org/10.1021/acsami.8b15320

Room temperature atomic layer deposited Al₂O₃ improves perovskite solar cells efficiency over time

Author(s): Kot, Małgorzata, Kegelmann, Lukas, Das, Chittaranjan, Kus, Peter, Tsud, Nataliya, Matolínová, Iva, Albrecht, Steve, Matolin, Vladimir, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2018
: Perovskite Solar Cells (PSCs); Atomic layer deposition (ALD); long time stabilty; X-Ray photoelectron spectroscopy (XPS); Field-emission scanning electron microscopy (FESEM)
Source: ChemSusChem, S. 3640 - 3648
Volume: 11
Issue/Journal number: 20
ISSN: 1864-5631; 1864-564X
DOI: https://doi.org/10.1002/cssc.201801434

Ionicity of ZnO - a key system for transparent conductive oxides

Author(s): Schmeißer, Dieter, Henkel, Karsten, Janowitz, Christoph
Type: Scientific Article ref.
Year of publication: 2018
: Ionicity; zinc oxide (ZnO); resonant photoelectron spectroscopy; defect states; transparent conductive oxide (TCO)
Source: epl : a letters journal exploring the frontiers of physics, S. 27003-1 - 27003-7
Volume: 123
Issue/Journal number: 2
ISSN: 1286-4854; 0295-5075
DOI: https://doi.org/10.1209/0295-5075/123/27003

Preparation, properties and electronic structure of SnO₂

Author(s): Henkel, Karsten, Haeberle, Jörg, Müller, Klaus, Janowitz, Christoph, Schmeißer, Dieter
Editor(s): Fornari, Robert
Type: part of book (chapter)
Year of publication: 2018
Publisher name: Duxford : Elsevier, Woodhead Publishing
: electronic structure; tin oxide (SnO₂); resonant photoelectron spectroscopy; intrinsic defect states
Source: Single Crystals of Electronic Materials, S. 547 - 572
ISBN: 978-0-08-102096-8; 978-0-08-102097-5
: Woodhead Publishing Series in Electronic and Optical Materials

Analysis of surface oxidation of TiON ALD films

Author(s): Łobaza, Justyna, Kot, Małgorzata, Schmeißer, Dieter
Type: conference publication
Year of publication: 2017
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: titanium oxynitride; X-Rax photoelectron spectroscopy; depth profiling; sputtering
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft, S. 202
URL: http://www.dpg-verhandlungen.de/year/2017/conference/dresden/part/ds/session/21/contribution/7
: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Band 52,2

Two polarization dependent Auger decays observed by resonant photoelectron spectroscopy at the Cu2p-edge of superconducting BiSrCu-oxides

Author(s): Schmeißer, Dieter, Janowitz, Christoph
Type: Scientific Article ref.
Year of publication: 2017
: Synchrotron radiation; Superconductor; Cuprates; Resonant photoemission
Source: Nuclear Instruments and Methods in Physics Research B, S. 53 - 56
Volume: 411
ISSN: 0168-583X; 1872-9584
DOI: https://doi.org/10.1016/j.nimb.2017.01.084

Synthesis of Methanol from CO2 for Power-to-Liquid applications

Author(s): Rachow, Fabian, Hagendorf, Moritz, Müller, Klaus, Schmeißer, Dieter
Type: conference publication
Year of publication: 2017
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: direct methanol synthesis; power to liquide; Cu-ZnO catalyst; CO2 utilization
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft, S. 256
URL: http://www.dpg-verhandlungen.de/year/2017/conference/muenster/part/ake/session/8/contribution/5
: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Band 52,4

Localized defect states and charge trapping in Al₂O₃ films prepared by atomic layer deposition

Author(s): Henkel, Karsten, Kot, Małgorzata, Schmeißer, Dieter
Type: conference publication
Year of publication: 2017
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: defect states; Al₂O₃; resonant photoelectron spectroscopy; X-Ray absorption spectroscopy; capacitance-voltage measurements
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft, S. 205
URL: http://www.dpg-verhandlungen.de/year/2017/conference/dresden/part/ds/session/32/contribution/4
: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Band 52,2

Characterization of the perovskite solar cells containing atomic layer deposited Al2O3 buffer layer

Author(s): Kot, Małgorzata, Wojciechowski, Konrad, Snaith, Henry J., Schmeißer, Dieter
Type: conference publication
Year of publication: 2017
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: Perovskite solar cell; atomic layer deposition; Al2O3; efficiency recovery
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft e.V., S. 147
URL: http://www.dpg-verhandlungen.de/year/2017/conference/dresden/part/cpp/session/38/contribution/5
: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Band 52,2

Direct CO2-Methanation of flue gas emitted by conventional power plants

Author(s): Israel, Johannes, Rachow, Fabian, Schwiertz, Carola, Charlafti, Evgenia, Müller, Klaus, Schmeißer, Dieter
Type: conference publication
Year of publication: 2017
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: CO2; methanation; Sabatier reaction; power plant; Schwarze Pumpe; autothermal mode
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft, S. 255
URL: http://www.dpg-verhandlungen.de/year/2017/conference/muenster/part/ake/session/8/contribution/5
: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Band 52,4

Localized defect states and charge trapping in atomic layer deposited-Al₂O₃ films

Author(s): Henkel, Karsten, Kot, Małgorzata, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2017
: defect states; resonant photoelectron spectroscopy (resPES); Al₂O₃; atomic layer deposition (ALD); excitons; polarons
Source: Journal of Vacuum Science and Technology, A : Vacuum, Surfaces, and Films, S. 01125-1 - 01125-18
Volume: 35
Issue/Journal number: 1
ISSN: 0734-2101; 1520-8559
DOI: https://doi.org/10.1116/1.4971991

In-gap states in titanium dioxide and oxynitride atomic layer deposited films

Author(s): Henkel, Karsten, Das, Chittaranjan, Kot, Małgorzata, Schmeißer, Dieter, Naumann, Franziska, Kärkkänen, Irina, Gargouri, Hassan
Type: Scientific Article ref.
Year of publication: 2017
: Titanium dioxide (TiO2); Titanium oxynitrdie (TiON); valence band spectra; in-gap states; band-gap narrowing; electrical characterization
Source: Journal of Vacuum Science and Technology: A, S. 01135-1 - 01135-8
Volume: 35
Issue/Journal number: 1
ISSN: 0734-2101; 1520-8559
DOI: https://doi.org/10.1116/1.4972247

Uncovering the Nature of Active Species of Nickel Phosphide Catalysts in High-Performance Electrochemical Overall Water Splitting

Author(s): Menezes, Prashanth W., Indra, Arindam, Das, Chittaranjan, Walter, Carsten, Göbel, Caren, Gutkin, Vitaly, Schmeißer, Dieter, Driess, Matthias
Type: Scientific Article ref.
Year of publication: 2017
: overall water splitting; electrocatalysis; nickel phosphide; structural rearrangement; surface structure
Source: ACS Catalysis, S. 103 - 109
Volume: 7
Issue/Journal number: 1
ISSN: 2155-5435
DOI: https://doi.org/10.1021/acscatal.6b02666

Direct Methanation of Flue Gas at a Lignite Power Plant

Author(s): Müller, Klaus, Rachow, Fabian, Israel, Johannes, Charlafti, Evgenia, Schwiertz, Carola, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2017
: CO2 recycling; Power to Gas (PtG); Synthetic Natural Gas (SNG); Sabatier-Reaction; Flue Gas
Source: International Journal of Environmental Science, S. 425 - 437
Issue/Journal number: 2
ISSN: 2367-8941
URL: http://www.iaras.org/iaras/home/caijes/direct-methanation-of-flue-gas-at-a-lignite-power-plant

A facile corrosion approach to the synthesis of highly active CoOxwater oxidation catalysts

Author(s): Indra, Arindam, Menezes, Prashanth W., Das, Chittaranjan, Göbel, Caren, Tallarida, Massimo, Schmeißer, Dieter, Driess, Matthias
Type: Scientific Article ref.
Year of publication: 2017
: water splitting; water oxidation; cobalt oxide catalyst; transmission electron microscopy (TEM); X-ray photoelectron spectroscopy (XPS); X-ray absorption spectroscopy (XAS); Cyclic voltammetry (CV)
Source: Journal of Materials Chemistry A, S. 5171 - 5177
Issue/Journal number: 5
ISSN: 2050-7488; 2050-7496
DOI: https://doi.org/10.1039/c6ta10650a

Analysis of titanium species in titanium oxynitride films prepared by plasma enhanced atomic layer deposition

Author(s): Kot, Małgorzata, Henkel, Karsten, Das, Chittaranjan, Brizzi, Simone, Kärkkänen, Irina, Schneidewind, Jessica, Naumann, Franziska, Gargouri, Hassan, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2017
: Titanium oxynitride; Plasma enhanced atomic layer deposition (PEALD); ALD process parameters; Ti-N contributions; In-gap defect states; Leakage current
Source: Surface and Coatings Technology, S. 586 - 593
Volume: 324
ISSN: 0257-8972; 1879-3347
DOI: https://doi.org/10.1016/j.surfcoat.2016.11.094

Selective Deposition of an ultrathin Pt Layer on a Au-Nanoisland-Modified Si Photocathode for Hydrogen Generation

Author(s): Das, Chittaranjan, Kot, Małgorzata, Rouissi, Zied, Kędzierski, Kamil, Henkel, Karsten, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2017
: water splitting; hydrogen evolution reaction (HER); Si photocathode; gold nanoislands; nanostructured platinum
Source: ACS Omega, S. 1360 - 1366
Volume: 2
Issue/Journal number: 4
ISSN: 2470-1343
DOI: https://doi.org/10.1021/acsomega.6b00374

Prozessoptimierung für die Methanisierung von CO₂ – vom Labor zum Technikum

Author(s): Rachow, Fabian
Type: doctoralthesis
Year of publication: 2017
: CO2-Nutzung; Energiespeicher; Erneuerbare Energien; Katalyse; Methanisierung; Carbon capture and storage (CCS); Catalysis; Energy storage; Renewable energy; Methanation
URN: urn:nbn:de:kobv:co1-opus4-42625

Room temperature atomic layer deposited Al₂O₃ on CH₃NH₃PbI₃ characterized by synchrotron-based X-ray photoelectron spectroscopy

Author(s): Kot, Małgorzata, Das, Chittaranjan, Henkel, Karsten, Wojciechowski, Konrad, Snaith, Henry J., Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2017
: Synchrotron-based X-ray photoelectron spectroscopy; Perovskite solar cells; Atomic layer deposition; Al₂O₃
Source: Nuclear Instruments and Methods in Physics Research B, S. 49 - 52
Volume: 411
ISSN: 0168-583X; 1872-9584
DOI: https://doi.org/10.1016/j.nimb.2017.01.082

New insights into water photooxidation on reductively pretreated hematite photoanodes

Author(s): Cibrev, Dejan, Tallarida, Massimo, Das, Chittaranjan, Lana-Villarreal, Teresa, Schmeißer, Dieter, Gómez, Roberto
Type: Scientific Article ref.
Year of publication: 2017
: hematite; photoanode; water oxidation; water splitting
Source: Physical Chemistry Chemical Physics, S. 21807 - 21817
Volume: 19
Issue/Journal number: 32
ISSN: 1463-9076; 1463-9084
DOI: https://doi.org/10.1039/C7CP03958A

Role of substrate morphology and chemistry in ALD: HfO2 on Si(111)-H terminated surfaces as model

Author(s): Rouissi, Zied
Type: doctoralthesis
Year of publication: 2017
Publisher name: Cottbus : BTU Cottbus-Senftenberg
: Gestufte Oberfläche; Morphologie; Rastertunnelmikroskopie (RTM); Wachstumsstatistik; Atomlagenabscheidung (ALD); Atomic layer deposition (ALD); Growth statistics; Morphology; Scanning tunneling microscopy (STM); Stepped surface
URL: https://opus4.kobv.de/opus4-btu/frontdoor/index/index/docId/4241
URN: urn:nbn:de:kobv:co1-opus4-42418

Sabatierbasierte autothermale katalytische Rauchgasmethanisierung im Technikumsmaßstab und Rückverstromung im BHKW

Author(s): Israel, Johannes
Type: doctoralthesis
Year of publication: 2017
: BHKW; Blockheizkraftwerk; CCU; Energiespeicher; Kohlendioxid; Methanisierung; Rauchgas; Sabatier; Wasserstoff; CCU; CHP; Carbon dioxid; Combined heat and power plant; Energy storage; Flue gas; Hydrogen; Methanation; Power-to-Gas; Sabatier
URN: urn:nbn:de:kobv:co1-opus4-41467

Comparison of the thermal stability of the α, β and γ phases in poly(vinylidene fluoride) based on in situ thermal Fourier transform infrared spectroscopy

Author(s): Biswas, Anirban, Henkel, Karsten, Schmeißer, Dieter, Mandal, Dipankar
Type: Scientific Article ref.
Year of publication: 2017
: PVDF; thermal stability; β-phase; infrared spectroscopy; in situ thermal FT-IR study
Source: Phase Transitions, S. 1205 - 1213
Volume: 90
Issue/Journal number: 12
ISSN: 0141-1594; 1029-0338
DOI: https://doi.org/10.1080/01411594.2017.1337902

Alkaline electrochemical water oxidation with multi-shelled cobalt manganese oxide hollow spheres

Author(s): Indra, Arindam, Menezes, Prashanth W., Das, Chittaranjan, Schmeißer, Dieter, Driess, Matthias
Type: Scientific Article ref.
Year of publication: 2017
: Water oxidation; Cobalt manganese oxides (CMOs); Multi-shelled hollow spheres; Near-edge X-ray absorption fine structure (NEXAFS); Cyclic voltammetry; Scanning electron microscopy
Source: Chemical Communications, S. 8641 - 8644
Volume: 53
Issue/Journal number: 62
ISSN: 1359-7345; 1364-548X
DOI: https://doi.org/10.1039/C7CC03566G

Electronic properties of atomic layer deposited films, anatase and rutile TiO2 studied by resonant photoemission spectroscopy

Author(s): Das, Chittaranjan, Richter, Matthias, Tallarida, Massimo, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2016
: titanium dioxide (TiO2); resonant photoemission spectroscopy (resPES); defect states; partial density of states (pDOS); charge neutrality level (CNL)
Source: Journal of Physics D: Applied Physics, S. 275304-1 - 275304-17
Volume: 49
Issue/Journal number: 27
ISSN: 0022-3727; 1361-6463
DOI: https://doi.org/10.1088/0022-3727/49/27/275304

Spectroscopic investigation of the electronic structure of thin atomic layer deposition HfO2 films

Author(s): Alberton Corrêa, Silma, Brizzi, Simone, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2016
: resonant photoelectron spectroscopy; hafnium oxide; atomic layer deposition; partial density of states; electronic band gap
Source: Journal of Vacuum Science & Technology A, S. 01117-1 - 01117-8
Volume: 34
Issue/Journal number: 1
ISSN: 0734-2101; 1520-8559
DOI: https://doi.org/10.1116/1.4935338

Influence of CO annealing in metal-oxide-semiconductor capacitors with SiO2 films thermally grown on Si and on SiC

Author(s): Pitthan, E., dos Reis, R., Alberton Corrêa, Silma, Schmeißer, Dieter, Boudinov, H. I., Stedile, F. C.
Type: Scientific Article ref.
Year of publication: 2016
: metal-oxide-semiconductor; silicon; silicon carbide; CO annealing
Source: Journal of Applied Physics, S. 025307-1 - 025307-6
Issue/Journal number: 119
ISSN: 0021-8979; 1089-7550
DOI: https://doi.org/10.1063/1.4939836

Plasma-enhanced atomic layer deposition of titanium oxynitrides films: A comparative spectroscopic and electrical study

Author(s): Sowińska, Małgorzata, Henkel, Karsten, Schmeißer, Dieter, Kärkkänen, Irina, Schneidewind, Jessica, Naumann, Franziska, Gruska, Bernd, Gargouri, Hassan
Type: Scientific Article ref.
Year of publication: 2016
: plasma enhanced atomic layer deposition; titanium oxynitride; X-ray photoelectron spectroscopy; ellipsometry; current-voltage; capacitance-voltage
Source: Journal of Vacuum Science and Technology A, S. 01127-1 - 01127-9
Issue/Journal number: 34
ISSN: 0734-2101; 1520-8559
DOI: https://doi.org/10.1116/1.4936227

Cerium(III) Complex Modified Gold Electrode: An Efficient Electrocatalyst for the Oxygen Evolution Reaction

Author(s): Garain, Samiran, Barman, Koushik, Sinha, Tridib Kumar, Jasimuddin, Sk, Haeberle, Jörg, Henkel, Karsten, Schmeißer, Dieter, Mandal, Dipankar
Type: Scientific Article ref.
Year of publication: 2016
: water oxidation; electrocatalyst; photoelectrocatalyst; photoluminescence; Ce(III)-complex; L-cysteine; gold electrode
Source: ACS Applied Materials and Interfaces, S. 21294 - 21301
Volume: 8
Issue/Journal number: 33
ISSN: 1944-8244; 1944-8252
DOI: https://doi.org/10.1021/acsami.6b05236

Analysis of nitrogen species in titanium oxynitride ALD films

Author(s): Sowinska, Małgorzata, Brizzi, Simone, Das, Chittaranjan, Kärkkänen, Irina, Schneidewind, Jessica, Naumann, Franziska, Gargouri, Hassan, Henkel, Karsten, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2016
: titanium oxynitride; X-ray photoelectron spectroscopy; X-ray absorption spectroscopy; ALD process parameters
Source: Applied Surface Science, S. 42 - 47
Volume: 381
ISSN: 0169-4332; 1873-5584
DOI: https://doi.org/10.1016/j.apsusc.2016.02.096

Analysis and optimization of interfaces in "wide-gap" chalcopyrite-based thin film solar cell devices

Author(s): Duarte, Roberto Felix
Type: doctoralthesis
Year of publication: 2016
: Chalcopyrite absorbers; Photovoltaics; Solid-state Physics; Thin Film Solar Cells; X-ray spectroscopy
URL: https://opus4.kobv.de/opus4-btu/frontdoor/index/index/docId/3740
URN: urn:nbn:de:kobv:co1-opus4-37402

Intrinsic localized gap states in IGZO and its parent single crystalline TCOs

Author(s): Schmeißer, Dieter, Haeberle, Jörg
Type: Scientific Article ref.
Year of publication: 2016
: Transparent conducting oxide; X-ray photoelectron spectroscopy; Resonant photoemission spectroscopy; X-ray absorption spectroscopy; Electronic band structure; Intrinsic localized gap states
Source: Thin Solid Films, S. 206 - 211
Issue/Journal number: 603
ISSN: 0040-6090; 1879-2731
DOI: https://doi.org/10.1016/j.tsf.2016.02.010

On the structural composition and stability of Fe–N–C catalysts prepared by an intermediate acid leaching

Author(s): Kramm, Ulrike Ingrid, Zana, Alessandro, Vosch, Tom, Fiechter, Sebastian, Arenz, Matthias, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2016
: Non-noblemetal catalysts (NNMC); Fe–N–C; oxygen reduction reaction (ORR); PEM fuel cell (PEM-FC); Accelerated stress tests (ASTs); Mößbauer spectroscopy
Source: Journal of Solid State Electrochemistry, S. 969 - 981
Volume: 20
Issue/Journal number: 4
ISSN: 1432-8488; 1433-0768
DOI: https://doi.org/10.1007/s10008-015-3060-z

Experimental Approach for Determining Semiconductor/liquid Junction Energetics by Operando Ambient Pressure X-ray Photoelectron Spectroscopy

Author(s): Richter, Matthias, Lichterman, Michael F., Hu, Shu, Crumlin, Ethan J., Axnanda, Stephanus, Favaro, Marco, Drisdell, Walter S., Hussain, Zahid, Brunschwig, Bruce S., Liu, Zhi, Lewis, Nathan S., Lewerenz, Hans-Joachim
Type: conference publication
Year of publication: 2016
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: in operando; ambient pressure spectroscopy; water splitting
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft, S. 409
URL: http://www.dpg-verhandlungen.de/year/2016/conference/regensburg/part/o/session/72/contribution/10?lang=en
: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Band 51

An Electrochemical, resonant Photoemission and Ambient Pressure-X-ray Photoelectron Spectroscopic Investigation of Si/TiO2/Ni/Electrolyte Interfaces

Author(s): Richter, Matthias, Lichterman, Michael F., Hu, Shu, Crumlin, Ethan J., Axnanda, Stephanus, Favaro, Marco, Drisdell, Walter S., Hussain, Zahid, Brunschwig, Bruce S., Liu, Zhi, Lewis, Nathan S., Lewerenz, Hans-Joachim
Type: conference publication
Year of publication: 2016
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: resonant photoelectron spectroscopy; ambient pressure spectroscopy; water splitting
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft, S. 414
URL: http://www.dpg-verhandlungen.de/year/2016/conference/regensburg/part/o/session/82/contribution/2?lang=en
: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Band 51

XPS study of the ALD growth of Al₂O₃ on the CH₃NH₃PbI₃

Author(s): Sowinska, Małgorzata, Das, Chittaranjan, Wojciechowski, Konrad, Snaith, Henry J., Schmeißer, Dieter
Type: conference publication
Year of publication: 2016
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: atomic layer deposition; perovskite solar cells; Al₂O₃; X-Ray photoelectron spectroscopy; synchrotron
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft, S. 206
URL: http://www.dpg-verhandlungen.de/year/2016/conference/regensburg/part/cpp/session/31/contribution/6?lang=en
: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Band 51

TiO2 laminated Silicon microstructures based stable photocathode for water splitting

Author(s): Das, Chittaranjan, Tallarida, Massimo, Schmeißer, Dieter
Type: conference publication
Year of publication: 2016
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: water splitting; TiO2; atomic layer deposition (ALD); Si photoelectrodes
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft, S. 213
URL: http://www.dpg-verhandlungen.de/year/2016/conference/regensburg/part/ds/session/48/contribution/4?lang=en
: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Band 51

Gap states in the electronic structure of SnO2 single crystals and amorphous SnOxthin films

Author(s): Haeberle, Jörg, Machulik, Stephan, Janowitz, Christoph, Manzke, Recardo, Gaspar, Diana, Barquinha, Pedro, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2016
: SnO2; electronic structure; gap states; resonant photoelectron spectroscopy (resPES)
Source: Journal of Applied Physics, S. 105101-1 - 105101-13
Volume: 120
Issue/Journal number: 10
ISSN: 0021-8979; 1089-7550
DOI: https://doi.org/10.1063/1.4962313

Atomic layer deposition of Al2O3 on CH3NH3PbI3 for enhancement of perovskite solar cells stability

Author(s): Sowinska, Małgorzata, Das, Chittaranjan, Wojciechowski, Konrad, Rouissi, Zied, Snaith, Henry J., Schmeißer, Dieter
Type: Scientific Article not ref.
Year of publication: 2016
: atomic layer deposition; perovskite soloar cells; X-ray photoelectron spectroscopy (XPS); Atomic foce microscopy (AFM)
Source: Synchrotron Radiation in Natural Science : Bulletin of the Polish Synchrotron Radiation Society, S. 33
Volume: 15
Issue/Journal number: 1-2
ISSN: 1644-7190

Probing the TiO2/Liquid Interface of a Photoelectrochemical Cell by X-Ray Photoelectron Spectroscopy

Author(s): Lichterman, Michael F., Richter, Matthias, Hu, Shu, Crumlin, Ethan J., Axnanda, Stephanus, Favaro, Marco, Drisdell, Walter S., Hussain, Zahid, Brunschwig, Bruce S., Liu, Zhi, Lewis, Nathan S., Lewerenz, Hans-Joachim
Type: conference publication
Year of publication: 2016
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: X-Ray photoelectron spectroscopy; phototanodes; TiO2 passivation; water splitting
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft, S. 414
URL: http://www.dpg-verhandlungen.de/year/2016/conference/regensburg/part/o/session/82/contribution/1?lang=en
: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Band 51

HfO2 grow by ALD on Si(111)-H terminated stepped surface

Author(s): Rouissi, Zied, Tallarida, Massimo, Schmeißer, Dieter
Type: conference publication
Year of publication: 2016
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: atomic layer deposition; stepped surfaces; scanning tunneling micrsocopy; HfO2; Si(111)
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft, S. 419
URL: http://www.dpg-verhandlungen.de/year/2016/conference/regensburg/part/o/session/89/contribution/13?lang=en
: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Band 51

ALD growth of Al2O3 on Stepped Surface of HOPG and Ag-HOPG

Author(s): Rouissi, Zied, Henkel, Karsten, Tallarida, Massimo, Schmeißer, Dieter
Type: conference publication
Year of publication: 2016
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: atomic layer deposition; Scanning tunneling microscopy (STM); Al2O3; HOPG
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft, S. 419
URL: http://www.dpg-verhandlungen.de/year/2016/conference/regensburg/part/o/session/89/contribution/12?lang=en
: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Band 51

Engineering of Sub-Nanometer SiOₓ Thickness in Si Photocathodes for Optimized Open Circuit Potential

Author(s): Das, Chittaranjan, Kot, Małgorzata, Henkel, Karsten, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2016
: atomic layer deposition; open circuit potential; Si photocathodes; silica; stability
Source: ChemSusChem, S. 2332 - 2336
Volume: 9
Issue/Journal number: 17
ISSN: 1864-5631; 1864-564X
DOI: https://doi.org/10.1002/cssc.201600777

The Cu2p-edge of superconducting BiSrCu-Oxides studed by resonant Photoelectron Spectroscopy

Author(s): Schmeißer, Dieter, Janowitz, Christoph
Type: Scientific Article not ref.
Year of publication: 2016
: synchrotron raidation; superconductor
Source: Synchrotron Radiation in Natural Science : Bulletin of the Polish Synchrotron Radiation Society, S. 35
Volume: 15
Issue/Journal number: 1-2
ISSN: 1644-7190

Spectroscopic investigation of the nitrogen role in organic-inorganic perovskite films

Author(s): Sowinska, Małgorzata, Das, Chittaranjan, Wojciechowski, Konrad, Snaith, Henry J., Schmeißer, Dieter
Type: conference publication
Year of publication: 2016
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: perovskite solar cells; X-ray photoelectron spectroscopy; nitrogen
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft, S. 150
URL: http://www.dpg-verhandlungen.de/year/2016/conference/regensburg/part/cpp/session/11/contribution/7?lang=en
: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Band 51

Yb3+ Assisted Self-Polarized PVDF Based Ferroelectretic Nanogenerator: A Facile Strategy of Highly Efficient Mechanical Energy Harvester Fabrication

Author(s): Ghosh, Sujoy Kumar, Biswas, Anirban, Sen, Shrabanee, Das, Chittaranjan, Henkel, Karsten, Schmeißer, Dieter, Mandal, Dipankar
Type: Scientific Article ref.
Year of publication: 2016
: PVDF; Yb 3+; Porous ferroelectret material; Self-polarization; Ferroelectretic nanogenerator; Mechanical energy harvester; Self-powered electronics
Source: Nano Energy, S. 621 - 629
Volume: 2016
Issue/Journal number: 30
ISSN: 2211-2855
DOI: https://doi.org/10.1016/j.nanoen.2016.10.042

Transparente leitfähige Metalloxideinkristalle und amorphe oxidische Dünnschichtsysteme - Eine photoelektronenspektroskopische Vergleichsstudie

Author(s): Haeberle, Jörg
Type: doctoralthesis
Year of publication: 2016
: Dünnschichtsysteme; Experimentelle partielle Zustandsdichte; Intrinsische Bandlückenzustände; Metalloxide; resonate Photoelktronenspektroskopie (resPES)
URL: https://opus4.kobv.de/opus4-btu/frontdoor/index/index/docId/4035
URN: urn:nbn:de:kobv:co1-opus4-40356

Sacrificial Self-Assembled Monolayers for the Passivation of GaAs(100) Surfaces and Interfaces

Author(s): Cuypers, Daniel, Fleischmann, Claudia, Dorp, Dennis H. von, Brizzi, Simone, Tallarida, Massimo, Müller, Matthias, Hönicke, Philipp, Billen, Arne, Chintala, Ravi, Conard, Thierry, Schmeißer, Dieter, Vandervorst, Wilfried, Elshocht, Sven van, Armini, Silvia, De Gendt, Stefan, Adelmann, Christoph
Type: Scientific Article ref.
Year of publication: 2016
: GaAs; passivation; Al₂O₃; atomic layer deposition (ALD); Synchrotron-radiation photoelectron spectroscopy (SRPES); self assembled monolayers (SAM); interface engineering
Source: Chemistry of Materials, S. 5689 - 5701
Volume: 28
Issue/Journal number: 16
ISSN: 0897-4756; 1520-5002
DOI: https://doi.org/10.1021/acs.chemmater.6b01732

Room-Temperature Atomic Layer Deposition of Al₂O₃: Impact on Efficiency, Stability and Surface Properties in Perovskite Solar Cells

Author(s): Kot, Małgorzata, Das, Chittaranjan, Wang, Zhiping, Henkel, Karsten, Rouissi, Zied, Wojciechowski, Konrad, Snaith, Henry J., Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2016
: Al₂O₃; atomic layer deposition (ALD); perovskite; solar cells; X-ray photoelectron spectroscopy (XPS)
Source: ChemSusChem, S. 3401 - 3406
Volume: 9
Issue/Journal number: 24
ISSN: 1864-5631; 1864-564X
DOI: https://doi.org/10.1002/cssc.201601186

Depicting the Electronic Structure of HfO₂ Films by Spectroscopic Techniques

Author(s): Corrêa, Silma Alberton, Brizzi, Simone, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2016
: HfO₂; resonant photoelectron spectroscopy (resPES); electronic structure; partial density of states; charge neutrality level
Source: ECS Transactions, S. 145 - 153
Volume: 75
Issue/Journal number: 6
ISSN: 1938-6737; 1938-5862
DOI: https://doi.org/10.1149/07506.0145ecst

A model for statistical electromigration simulation with dependence on capping layer and Cu microstructure in two dimensions

Author(s): Kraatz, Matthias, Gall, Martin, Zschech, Ehrenfried, Schmeißer, Dieter, Ho, Paul S.
Type: Scientific Article ref.
Year of publication: 2016
: Electromigration; Grain growth; Computer simulation; 2D; Copper Interconnects; On-chip; Statistics; Parallel computing
Source: Computational Materials Science, S. 29 - 35
Volume: 120
ISSN: 1879-0801; 0927-0256
DOI: https://doi.org/10.1016/j.commatsci.2016.04.020

A spectroscopic comparison of IGZO thin film and the parent In2O3, Ga2O3, and ZnO single crystals

Author(s): Haeberle, Jörg, Brizzi, Simone, Gaspar, Diana, Barquinha, Pedro, Galazka, Zbigniew, Schulz, Detlev, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2016
: transparent conducting oxides (TCO); resonant photoelectron spectroscopy; in-gapdefect states
Source: Materials Research Express, S. 106302-1 - 106302-17
Volume: 3
Issue/Journal number: 10
ISSN: 2053-1591
DOI: https://doi.org/10.1088/2053-1591/3/10/106302

Lab-based in-situ X-ray microscopy - methodical developments and applications in materials science and microelectronics

Author(s): Niese, Sven
Type: doctoralthesis
Year of publication: 2015
: Diffractive X-ray lens; Double cantilever beam test; X-ray microscopy
URL: https://opus4.kobv.de/opus4-btu/frontdoor/index/index/docId/3566
URN: urn:nbn:de:kobv:co1-opus4-35665

Self-Poled Transparent and Flexible UV Light-Emitting Cerium Complex–PVDF Composite: A High-Performance Nanogenerator

Author(s): Garain, Samiran, Sinha, Tridib Kumar, Adhikary, Prakriti, Henkel, Karsten, Sen, Shrabanee, Ram, Shanker, Sinha, Chittaranjan, Schmeißer, Dieter, Mandal, Dipankar
Type: Scientific Article ref.
Year of publication: 2015
: PVDF; electroactive phase; nanogenerator; cerium charge transfer complex; piezoelectric energy harvester; UV-emitter
Source: ACS Applied Materials & Interfaces, S. 1298 - 1307
Volume: 2015
Issue/Journal number: 7
ISSN: 1944-8244; 1944-8252
DOI: https://doi.org/10.1021/am507522r

Thermal and plasma enhanced atomic layer deposition of TiO2: Comparison of spectroscopic and electric properties

Author(s): Das, Chittaranjan, Henkel, Karsten, Tallarida, Massimo, Schmeißer, Dieter, Gargouri, Hassan, Kärkkänen, Irina, Schneidewind, Jessica, Gruska, Bernd, Arens, Michael
Type: Scientific Article ref.
Year of publication: 2015
: titanium oxide (TiO2); atomic layer deposition; plasma enhanced atomic layer deposition; synchrotron radiation photoelectron spectroscopy (SR-PES); x-ray absorption spectroscopy; capacitance-voltage (CV); current-voltage (IV); ellipsometry; in-gap states
Source: Journal of Vacuum Science and Technology A, S. 01144-1 - 01144-8
Volume: 2015
Issue/Journal number: 33
ISSN: 1520-8559; 0734-2101
DOI: https://doi.org/10.1116/1.4903938

Si microstructures laminated with a nanolayer of TiO2 as long-term stable and effective photocathodes in PEC devices

Author(s): Das, Chittaranjan, Tallarida, Massimo, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2015
: water splitting; photocorrosion; protection layer; photoelectrochemical device (PEC device); atomic layer deposition (ALD); silicon (Si); titanum oxide (TiO2); microstructure
Source: Nanoscale, S. 7726 - 7733
Issue/Journal number: 7
ISSN: 2040-3364; 2040-3372
DOI: https://doi.org/10.1039/C5NR00764J

Graphene oxide monolayers as atomically thin seeding layers for atomic layer deposition of metal oxides

Author(s): Nourbakhsh, Amirhasan, Adelmann, Christoph, Song, Yi, Lee, Chang Seung, Asselberghs, Inge, Huyghebaert, Cedric, Brizzi, Simone, Tallarida, Massimo, Schmeißer, Dieter, Elshocht, Sven van, Heyns, Marc, Kong, Jing, Palacios, Tomás, De Gendt, Stefan
Type: Scientific Article ref.
Year of publication: 2015
: Graphene Oxide; seed layer; atomic layer deposition; oxygen plasma treatment; photoelectron spectroscopy; density functional theory; capacitance-voltage
Source: Nanoscale, S. 10781 - 10789
Volume: 2015
Issue/Journal number: 7
ISSN: 2040-3364; 2040-3372
DOI: https://doi.org/10.1039/C5NR01128K

DNA-Assisted β‑phase Nucleation and Alignment of Molecular Dipoles in PVDF Film: A Realization of Self-Poled Bioinspired Flexible Polymer Nanogenerator for Portable Electronic Devices

Author(s): Tamang, Abiral, Ghosh, Sujoy Kumar, Garain, Samiran, Alam, Md. Mehebub, Haeberle, Jörg, Henkel, Karsten, Schmeißer, Dieter, Mandal, Dipankar
Type: Scientific Article ref.
Year of publication: 2015
: PVDF; β-phase; DNA; self-poling; piezoelectric flexible nanogenerator
Source: ACS Applied Materials & Interfaces, S. 16143 - 16147
Issue/Journal number: 7
ISSN: 1944-8244; 1944-8252
DOI: https://doi.org/10.1021/acsami.5b04161

Charakterisierung von TiO2-ALD-Schichten und deren Nutzung für die Passivierung von Si-Photokathoden

Author(s): Henkel, Karsten, Das, Chittaranjan, Sowinska, Małgorzata, Tallarida, Massimo, Schmeißer, Dieter, Gargouri, Hassan, Kärkkänen, Irina, Schneidewind, Jessica, Gruska, Bernd, Arens, Michael
Editor(s): Glück, B. K., Schmidt, S., Stein, E., Raschke, Jörg-Uwe, Richter, H.
Type: conference publication
Year of publication: 2015
Publisher name: Senftenberg : BTU Cottbus-Senftenberg
: TiO2; Korrosion; Atomlagenabscheidung; Silizium; Photokathoden; Linear Scan Voltametry; Photoelektronenspektroskopie
Source: Tagungsband Photovoltaik-Meeting: Anwendungen-Qualität-Perspektiven, Senftenberg, 15.04.2015, S. 3 - 8

Spin State and Satellite Structures of ε-Fe₂O₃ as determined by Resonant Photoelectron Spectroscopy

Author(s): Schmeißer, Dieter, Haeberle, Jörg, Richter, Matthias, Brazda, Petr
Type: Scientific Article ref.
Year of publication: 2015
: Resonant photoelectron spectroscopy; ε-Fe2O3nano particles; Satellite emission
Source: Nuclear Instruments and Methods in Physics Research B, S. 127 - 131
Volume: 2015
Issue/Journal number: 364
ISSN: 0168-583X
DOI: https://doi.org/10.1016/j.nimb.2015.08.062

Spectroscopic and electrochemical study of TiO2/Si photocathode

Author(s): Das, Chittaranjan
Type: doctoralthesis
Year of publication: 2015
: Atomic layer deposition (ALD); Photocathodes; TiO2; X-Ray absorption spectroscopy (XAS); X-Ray photoelectron spectroscoopy (XPS)
URL: https://opus4.kobv.de/opus4-btu/frontdoor/index/index/docId/3692
URN: urn:nbn:de:kobv:co1-opus4-36924

Determination of charge neutrality level in TiO2 films from res-PES measurements

Author(s): Das, Chittaranjan, Tallarida, Massimo, Schmeißer, Dieter
Type: conference publication
Year of publication: 2015
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: charge neutrality level; resonant photoelectron spectroscopy; TiO2
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft, S. 415
URL: http://www.dpg-verhandlungen.de/year/2015/conference/berlin/part/o/session/58/contribution/12?lang=en
: Verhandlungen der Deutschen Physikalischen Gesellschaft : Reihe 6, Band 50

Spectroscopic investigation of the electronic structure of HfO2 thin films

Author(s): Alberton Corrêa, Silma, Brizzi, Simone, Tallarida, Massimo, Schmeißer, Dieter
Type: conference publication
Year of publication: 2015
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: electronic structure; HfO2
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft, S. 211
URL: http://www.dpg-verhandlungen.de/year/2015/conference/berlin/part/ds/session/36/contribution/106?lang=en
: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Band 50

Comparison of charge neutrality level of Cu/CuO/HfO2 and Si/SiO2/HfO2

Author(s): Rouissi, Zied, Brizzi, Simone, Alberton Corrêa, Silma, Tallarida, Massimo, Schmeißer, Dieter
Type: conference publication
Year of publication: 2015
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: charge neutrality level (CNL); resonant photoelectron spectroscopy; HfO2
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft, S. 208
URL: http://www.dpg-verhandlungen.de/year/2015/conference/berlin/part/ds/session/36/contribution/47?lang=en
: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Band 50

A polymer nanogenerator based on silver nanoparticles doped electrospun P(VDF-HFP) nanofibers

Author(s): Mandal, Dipankar, Henkel, Karsten, Schmeißer, Dieter
Type: conference publication
Year of publication: 2015
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: nanogenerator; PVDF; nanoparticles
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft, S. 208
URL: http://www.dpg-verhandlungen.de/year/2015/conference/berlin/part/ds/session/36/contribution/34?lang=en
: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Band 50

The Electronic Structure of amorphuos SnOx thin films and SnO2 single crystals

Author(s): Haeberle, Jörg, Gaspar, Diana, Barquinha, Pedro, Pereira, Luís, Martins, Rodrigo, Fortunato, Elvira, Machulik, Stephan, Janowitz, Christoph, Manzke, Recardo, Schmeißer, Dieter
Type: conference publication
Year of publication: 2015
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: electronic structure; SnO2
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft, S. 271
URL: http://www.dpg-verhandlungen.de/year/2015/conference/berlin/part/hl/session/21/contribution/17?lang=en
: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Band 50

Self restriction oft the Sabatier reaction in large scale

Author(s): Israel, Johannes, Rachow, Fabian, Schwiertz, Carola, Charlafti, Evgenia, Müller, Klaus, Schmeißer, Dieter
Type: conference publication
Year of publication: 2015
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: methanation; Sabatier reaction
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft
URL: http://www.dpg-verhandlungen.de/year/2015/conference/berlin/part/ake/session/9/contribution/4?lang=en
: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Band 50

CO2 Methanation with different gas mixtures

Author(s): Rachow, Fabian, Israel, Johannes, Schwiertz, Carola, Charlafti, Evgenia, Müller, Klaus, Schmeißer, Dieter
Type: conference publication
Year of publication: 2015
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: methanation; Sabatier reaction; contamination; catalyst
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft, S. 539
: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Band 50

Study of atomic layer deposition with scanning tunneling microscopy

Author(s): Rouissi, Zied, Tallarida, Massimo, Schmeißer, Dieter
Type: conference publication
Year of publication: 2015
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: Atomic layer deposition (ALD); Scanning tunneling microscopy (STM); Al2O3
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft, S. 401
: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Band 50

Excitons and Polarons in resonant Auger decay processes

Author(s): Richter, Matthias
Type: doctoralthesis
Year of publication: 2014
: Exciton; Polaron; X-Ray absorption spectroscopy (XAS); resonant photoemission spectroscopy (resPES); Auger decay
URL: http://opus.kobv.de/btu/volltexte/2014/2981/
URN: urn:nbn:de:kobv:co1-opus-29816

Capacitance and conductance versus voltage characterization of Al2O3 layers prepared by PE-ALD at 25°C ≤ T ≤ 200°C

Author(s): Henkel, Karsten, Gargouri, Hassan, Gruska, Bernd, Arens, Michael, Tallarida, Massimo, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2014
: Atomic layer deposition (ALD); Al2O3; dielectric properties; interface state density; fixed oxide charge; permittivity
Source: Journal of Vacuum Science and Technology A, S. 01107-1 - 01107-10
Volume: 1
Issue/Journal number: 32
URL: http://link.aip.org/link/?JVA/32/01A107&aemail=author
DOI: https://doi.org/10.1116/1.4831897

Study of InP Surfaces after Wet Chemical Treatments

Author(s): Cuypers, Daniel, Dorp, Dennis H. von, Tallarida, Massimo, Brizzi, Simone, Conard, Thierry, Rodriguez, Leonard, Mees, M., Arnauts, Sophia, Schmeißer, Dieter, Adelmann, Christoph, De Gendt, Stefan
Type: Scientific Article ref.
Year of publication: 2014
: Synchrotron Radiation Photoelectron Spectroscopy; Scanning Tunneling Microscopy; InP; Wet chemical treatment
Source: ECS Journal of Solid State Science and Technology, S. 3016 - 3022
Volume: 3
Issue/Journal number: 1
ISSN: 2162-8777; 2162-8769
DOI: https://doi.org/10.1149/2.005401jss

Quantum size effects in TiO2 thin films grown by atomic layer deposition

Author(s): Tallarida, Massimo, Das, Chittaranjan, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2014
: atomic layer deposition (ALD); charge transfer multiplet; covalency; energy conversion; quantum size effects; titanium dioxide (TiO2); water splitting; X-ray absorption spectroscopy (XAS)
Source: Beilstein Journal of Nanotechnology, S. 77 - 82
Issue/Journal number: 5
ISSN: 2190-4286
DOI: https://doi.org/10.3762/bjnano.5.7

Multiple Auger processes in Graphene

Author(s): Richter, Matthias, Starke, Ulrich, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2014
: Graphene; X-Ray absorption spectroscopy; XAS; resonant photoemission spectroscopy; resPES; multiple hole Auger
Source: Journal of Electron Spectroscopy and Related Phenomena, S. 1 - 6
Issue/Journal number: Vol. 192
ISSN: 0368-2048
DOI: https://doi.org/10.1016/j.elspec.2013.12.009

Correlations between Mass Activity and Physicochemical Properties of Fe/N/C Catalysts for the ORR in PEM Fuel Cell via 57 Fe Mössbauer Spectroscopy and Other Techniques

Author(s): Kramm, Ulrike Ingrid, Lefèvre, Michel, Larouche, Nicholas, Schmeißer, Dieter, Dodelet, Jean-Pol
Type: Scientific Article ref.
Year of publication: 2014
: Fe-N-C catalyst; 57 Fe Mössbauer Spectroscopy; X-ray photo-electron spectroscopy; neutron activation analysis; nitrogen sorption measurements; oxygen reduction reaction (ORR); PEM Fuel Cell
Source: Journal of the American Chemica Society, S. 978 - 985
Volume: 136
Issue/Journal number: 3
ISSN: 0002-7863; 1520-5126
DOI: https://doi.org/10.1021/ja410076f

Interlayer-exciton mediated three-hole-Auger-decay in the pi-band of highly oriented pyrolytic graphite

Author(s): Richter, Matthias, Friedrich, Daniel, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2014
: resonant excitation; three hole Auger decay; X-ray photoelectron spectroscopy; HOPG
Source: Physica E, S. 441 - 446
Volume: Vol. 56
ISSN: 1386-9477
DOI: https://doi.org/10.1016/j.physe.2013.01.015

PE-ALD-Al2O3-Schichten für die Passivierung von Solarzellen

Author(s): Henkel, Karsten, Tallarida, Massimo, Haeberle, Jörg, Gargouri, Hassan, Naumann, Franziska, Gruska, Bernd, Arens, Michael, Schmeißer, Dieter
Editor(s): Glück, Bernhard K., Schmidt, Sindy, Stein, Erhard, Raschke, Jörg-Uwe, Richter, Hans
Type: conference publication
Year of publication: 2014
Publisher name: BTU : Cottbus-Senftenberg
: Al2O3; Atomlagenabscheidung (ALD); Passivierung; PE-ALD; negative fixe Oxidladungen
Source: Tagungsband Photovoltaik-Meeting: Anwendungen-Qualität-Perspektiven, Senftenberg, 16.04.2014, S. 7 - 14

Effect of iron carbide formation on the number of active sites in Fe-N-C catalysts for the oxygen reduction reaction in acidic media

Author(s): Kramm, Ulrike Ingrid, Herrmann-Geppert, Iris, Fiechter, Sebastian, Zehl, Gerald, Zizak, Ivo, Dorbandt, Iris, Schmeißer, Dieter, Bogdanoff, Peter
Type: Scientific Article ref.
Year of publication: 2014
: Oxygen reduction reaction (ORR); Fe-N-C catalyst; acidic media; high-temperature X-ray diffraction (HT-XRD); thermogravimetry coupled with mass-spectroscopy (TG-MS)
Source: Journals of materials chemistry A, S. 2663 - 2670
Issue/Journal number: 8
ISSN: 2050-7488; 2050-7496
DOI: https://doi.org/10.1039/c3ta13821f

Modification of Hematite Electronic Properties with Trimethyl Aluminum to Enhance the Efficiency of Photoelectrodes

Author(s): Tallarida, Massimo, Das, Chittaranjan, Cibrev, Dejan, Kukli, Kaupo, Tamm, Aile, Ritala, Mikko, Lana-Villarreal, Teresa, Gómez, Roberto, Leskelä, Markku, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2014
: Hematite; Atomic Layer deposition; Photoelectrode; electro-catalysis; TMA; efficiency enhancement
Source: The Journal of Physical Chemistry Letters, S. 3582 - 3587
Volume: 5
Issue/Journal number: 20
DOI: https://doi.org/10.1021/jz501751w

On the scalability of doped hafnia thin films

Author(s): Adelmann, Christoph, Schram, Tom, Chew, Soon Aik, Woicik, J. C., Brizzi, Simone, Tallarida, Massimo, Schmeißer, Dieter, Horiguchi, Naoto, Elshocht, Sven van, Ragnarsson, Lars-Åke
Type: Scientific Article ref.
Year of publication: 2014
: scalability; hafnia thin films; Al:HfO2; Gd:HfO2; EXAFS; equivalent oxide thickness (EOT); leakage current; X-ray absorption spectroscopy (XAS)
Source: Applied Physics Letters, S. 122906-1 - 122906-4
Issue/Journal number: 104
ISSN: 0003-6951; 1077-3118
DOI: https://doi.org/10.1063/1.4870075

Electronic structure of amorphous ZnO films

Author(s): Schmeißer, Dieter, Haeberle, Jörg, Barquinha, Pedro, Gaspar, Diana, Pereira, Luís, Martins, Rodrigo, Fortunato, Elvira
Type: Scientific Article ref.
Year of publication: 2014
: a-ZnO thin films; intrinsic defects; resonant PES; amorphous oxide semiconductors (AOS); transparent conducting oxides (TCO); charge transfer
Source: Physica Status Solidi C, S. 1476 - 1480
Volume: 11
Issue/Journal number: 9-10
ISSN: 1610-1642
DOI: https://doi.org/10.1002/pssc.201400010

Improved performance of a polymer nanogenerator based on silver nanoparticles doped electrospun P(VDF–HFP) nanofibers

Author(s): Mandal, Dipankar, Henkel, Karsten, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2014
: piezoelectric thin polymer film; FTIR; nanogenerator; PVDF; P(VDF-HFP); nanofibers
Source: Physical Chemistry Chemical Physics, S. 10403 - 10407
Volume: 2014
Issue/Journal number: 16
ISSN: 1463-9084; 1463-9076
DOI: https://doi.org/10.1039/C3CP55238A

A density functional theory study of catalytic sites for oxygen reduction in Fe/N/C catalysts used in H2/O2 fuel cells

Author(s): Szakacs, Csaba E., Lefèvre, Michel, Kramm, Ulrike Ingrid, Dodelet, Jean-Pol, Vidal, François
Type: Scientific Article ref.
Year of publication: 2014
: density functional theory (DFT); iron-based catalyst; iron−nitrogen−carbon catalyst; non-noble metal catalyst; oxygen reduction reaction (ORR); polymer electrolyte membrane fuel cell (PEM-FC)
Source: Physical Chemistry Chemical Physics, S. 13654 - 13661
Volume: 2014
Issue/Journal number: 16
ISSN: 1463-9076; 1463-9084
DOI: https://doi.org/10.1039/C3CP55331K

Untersuchungen zu Fanoresonanzen in der resonanten Photoelektronenspektroskopie

Author(s): Städter, Matthias
Type: doctoralthesis
Year of publication: 2014
: Fano; Fanointerferenzen; Festkörperphysik; In-gap Zustände; Resonante Photoelektronenspektroskopie
URL: http://opus4.kobv.de/opus4-btu/frontdoor/index/index/docId/3186
URN: urn:nbn:de:kobv:co1-opus4-31860

Analyzing Structural Changes of Fe-N-C Cathode Catalysts in PEM Fuel Cell by Mößbauer Spectroscopy of Complete Membrane-Electrode-Assemblies

Author(s): Kramm, Ulrike Ingrid, Lefèvre, Michel, Bogdanoff, Peter, Schmeißer, Dieter, Dodelet, Jean-Pol
Type: Scientific Article ref.
Year of publication: 2014
: iron-based catalyst; iron−nitrogen−carbon catalyst; non-noble metal catalyst; nonprecious metal catalyst; oxygen reduction reaction; ORR; polymer electrolyte membrane fuel cell; PEM-FC; degradation
Source: The Journal of Physical Chemistry Letters, S. 3750 - 3756
Volume: 2014
Issue/Journal number: 5
ISSN: 1948-7185
DOI: https://doi.org/10.1021/jz501955g

Unification of Catalytic Water Oxidation and Oxygen Reduction Reactions: Amorphous Beat Crystalline Cobalt Iron Oxides

Author(s): Indra, Arindam, Menezes, Prashanth W., Sahraie, Nastaran Ranjbar, Bergmann, Arno, Das, Chittaranjan, Tallarida, Massimo, Schmeißer, Dieter, Strasser, Peter, Driess, Matthias
Type: Scientific Article ref.
Year of publication: 2014
: photochemical; electrochemical; catalyst; water oxidation reaction; oxygen reduction reaction; cobalt iron oxides; control of crytallinity
Source: Journal of the American Chemical Society, S. 17530 - 17536
Volume: 2014
Issue/Journal number: 136
ISSN: 1520-5126; 0002-7863
DOI: https://doi.org/10.1021/ja509348t

Aluminium based micro mirrors exposed to UV laser light – in situ performance and degradation

Author(s): Mai, Alexander
Type: doctoralthesis
Year of publication: 2014
: In situ; Laser exposure; MOEMS; Micro mirror array; SLM
URL: https://opus4.kobv.de/opus4-btu/frontdoor/index/index/docId/3149
URN: urn:nbn:de:kobv:co1-opus4-31497

Charging effect in HfO2 films deposited on SiO2/Si by atomic layer deposition

Author(s): Alberton Corrêa, Silma, Brizzi, Simone, Tallarida, Massimo, Schmeißer, Dieter
Type: conference publication
Year of publication: 2014
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: Charging; HfO2; atomic layer deposition (ALD)
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft
URL: http://www.dpg-verhandlungen.de/year/2014/conference/dresden/part/ds/session/49/contribution/10?lang=en
: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Band 49

X-ray linear dichroism in atomic layer deposited Titanium dioxide layers

Author(s): Das, Chittaranjan, Tallarida, Massimo, Schmeißer, Dieter
Type: conference publication
Year of publication: 2014
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: X-ray linear dichroism; atomic layer deposition (ALD); TiO2; X-ray absorption spectroscopy; X-ray photoelectron spectroscopy
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft
URL: http://www.dpg-verhandlungen.de/year/2014/conference/dresden/part/ds/session/49/contribution/4?lang=en
: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Band 49

Structural changes in HfO2 thin films: thickness and doping dependence

Author(s): Brizzi, Simone, Tallarida, Massimo, Adelmann, Christoph, Ragnarsson, Lars-Åke, Elshocht, Sven van, Schmeißer, Dieter
Type: conference publication
Year of publication: 2014
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: Structure; HfO2 thin films; thickness dependence; doping dependence; atomic layer deposition (ALD)
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft
URL: http://www.dpg-verhandlungen.de/year/2014/conference/dresden/part/ds/session/49/contribution/9?lang=en
: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Band 49

New opportunities with Plasma enhanced atomic layer deposition (PE-ALD) of oxides

Author(s): Tallarida, Massimo, Henkel, Karsten, Gargouri, Hassan, Haeberle, Jörg, Gruska, Bernd, Arens, Matthias, Schmeißer, Dieter
Type: conference publication
Year of publication: 2014
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: Atomic layer deposition; Plasma enhanced atomic layer deposition; X-ray photoelectron spectroscopy; spectroscopic ellipsometry; dielectric properties; Al2O3
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft
URL: http://www.dpg-verhandlungen.de/year/2014/conference/dresden/part/ds/session/49/contribution/3?lang=en
: Verhandlungen der Deutschen Physikalischen Gesellschaft : Reihe 6, Band 49

Characterization of diamond-like carbon (DLC) coatings on industrial polyethylene and polyoxymethylene by SEM, AFM and NEXAFS

Author(s): Rösken, Liz M., Rohrbeck, Magdalena, Catena, Alberto, Wehner, Stefan, Fischer, Christian B., Richter, Matthias, Städter, Matthias, Schmeißer, Dieter
Type: conference publication
Year of publication: 2014
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: Diamond-like carbon (DLC); soft plolymers; Scanning electron microscopy (SEM); Atomic foce microscopy (AFM); Near-edge X-Ray absorption spectroscopy (NEXAFS)
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft
URL: http://www.dpg-verhandlungen.de/year/2014/conference/dresden/part/ds/session/43/contribution/20?lang=en
: Verhandlungen der Deutschen Physikalischen Gesellschaft : Reihe 6, Band 49

Control of thickness of SiO2 interfacial layer for photocatalytic water splitting on Si photocathodes

Author(s): Das, Chittaranjan, Tallarida, Massimo, Schmeißer, Dieter
Type: conference publication
Year of publication: 2014
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: photocatalysis; water splitting; Si photocathodes; atomic layer depsoition (ALD); passivation layer; TiO2
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft
URL: http://www.dpg-verhandlungen.de/year/2014/conference/dresden/part/ds/session/49/contribution/5?lang=en
: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Band 49

Fuel cells, Non-precious metal catalysts for the oxygen reduction reaction

Author(s): Kramm, Ulrike Ingrid
Editor(s): Kreysa, Gerhard, Ota, Ken-ichiro, Savinell, Robert F.
Type: part of book (chapter)
Year of publication: 2014
Publisher name: New York : Springer
: Fuel cells; Non-Precious Metal Catalysts; Oxygen Reduction Reaction (ORR)
Source: Encyclopedia of Applied Electrochemistry, S. 909 - 918
ISBN: 978-1-4419-6995-8; 978-1-4419-6996-5
URL: http://link.springer.com/referenceworkentry/10.1007%2F978-1-4419-6996-5_204

A spectroscopic comparison of AOS thin films and TCO single crystals

Author(s): Haeberle, Jörg, Gaspar, Diana, Barquinha, Pedro, Machulik, Stephan, Janowitz, Christoph, Galazka, Zbigniew, Schmeißer, Dieter
Type: conference publication
Year of publication: 2014
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: Amorphous oxide semiconductors (AOS); Transparent conductive oxides (TCO); In2O3; Ga2O3; ZnO; SnO2; GIZO; resonant photoelectron spectroscopy
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft
URL: http://www.dpg-verhandlungen.de/year/2014/conference/dresden/part/hl/session/107/contribution/15?lang=en
: Verhandlungen der Deutschen Physikalischen Gesellschaft, Reihe 6, Band 49

Resonant Photoemission at the O1s threshold to characterize In2O3 single crystals

Author(s): Haeberle, Jörg, Richter, Matthias, Galazka, Zbigniew, Janowitz, Christoph, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2014
: In2O3; TCO; X-ray spectroscopy; Small polaron; Charge transfer
Source: Thin Solid Films, S. 53 - 56
Volume: 2014
Issue/Journal number: 555
ISSN: 0040-6090; 1879-2731
DOI: https://doi.org/10.1016/j.tsf.2013.03.036

Understanding the Interface Reactions of Rutile TiO2 Grown by Atomic Layer Deposition on Oxidized Ruthenium

Author(s): Popovici, Mihaela, Delabie, Annelies, Adelmann, Christoph, Meersschaut, Johan, Franquet, Alexis, Tallarida, Massimo, Berg, Jaap van den, Richard, Olivier, Swerts, Johan, Tomida, Kazuyuki, Kim, Min-Soo, Tielens, Hilde, Bender, Hugo, Conard, Thierry, Jurczak, Malgorzata, Elshocht, Sven van, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2013
: TiO2; atomic layer deposition; rutile; RuOx; Rutherford backscattering (RBS); time of flight secondary ion mass spectrometry (TOFSIMS); Medium Energy Ion Scattering Spectroscopy (MEIS); X-Ray absorption spectroscopy; transmission electron microscopy (TEM); X-ray diffraction (XRD)
Source: ECS Journal of Solid State Science and Technology, S. 23 - 27
Volume: 2
Issue/Journal number: 1
ISSN: 2162-8769
DOI: https://doi.org/10.1149/2.035301jss

Interlayer formation of diamond-like carbon coatings on industrial polyethylene: Thickness dependent surface characterization by SEM, AFM and NEXAFS

Author(s): Fischer, Christian B., Rohrbeck, Magdalena, Wehner, Stefan, Richter, Matthias, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2013
: Diamond-like carbon; Interlayer formation; Polyethylene; Surface characterization; Coatings; Plastics
Source: Applied Surface Science, S. 381 - 389
Issue/Journal number: 271
ISSN: 0169-4332
DOI: https://doi.org/10.1016/j.apsusc.2013.01.210

Height distribution of atomic force microscopy images as a tool for atomic layer deposition characterization

Author(s): Kolanek, Krzysztof, Tallarida, Massimo, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2013
: Atomic layer deposition (ALD); Atomic force microscopy; HfO2; height distribution
Source: Journal of Vacuum Science and Technology : A, S. 01104-1 - 01104-9
Volume: 31
Issue/Journal number: 1
DOI: https://doi.org/10.1116/1.4754557

Structural and Magnetic Studies on Iron Oxide and Iron-Magnesium Oxide Thin Films Deposited Using Ferrocene and (Dimethylaminomethyl)ferrocene Precursors

Author(s): Kukli, Kaupo, Dimri, Mukesh Chandra, Tamm, Aile, Kemell, Marianna, Käämbre, Tanel, Vehkamäki, Marko, Puttaswamy, Manjunath, Stern, Raivo, Kuusik, Ivar, Kikas, Arvo, Tallarida, Massimo, Schmeißer, Dieter, Ritala, Mikko, Leskelä, Markku
Type: Scientific Article ref.
Year of publication: 2013
: iron oxide; iron magnesium oxide; GIXRD; Raman spectroscopy; X-Ray absorption spectroscopy (XAS); scanning electron microscopy (SEM); magnetization
Source: ECS Journal of Solid State Science and Technology, S. 45 - 54
Volume: 2
Issue/Journal number: 3
ISSN: 2162-8769
DOI: https://doi.org/10.1149/2.004303jss

Multiple Auger Decay At Resonant Photo-Excitation In Carbon Thin Films

Author(s): Richter, Matthias, Paloumpa, Ioanna, Friedrich, Daniel, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2013
: resonant photoelectron spectroscopy; graphene; HOPG; X-ray absorption spectroscopy (XAS); X-ray photoelectron spectroscopy (XPS)
Source: ECS Transactions, S. 9 - 21
Volume: 50
Issue/Journal number: 20
DOI: https://doi.org/10.1149/05020.0009ecst

The Co2p Oxidation State In Co-PI Catalysts

Author(s): Richter, Matthias, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2013
: X-Ray photoelectron spectroscopy (XPS); X-Ray absorption spectroscopy (XAS); CoPI; oxygene evolution; water oxydation
Source: ECS Transactions, S. 113 - 126
Volume: 50
Issue/Journal number: 49
DOI: https://doi.org/10.1149/05049.0113ecst

Spin states in Co-PI catalysts

Author(s): Richter, Matthias, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2013
: resonant photoelectron spectroscopy; CoPI; oxygen evolution reaction
Source: Applied Physics Letters, S. 253904-1 - 253904-4
Issue/Journal number: 102
ISSN: 1077-3118
DOI: https://doi.org/10.1063/1.4811748

Surface Functionalization of Nanostructured Fe2O3 Polymorphs: From Design to Light-Activated Applications

Author(s): Barreca, Davide, Carraro, Giorgio, Gasparotto, Alberto, Maccato, Chiara, Rossi, Francesca, Salviati, Giancarlo, Tallarida, Massimo, Das, Chittaranjan, Fresno, Fernando, Korte, Dorota, Štangar, Urška Lavrenčič, Franko, Mladen, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2013
: chemical vapor deposition; atomic layer deposition; iron oxide; titanomagnetite; photoactivated properties
Source: ACS Applied Materials & Interfaces, S. 7130 - 7138
Volume: 5
Issue/Journal number: 15
ISSN: 1944-8252
DOI: https://doi.org/10.1021/am401475g

Surface Chemistry and Interface Formation during the Atomic Layer Deposition of Alumina from Trimethylaluminum and Water on Indium Phosphide

Author(s): Adelmann, Christoph, Cuypers, Daniel, Tallarida, Massimo, Rodriguez, Leonard, De Clercq, Astrid, Friedrich, Daniel, Conard, Thierry, Delabie, Annelies, Seo, Jin Won, Locquet, Jean-Pierre, De Gendt, Stefan, Schmeißer, Dieter, Elshocht, Sven van, Caymax, Matty
Type: Scientific Article ref.
Year of publication: 2013
Source: Chemistry of Materials, S. 1078 - 1091
Volume: 25
Issue/Journal number: 7
ISSN: 1520-5002
DOI: https://doi.org/10.1021/cm304070h

III-V/Oxide Interfaces Investigated with Synchrotron Radiation Photoemission Spectroscopy

Author(s): Tallarida, Massimo, Adelmann, Christoph, Delabie, Annelies, Elshocht, Sven van, Caymax, Matty, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2013
: Interfaces; III/V; Synchrotron Photoemission Spectroscopy
Source: ECS Transactions, S. 123 - 128
Volume: 50
Issue/Journal number: 4
ISSN: 1938-6737
DOI: https://doi.org/10.1149/05004.0123ecst

Sabatier based CO2-methanation of flue gas emitted by conventional power plants

Author(s): Müller, Klaus, Fleige, Michael, Rachow, Fabian, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2013
: Power to gas; CO2 -Methanation; Sabatier-reaction; flue gas
Source: Energy Procedia, S. 240 - 248
Volume: 40
ISSN: 1876-6102
DOI: https://doi.org/10.1016/j.egypro.2013.08.028

Ellipsometry and XPS comparative studies of thermal and plasma enhanced atomic layer deposited Al2O3-films

Author(s): Haeberle, Jörg, Henkel, Karsten, Gargouri, Hassan, Naumann, Franziska, Gruska, Bernd, Arens, Michael, Tallarida, Massimo, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2013
: Al2O3; ALD; ellipsometry; PE-ALD; XPS
Source: Beilstein Journal of Nanotechnology, S. 732 - 742
Volume: 2013
Issue/Journal number: 4
ISSN: 2190-4286
DOI: https://doi.org/10.3762/bjnano.4.83

Structural and luminescence properties of HfO2 nanocrystals grown by atomic layer deposition on SiC/SiO2 core/shell nanowires

Author(s): Rossi, Francesca, Fabbri, Filippo, Tallarida, Massimo, Schmeißer, Dieter, Modreanu, Mircea, Attolini, Giovanni, Salviati, Giancarlo
Type: Scientific Article ref.
Year of publication: 2013
: Silicon carbide; Silicon dioxide; Nanowires; Hafnium oxide; Nanocrystals
Source: Scripta Materialia, S. 744 - 747
Volume: 69
Issue/Journal number: 10
ISSN: 1359-6462
DOI: https://doi.org/10.1016/j.scriptamat.2013.08.017

Sabatier-based CO2-methanation by catalytic conversion

Author(s): Müller, Klaus, Städter, Matthias, Rachow, Fabian, Hoffmannbeck, David, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2013
: CO2; Sabatier reaction; Catalysis; RuO2
Source: Environmental Earth Sciences, S. 3771 - 3778
Volume: 70
Issue/Journal number: 8
ISSN: 1866-6280
DOI: https://doi.org/10.1007/s12665-013-2609-3

Study of InP Surfaces after Wet Chemical Treatments

Author(s): Cuypers, Daniel, Dorp, Dennis H. von, Tallarida, Massimo, Brizzi, Simone, Rodriguez, Leonard, Conard, Thierry, Arnauts, Sophia, Schmeißer, Dieter, Adelmann, Christoph, De Gendt, Stefan
Type: Scientific Article ref.
Year of publication: 2013
: Synchrotron Radiation Photoelectron Spectroscopy; InP; Wet chemical treatment
Source: ECS Transactions, S. 297 - 303
Volume: 58
Issue/Journal number: 6
ISSN: 1938-6737; 1938-5862
DOI: https://doi.org/10.1149/05806.0297ecst

Study of InP Surfaces After Wet Chemical Treatments

Author(s): Cuypers, Daniel, Dorp, Dennis H. von, Tallarida, Massimo, Brizzi, Simone, Rodriguez, Leonard, Conard, Thierry, Arnauts, Sophia, Schmeißer, Dieter, Adelmann, Christoph, De Gendt, Stefan
Type: conference publication
Year of publication: 2013
Publisher name: The Electrochemical Society
: Synchrotron Radiation Photoelectron Spectroscopy; InP; Wet chemical treatment
Source: Meeting Abstracts-Electrochemical Society, San Francisco, 2013, S. 2132
URL: http://ma.ecsdl.org/content/MA2013-02/30/2132.full.pdf+html

Ambient pressure thermal desorption spectroscopy (AP-TDS) of NiO/SiO2 catalysts

Author(s): Städter, Matthias, Müller, Klaus, Rachow, Fabian, Richter, Matthias, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2013
: CO2; NiO; TDS; XAS; XPS
Source: Environmental Earth Sciences, S. 3779 - 3784
Volume: 70
Issue/Journal number: 8
ISSN: 1866-6280
DOI: https://doi.org/10.1007/s12665-013-2835-8

Linear dichroism in ALD layers of TiO₂

Author(s): Das, Chittaranjan, Tallarida, Massimo, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2013
: Anatase; Dichroism; Amorphous
Source: Environmental Earth Sciences, S. 3785 - 3795
Volume: 70
Issue/Journal number: 8
ISSN: 1866-6280
DOI: https://doi.org/10.1007/s12665-013-2836-7

Spektroskopische Untersuchungen an organischen Materialien und Metalloxiden

Author(s): Michling, Marcel Frank
Type: doctoralthesis
Year of publication: 2013
: Spektroskopie; Organik; Metalloxide; Bandlücke; 3h-Auger
URL: http://opus.kobv.de/btu/volltexte/2013/2901/
URN: urn:nbn:de:kobv:co1-opus-29014

Interface engineering for the TaN/Ta barrier film deposition process to control Ta-crystal growth

Author(s): Gerlich, Lukas, Ohsiek, Susanne, Klein, Christoph, Geiß, Mario, Friedemann, Michael, Kücher, Peter, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2013
: Tantalum; in situ XPS; Ta-phase; TaNx; Barrier; Interface
Source: Microelectronic Engineering, S. 63 - 68
Volume: Vol. 106
DOI: https://doi.org/10.1016/j.mee.2013.01.017

Geoenergy: new concepts for utilization of geo-reservoirs as potential energy sources

Author(s): Scheck-Wenderoth, Magdalena, Schmeißer, Dieter, Mutti, Maria, Kolditz, Olaf, Huenges, Ernst, Schultz, Hans-Martin, Liebscher, Axel, Bock, Michaela
Type: Scientific Article ref.
Year of publication: 2013
: Geothermal technologies; capturing and storing and utilizing CO2; hydraulic fracturing
Source: Environmental Earth Sciences, S. 3427 - 3431
Volume: 70
Issue/Journal number: 8
ISSN: 1866-6280
DOI: https://doi.org/10.1007/s12665-013-2877-y

In situ ARXPS Charakterisierung von tantalbasierten Barriereschichten

Author(s): Gerlich, Lukas
Type: doctoralthesis
Year of publication: 2013
: Photoelektronenspektroskopie; Tantal; ARXPS; Barriere; Interface
URL: http://opus.kobv.de/btu/volltexte/2013/2848/
URN: urn:nbn:de:kobv:co1-opus-28485

Atomic layer deposition of Ga2O3 using Tri-methyl-Gallium and H2O

Author(s): Choudhury, Sakeb Hasan, Tallarida, Massimo, Das, Chittaranjan, Schmeißer, Dieter
Type: conference publication
Year of publication: 2013
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: atomic layer deposition; Ga2O3; X-ray photoelectron spectroscopy (XPS); Si, TiO2, Al2O3 and RuO2 substrates
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft
URL: http://www.dpg-verhandlungen.de/year/2013/conference/regensburg/part/ds/session/4/contribution/2?lang=de
: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Band 48

CVD and ALD deposited hafnia: an XPS study

Author(s): Brizzi, Simone, Tallarida, Massimo, Schmeißer, Dieter
Type: conference publication
Year of publication: 2013
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: HfO2; chemical vapor deposition; atomic layer deposition (ALD); X-Ray photoelectron spectroscopy
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft
URL: http://www.dpg-verhandlungen.de/year/2013/conference/regensburg/part/ds/session/30/contribution/1?lang=de
: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Band 48

An efficient Si photo cathode for a wide range of electrolyte pH values

Author(s): Das, Chittaranjan, Tallarida, Massimo, Skorupska, Katarzyna, Lewerenz, Hans-Joachim, Schmeißer, Dieter
Type: conference publication
Year of publication: 2013
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: Si photoelectrode; water splitting; atomic layer deposition (ALD); TiO2
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft
URL: http://www.dpg-verhandlungen.de/year/2013/conference/regensburg/part/ds/session/4/contribution/3?lang=de
: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Band 48

Sabatier based CO2-Methanation of flue gas in conventional power plants

Author(s): Fleige, Michael, Müller, Klaus, Schmeißer, Dieter
Type: conference publication
Year of publication: 2013
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: methanation; flue gas; power plant; Sabatier reaction; power to gas
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft
URL: http://www.dpg-verhandlungen.de/year/2013/conference/regensburg/part/o/session/36/contribution/70?lang=de
: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Band 51

Reaction kinetics of the Sabatier Reaction in a demonstration plant

Author(s): Israel, Johannes, Müller, Klaus, Rachow, Fabian, Beuckert, Guido, Schmeißer, Dieter
Type: conference publication
Year of publication: 2013
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: methanation; Sabatier reaction; reaction kinetics
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft
URL: http://www.dpg-verhandlungen.de/year/2013/conference/regensburg/part/o/session/20/contribution/5?lang=de
: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Band 48

Sabatier based Methanation of carbon dioxide and Catalyst stability against contaminations

Author(s): Rachow, Fabian, Müller, Klaus, Schmeißer, Dieter
Type: conference publication
Year of publication: 2013
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: methanation; Sabatier reaction; catalyst contaminations; NOx and SOx; long term stability
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft
URL: http://www.dpg-verhandlungen.de/year/2013/conference/regensburg/part/o/session/20/contribution/4?lang=de
: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Band 48

The Co2p spin and oxidation state in Co-PI catalysts

Author(s): Richter, Matthias, Schmeißer, Dieter
Type: conference publication
Year of publication: 2013
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: X-Ray photoelectron spectroscopy; resonant photoemission spectroscopy; cobalt based catalyst; water splitting
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft
URL: http://www.dpg-verhandlungen.de/year/2013/conference/regensburg/part/ds/session/35/contribution/9?lang=de
: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Band 48

Multiple Auger Decay at resonant photo-excitation in carbon thin films

Author(s): Richter, Matthias, Städter, Matthias, Paloumpa, Ioanna, Schmeißer, Dieter
Type: conference publication
Year of publication: 2013
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: resonant photoelectron spectroscopy; Auger decay; multiple decay; carbon thin films
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft
URL: http://www.dpg-verhandlungen.de/year/2013/conference/regensburg/part/hl/session/52/contribution/6?lang=de
: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Band 48

Fano-Profiles in HOPG and graphene flakes

Author(s): Städter, Matthias, Richter, Matthias, Schmeißer, Dieter
Type: conference publication
Year of publication: 2013
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: resonant photoelectron spectroscopy; Fano profiles; Graphene; HOPG
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft
URL: http://www.dpg-verhandlungen.de/year/2013/conference/regensburg/part/hl/session/52/contribution/5?lang=de
: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Band 48

Interlayer formation of Diamond-Like Carbon Coatings on Polyethylene Plastic Material

Author(s): Fischer, Christian B., Rohrbeck, Magdalena, Wehner, Stefan, Richter, Matthias, Städter, Matthias, Schmeißer, Dieter
Type: conference publication
Year of publication: 2013
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: Diamond-like carbon (DLC); topography; X-ray absorption spectroscopy; plasma enhanced chemical vapor deposition
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft
URL: http://www.dpg-verhandlungen.de/year/2013/conference/regensburg/part/o/session/33/contribution/4?lang=de
: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Band 48

Electro-active β-Phase Formation in Poly(vinylidene fluoride) Films by Hydrated Rare earth Metal Salt

Author(s): Garain, Samiran, Adhikary, Prakriti, Mandal, Dipankar, Sen, Shrabanee, Henkel, Karsten, Schmeißer, Dieter
Type: conference publication
Year of publication: 2013
Publisher name: Haldia : Institute of Technology, Haldia, WB, India
: PVDF; β-Phase; piezoelectric
Source: Proceeding of the International Conference on Nanotechnology 2013 (ICNT 2013), S. 127
ISBN: 978-81-927756-0-9

Influence of the fullerene derivatives and cage polyhedral oligomeric silsesquioxanes on 3-aminopropyltrimethoxysilane based hybrid nanocomposites chemical, morphological and electrical properties

Author(s): Klocek, Jolanta, Kolanek, Krzysztof, Henkel, Karsten, Zschech, Ehrenfried, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2013
: low-k; fullerene; aminopropyltrimethoxysilane; silsesqiuoxane; X-ray photoelectron spectroscopy (XPS); Atomic force microscopy (AFM); Capacitance voltage (CV)
Source: Journal of Physics and Chemistry of Solids, S. 135 - 145
Volume: 74
Issue/Journal number: 1
ISSN: 0022-3697
DOI: https://doi.org/10.1016/j.jpcs.2012.08.013

Resonant Photoemission at the O1s threshold to characterize In2O3 single crystals

Author(s): Haeberle, Jörg, Richter, Matthias, Schmeißer, Dieter, Galazka, Zbigniew, Janowitz, Christoph
Type: conference publication
Year of publication: 2013
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: resonant photoelectron spectroscopy; In2O3
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft
URL: http://www.dpg-verhandlungen.de/year/2013/conference/regensburg/part/mm/session/15/contribution/57?lang=de
: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Band 48

Control of the Crystalline Polymorph, Molecular Dipole and Chain Orientations in P(VDF-HFP) for High Electrical Energy Storage Application

Author(s): Mandal, Dipankar, Henkel, Karsten, Schmeißer, Dieter
Type: conference publication
Year of publication: 2012
Publisher name: IEEE
Source: International Conference on Nanoscience, Technology and Societal Implications (NSTSI), 2011
ISBN: 978-1-4577-2035-2
DOI: https://doi.org/10.1109/NSTSI.2011.6111801

The electroactive Beta-phase formation in Poly(vinylidene fluoride) by gold nanoparticles doping

Author(s): Mandal, Dipankar, Henkel, Karsten, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2012
Source: Materials Letters, S. 123 - 125
Issue/Journal number: 73
ISSN: 0167-577X

In situ study of the atomic layer deposition of HfO2 on Si

Author(s): Kolanek, Krzysztof, Tallarida, Massimo, Michling, Marcel, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2012
Source: Journal of Vacuum Science and Technology, S. 01143-1 - 01143-15
Issue/Journal number: A 30
ISSN: 0734-2101

Excited states in P3HT and P3HT/PCBM blends

Author(s): Müller, Klaus, Richter, Matthias, Philip, Shine, Kunst, Manuel, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2012
Source: BioNanoScience, S. 42 - 51
Volume: 2
Issue/Journal number: 1
ISSN: 2191-1630

Spectroscopic and atomic force microscopy investigations of hybrid materials composed of fullerenes and 3-aminopropyltrimethoxysilane

Author(s): Klocek, Jolanta, Kolanek, Krzysztof, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2012
Source: Journal of Physics and Chemistry of Solids, S. 699 - 706
Volume: 73
Issue/Journal number: 5
ISSN: 0022-3697

Valence and Conduction band states of PCBM as probed by photoelectron spectroscopy at resonant excitation

Author(s): Richter, Matthias, Friedrich, Daniel, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2012
Source: BioNanoScience, S. 59 - 65
Volume: 2
Issue/Journal number: 1
ISSN: 2191-1630

The effect of X-ray photoelectron spectroscopy measurement on P(VDF-TrFE) copolymer thin films

Author(s): Mandal, Dipankar, Müller, Klaus, Henkel, Karsten, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2012
: P(VDF-TrFE) copolymer thin film; XPS measurement; X-ray irradiation; Ferroelectric to paraelectric phase transformation
Source: Applied Surface Science, S. 209 - 213
Issue/Journal number: 261
ISSN: 0169-4332; 1873-5584
DOI: https://doi.org/10.1016/j.apsusc.2012.07.144

Electronic structure of cobalt–nickel mixed oxides

Author(s): Schmidt, Stephan, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2012
: Transition metals; Oxides; Resonant photoemission; X-ray absorption spectroscopy
Source: Solid State Ionics, S. 737 - 741
Issue/Journal number: 225
ISSN: 1872-7689
DOI: https://doi.org/10.1016/j.ssi.2012.06.009

In situALD experiments with synchrotron radiation photoelectron spectroscopy

Author(s): Tallarida, Massimo, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2012
: Atomic layer deposition (ALD); in situ; photoelectron spectroscopy
Source: Semiconductor Science and Technology, S. 074010
Volume: 27
Issue/Journal number: 7
ISSN: 1361-6641
DOI: https://doi.org/10.1088/0268-1242/27/7/074010

Resonant Photoemission at the O1s threshold to characterize β-Ga2O 3 single crystals

Author(s): Michling, Marcel, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2012
: resonant photoelectron spectroscopy; Ga2O3
Source: IOP Conference Series: Materials Science and Engineering, S. 012002
Issue/Journal number: 34
ISSN: 1757-8981
DOI: https://doi.org/10.1088/1757-899X/34/1/012002

III-V/oxide interfaces investigated with synchrotron radiation photoemission spectroscopy

Author(s): Tallarida, Massimo
Type: conference publication
Year of publication: 2012
Publisher name: The Electrochemical Society
: interfaces; III/V; Synchrotron Photoemission Spectroscopy
Source: Meeting Abstracts-Electrochemical Society, Pacific Rim Meeting on Electrochemical and Solid-State Science, Honolulu, 2012, S. 2587 - 2587
URL: http://ma.ecsdl.org/content/MA2012-02/31/2587.full.pdf+html

Processing and investigation of thin films with incorporated carbon species for possible application as low-k materials

Author(s): Klocek, Jolanta
Type: doctoralthesis
Year of publication: 2012
: X-ray photoelectron spectroscopy; Capacitance–voltage characterization; 3-Aminopropyltrimethoxysilane; Low-k materials; Atomic force microscopy
URL: http://opus.kobv.de/btu/volltexte/2012/2435/
URN: urn:nbn:de:kobv:co1-opus-24358

Spectroscopic characterization of Cobalt–Phthalocyanine electrocatalysts for fuel cell applications

Author(s): Müller, Klaus, Richter, Matthias, Friedrich, Daniel, Paloumpa, Ioanna, Kramm, Ulrike Ingrid, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2012
: Co-phthalocyanine; Catalysis; Oxygen reduction reaction (ORR); XPS; NEXAFS
Source: Solid State Ionics, S. 78 - 82
Issue/Journal number: 216
ISSN: 1872-7689
DOI: https://doi.org/10.1016/j.ssi.2011.12.013

Herstellung und Charakterisierung hocheffzienter, mikromechanischer NIR-Beugungsgitter für den Einsatz in miniaturisierten Spektrometern

Author(s): Zimmer, Fabian
Type: doctoralthesis
Year of publication: 2012
: Mikrosystemtechnik; MEMS; Mikrooptik; Mikrospiegel; Spektrometer
URL: http://opus.kobv.de/btu/volltexte/2012/2522/
URN: urn:nbn:de:kobv:co1-opus-25224

Elektronische Struktur epitaktischer Chalkopyrite und deren Heterokontakte für die Photovoltaik

Author(s): Hofmann, Andreas
Type: doctoralthesis
Year of publication: 2012
URN: urn:nbn:de:kobv:co1-opus-24434

Multiple Auger decay at resonant photo-excitation in carbon thin films

Author(s): Richter, Matthias, Friedrich, Daniel, Schmeißer, Dieter
Type: conference publication
Year of publication: 2012
Publisher name: The Electrochemical Society
Source: Meeting Abstracts-Electrochemical Society, Pacific Rim Meeting on Electrochemical and Solid-State Science, Honolulu, 2012, S. 3509
URL: http://ma.ecsdl.org/content/MA2012-02/50/3509.full.pdf+html

The Co2p oxidation state in Co-PI catalysts

Author(s): Richter, Matthias, Schmeißer, Dieter
Type: conference publication
Year of publication: 2012
Publisher name: The Electrochemical Society
Source: Meeting Abstracts-Electrochemical Society, Pacific Rim Meeting on Electrochemical and Solid-State Science, Honolulu, 2012, S. 1803

GaAs clean up studied with synchrotron radiation photoemission

Author(s): Tallarida, Massimo, Adelmann, Christoph, Delabie, Annelies, van Elshocht, Sven, Caymax, Matty, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2012
: photoemission spectroscopy; atomic layer deposition; GaAs
Source: IOP Conference Series : Materials Science and Engineering, S. 012003
Issue/Journal number: 41
ISSN: 1757-899X
DOI: https://doi.org/10.1088/1757-899X/41/1/012003

Control of β- and γ-Phase formation in electroactive P(VDF-HFP) films by silver nano-particle doping

Author(s): Mandal, Dipankar, Henkel, Karsten, Das, Suken, Schmeißer, Dieter
Editor(s): Heber, Jörg, Schlom, Darrell, Tokura, Yoshinori, Waser, Rainer, Wuttig, Matthias
Type: conference publication
Year of publication: 2012
Publisher name: Weinheim : Wiley-VCH
: P(VDF.HFP); electroactive phase; nanoparticle doping; FTIR
Source: Frontiers in Electronic Materials: A Collection of Extended Abstracts of the Nature Conference Frontiers in Electronic Materials, June 17 to 20 2012, Aachen, Germany, S. 640 - 641
ISBN: 978-3-527-41191-7
DOI: https://doi.org/10.1002/9783527667703.ch69

Intrinsic defects in TiO2 to explain resistive switching devices

Author(s): Schmeißer, Dieter, Richter, Matthias, Tallarida, Massimo
Editor(s): Heber, Jörg, Schlom, Darrell, Tokura, Yoshinori, Waser, Rainer, Wuttig, Matthias
Type: conference publication
Year of publication: 2012
Publisher name: Weinheim : Wiley-VCH
: resonant photoelectron spectroscopy; Auger processes; XPS; X-ray absorption spectroscopy
Source: Frontiers in Electronic Materials: A Collection of Extended Abstracts of the Nature Conference Frontiers in Electronic Materials, June 17 to 20 2012, Aachen, Germany, S. 255 - 256
ISBN: 978-3-527-41191-7
DOI: https://doi.org/10.1002/9783527667703.ch45

CO2-Methanation by Catalytic Conversion

Author(s): Müller, Klaus, Hoffmannbeck, David, Kirner, Georg, Städter, Matthias, Schmeißer, Dieter
Type: conference publication
Year of publication: 2012
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft
URL: http://www.dpg-verhandlungen.de/year/2012/conference/berlin/part/ds/session/37/contribution/45
: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Bd. 47

Study of excited states and a model for exciton-polaron interaction in P3HT

Author(s): Philip, Shine, Müller, Klaus, Richter, Matthias, Kunst, Marinus, Schmeißer, Dieter
Type: conference publication
Year of publication: 2012
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft, Reihe 6, Bd. 47
URL: http://www.dpg-verhandlungen.de/year/2012/conference/berlin/part/ds/session/44/contribution/31

Investigation of Linear Dichroism in ALD layers of TiO2

Author(s): Das, Chittaranjan, Städter, Matthias, Tallarida, Massimo, Schmeißer, Dieter
Type: conference publication
Year of publication: 2012
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft, Reihe 6, Bd. 47
URL: http://www.dpg-verhandlungen.de/year/2012/conference/berlin/part/ds/session/44/contribution/59

AP-TDS characterization of CO2 methanation catalysts

Author(s): Städter, Matthias, Schmeißer, Dieter
Type: conference publication
Year of publication: 2012
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft, Reihe 6, Bd. 47
URL: http://www.dpg-verhandlungen.de/year/2012/conference/berlin/part/va/session/2/contribution/2

Role of substrate chemistry in ALD revealed by in-situ techniques

Author(s): Tallarida, Massimo, Michling, Marcel, Das, Chittaranjan, Friedrich, Daniel, Städter, Matthias, Schmeißer, Dieter
Type: conference publication
Year of publication: 2012
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft,Reihe 6, Bd. 47
URL: http://www.dpg-verhandlungen.de/year/2012/conference/berlin/part/ds/session/22/contribution/3

Diamond-Like Carbon Coatings on Industrial Polyethylene Surfaces

Author(s): Rohrbeck, Magdalena, Fischer, Christian B., Wehner, Stefan, Richter, Matthias, Schmeißer, Dieter
Type: conference publication
Year of publication: 2012
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft, Reihe 6, Bd. 47
URL: http://www.dpg-verhandlungen.de/year/2012/conference/berlin/part/o/session/35/contribution/28

3h-Auger decay in the π-band of HOPG

Author(s): Richter, Matthias, Friedrich, Daniel, Schmeißer, Dieter
Type: conference publication
Year of publication: 2012
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft, Reihe 6, Bd. 47
URL: http://www.dpg-verhandlungen.de/year/2012/conference/berlin/part/ds/session/35/contribution/4

Diamond-Like Carbon Coatings on Selected Plastic Materials

Author(s): Fischer, Christian B., Rohrbeck, Magdalena, Wehner, Stefan, Richter, Matthias, Schmeißer, Dieter
Type: conference publication
Year of publication: 2012
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft, Reihe 6, Bd. 47
URL: http://www.dpg-verhandlungen.de/year/2012/conference/berlin/part/o/session/66/contribution/9

Spectroscopic and capacitance-voltage characterization of thin aminopropylmethoxysilane films doped with copper phthalocyanine, tris(dimethylvinylsilyloxy)-POSS and fullerene cages

Author(s): Klocek, Jolanta, Henkel, Karsten, Kolanek, Krzysztof, Zschech, Ehrenfried, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2012
Source: Applied surface science, S. 4213 - 4221
Volume: 258
Issue/Journal number: 10
ISSN: 0169-4332

Studies of the chemical and electrical properties of fullerene and 3-aminopropyltrimethoxysilane based low-k materials

Author(s): Klocek, Jolanta, Henkel, Karsten, Kolanek, Krzysztof, Broczkowska, K., Schmeißer, Dieter, Miller, M., Zschech, Ehrenfried
Type: Scientific Article ref.
Year of publication: 2012
Source: Thin Solid Films, S. 2498 - 2504
Volume: 520
Issue/Journal number: 7
ISSN: 0040-6090

Annealing influence on siloxane based materials incorporated with fullerenes, phthalocyanines and silsesquioxanes

Author(s): Klocek, Jolanta, Henkel, Karsten, Kolanek, Krzysztof, Zschech, Ehrenfried, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2012
Source: BioNanoScience, S. 52 - 58
Volume: 2
Issue/Journal number: 1
ISSN: 2191-1630

Spin coated organic ferroelectric films for non volatile memories

Author(s): Müller, Klaus, Henkel, Karsten, Mandal, Dipankar, Seime, Bernd, Paloumpa, Ioanna, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2011
: organic; ferroelectric
Source: Physica Status Solidi : A 208(2011)2, S. 330-342, 1521-396X

Ultrathin TaN/Ta barrier modifications to fullfill next technology node requirements

Author(s): Gehrlich, Lukas, Ohsiek, Susanne, Klein, M., Geiss, M., Friedemann, Michael, Kücher, Peter, Schmeißer, Dieter
Type: conference publication
Year of publication: 2011
Publisher name: Piscataway, NJ : IEEE
Source: 2011 IEEE International Interconnect Technology Conference and 2011 Materials for Advanced Metallization (IITC/MAM 2011), Dresden, Germany, 8 - 12 May 2011, S. 82 - 84
ISBN: 978-1-4577-0503-8
DOI: https://doi.org/10.1109/IITC.2011.5940322

In-situ Atomic Layer Deposition growth of Hf-oxide

Author(s): Karavaev, Konstantin
Type: doctoralthesis
Year of publication: 2011
: Atomic layer deposition; ALD; X-ray photoelectron spectroscopy; XPS; Hf=2
URL: http://opus.kobv.de/btu/volltexte/2011/2261/
URN: urn:nbn:de:kobv:co1-opus-22617

Comment on "Preparation and Characterization of Silver-Poly(vinylidene fluoride) Nanocomposites:Formation of Piezoelectric Polymorph of Poly(vinylidene fluoride"

Author(s): Mandal, Dipankar, Henkel, Karsten, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2011
Source: The Journal of Physical Chemistry B 115 (2011) 10567, 1520-6106

Pr-O-Al-N dielectrics for metal insulator semiconductor stacks

Author(s): Henkel, Karsten, Torche, Mohamed, Sohal, Rakesh, Karavaev, Konstantin, Burkov, Yevgen, Schwiertz, Carola, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2011
: semiconductor; dielectric
Source: Physica Status Solidi A 208(2011)2, S. 317-329, 1521-396X

Field effect transistors on graphitized polymer surfaces

Author(s): Koval, Yuri, Lazareva, I., Müller, P., Müller, Klaus, Henkel, Karsten, Friedrich, Daniel
Type: Scientific Article ref.
Year of publication: 2011
: transistors; polymer
Source: Physica Status Solidi : B 248(2011)2, S. 299-308, 0370-1972

Substrate Reactivity Effects in the Atomic Layer Deposition of Aluminum Oxide from Trimethylaluminum on Ruthenium

Author(s): Tallarida, Massimo, Kukli, Kaupo, Michling, Marcel, Ritala, Mikko, Leskelä, Markku, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2011
Source: Chemistry of Materials, S. 3159 - 3168
Volume: 23
Issue/Journal number: 13
ISSN: 0897-4756

Atomic layer deposition reactor for fabrication of metal oxides

Author(s): Kolanek, Krzysztof, Tallarida, Massimo, Michling, Marcel, Karavaev, Konstantin, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2011
Source: Physica Status Solidi C 8 (2011) 1287-1292, 1610-1634

Growth of TiO2 with Thermal and Plasma Enhanced Atomic Layer Deposition

Author(s): Tallarida, Massimo, Friedrich, Daniel, Städter, Matthias, Michling, Marcel, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2011
Source: Journal of Nanoscience and Nanotechnology, S. 8049 - 8053
Volume: 11
Issue/Journal number: 9
ISSN: 1533-4880

Surface chemistry and Fermi level movement during the self-cleaning of GaAs by trimethyl-aluminum

Author(s): Tallarida, Massimo, Adelmann, Christoph, Delabie, Annelies, Elshocht, Sven van, Caymax, Matty, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2011
Source: Applied physics letters, S. 042906-1 - 042906-3
Volume: 99
Issue/Journal number: 4
ISSN: 1077-3118
DOI: https://doi.org/10.1063/1.3615784

Atomic layer deposition of nanolaminate oxide films on Si

Author(s): Tallarida, Massimo, Weisheit, Martin, Kolanek, Krzysztof, Michling, Marcel, Engelmann, Hans-Jürgen, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2011
Source: Journal of Nanoparticle Research, S. 5975 - 5983
Volume: 13
Issue/Journal number: 11
DOI: https://doi.org/10.1007/s11051-011-0319-x

In situ determination of laser induced degradation of micro-mirror arrays

Author(s): Mai, Andreas, Dauderstädt, Ulrike, Pahner, D., Krellmann, M., Schmeißer, Dieter, Wagner, M.
Type: conference publication
Year of publication: 2011
Publisher name: Piscataway, NJ : IEEE
: micro-mirror arrays; laser induced degradation
Source: International Students and Young Scientists Workshop Photonics and Microsystems, Cottbus, Germany, 8 - 10 June 2011, S. 84 - 88
ISBN: 978-1-4577-1651-5
DOI: https://doi.org/10.1109/STYSW.2011.6155850

Atomic Layer Deposition of Ruthenium Films from (Ethylcyclopentadienyl)(pyrrolyl)ruthenium and Oxygen

Author(s): Kukli, Kaupo, Kemell, Marianna, Puukilainen, Esa, Aarik, Jaan, Aidla, Aleks, Sajavaara, Timo, Laitinen, Mikko, Tallarida, Massimo, Sundqvist, Jonas, Ritala, Mikko, Leskelä, Markku
Type: Scientific Article ref.
Year of publication: 2011
: Atomic layer deposition (ALD); Ruthenium
Source: Journal of the Electrochemical Society, S. 158 - 165
Volume: 158
Issue/Journal number: 3
ISSN: 0013-4651
DOI: https://doi.org/10.1149/1.3533387

Atomic scale engineering of HfO2–based dielectrics for future DRAM applications

Author(s): Dudek, Piotr T.
Type: doctoralthesis
Year of publication: 2011
: Dielectrics; High-k materials; Atomic Scale Engineering; HfO2-based materials; XPS
URL: http://opus.kobv.de/btu/volltexte/2011/2277/
URN: urn:nbn:de:kobv:co1-opus-22775

Electronic structure and optical properties of P3HT - Evidence of 2D-polarons in P3HT

Author(s): Richter, Matthias, Schmeißer, Dieter
Type: conference publication
Year of publication: 2011
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft, Reihe 6, Bd. 46, S. 311
URL: http://www.dpg-verhandlungen.de/year/2011/conference/dresden/part/ds/session/64/contribution/3

Localized gap states in cobalt/nickel mixed oxides

Author(s): Schmidt, Stefan, Schmeißer, Dieter
Type: conference publication
Year of publication: 2011
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft, Reihe 6, Bd. 46, S. 486
URL: http://www.dpg-verhandlungen.de/year/2011/conference/dresden/part/o/session/69/contribution/2

A growth model for the HfO2 ALD process

Author(s): Michling, Marcel, Kolanek, Krzysztof, Schmeißer, Dieter, Tallarida, Massimo
Type: conference publication
Year of publication: 2011
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft, Reihe 6, Bd. 46, S. 294
URL: http://www.dpg-verhandlungen.de/year/2011/conference/dresden/part/ds/session/12/contribution/1

Time resolved microwave conductivity measurements of Bulk Heterojunction solar cells

Author(s): Philip, Shine, Martinez, Elias, Müller, Klaus, Kunst, Marinus, Schmeißer, Dieter
Type: conference publication
Year of publication: 2011
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft, Reihe 6, Bd. 46, S. 301
URL: http://www.dpg-verhandlungen.de/year/2011/conference/dresden/part/ds/session/42/contribution/31

Investigation of new Catalysts for PEM Fuel Cells

Author(s): Mbua, Roy, Müller, Klaus, Richter, Matthias, Henkel, Karsten, Paloumpa, Ioanna, Schmeißer, Dieter, Kramm, Ulricke
Type: conference publication
Year of publication: 2011
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft, Reihe 6, Bd. 46, S. 483
URL: http://www.dpg-verhandlungen.de/year/2011/conference/dresden/part/o/session/60/contribution/119

Spectroscopic and microscopic characterization of potential catalysts for the hydrogenation of CO2

Author(s): Hoffmannbeck, David, Richter, Matthias, Städter, Matthias, Paloumpa, Ioanna, Henkel, Karsten, Schmeißer, Dieter
Type: conference publication
Year of publication: 2011
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft, Reihe 6, Bd. 46, S. 483
URL: http://www.dpg-verhandlungen.de/year/2011/conference/dresden/part/o/session/60/contribution/123

Electronic structure of thin spin-coated polyimide layers

Author(s): Friedrich, Daniel, Koval, Yuri, Müller, Paul, Schmeißer, Dieter
Type: conference publication
Year of publication: 2011
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft, Reihe 6, Bd. 46, S. 311
URL: http://www.dpg-verhandlungen.de/year/2011/conference/dresden/part/ds/session/63/contribution/3

Atomic layer deposition of TiO

Author(s): Tallarida, Massimo, Deßmann, Nils, Städter, Matthias, Friedrich, Daniel, Michling, Marcel, Schmeißer, Dieter
Type: conference publication
Year of publication: 2011
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft, Reihe 6, Bd. 46
URL: http://www.dpg-verhandlungen.de/year/2011/conference/dresden/part/ds/session/12/contribution/2

Fullerenol as probed by Synchrotron X-Ray Photoemission and Absorption Spectroscopy

Author(s): Friedrich, Daniel, Henkel, Karsten, Richter, Matthias, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2011
Source: BioNanoScience 1(2011)4, S. 218-223, 2191-1630

Studying the eﬀect of Cu microstructure on electromigration reliability using statistical simulation

Author(s): Kraatz, Matthias
Type: doctoralthesis
Year of publication: 2011
: Electromigration; Simulation; Grain growth; Statistics

Atomic-scale engineering of future high-k dynamic random access memory dielectrics: The example of partial Hf substitution by Ti in BaHfO3

Author(s): Dudek, Piotr T., Lupina, Grzegorz, Kozłowski, Grzegorz, Zaumseil, Peter, Bauer, Jakob, Fursenko, Oksana, Dabrowski, Jarek Marek, Schmidt, R., Lippert, Gunther, Müssig, Hans-Joachim, Schröder, Thomas, Schmeißer, Dieter, Zschech, Ehrenfried
Type: Scientific Article ref.
Year of publication: 2011
Source: Journal of Vacuum Science and Technology / B
Volume: 29
Issue/Journal number: 1
ISSN: 2166-2754

Statistical Analysis of Computer-simulated On-Chip Interconnect Electromigration Lifetimes under the Influence of Microstructure and Strengthened Top Interface

Author(s): Kraatz, Matthias, Zhang, Lijuan, Schmeißer, Dieter, Zschech, Ehrenfried, Ho, Paul S.
Type: conference publication
Year of publication: 2011
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft, Reihe 6, Bd. 46, S. 292
URL: http://www.dpg-verhandlungen.de/year/2011/conference/dresden/part/ds/session/7/contribution/2

Influence of Na on the structure of Bi4Ti3O12 films deposited by liquid-delivery spin MOCVD

Author(s): Schwarzkopf, Jutta, Dirsyte, R., Devi, A., Kwasniewski, A., Schmidbauer, M., Wagner, Gerd, Michling, Marcel, Schmeißer, Dieter, Fornari, Robert
Type: Scientific Article ref.
Year of publication: 2011
Source: Thin solid films, S. 5754 - 5759
Volume: 519
Issue/Journal number: 17
ISSN: 0040-6090

Experimental electronic structure of In2O3 and Ga2O3

Author(s): Janowitz, Christoph, Scherer, Valentina, Mohamed, Mansour, Krapf, Alica, Dwelk, Helmut, Manzke, Recardo, Galazka, Zbigniew, Uecker, Reinhard, Irmscher, Klaus, Fornari, Robert, Michling, Marcel, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2011
Source: New Journal of Physics, S. 085014
Volume: 13
Issue/Journal number: 8
ISSN: 1367-2630

Single crystalline Pr2-xYxO3 (x=0-2)dielectrics on Si with tailored electronic and crystallographic structure

Author(s): Seifarth, Olaf, Schubert, Markus Andreas, Giussani, A., Klenov, D. O., Schmeißer, Dieter, Schroeder, Thomas
Type: Scientific Article ref.
Year of publication: 2010
: crystalline; dielectric; structure
First page: 103709
Volume: 108
Issue/Journal number: 10
ISSN: 1089-7550

Band gab determination of P(VDF-TrFE) copolymer film by electron energy loss spectroscopy

Author(s): Mandal, Dipankar, Henkel, Karsten, Müller, Klaus, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2010
Source: Bulletin of Materials Science 33(2010)4, S. 457-461, 0973-7669

In situ studies of the atomic layer deposition of thin HfO2 dielectrics by ultra high vacuum atomic force microscope

Author(s): Kolanek, Krzysztof, Tallarida, Massimo, Karavaev, Konstantin, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2010
: in situ; atomic layer deposition; dielectric; microscope
Source: Thin Solid Films 518(2010)16, S. 4688 - 4691, 0040-6090

Band alignment of high-k/SiO2/Si stacks incorporating Zr and Al oxides prepared by atomic layer deposition

Author(s): Starzyk, Łukasz, Tallarida, Massimo, Schmeißer, Dieter
Type: conference publication
Year of publication: 2010
Source: Proceedings of 2010 International Students and Young Scientists Workshop "Photonics and Microsystems" : International Optoelectronics Workshop : Szklarska Poreba, Poland, 25-27 June, 2010, S.75 - 78, 978-1-4244-8324-2

Localized Gap States in LiCoO2 and their Influence on the Transport Properties in Li-Ion Batteries

Author(s): Schmeißer, Dieter, Schmidt, Stephan, Seibold, Götz, Cherkashinin, Gennady, Jaegermann, Wolfram
Type: Scientific Article ref.
Year of publication: 2010
Source: ECS Transactions, S. 37 - 45
Volume: 25
Issue/Journal number: 35
ISSN: 1938-5862

Atomic layer deposition of HfO2 investigated in situ by means of a noncontact atomic force microscopy

Author(s): Kolanek, Krzysztof, Tallarida, Massimo, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2010
Source: Materials Science Poland 28(2010)3, S. 731-740, 0137-1339

Synchrotron radiation spectroscopy studies of the initial interaction of Chromium and Cobalt with the surface of Titanium Dioxide

Author(s): Müller, Sebastian
Type: doctoralthesis
Year of publication: 2010
: Titanium dioxide; Metal/metal-oxide interaction; Multiplet-calculation; Resonant photoemission
URL: http://opus.kobv.de/btu/volltexte/2010/1891/
URN: urn:nbn:de:kobv:co1-opus-18914

Study of P3HT/PCBM based films by NEXAFS

Author(s): Richter, Matthias, Friedrich, Daniel, Philip, Shine, Paloumpa, Ioanna, Müller, Klaus, Schmeißer, Dieter
Type: conference publication
Year of publication: 2010
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft, Reihe 6, Bd. 45, S. 194
URL: http://www.dpg-verhandlungen.de/year/2010/conference/regensburg/part/df/session/7/contribution/4

Cobalt/nickel mixed oxides - cathode materials for Li-Ion-Batteries

Author(s): Schmidt, Stephan, Schmeißer, Dieter
Type: conference publication
Year of publication: 2010
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft, Reihe 6, Bd. 45, S. 596
URL: http://www.dpg-verhandlungen.de/year/2010/conference/regensburg/part/o/session/45/contribution/6

In-situ analysis of moving reaction fronts for the bistable CO oxidation reaction on noble metal catalyst

Author(s): Schmeißer, Dieter, Müller, Sebastian, Henkel, Karsten, Müller, Klaus, Wehner, Stefan
Type: conference publication
Year of publication: 2010
Publisher name: Frankfurt : Dechema e.V.
: CO oxidation; Ir; Pd; photo electron emission microscopy (PEEM)
Source: Extended Abstracts Book of First International Conference on Materials for Energy, S. 932
ISBN: 978-3-89746-117-8

ALD on high mobility channels: engineering the proper gate stack passivation

Author(s): Sioncke, Sonja, Lin, Hang-Chu, Brammertz, Guy, Delabie, Annelies, Conard, Thierry, Franquet, Alexis, Caymax, Matty, Meuris, Marc, Schmeißer, Dieter, Tallarida, Massimo
Type: Scientific Article ref.
Year of publication: 2010
: ALD; engineering; gate stack; passivation
Source: ECS Transactions, S. 9 - 23
Volume: 33
Issue/Journal number: 2
ISSN: 1938-5862

Atomic Layer Deposition and Characterization of Erbium Oxide-Doped Zirconium Oxid Thin Films

Author(s): Tamm, Aile, Kemell, Marianna, Kozlova, Jekaterina, Sajavaara, Timo, Tallarida, Massimo, Kukli, Kaupo, Sammelselg, V., Ritala, Mikko, Leskelä, Markku
Type: Scientific Article ref.
Year of publication: 2010
: atomic Layer deposition; Erbium; Zirconium; Oxid-Doped
Source: Journal of The Electrochemical Society, S. 193 - 201
Volume: 157
Issue/Journal number: 10

Structure and morphology of Ru films grown by atomic layer deposition from 1-ethyl-1´-methyl-ruthenocene

Author(s): Kukli, Kaupo, Aarik, Jaan, Aidla, Aleks, Uustare, Teet, Jõgi, Indrek, Lu, Jun, Tallarida, Massimo, Kemell, Marianna, Kiisler, Alma- Asta, Ritala, Mikko, Leskelä, Markku
Type: Scientific Article ref.
Year of publication: 2010
: morphology; atomic layer deposition
Source: Journal of Crystal Growth, S. 2025 - 2032
Volume: 312
Issue/Journal number: 12-13
ISSN: 0022-0248
DOI: https://doi.org/10.1016/j.jcrysgro.2010.03.033

Optimization of MFIS structures containing poly(vinylidene-fluoride trifluoroethylene) for non-volatile memory applications

Author(s): Henkel, Karsten, Seime, Bernd, Paloumpa, Ioanna, Müller, Klaus, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2010
Source: Materials Science Poland 28(2010)1, S. 117-128, 0137-1339

Buffer layer investigations on MFIS capacitors consisting of ferroelectric poly[vinylidene fluoride trifluoroethylene]

Author(s): Henkel, Karsten, Seime, Bernd, Paloumpa, Ioanna, Müller, Klaus, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2010
Source: IOP conference series: Materials Science and Engineering 8 (2010) 012036

Band structure and electrical properties of MBE grown HfO2 - based alkaline earth perovskites

Author(s): Dudek, Peter, Lupina, Grzegorz, Kozłowski, Grzegorz, Dabrowski, Jarek Marek, Lippert, Gunther, Müssig, Hans-Joachim, Schmeißer, Dieter, Schroeder, Thomas
Type: conference publication
Year of publication: 2010
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft, Reihe 6, Bd. 45, S. 232
URL: http://www.dpg-verhandlungen.de/year/2010/conference/regensburg/part/ds/session/24/contribution/4

Spectroscopic investigations of P3HT/PCBM films for organic BHJ solar cells

Author(s): Philip, Shine, Richter, Matthias, Friedrich, Daniel, Paloumpa, Ioanna, Müller, Klaus, Schmeißer, Dieter
Type: conference publication
Year of publication: 2010
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft, Reihe 6, Bd. 45, S. 153

Determination of interfacial layers in high-k nanomaterials by ADXPS measurements

Author(s): Wyrodek, Jakub, Tallarida, Massimo, Weisheit, Martin, Schmeißer, Dieter
Type: conference publication
Year of publication: 2010
Source: Proceedings of 2010 International Students and Young Scientists Workshop "Photonics and Microsystems" : International Optoelectronics Workshop : Szklarska Poreba, Poland, 25-27 June, 2010, S.89 -92, 978-1-4244-8324-2

Buffer layer incestigaions on MFIS capacitors consisting of ferroelectric poly[vinylidene fluoride trifluoroethylene]

Author(s): Henkel, Karsten, Seime, Bernd, Paloumpa, Ioanna, Müller, Klaus, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2010
: MFIS capacitors; ferroelectric
Source: IOP conference series : Materials Science and Engineering, S. 012036
Volume: 8
Issue/Journal number: 1
ISSN: 1757-899X

Stochastic aspects of pattern formation during the catalytic oxidation of CO on Pd(111)

Author(s): Wehner, Stefan, Karpitschka, Stefan, Burkov, Yevgen, Schmeißer, Dieter, Küppers, Jürgen, Brand, Helmut R.
Type: Scientific Article ref.
Year of publication: 2010
: stochastic; pattern; catalytic oxidation
Source: Physica : D 239(2010)11, S. 746-751, 0167-2789

The band gab and band offset in ultrathin oxide-semiconductor heterostructures

Author(s): Schmeißer, Dieter, Henkel, Karsten, Bergholz, Matthias, Tallarida, Massimo
Type: Scientific Article ref.
Year of publication: 2010
: band gab; offset; ultrathin; heterostructures
Source: Superlattices and Microstructures 47(2010)3, S. 369-376, 1096-3677

Determination of interfacial layers in high - k ALD nanolaminate materials by ARXPS and SRXPS measurements

Author(s): Wyrodek, Jakub, Tallarida, Massimo, Schmeißer, Dieter, Weisheit, Martin
Type: conference publication
Year of publication: 2010
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft, Reihe 6, Bd. 45, S. 232
URL: http://www.dpg-verhandlungen.de/year/2010/conference/regensburg/part/ds/session/24/contribution/6

Performance of organic solar cells with a ferroelectric component

Author(s): Kachel, Krzysztof, Richter, Matthias, Philip, Shine, Paloumpa, Ioanna, Müller, Klaus, Schmeißer, Dieter
Type: conference publication
Year of publication: 2010
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft, Reihe 6, Bd. 45, S. 153
URL: http://www.dpg-verhandlungen.de/year/2010/conference/regensburg/part/cpp/session/27/contribution/6

Characterization of ion beam modified polyimide layers

Author(s): Friedrich, Daniel, Michling, Marcel, Schmeißer, Dieter, Koval, Yuri, Müller, Paul
Type: conference publication
Year of publication: 2010
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft, Reihe 6, Bd. 45, S. 247
URL: http://www.dpg-verhandlungen.de/year/2010/conference/regensburg/part/ds/session/38/contribution/10

Electrically optimized high-κ metal gate MOSFET by specific modification of the band alignment

Author(s): Starzyk, Łukasz, Tallarida, Massimo, Schmeißer, Dieter
Type: conference publication
Year of publication: 2010
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft, Reihe 6, Bd. 45, S. 231
URL: http://www.dpg-verhandlungen.de/year/2010/conference/regensburg/part/ds/session/23/contribution/3

Spectroscopic investigations of interaction between C60 fullerene and nitrogen atom from amine group

Author(s): Klocek, Jolanta, Friedrich, Daniel, Zagorodniy, Kostyantyn, Schmeißer, Dieter
Type: conference publication
Year of publication: 2010
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft, Reihe 6, Bd. 45, S. 231
URL: http://www.dpg-verhandlungen.de/year/2010/conference/regensburg/part/ds/session/23/contribution/1

In-situ EELS and UPS measurements on HfO2 ALD layers

Author(s): Michling, Marcel, Tallarida, Massimo, Kolanek, Krzysztof, Schmeißer, Dieter
Type: conference publication
Year of publication: 2010
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft, Reihe 6, Bd. 45
URL: http://www.dpg-verhandlungen.de/year/2010/conference/regensburg/part/ds/session/24/contribution/5

Atomic layer deposition of HfO2 onto SiO2 substrates investigated in-situ by non-contact UHV/AFM

Author(s): Kolanek, Krzysztof, Karavaev, Konstantin, Tallarida, Massimo, Schmeißer, Dieter
Type: conference publication
Year of publication: 2010
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft, Reihe 6, Bd. 45, S. 248

Synchrotron radiation spectroscopy studies of the initial interaction between cobalt and titanium dioxide

Author(s): Müller, Sebastian, Schmeißer, Dieter
Type: conference publication
Year of publication: 2010
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft, Reihe 6, Bd. 45, S. 652

Fullerene based materials for ultra-low-k application

Author(s): Broczkowska, K., Klocek, Jolanta, Friedrich, Daniel, Henkel, Karsten, Kolanek, Krzysztof, Urbanowicz, A., Schmeißer, Dieter, Miller, M., Zschech, Ehrenfried
Type: conference publication
Year of publication: 2010
Publisher name: Piscataway, NJ : IEEE
Source: International Students and Young Scientists Workshop "Photonics and Microsystems", Szklarska, Poreba, Poland, 25 - 27 June 2010, S. 39 - 43
ISBN: 978-1-4244-8324-2

Local anodic oxidation by atomic force microscopy for nano-Raman strain measurements on silicon-germanium thin films

Author(s): Kolanek, Krzysztof, Hermann, Peter, Dudek, Piotr T., Gotszalk, Teodor, Chumakov, Dmytro, Weisheit, Martin, Hecker, Michael, Zschech, Ehrenfried
Type: Scientific Article ref.
Year of publication: 2010
: oxidation; microscope; measurements; thin films
Source: Thin Solid Films, S. 3267 - 3272
Volume: 518
Issue/Journal number: 12
ISSN: 0040-6090

Scaling effects on microstructure and reliability for cu interconnects

Author(s): Ho, Paul S., Zschech, Ehrenfried, Schmeißer, Dieter, Meyer, Moritz Andreas, Huebner, Rene, Hauschildt, Meike, Zhang, Lijuan, Gall, Martin, Kraatz, Matthias
Type: Scientific Article ref.
Year of publication: 2010
: scaling; microstructure; interconnects
Source: International journal of materials research 101(2010)2, S. 216-227, 0179-4841

Interface Reactions in Ultrathin Functional Dielectric Films

Author(s): Schmeißer, Dieter, Henkel, Karsten, Müller, Klaus, Tallarida, Massimo
Type: Scientific Article ref.
Year of publication: 2009
: ultrathin; dielectric
Source: Advanced Engineering Materials 11(2009)4, S. 269-274, 1527-2648

Interface screening and imprint in pol(vinylidene fluoride/trifluoroethylene) ferroelectric field effect transistors

Author(s): Lazareva, I., Koval, Yuri, Müller, P., Müller, Klaus, Henkel, Karsten, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2009
: interface; screening; transistors
Source: Journal of Applied Physics 105(2009)5, 054110, 1089-7550

Microscopic and spectroscopic characterization of interfaces and dielectric layers for OFET devices

Author(s): Müller, Klaus, Burkov, Yevgen, Mandal, Dipankar, Henkel, Karsten, Paloumpa, Ioanna, Goryachko, Andriy, Schmeißer, Dieter
Editor(s): Wöll, Christof
Type: part of book (chapter)
Year of publication: 2009
Publisher name: Weinheim : Wiley-VCH
: microscopic; spectrocsopic; dielectric
Source: Organic Electronics : structural and Electronic Properties of OFETs, S. 445 - 468
ISBN: 978-3-527-40810-8

HfO2/Si interface formation in atomic layer deposition films: an in situ investigation

Author(s): Tallarida, Massimo, Karavaev, Konstantin, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2009
: atomic layer deposition
Source: Journal of Vacuum Science and Technology B 27(2009)1, S. 300-304

Nachweis von Aerosolen (<1µm) mit Schwingquarzimpedanzspektroskopie

Author(s): Schwiertz, Carola, Henkel, Karsten, Blei, S., Heidenreich, R., Schmeißer, Dieter
Type: part of book (chapter)
Year of publication: 2009
: Schwingquarzimpedanzspektroskopie
Source: Gerlach, Gerald (Hrsg.): 9. Dresdner Sensor-Symposium : Dresden, 07.-09. Dezember 2009. - Dresden : TUDpress, 2009, S. 217 - 220, 978-3-941298-44-6 (Dresdner Beiträge zur Sensorik ; 39)

Electrical investigations on metal/ferroelectric/insulator/semiconductor structures using Poly[vinylidene fluoride trifluoroethylene] as ferroelectric layer for organic nonvolatile memory applications

Author(s): Henkel, Karsten, Lazareva, I., Mandal, Dipankar, Paloumpa, Ioanna, Müller, Klaus, Koval, Yuri, Müller, P., Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2009
: metal; frerroelectric; insulator; semiconductor
Source: Journal of Vacuum Science and Technology B 27(2009)1, S. 504-507

In situ measurements of the atomic layer deposition of high-k dielectrics by atomic force microscope for advanced microsystems

Author(s): Kolanek, Krzysztof, Tallarida, Massimo, Karavaev, Konstantin, Schmeißer, Dieter
Type: conference publication
Year of publication: 2009
Publisher name: Piscataway, NJ : IEEE
: atomic layer deposition; microsystems; high-k dielectrics
Source: International Students and Young Scientists Workshop "Photonics and Microsystems", 2009, 25 - 27 June 2009, Harz University, Wernigerode, Germany, S. 47 - 51
ISBN: 978-1-4244-4303-1

Untersuchung der ultraschnellen Elektronentransferdynamik an organisch/anorganischen Grenzflächen unter Einsatz von Femtosekundenspektroskopie im Ultrahochvakuum

Author(s): Neubauer, Antje
Type: doctoralthesis
Year of publication: 2009
: Halbleiteroberfläche; Perylen; Synthetischer Farbstoff; Absorptionsspektroskopie; Elektronentransfer
URL: http://opus4.kobv.de/opus4-btu/frontdoor/index/index/docId/711
URN: urn:nbn:de:kobv:co1-opus-7858

On the band gaps and electronic structure of thin single crystalline praseodymium oxide layers on Si(111)

Author(s): Schmeißer, Dieter, Müller, S., Seifarth, Olaf, Dabrowski, Jarek Marek, Müssig, Hans-Joachim, Schroeder, Thomas
Type: Scientific Article ref.
Year of publication: 2009
: band gabs; electronic structure; oxide layers
Source: Journal of vacuum science & technology / B, S. 271 - 276
Volume: 27
Issue/Journal number: 1

Optimization of the AION buffer layer for PrxOy/Si stacks

Author(s): Henkel, Karsten, Burkov, Yevgen, Karavaev, Konstantin, Torche, Mohamed, Schwiertz, Carola, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2009
: AION buffer
Source: Journal of Vacuum Science and Technology : B 27(2009)1, S. 253-257

Synchrotron radiation spectroscopy studies of ultrathin chromium films on titanium dioxide

Author(s): Müller, Sebastian, Schmeißer, Dieter
Type: conference publication
Year of publication: 2009
Publisher name: Piscataway, NJ : IEEE
: synchrotron; radiation; spectroscopy; ultrathin; titanium; chromium
Source: International Students and Young Scientists Workshop "Photonics and Microsystems", 2009, 25 - 27 June 2009, Harz University, Wernigerode, Germany, S. 64 - 68
ISBN: 978-1-4244-4303-1

Nobel "in-situ2" Approach to Modified ALD Processes for Nano-functional Metals Oxide Films

Author(s): Tallarida, Massimo, Karavaev, Konstantin, Kolanek, Krzysztof, Schmeißer, Dieter
Type: conference publication
Year of publication: 2009
: in-situ2; ALD; nano-functional
Source: Meeting Abstracts-Electrochemical Society 902 (2009) 2036, ISSN 1091-8213

Novel "In-situ2" Approach to Modified ALD Processes for Nano-functional Metal Oxide Films

Author(s): Tallarida, Massimo, Karavaev, Konstantin, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2009
Source: ECS Transactions 25(2009)4, S. 253-261, 1938-5862

Evolution of the interfacial layer during the atomic layer deposition of HfO2 on Si/SiO2 substrates

Author(s): Karavaev, Konstantin, Tallarida, Massimo, Schmeißer, Dieter
Type: conference publication
Year of publication: 2009
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft, Reihe 6, Bd. 44, S. 160

In-Situ Studies of ALD Growth of Hafnium Oxide Films

Author(s): Karavaev, Konstantin, Kolanek, Krzysztof, Tallarida, Massimo, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2009
Source: Advanced Engineering Materials 11(2009)4, S. 264-268, 1615-7508

Electrical Investigations on Praseodymium Oxide/Aluminum Oxynitride Containing Metal-Insulator-Semiconductor Stacks and on Metal-Ferroelectric-Insulator-Semiconductor Structures Consisting of Poly[vinylidene fluoride trifluoroethylene]

Author(s): Henkel, Karsten
Type: doctoralthesis
Year of publication: 2009
Publisher name: Aachen : Shaker
: Pr2O3; P(VDF-TrFE); capacitance-voltage; conductance-voltage; current-voltage; dielectric properties; high-k; feFET
ISBN: 978-3-8322-8404-6

In-situ investigations of the atomic layer deposition of HfO2 with UHV/AFM

Author(s): Kolanek, Krzysztof, Karavaev, Konstantin, Tallarida, Massimo, Schmeißer, Dieter
Type: conference publication
Year of publication: 2009
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft, Reihe 6, Bd. 44, S. 160
URL: http://www.dpg-verhandlungen.de/year/2009/conference/dresden/part/ds/session/11/contribution/6

Study of polyimide after graphitization with low-energy Ar+ Ion irradiation by NEXAFS

Author(s): Michling, Marcel, Friedrich, Daniel, Schmeißer, Dieter, Koval, Yuri, Müller, Paul
Type: conference publication
Year of publication: 2009
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft, Reihe 6, Bd. 44, S. 147
URL: http://www.dpg-verhandlungen.de/year/2009/conference/dresden/part/df/session/15/contribution/5

Temperature dependence of organic solar cell parameters

Author(s): Richter, Matthias, Müller, Klaus, Philip, Shine, Paloumpa, Ioanna, Henkel, Karsten, Schmeißer, Dieter
Type: conference publication
Year of publication: 2009
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Bd. 44, S. 671
URL: http://www.dpg-verhandlungen.de/year/2009/conference/dresden/part/syop/session/4/contribution/2

Investigation of ultra-thin Chromium layers on Titanium Dioxide by resonant photoemission

Author(s): Müller, Sebastian, Schmeißer, Dieter
Type: conference publication
Year of publication: 2009
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft, Reihe 6, Bd. 44, S. 453
URL: http://www.dpg-verhandlungen.de/year/2009/conference/dresden/part/o/session/3/contribution/5

Basics of the atomic layer deposition of HfO2 onto Si/SiO2 substrates: in-situ investigations with XPS, XAS and UHV-AFM

Author(s): Tallarida, Massimo, Karavaev, Konstantin, Kolanek, Krzysztof, Schmeißer, Dieter
Type: conference publication
Year of publication: 2009
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Bd. 44, S. 159
URL: http://www.dpg-verhandlungen.de/year/2009/conference/dresden/part/ds/session/11/contribution/4

In-situ experimental approach to the study of atomic layer deposition with atomic force microscope, X-ray photoelectron and X-ray absorption spectroscopy

Author(s): Tallarida, Massimo, Karavaev, Konstantin, Kolanek, Krzysztof, Schmeißer, Dieter
Type: conference publication
Year of publication: 2009
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Bd. 44, S. 176
URL: http://www.dpg-verhandlungen.de/year/2009/conference/dresden/part/ds/session/26/contribution/15

The electronic band diagram of thin PrO2(111) / Pr-silicate buffers on Si(111) and its relevance to dielectric properties

Author(s): Seifarth, Olaf, Walczyk, Christian, Lupina, Grzegorz, Zaumseil, Peter, Schmeißer, Dieter, Müssig, Hans-Joachim, Schroeder, Thomas
Type: conference publication
Year of publication: 2009
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft, Reihe 6, Bd. 44, S. 136
URL: http://www.dpg-verhandlungen.de/year/2009/conference/dresden/part/df/session/6/contribution/5

Dynamical X-ray Microscopy Study of Stress-Induced Voiding in Cu Interconnects

Author(s): Heim, S., Friedrich, Daniel, Guttmann, P., Rehbein, S., Chumakov, Dmytro, Ritz, Y., Schneider, G., Schmeißer, Dieter, Zschech, Ehrenfried
Type: conference publication
Year of publication: 2009
: x-ray; Microscopy; Interconnects
Source: AIP conference proceedings 1143(2009)1, S. 20-30, 1551-7616
URL: http://link.aip.org/link/?APCPCS/1143/20/1

Geometry and Microstructure Effect on EM-Induced Copper Interconnect Degradation

Author(s): Zschech, Ehrenfried, Ho, O. S., Schmeißer, Dieter, Meyer, Moritz Andreas, Vairagar, A. V., Schneider, G., Hauschildt, Meike, Kraatz, Matthias, Sukharev, V.
Type: Scientific Article ref.
Year of publication: 2009
: Microstructure
Source: IEEE Transactions on Device and Materials Reliability, S. 20 - 30
Volume: 9
Issue/Journal number: 1
ISSN: 1530-4388
URL: http://ieeexplore.ieee.org/xpls/icp.jsp?arnumber=4796372

Study of C60 based films formation by NEXAFS

Author(s): Friedrich, Daniel, Michling, Marcel, Klocek, Jolanta, Schmeißer, Dieter, Avdoshenko, Stas, Chumakov, Dmytro, Zschech, Ehrenfried
Type: conference publication
Year of publication: 2009
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft, Reihe 6, Bd. 44, S. 145

Characterization of oxidic and organic materials with synchrotron radiation based XPS and XAS

Author(s): Schmeißer, Dieter, Tallarida, Massimo, Henkel, Karsten, Müller, Klaus, Mandal, Dipankar, Chumakov, Dmytro, Zschech, Ehrenfried
Type: Scientific Article ref.
Year of publication: 2009
: oxidic; organic; materials; synchrotron radiation; XPS; XAS
Source: Materials Science Poland 27(2009)1, S. 141-157

Electromigration simulation for on-chip Cu interconnects

Author(s): Kraatz, Matthias, Schmeißer, Dieter, Zschech, Ehrenfried, Ho, Paul S.
Type: conference publication
Year of publication: 2009
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft, Reihe 6, Bd. 44, S. 161
URL: http://www.dpg-verhandlungen.de/year/2009/conference/dresden/part/ds/session/13/contribution/4

The stability of C60 and its derivatives upon handling in microsystems technologies

Author(s): Klocek, Jolanta, Friedrich, Daniel, Schmeißer, Dieter, Hecker, Michael, Zschech, Ehrenfried
Type: conference publication
Year of publication: 2009
Publisher name: Piscataway, NJ : IEEE
: c60; derivatices
Source: International Students and Young Scientists Workshop "Photonics and Microsystems", 2009, 25 - 27 June 2009, Harz University, Wernigerode, Germany, S. 43 - 46
ISBN: 978-1-4244-4303-1

Resistive memory switching in perovskite-derivative single crystals

Author(s): Müller, P., Chowdhury, F., Dremov, V., Koval, Yuri, Lichtenberg, F., Müller, S., Schmeißer, Dieter, Pentcheva, R.
Type: conference publication
Year of publication: 2008
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft, Reihe 6, Bd. 43, S. 818
URL: http://www.dpg-verhandlungen.de/year/2008/conference/berlin/part/synf/session/1/contribution/11

Influence of Annealing on the Structure and Stoichiometry of Europium-Doped Titanium Dioxide Thin Films

Author(s): Schmeißer, Dieter, Domaradzki, Jarosław, Kaczmarek, Danuta, Borkowska, Angnieszka, Müller, Sebastian
Type: article
Year of publication: 2008
Source: Vacuum 82(2008)10, S. 1007-1012, 0042-207X

Microscopic and Spectroscopic Characterization of Interfaces and Dielectric Layers for OFET Devices

Author(s): Schmeißer, Dieter, Burkov, Yevgen, Paloumpa, Ioanna, Mandal, Dipankar, Henkel, Karsten
Type: article
Year of publication: 2008
Source: Physica Status Solidi : A 205(2008)3, S. 600-611, 1862-6300

Al-Oxynitride Interfacial Layer Investigations for PrxOy on SiC and Si

Author(s): Schmeißer, Dieter, Henkel, Karsten, Karavaev, Konstantin
Type: article
Year of publication: 2008
Source: Journal of Physics : Conference series 94(2008) 012004, 1742-6588

Application of r.f. plasma ultrashallow nitrogen ion implantation for pedestal oxynitride layer formation

Author(s): Bieniek, Tomasz, Beck, Romuald B., Jakubowski, Andrzej, Konarski, Piotr, Cwil, M., Hoffmann, Patrick, Schmeißer, Dieter
Type: article
Year of publication: 2008
: ultrashallow; oxynitride
Source: Vacuum 82(2008)10, S. 1020-1028, 0042-207X

Interface chemistry of high-k PrxAl2-xO3 (x=2-0) dielectrics on TiN for dynamic random access memory applications

Author(s): Sohal, Rakesh, Lupina, Grzegorz, Lippert, Gunther, Wenger, Christian, Seifarth, Olaf, Schröder, Thomas, Tallarida, Massimo, Schmeißer, Dieter
Type: article
Year of publication: 2008
: high-k; dielectric; random
Source: BESSY annual report 2007, S. 197-198

Soft X-ray emission electron microscopy: chemical state microscopy from interface and bulk

Author(s): Zimina, A., Batchelor, David R., Eisebitt, S., Schmeißer, Dieter, Shukalov, A., Eberhardt, W.
Type: article
Year of publication: 2008
: x-ray; microscopy; interface; bulk
Source: Surface and Interface Analysis 40(2008)5, S. 958-960, 1096-9918

Properties of Cr deposited on TiO2 thin films

Author(s): Müller, Sebastian, Schmeißer, Dieter
Type: article
Year of publication: 2008
: cr; TiO2
Source: BESSY annual report 2007, S. 433-434

Band gap and electronic structure determination with XAS and UPS of thin Pr-oxide films on Si(111)

Author(s): Seifarth, Olaf, Wilke, A., Walczyk, Christian, Dabrowski, Jarek Marek, Zaumseil, Peter, Schmeißer, Dieter, Müssig, Hans-Joachim, Schroeder, Thomas
Type: conference publication
Year of publication: 2008
: band gab; XAS; UPS; Si(111)
Source: Proceedings of 15th Workshop on Dielectrics in Microelectronics, Bad Saarow, 23 - 25 June 2008, Bad Saarow (Berlin), S. 285 - 286

Electrical investigations on MFIS structures consisting P[VDF/TrFE] as ferro-electric layer for non-volatile memory applications

Author(s): Henkel, Karsten, Mandal, Dipankar, Seime, Bernd, Paloumpa, Ioanna, Lazareva, I., Müller, Klaus, Schmeißer, Dieter
Type: conference publication
Year of publication: 2008
: MFIS, P[VDF/TrFE]; ferroelectric; non-volatile
Source: Proceedings of 15th Workshop on Dielectrics in Microelectronics, Bad Saarow, 23 - 25 June 2008, Bad Saarow (Berlin), S. 159 - 160

Al-Oxynitride as a buffer layer for high-k dielectrics

Author(s): Henkel, Karsten, Burkov, Yevgen, Bergholz, Matthias, Karavaev, Konstantin, Sohal, Rakesh, Torche, Mohamed, Schmeißer, Dieter
Type: conference publication
Year of publication: 2008
: buffer layer; high-k; dielectric
Source: Proceedings of 15th Workshop on Dielectrics in Microelectronics, Bad Saarow, 23 - 25 June 2008, Bad Saarow (Berlin), S. 161 - 162

Ultra-thin films of a ferroelectric copolymer: P(VDF-TrFE)

Author(s): Mandal, Dipankar
Type: doctoralthesis
Year of publication: 2008
: Grenzflächenchemie; Photoelektronenspektroskopie; Polymerfilm
URL: http://opus4.kobv.de/opus4-btu/frontdoor/index/index/docId/439
URN: urn:nbn:de:kobv:co1-opus-5628

Study of silicon/oxides interfaces by means of Si2p resonant photoemission

Author(s): Tallarida, Massimo, Schmeißer, Dieter
Type: article
Year of publication: 2008
: photoemission; Si2p
Source: Thin Solid Films 517(2008)1, S. 447-449, 0040-6090

The initial atomic layer deposition of HfO2/Si(001) as followed in situ by synchrotron radiation photoelectron spectroscopy

Author(s): Tallarida, Massimo, Karavaev, Konstantin, Schmeißer, Dieter
Type: article
Year of publication: 2008
: synchrotron; photoelectron; HfO2
Source: Journal of applied physics 104(2008)6, 064116, 1089-7550

Ferroelectric properties of spin-coated ultrathin (down to 10nm) copolymer films

Author(s): Müller, Klaus, Mandal, Dipankar, Henkel, Karsten, Paloumpa, Ioanna, Schmeißer, Dieter
Type: article
Year of publication: 2008
: ferroelectric; spin-coated; copolymer
Source: Applied Physics Letters 93(2008)11, 112901, 1077-3118

Ferromagnetism and magnetic clusters in cobalt-doped ZnO

Author(s): Opel, Matthias, Nielsen, Karl-Wilhelm, Bauer, Sebastian, Goennenwein, Sebastian T. B., Gross, Rudolf, Cezar, Julio C., Schmeißer, Dieter, Simon, Jürgen, Mader, Werner
Type: conference publication
Year of publication: 2008
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft, Reihe 6, Bd. 43, S. 430
URL: http://www.dpg-verhandlungen.de/year/2008/conference/berlin/part/ma/session/3/contribution/6

On the electronic and dielectric characterisation of thin cubic PrO2 layers on Silicon

Author(s): Seifarth, Olaf, Walczyk, Christian, Lupina, Grzegorz, Dabrowski, Jaroslaw, Weidner, Günter, Zaumseil, Peter, Schmeißer, Dieter, Storck, Peter, Müssig, Hans-Joachim, Schroeder, Thomas
Type: conference publication
Year of publication: 2008
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft, Reihe 6, Bd. 43, S. 196
URL: http://www.dpg-verhandlungen.de/year/2008/conference/berlin/part/df/session/12/contribution/6

Field effect transistor of graphitized polyimide with P(VDF-TrFE) as gate insulator

Author(s): Lazareva, I., Koval, Yuri, Müller, P., Paloumpa, Ioanna, Müller, Klaus, Schmeißer, Dieter
Type: conference publication
Year of publication: 2008
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft, Reihe 6, Bd. 43, S. 195
URL: http://www.dpg-verhandlungen.de/year/2008/conference/berlin/part/df/session/11/contribution/6

C(V) and C(t) measurements on MFIS structures consisting P[VDF/TrFE] as ferroelectric layer

Author(s): Henkel, Karsten, Seime, Bernd, Paloumpa, Ioanna, Müller, Klaus, Schmeißer, Dieter
Type: conference publication
Year of publication: 2008
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Bd. 43, S. 828
URL: http://www.dpg-verhandlungen.de/year/2008/conference/berlin/part/sysa/session/4/contribution/7

X-ray photoemission spectroscopy of Aluminium Oxynitride on Si(001) and the rise as buffer layers

Author(s): Burkov, Yevgen, Henkel, Karsten, Schmeißer, Dieter
Type: conference publication
Year of publication: 2008
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Bd. 43, S. 243
URL: http://www.dpg-verhandlungen.de/year/2008/conference/berlin/part/ds/session/23/contribution/5

Band gap determination of thin Praseodymiumoxide layers on Aluminiumoxynitride films

Author(s): Bergholz, Matthias, Schmeißer, Dieter
Type: conference publication
Year of publication: 2008
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Bd. 43, S. 243
URL: http://www.dpg-verhandlungen.de/year/2008/conference/berlin/part/ds/session/23/contribution/4

Nanosized superparamagnetic precipitates in cobalt-doped ZnO

Author(s): Opel, Matthias, Nielsen, Karl-Wilhelm, Bauer, Sebastian, Goennenwein, Sebastian T. B., Gross, Rudolf, Cezar, Julio C., Schmeißer, Dieter, Simon, Jürgen, Mader, Werner
Type: Scientific Article ref.
Year of publication: 2008
: nanosized; superparamagnetic
Source: The European Physical Journal : B, S. 437 - 444
Volume: 63
Issue/Journal number: 4
ISSN: 1434-6036

Al-Oxyxynitride interfacial layer investigations for PrXOY on SiC and Si

Author(s): Henkel, Karsten, Karavaev, Konstantin, Torche, Mohamed, Schwiertz, Carola, Burkov, Yevgen, Schmeißer, Dieter
Type: article
Year of publication: 2008
Source: Journal of Physics: Conference Series 94 (2008) 012004

Deposition of reactive and non-reactive metals on titanium dioxide - chromium and cobalt

Author(s): Müller, S., Schmeißer, Dieter
Type: part of book (chapter)
Year of publication: 2008
Source: Students and Young Scientists Workshop "Photonics and Microsystems", IEEE, 2008, S. 53-58., 978-1-4244-4971-2.

Dipole orientation of the P[VDF-TrFE] co-polymer films: A NEXAFS study

Author(s): Mandal, Dipankar, Müller, Klaus, Schmeißer, Dieter
Type: conference publication
Year of publication: 2008
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Bd. 43, S. 840
URL: http://www.dpg-verhandlungen.de/year/2008/conference/berlin/part/sysa/session/5/contribution/76

Interface reactions of ferroelectric copolymer layers with different electrode materials

Author(s): Müller, Klaus, Mandal, Dipankar, Henkel, Karsten, Paloumpa, Ioanna, Schmeißer, Dieter
Type: conference publication
Year of publication: 2008
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Bd. 43, S. 830
URL: http://www.dpg-verhandlungen.de/year/2008/conference/berlin/part/sysa/session/5/contribution/16

Direct Observation of d2L2 Charge Transfer States in TiO2 thin films by Resonant Photoelectron Spectroscopy

Author(s): Müller, Sebastian, Schmeißer, Dieter
Type: conference publication
Year of publication: 2008
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft, Reihe 6, Bd. 43, S. 592
URL: http://www.dpg-verhandlungen.de/year/2008/conference/berlin/part/o/session/32/contribution/3

In-situ ALD growth of Hafnium oxide films

Author(s): Karavaev, Konstantin, Tallarida, Massimo, Schmeißer, Dieter, Zschech, Ehrenfried
Type: conference publication
Year of publication: 2008
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Bd. 43, S. 244
URL: http://www.dpg-verhandlungen.de/year/2008/conference/berlin/part/ds/session/23/contribution/12

HfO2 ALD-growth studied by in situ photoemission

Author(s): Tallarida, Massimo, Karavaev, Konstantin, Schmeißer, Dieter, Zschech, Ehrenfried
Type: conference publication
Year of publication: 2008
: ald; photoemission
Source: Proceedings of 15th Workshop on Dielectrics in Micoelectronics, Bad Saarow, 23 - 25 June 2008, S. 289 - 290

Photoemission and absorption spectroscopy for in situ investigations of the ALD growth

Author(s): Tallarida, Massimo, Karavaev, Konstantin, Schmeißer, Dieter, Zschech, Ehrenfried
Type: conference publication
Year of publication: 2008
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft, Reihe 6, Bd. 43, S. 242
URL: http://www.dpg-verhandlungen.de/year/2008/conference/berlin/part/ds/session/22/contribution/5

Novel Carbon-cage based ultralow-k materials: Modelling and first experiments

Author(s): Zagorodniy, Kostyantyn, Chumakov, Dmytro, Täschner, Christine, Lukowiak, Anna, Stegmann, Heiko, Schmeißer, Dieter, Geisler, Holm, Engelmann, Hans-Jürgen, Hermann, Helmut, Zschech, Ehrenfried
Type: Scientific Article not ref.
Year of publication: 2008
: carbon-cage; ultralow-k
Source: IEEE Transaction on Semiconductor Manufacturing 21(2008)4, S. 646-660, 0894-6507
DOI: https://doi.org/10.1109/TSM.2008.2005396

Nano-scale analysis using synchrotron-radiation: Applications in the semiconductor industry

Author(s): Zschech, Ehrenfried, Geisler, Holm, Rinderknecht, Jochen, Schneider, Gerd, Spolenak, Ralph, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2008
: synchrotron-radiation; semiconductor
Source: Current nanoscience, S. 256 - 266
Volume: 4
Issue/Journal number: 3
ISSN: 1573-4137

Influence of the Substrate on the Pattern Formation of a Surface Reaction

Author(s): Schmeißer, Dieter, Wehner, Stefan, Hoffmann, Patrick, Brand, Helmut R., Küppers, Jürgen
Editor(s): Descalzi, Orazio
Type: conference publication
Year of publication: 2007
Publisher name: Melville, New York : AIP Publishing
Source: Nonequilibrium statistical mechanics and nonlinear physics, XV Conference on Nonequilibrium Statistical Mechanics and Nonlinear Physics, Mar del Plata, Argentina, 4 - 8 December 2006, S. 121 - 126
ISBN: 978-0-7354-0421-2
: AIP conference proceedings ; 913,1

Ferromagnetic Semiconducting EuO Nanorods

Author(s): Schmeißer, Dieter, Bierman, Matthew J.
Type: article
Year of publication: 2007
Source: Advanced Materials 19(2007)18, S. 2677-2681, 0935-9648

Composition and Electrical Properties of Ultra-Thin SiOxNy Layers Formed by rf Plasma Nitrogen Implantation/Plasma Oxidation Processes

Author(s): Beck, Romuald B., Hoffmann, Patrick, Schmeißer, Dieter, Bieniek, Tomasz, Jakubowski, Andrzej
Type: article
Year of publication: 2007
Source: Journal of Telecommunications and Information Technology 3(2007)S. 9 -15, 1509-4553

Preparation and Characterization of TiO2 Thin Films and Cr and Co Doped TiO2 Thin Films

Author(s): Müller, Sebastian, Seibold, Götz, Schmeißer, Dieter
Editor(s): Vierhaus, Heinrich Theodor
Type: article
Year of publication: 2007
Source: Computer Science Reports (2007)3, S. 7-12, 1437-7969

Dielectric Buffer Layer (Aluminium Oxynitride/AlON) for Ultrathin High-k Materials

Author(s): Burkov, Yevgen
Editor(s): Vierhaus, Heinrich Theodor
Type: article
Year of publication: 2007
Source: Computer Science Reports (2007)3, S. 21-24, 1437-7969

Study of Bulk and Interface Defects in Silicon Oxide with X-ray Absorption Spectroscopy

Author(s): Tallarida, Massimo, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2007
Source: Materials Science and Engineering : B, S. 23 - 26
Volume: 144
Issue/Journal number: 1-3
ISSN: 0921-5107

Comparison of Composition of Ultra-Thin Silicon Oxynitride Layers´ fabricated by PECVD and Ultrashallow rf Plasma Ion Implantation

Author(s): Schmeißer, Dieter, Mroczynski, Robert, Bieniek, Tomasz
Type: article
Year of publication: 2007
Source: Journal of Telecommunications and Information Technology 3(2007)S. 20-24,1509-4553

The Influence of Annealing (900 Grad C) of Ultra-Thin PECVD Silicon Oxynitride Layers

Author(s): Mroczynski, Robert, Hoffmann, Patrick, Schmeißer, Dieter
Type: article
Year of publication: 2007
Source: Journal of Telecommunications and Information Technology 3(2007)S. 16-19, 1509-4553

Synchrotron radiation x-ray photoelectron spectroscopy study on the interface chemistry of high-k PrxAl2-xO3 (x=0-2) dielectrics on TiN for dynamic random access memory applications

Author(s): Schroeder, Thomas, Lupina, Grzegorz, Seifarth, Olaf, Tallarida, Massimo, Schmeißer, Dieter
Type: Scientific Article not ref.
Year of publication: 2007
Source: Journal of Applied Physics, S. 014103
Volume: 102
Issue/Journal number: 1
ISSN: 0021-8979

Elektronische Struktur dünner Halbleiterfilme (Chalkopyrite) als Absorbermaterialien für Dünnschichtsolarzellen

Author(s): Lehmann, Carsten
Type: doctoralthesis
Year of publication: 2007
: Photovoltaik; Dünnschichtsolarzelle
URL: http://opus.kobv.de/btu/volltexte/2008/431/
URN: urn:nbn:de:kobv:co1-opus-4319

Al-oxynitride buffer layer facilities for PrOx/SiC interfaces

Author(s): Henkel, Karsten, Sohal, Rakesh, Schmeißer, Dieter, Schwiertz, Carola, Burkov, Yevgen, Torche, Mohamed
Type: article
Year of publication: 2007
Source: MRS Proceedings 996, 2007, H05-23

Metallic nickel nanorod arrays embedded into ordered block copolymer templates

Author(s): Seifarth, Olaf, Burkov, Yevgen, Schmeißer, Dieter, Stamm, Manfred
Type: Scientific Article not ref.
Year of publication: 2007
Source: Thin Solid Films, S. 6552 - 6556
Volume: 515
Issue/Journal number: 16
ISSN: 0040-6090

No interfacial layer for PEDOT electrodes on PVDF: Characterization of reactions at the interface P(VDF/TrFE)/Al and P(VDF/TrFE)/PEDOT:PSS

Author(s): Müller, Klaus, Mandal, Dipankar, Schmeißer, Dieter
Type: article
Year of publication: 2007
Source: MRS Proceedings 997(2007)I6-02

Organic field effect transistors with ferroelectric hysteresis

Author(s): Müller, Klaus, Henkel, Karsten, Schmeißer, Dieter
Type: article
Year of publication: 2007
Source: Thin Solid Films 515(2007)19, S. 7683 - 7687, 0040-6090

Buffer layer investigation of MFIS stacks with an organic ferroelectric layer

Author(s): Seime, Bernd, Henkel, Karsten, Paloumpa, Ioanna, Müller, Klaus, Schmeißer, Dieter
Type: conference publication
Year of publication: 2007
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Bd. 42, S. 216
URL: http://www.dpg-verhandlungen.de/year/2007/conference/regensburg/part/df/session/11/contribution/1

In-situ Atomic Layer Deposition growth of Hafnium oxide

Author(s): Karavaev, Konstantin, Tallarida, Massimo, Schmeißer, Dieter
Editor(s): Vierhaus, Heinrich Theodor
Type: conference publication
Year of publication: 2007
Publisher name: Cottbus : BTU
Source: DEDIS-Nano-Days, October 11th and October 12th, 2007, S. 13 - 19
: Computer science reports; 2007,3

Effects of advanced process approaches on electromigration degradation of Cu on-chip interconnects

Author(s): Meyer, Moritz Andreas
Type: doctoralthesis
Year of publication: 2007
: Elektromigration
URL: http://opus4.kobv.de/opus4-btu/frontdoor/index/index/docId/343
URN: urn:nbn:de:kobv:co1-opus-3509

Study of bulk and interface defects in silicon oxide with X-ray absorption spectroscopy

Author(s): Tallarida, Massimo, Schmeißer, Dieter
Type: article
Year of publication: 2007
Source: Journal of Telecommunications and Information Technology 3 (2007) 16-19, 1509-4553

PrOx/AlON stacks as a high-k candidate on SiC

Author(s): Henkel, Karsten, Sohal, Rakesh, Torche, Mohamed, Schwiertz, Carola, Burkov, Yevgen, Schmeißer, Dieter
Type: conference publication
Year of publication: 2007
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Bd. 42, S. 215
URL: http://www.dpg-verhandlungen.de/year/2007/conference/regensburg/part/df/session/10/contribution/8

Study of reactions at the interface P(VDF/TrFE)/Al and P(VDF/TrFE)/PEDOT:PSS

Author(s): Mandal, Dipankar, Müller, Klaus, Seifarth, Olaf, Hoffman, Patrick, Henkel, Karsten, Schmeißer, Dieter
Type: conference publication
Year of publication: 2007
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Bd. 42, S. 797
URL: http://www.dpg-verhandlungen.de/year/2007/conference/regensburg/part/syoe/session/8/contribution/18

The initial stages of Chromium growth on Titaniumdioxide-Investigations using synchrotron radiation

Author(s): Müller, Sebastian, Schmeißer, Dieter
Type: conference publication
Year of publication: 2007
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Bd. 42, S. 598
URL: http://www.dpg-verhandlungen.de/year/2007/conference/regensburg/part/o/session/33/contribution/8

X-ray magnetic circulardichroism in cobalt-doped ZnO

Author(s): Nielsen, Karl-Wilhelm, Bauer, Sebastian, Senn, Konrad, Goennenwein, Sebastian T. B., Opel, Matthias, Cezar, Julio C., Schmeißer, Dieter, Gross, Rudolf
Type: conference publication
Year of publication: 2007
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Bd. 42, S. 454
URL: http://www.dpg-verhandlungen.de/year/2007/conference/regensburg/part/ma/session/15/contribution/13

Metallic Single-Crystal CoSi Nanowires via Chemical Vapor Deposition of Single-Source Precursor

Author(s): Schmitt, Andrew L., Zhu, Lei, Schmeißer, Dieter, Himpsel, Franz J., Jin, Song
Type: article
Year of publication: 2006
Source: The Journal of Physical Chemistry : B 110(2006)37, S. 18142-18146

Synthesis and Properties of Single-Crystal FeSi Nanowires

Author(s): Schmitt, Andrew L., Bierman, Matthew J., Schmeißer, Dieter, Himpsel, Franz J., Jin, Song
Type: article
Year of publication: 2006
Source: Nano Letters 6(2006)8, S. 1617 - 1621, 1530-6984

Numerical analysis of seeding process during Czochralski growth of oxide single crystals

Author(s): Tavakoli, Mohammad Hossein
Type: doctoralthesis
Year of publication: 2006
: Kristallzüchtung; Czochralski-Verfahren; Ankeimprozess; Temperaturverteilung
URL: http://opus4.kobv.de/opus4-btu/frontdoor/index/index/docId/12
URN: urn:nbn:de:kobv:co1-opus-145

Photo-Emission-Electron-Microscopy for Characterization of an Operating Organic Electronic Device

Author(s): Müller, Klaus, Burkov, Yevgen, Schmeißer, Dieter
Type: article
Year of publication: 2006
: photo-emission-electron-microscopy
Source: Thin Solid Films 495(2006), S. 219 - 223, 0040-6090

The Consequences of anisotropic Diffusion and Noise: PEEM at the CO Oxidation Reaction on Stepped Ir(111) Surfaces

Author(s): Schmeißer, Dieter
Type: article
Year of publication: 2006
: Ir(111) Surfaces
Source: Chemical Physics Letters 423(2006)1-3, S. 39 - 44, 0009-2614

Nano-scaled Dielectric Barriers (NanoDieB) for CMOS compatible Si-technologies

Author(s): Schmeißer, Dieter, Seibold, Götz, Reif, Jürgen
Type: article
Year of publication: 2006
: nano-scaled; dielectric; CMOS
Source: Forum der Forschung, S. 131 - 136
Issue/Journal number: 19
ISSN: 0947-6989

Praseodymium Silicate high-k dielectrics on Si(001)

Author(s): Lupina, Grzegorz
Type: doctoralthesis
Year of publication: 2006
: High-k dielectrics; Praseodymium silicate; XPS
URL: http://opus4.kobv.de/opus4-btu/frontdoor/index/index/docId/36
URN: urn:nbn:de:kobv:co1-opus-421

Praseodymium Silicate Films on Si(100) for Gate Dielectric Applications: Physical and Electrical Characterization

Author(s): Lupina, Grzegorz, Schroeder, Thomas, Schmeißer, Dieter, Dabrowski, Jarek Marek
Type: article
Year of publication: 2006
Source: Journal for Applied Physics 99(2006)11, 114109, 0021-8979

X-ray Absorption and Photoemission Spectroscopy of 3C- and 4H-SiC

Author(s): Tallarida, Massimo, Schmeißer, Dieter, Zheng, Fan
Type: conference publication
Year of publication: 2006
Source: Surface Science 600(2006)18, S. 3879 - 3883, 0039-6028

Resonant photoemission at the oxygen K edge as a tool to study the electronic properties of defects at SiO2/Si and SiO2/SiC interfaces

Author(s): Tallarida, Massimo, Sohal, Rakesh, Schmeißer, Dieter
Type: conference publication
Year of publication: 2006
Source: Superlattices and Microstructures 40(2006)4/6, S. 393 - 398, 0749-6036

Al-Oxynitrides as a Buffer Layer for Pr2O3/SiC Interfaces

Author(s): Sohal, Rakesh, Torche, Mohamed, Schmeißer, Dieter
Type: conference publication
Year of publication: 2006
Source: Materials Science in Semiconductor Processing 9(2006)6, S. 945 - 948, 1369-8001

Organic thin film transistors with polymer high-k dielectric insulator

Author(s): Müller, Klaus, Paloumpa, Ioanna, Schmeißer, Dieter, Henkel, Karsten
Type: article
Year of publication: 2006
: high-k
Source: Materials Science and Engineering : C 26(2006)5-7, S. 1028 -1031, 0928-4931

Silicate Formation at the Interface of Pr-Oxide as a High-K Dielectric and Si(001) surfaces

Author(s): Schmeißer, Dieter, Zheng, Fan, Perez-Dieste, Virginia
Type: conference publication
Year of publication: 2006
Source: Material Science and Engineering : C 26(2006)5/7, S. 1122-1126, 0928-4931

Electron spectroscopy and microscopy on chromium oxide nanowires on templated block copolymers

Author(s): Seifarth, Olaf, Schmeißer, Dieter, Stamm, Manfred, Krenek, Radim, Sydorenko, Alexander
Type: Scientific Article ref.
Year of publication: 2006
: copolymers; nanowires
Source: Progress in Solid State Chemistry, S. 111 - 119
Volume: 34
Issue/Journal number: 2-4
ISSN: 0079-6786

Characterization of Nanocrystalline TiO2 - HfO2 Thin Films Prepared by Low Pressure Hot Target Reactive Magnetron Sputtering

Author(s): Domaradzki, Jarosław, Schmeißer, Dieter, Kaczmarek, Danuta, Beuckert, Guido, Prociow, E. L., Borkowska, Angnieszka, Kudrawiec, Robert, Misiewicz, J.
Type: conference publication
Year of publication: 2006
Source: Surface and Coatings Technology 200(2006)22/23, S. 6283-6287, 0257-8972

Microstructure and Optical Properties of TiO2 Thin Films Prepared by Low Pressure Hot Target Reactive Magnetron Sputtering

Author(s): Domaradzki, Jarosław, Kaczmarek, Danuta, Schmeißer, Dieter, Beuckert, Guido
Type: article
Year of publication: 2006
Source: Thin Solid Films 513(2006)1/2, S. 269-274, 0040-6090

Noise-Induced Spatiotemporal Patterns in a Bistable Reaction-Diffusion System: Photoelectron Emission Microscopy experiments and Modeling of the CO Oxidation Reaction on Ir(111)

Author(s): Hoffmann, Patrick, Wehner, Stefan, Schmeißer, Dieter
Type: article
Year of publication: 2006
Source: Physical Review : E 73( 2006)5, 56123, 1539-3755

CVD growth of (001) and (111) 3C-SiC epilayers and their interface reactivity with praseodymium oxide dielectric layers

Author(s): Sohal, Rakesh
Type: doctoralthesis
Year of publication: 2006
: Siliciumcarbid; Kristallfläche; Dielektrische Schicht; CVD-Verfahren
URL: http://opus4.kobv.de/opus4-btu/frontdoor/index/index/docId/13
URN: urn:nbn:de:kobv:co1-opus-121

The interaction of Al, Ag, Au and Ti to Pr2O3 thin film dielectrics

Author(s): Torche, Mohamed, Henkel, Karsten, Schmeißer, Dieter
Type: article
Year of publication: 2006
: thin films; Pr2O3
Source: Materials Science and Engineering : C 26(2006)5-7, S. 1127-1130, 0928-4931

Pr-O-N Dielectrics for MIS Stacks on Silicon and SiliconCarbide Surfaces

Author(s): Henkel, Karsten, Torche, Mohamed, Sohal, Rakesh, Schwiertz, Carola, Hoffmann, Patrick, Schmeißer, Dieter
Editor(s): Dudley, Michael
Type: conference publication
Year of publication: 2006
Publisher name: Warrendale, Pa. : Materials Research Society
Source: Silicon carbide 2006 - materials, processing and devices, symposium held April 18 - 20, 2006, San Francisco, California, U.S.A., S. 353 - 358
ISBN: 978-1-55899-867-4
: Materials Research Society symposium proceedings ; 911

Noise-induced spatiotemporal patterns in a bistable reaction-diffusion system: Photoelectron emission micrsoscopy experiments and modeling of the CO oxidation reaction on Ir(111)

Author(s): Hoffmann, Patrick, Wehner, Stefan, Schmeißer, Dieter, Brand, Helmut R., Küppers, Jürgen
Type: Scientific Article ref.
Year of publication: 2006
Source: Physical Review : E, S. 056123
Volume: 73
Issue/Journal number: 5
ISSN: 1550-2376

Chemical Bonding in Low-k Dielectric Materials for Interconnect Isolation: Characterization using XAS and EELS

Author(s): Schmeißer, Dieter
Type: conference publication
Year of publication: 2006
: XAS; EELS; low-k Materials
Source: Zschech, Ehrenfried (Hrsg.): Stress-Induced Phenomena in Metallization : 8th International Workshop on Stress-Induced Phenomena in Metallization. - Woodbury, NY : AIP Press, 2006, S. 117-124, 0-7354-0310-4 (AIP Conference Proceedings ; 817)

Resonant photoemission at the Oxygen K edge as a tool to study the eletronic properties of defects at SiO2/Si and SiO2/SiC interfaces

Author(s): Tallarida, Massimo, Sohal, Rakesh, Schmeißer, Dieter
Type: article
Year of publication: 2006
Source: Superlattices and Microstructures 40(2006)4-6, S. 393-398, 0749-6036

Pattern formation in the CO + O reaction on Ir(111) surfaces under the influence of noise

Author(s): Wehner, Stefan, Hofmann, Patrick, Schmeißer, Dieter, Brand, Helmut R., Küppers, Jürgen
Type: conference publication
Year of publication: 2006
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft, Reihe 6, Bd. 41, S. 708
URL: http://www.dpg-verhandlungen.de/year/2006/conference/dresden/part/syss/session/1/contribution/9

Electronic Properties of Metals Embedded into Porous Polymeric Nanotemplates

Author(s): Krenek, Radim, Cimrova, Vera, Seifarth, Olaf, Bocharova, Vera, Gorodyska, Ganna, Sidorenko, Alexander, Schmeißer, Dieter, Stamm, Manfred
Type: conference publication
Year of publication: 2006
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Bd. 41, S. 108
URL: http://www.dpg-verhandlungen.de/year/2006/conference/dresden/part/cpp/session/25/contribution/2

Electronic properties of the 2x1 3C-SiC surface reconstruction studied with resonant photoemission

Author(s): Tallarida, Massimo, Sohal, Rakesh, Schmeißer, Dieter
Type: conference publication
Year of publication: 2006
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft, Reihe 6, Bd. 41, S. 239
ISBN: 0420-0195
URL: http://www.dpg-verhandlungen.de/year/2006/conference/dresden/part/hl/session/5/contribution/2

Formation of Pedestal Oxynitride Layer by Extremely Shallow Nitrogen Implantation in Planar R.F. Plasma Reactor

Author(s): Bieniek, Tomasz, Beck, Romuald B., Jakubowski, Andrzej, Hoffmann, Patrick, Schmeißer, Dieter, Konarski, Piotr, Cwil, M.
Type: article
Year of publication: 2006
Source: Meeting Abstracts-Electrochemical Society 502(2006)531, 1091-8213

Inorganic and organic layers for high-k and organic memory applications

Author(s): Henkel, Karsten, Torche, Mohamed, Schwiertz, Carola, Paloumpa, Ioanna, Sohal, Rakesh, Müller, Klaus, Schmeißer, Dieter
Type: conference publication
Year of publication: 2006
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft, Reihe 6, Bd. 41, S. 127
URL: http://www.dpg-verhandlungen.de/year/2006/conference/dresden/part/df/session/1/contribution/4

CO oxidation on Ir(111) surfaces: consequences of anisotropic diffusion and noise

Author(s): Wehner, Stefan, Hoffmann, Patrick, Schmeißer, Dieter, Brand, Helmut R., Küppers, Jürgen
Type: conference publication
Year of publication: 2006
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft, Reihe 6, Bd. 41, S. 475
URL: http://www.dpg-verhandlungen.de/year/2006/conference/dresden/part/o/session/14/contribution/37

ELS to determine the band gap of thin dielectric layers

Author(s): Bergholz, Matthias, Sohal, Rakesh, Schmeißer, Dieter
Type: conference publication
Year of publication: 2006
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft, Reihe 6, Bd. 41, S. 156
URL: http://www.dpg-verhandlungen.de/year/2006/conference/dresden/part/ds/session/8/contribution/2

P(VDF/TrFE) as ferroelectric insulation layer for organic field effect transistors

Author(s): Müller, Klaus, Henkel, Karsten, Paloumpa, Ioanna, Schmeißer, Dieter
Type: conference publication
Year of publication: 2006
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Bd. 41, S. 101
URL: http://www.dpg-verhandlungen.de/year/2006/conference/dresden/part/cpp/session/23/contribution/28

Improvement of Nitrogen Incorporation into Oxynitrides on 4H-SiC(0001)

Author(s): Hoffmann, Patrick, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2006
Source: Nuclear Instruments and Methods in Physics Research, Section B : Beam with Materials and Atoms, S. 85 - 89
Volume: 246
Issue/Journal number: 1

Properties of chromium, cobalt and nickel nanoparticles embedded into ordered block copolymers and conducting polymers

Author(s): Seifarth, Olaf
Type: doctoralthesis
Year of publication: 2006
: block copolymers; chromium nanoparticles; cobalt nanoparticles; nickel nanoparticles

Praseodymium oxide as dielectric in MIS stacks

Author(s): Torche, Mohamed
Type: doctoralthesis
Year of publication: 2006
: high-k; Pr2O3; X-ray photoelectron spectroscopy; XPS

Characterization of chemical bonding in low-k dielectric materials for interconnect isolation: A XAS and EELS Study

Author(s): Hoffmann, Patrick, Schmeißer, Dieter, Engelmann, Hans-Jürgen, Zschech, Ehrenfried, Stegmann, Heiko, Himpsel, Franz J., Denlinger, Jonathan D.
Editor(s): Tsui, Ting Y.
Type: conference publication
Year of publication: 2006
Publisher name: Warrendale, Pa. : Materials Research Society
Source: Materials, technology and reliability of low-k dielectrics and copper interconnects, symposium held April 18 - 21, 2006, San Francisco, California, S. 55 - 62
ISBN: 978-1-55899-870-5
: Materials Research Society symposium proceedings ; 914

Characterization of Chemical Bonding in Low-K Dielectric Materials for Interconnect Isolation: XAS and EELS Study

Author(s): Hoffmann, Patrick, Schmeißer, Dieter, Himpsel, Franz J., Engelmann, Hans-Jürgen, Zschech, Ehrenfried, Stegmann, Heiko, Denlinger, Jonathan D.
Type: conference publication
Year of publication: 2006
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Bd. 41, S. 156

Silicate Formation at the Interface of High-k Dielectrics and Si(001) Surfaces

Author(s): Schmeißer, Dieter, Zheng, Fan, Himpsel, Franz J., Engelmann, Hans-Jürgen, Zschech, Ehrenfried
Type: conference publication
Year of publication: 2006
Source: MRS Proceedings 917( 2006), E10-02

Silicate Formation at the Interface of Hf-Oxide and Pr-Oxide as a High-k Dielectric and Si(001) surfaces

Author(s): Schmeißer, Dieter, Zschech, Ehrenfried
Type: article
Year of publication: 2006
Source: Materials Science in Semiconductor Processing 9(2006)6, S. 934-939, 1369-8001

Chemical Bonding, Permittivity, and Elastic Properties in Locally Modified Organosilicate Glass

Author(s): Zschech, Ehrenfried, Stegmann, Heiko, Schmeißer, Dieter, Hoffmann, Patrick
Type: conference publication
Year of publication: 2006
Source: Materials Research Society Symposium Proceedings 914(2006), F11-03

A polymer high-k dielectric insulator for organic field effect Transistors

Author(s): Müller, Klaus, Paloumpa, Ioanna, Henkel, Karsten, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2005
Source: Journal of Applied Physics, S. 056104
Volume: 98
Issue/Journal number: 5
ISSN: 0021-8979

Grenzflächenoptimierung für funktionale Dünnschichtsysteme: Oxide und Polymere

Author(s): Henkel, Karsten, Sohal, Rakesh, Torche, Mohamed, Paloumpa, Ioanna, Müller, Klaus, Hoffmann, Patrick, Schmeißer, Dieter
Type: Scientific Article not ref.
Year of publication: 2005
Source: Forum der Forschung, S. 49 - 56
Volume: 9
Issue/Journal number: 18
ISSN: 0947-6989

Resonante Photoemission an der Cu2p Kante von Cu und CuO

Author(s): Schmeißer, Dieter, Himpsel, Franz J., Denlinger, Jonathan D., Ederer, David L.
Type: Scientific Article ref.
Year of publication: 2005
Source: Forum der Forschung, S. 57 - 62
Volume: 9
Issue/Journal number: 18
ISSN: 0947-6989

Growth of oxynitrides on Si-rich 4H-SiC(0001) surfaces

Author(s): Hoffmann, Patrick, Goryachko, Andriy, Schmeißer, Dieter
Type: conference publication
Year of publication: 2005
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: X-Ray photoelectron spectroscopy; scanning tunneling microscopy (STM); atomic force microscopy (AFM); silicon oxynitride; 4H-SiC(0001)
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft
URL: http://www.dpg-verhandlungen.de/year/2005/conference/berlin/part/hl/session/26/contribution/1?lan=en
: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Band 40

Surface Potential profiling on operating full organic thin film transistors by Kelvin probe force microscopy

Author(s): Geuss, Markus, Müller, Klaus, Paloumpa, Ioanna, Schmeißer, Dieter
Type: conference publication
Year of publication: 2005
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: organic field effect transistor; Kelvin probe force microscopy
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft
URL: http://www.dpg-verhandlungen.de/year/2005/conference/berlin/part/syoo/session/6/contribution/36?lan=en
: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Band 40

Photoelectron spectroscopy and microscopy on magnetic nano particles embedded into block copolymers

Author(s): Seifarth, Olaf, Burkov, Yevgen, Schmeißer, Dieter, Sydorenko, Alexander, Krenek, Radim, Stamm, Manfred
Type: conference publication
Year of publication: 2005
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: photoelectron emission microscopy (PEEM); X-ray photoelectron spectroscopy; X-ray absorption spectroscopy; block copolymers; magnetic nano particles
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft
URL: http://www.dpg-verhandlungen.de/year/2005/conference/berlin/part/cpp/session/29/contribution/27?lan=en
: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Band 40

Growth and Characterization of 3C-SiC thin films on Si substrates

Author(s): Sohal, Rakesh, Henkel, Karsten, Müller, Klaus, Schmeißer, Dieter
Type: conference publication
Year of publication: 2005
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: low pressure chemical vapor deposition (LPCVD); 3C-SiC; X-ray photoelectron spectroscopy (XPS); Fourier Transform Infrared Spectroscopy (FTIR); X-Ray diffraction
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft
URL: http://www.dpg-verhandlungen.de/year/2005/conference/berlin/part/hl/session/58/contribution/50?lan=en
: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Band 40

Surface potential profiling on organic thin film transistors by photoemission-electron-microscopy (PEEM)

Author(s): Müller, Klaus, Burkov, Yevgen, Schmeißer, Dieter
Type: conference publication
Year of publication: 2005
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: organic field effect transistor; Photoemission-electron-microscopy (PEEM); Kelvin-AFM; X-Ray photoelectron spectroscopy
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft
URL: http://www.dpg-verhandlungen.de/year/2005/conference/berlin/part/syoo/session/6/contribution/41?lan=en
: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Band 40

P(VDF/TrFE) as a ferroelectric dielectric for Organic Field effect Transistors in MFIS structure

Author(s): Henkel, Karsten, Paloumpa, Ioanna, Müller, Klaus, Schmeißer, Dieter
Type: conference publication
Year of publication: 2005
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: P(VDF/TrFE); Organic ferroelectric field effect transistor; capacitance voltage measurements
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft
URL: http://www.dpg-verhandlungen.de/year/2005/conference/berlin/part/syoo/session/6/contribution/39?lan=en
: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Band 40

Organic Field Effect Transistors with polymer high-k dielectric insulator

Author(s): Müller, Klaus, Paloumpa, Ioanna, Henkel, Karsten, Schmeißer, Dieter
Type: conference publication
Year of publication: 2005
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: organic field effect transistor; P(VDF/TrFE); high-k organic
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft
URL: http://www.dpg-verhandlungen.de/year/2005/conference/berlin/part/syoo/session/6/contribution/30?lan=en
: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Band 40

Ti-doping of Pr silicate layers for high-k dielectrics applications

Author(s): Lupina, Grzegorz, Schroeder, Thomas, Dabrowski, Jarek Marek, Schmeißer, Dieter, Müssig, Hans-Joachim
Type: conference publication
Year of publication: 2005
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: high-k; X-ray photoelectron spectroscopy; ab inito calculations; Capacitance-voltage measurements; Pr silicate
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft
URL: http://www.dpg-verhandlungen.de/year/2005/conference/berlin/part/df/session/6/contribution/5?lan=en
: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Band 40

Composition and thermal stability of thin functional oxidic (Pr, La, Y) and metallic (Ru, Ti) layers on Si and SiC substrates

Author(s): Styervoyedov, Andriy, Paloumpa, Ioanna, Schmeißer, Dieter
Type: conference publication
Year of publication: 2005
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: Pr-, La- and Y- based oxides; MOS transistor; high-k; X-Ray photoelectron spectroscopy
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft
URL: http://www.dpg-verhandlungen.de/year/2005/conference/berlin/part/ds/session/24/contribution/17?lan=en
: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Band 40

The initial interaction of Pr2O3 to (001) and (111) oriented Si substrates

Author(s): Schmeißer, Dieter
Type: conference publication
Year of publication: 2005
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: Pr2O3; high-k; X-ray photoelectron spectroscopy (XPS)
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft
URL: http://www.dpg-verhandlungen.de/year/2005/conference/berlin/part/ds/session/11/contribution/2?lan=en
: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Band 40

Scanning Kelvin Probe Microscopy Investigations of Au-P3HT-Au structures for Organic Field Effect Transistors

Author(s): Goriachko, Andrii, Müller, Klaus, Paloumpa, Ioanna, Schmeißer, Dieter
Type: conference publication
Year of publication: 2005
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: scanning Kelvin probe microscopy (SKPM); organic field effect transistor (OFET)
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft
URL: http://www.dpg-verhandlungen.de/year/2005/conference/berlin/part/syoo/session/6/contribution/24?lan=en
: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Band 40

Characterisation of nearly free electron bands in thin Al-Mg alloy films on Si(111)

Author(s): Tallarida, Massimo, Aballe, Lucia, Kumar, Ashwani, Barman, Sudipto Roy, Horn, Karsten
Type: conference publication
Year of publication: 2005
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: X-Ray photoelectron spectroscopy; angle-resolved; Al-Mg alloy; Si(111); moöecuar beam epxitaxy (MBE)
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft
URL: http://www.dpg-verhandlungen.de/year/2005/conference/berlin/part/o/session/52/contribution/8?lan=en
: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Band 40

The interaction of Al, Au, Ag, and Ti metal contacts with Pr2O3 thin films

Author(s): Torche, Mohamed, Schmeißer, Dieter
Type: conference publication
Year of publication: 2005
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: high-k; Pr2O3; X-ray photoelectron spectroscopy (XPS); Al, Ag, Au, and Ti electrodes; metal dielectric interaction
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft
URL: http://www.dpg-verhandlungen.de/year/2005/conference/berlin/part/ds/session/11/contribution/4?lan=en
: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Band 40

Pr4f occupancy and origin of gap states at the Pr2O3 / Si (001) interface

Author(s): Schmeißer, Dieter
Type: article
Year of publication: 2005
Source: BESSY annual report 2004, pp. 192-194

PEEM imaging contrast in an operating organic electronic device

Author(s): Müller, Klaus
Type: article
Year of publication: 2005
Source: BESSY annual report 2004, pp. 187-189

Spectro-Microscopic Characterisation of CuInS2 Surfaces

Author(s): Müller, Klaus
Type: article
Year of publication: 2005
: High-resolution PEEM; CuInS2; Solar cells; Surface characterisation
Source: Thin Solid Films 480-481 (2005) 291-294

Oxynitride Grotwth on 4H-SiC(0001) by N2O

Author(s): Hoffmann, Patrick
Type: article
Year of publication: 2005
Source: BESSY annual report 2004, pp. 397-399

The interaction of titanium to Pr2O3 thin films dielectrics

Author(s): Torche, Mohamed
Type: article
Year of publication: 2005
Source: BESSY annual report 2004, pp. 395-396

Microphase separation in thin films of poly(styrene-block-4-vinylpyridine) Copolymer-2-(4-Hydroxybenzeneazo) benzoic Acid Assembly

Author(s): Tokarev, Igor, Krenek, Radim, Burkov, Yevgen, Schmeißer, Dieter, Sidorenko, Alexander, Minko, Sergiy, Stamm, Manfred
Type: Scientific Article ref.
Year of publication: 2005
Source: Macromolecules, S. 507 - 516
Volume: 38
Issue/Journal number: 2
ISSN: 1520-5835

Oxynitride on 4H-SiC (0001)

Author(s): Hoffmann, Patrick
Type: article
Year of publication: 2005
: Silicon carbide; Oxynitride; N2O; Photoelectron spectroscopy
Source: Materials Science and Engineering B 118 (2005) 270-274

Interface reactivity of Pr and SiO2 at 4H-SiC(0001)

Author(s): Schmeißer, Dieter
Type: article
Year of publication: 2005
: Photoelectron spectroscopy; 4H-SiC; Interface reactivity; High-k dielectric layer
Source: Materials Science and Engineering B 118 (2005) 19-22.

Praseodymium silicate layers with atomically abrupt interface on Si(100)

Author(s): Lupina, Grzegorz, Schroeder, Thomas, Dabrowski, Jarek Marek, Schmeißer, Dieter, Hoffmann, Patrick
Type: Scientific Article ref.
Year of publication: 2005
Source: Applied Physics Letters
Volume: 87
Issue/Journal number: 5
ISSN: 0003-6951

Photoelectron spectroscopy and microscopy on Cr nano particels embedded into block copolymers

Author(s): Seifarth, Olaf, Burkov, Yevgen, Goryachko, Andriy, Schmeißer, Dieter, Sydorenko, Alexander, Krenek, Radim, Stamm, Manfred
Type: article
Year of publication: 2005
Source: BESSY annual report 2004, pp. 195-197

Pr-Silicate formation on SiO2 covered SiC surfaces

Author(s): Sohal, Rakesh
Type: article
Year of publication: 2005
Source: BESSY annual report 2004, pp. 393-394

Spatiotemporal patterns of external noise-induced transitions in a bistable reaction-diffusion system : Photoelectron Emission Microscopy experiments and modeling

Author(s): Wehner, Stefan, Schmeißer, Dieter, Hoffmann, Patrick
Type: article
Year of publication: 2005
Source: Physical Review Letters 95(2005)3, S. 038301, 0031-9007

Pr-silicate formation on SiO2 covered 3C-SiC(111)

Author(s): Schmeißer, Dieter, Müssig, Hans-Joachim
Type: conference publication
Year of publication: 2005
Publisher name: New York, NY : AIP, American Inst. of Physics
Source: Physics of semiconductors, 27th International Conference on the Physics of Semiconductors, S. 75 - 76
ISBN: 0-7354-0257-4
: AIP conference proceedings ; 772

Advanced MOSFET Gate Dielectrics for High-Performance Microprocessors: Materials Selection and Analytical Challenges

Author(s): Zschech, Ehrenfried, Engelmann, Hans-Jürgen, Ohsiek, Susanne
Editor(s): Kramer, B.
Type: part of book (chapter)
Year of publication: 2005
Source: Advances in Solid State Physics. Bd. 45. - Berlin [u.a.] : Springer, 2005, S. 375 - 388, 3-540-26041-2
DOI: https://doi.org/http://dx.doi.org/10.1007/11423256_30

Electronic Properties of the Interface Formed by Pr2o3 Growth on Si(001), Si(111)and SiC(0001) Surfaces

Author(s): Schmeißer, Dieter, Hoffmann, Patrick, Beuckert, Guido
Editor(s): Zschech, Ehrenfried, Whelan, Caroline
Type: part of book (chapter)
Year of publication: 2005
Source: Zschech, Ehrenfried (Hrsg.): Materials for information technology : devices, interconnects and packaging. - Berlin [u.a.] : Springer, 2005, S. 449-460, 1-85233-941-1 (Engineering materials and processes )

Photoemission studies of very thin (<10nm) silicon oxynitride (SiOxNy) layers formed by PECVD

Author(s): Hoffmann, Patrick
Type: article
Year of publication: 2004
: Semiconductors; Thin films; Vapour deposition; Photoelectron spectroscopies; Synchrotron radiation
Source: Journal of Alloys and Compounds 382/1-2 (2004) 228-233

PEEM studies of KCN-etched CuInS2 surfaces

Author(s): Müller, Klaus
Type: article
Year of publication: 2004
Source: BESSY annual report 2003, pp. 413-414

Investigations of 3C-SiC growth on Si (001)

Author(s): Torche, Mohamed, Müller, Klaus, Henkel, Karsten, Lupina, Grzegorz, Goryako, Andrey, Wollweber, Jürgen, Schmeißer, Dieter
Type: conference publication
Year of publication: 2004
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: 3C-SiC; chemical vapor deposition (CVD); X-ray photoelectron spectroscopy (XPS)
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft
URL: http://www.dpg-verhandlungen.de/year/2004/conference/regensburg/part/hl/session/44/contribution/42?lang=de
: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Band 39

Stability and electronic properties of silicates in the system SiO2 - Pr2O3 - Si(001)

Author(s): Schmeißer, Dieter, Müssig, Hans-Joachim
Type: conference publication
Year of publication: 2004
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: Pr2O3; high-k; X-ray photoelectron spectroscopy (XPS); silicate
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft
URL: http://www.dpg-verhandlungen.de/year/2004/conference/regensburg/part/hl/session/31/contribution/3?lang=de
: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Band 39

All Polymer Field-Effect-Transistors based on Low-Cost-Microstructuring

Author(s): Müller, Klaus, Paloumpa, Ioanna, Schwiertz, Carola, Jahnke, Agnes, Schmeißer, Dieter
Type: conference publication
Year of publication: 2004
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: organic field effect transistor; low cost printing; microstructuring
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft
URL: http://www.dpg-verhandlungen.de/year/2004/conference/regensburg/part/syoh/session/5/contribution/75?lang=de
: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Band 39

Spectromicroscopic Characterisation of All Polymer Transistor Structures

Author(s): Müller, Klaus, Burkov, Yevgen, Schmeißer, Dieter
Type: conference publication
Year of publication: 2004
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: organic field effect transistor; photoemission electron microscopy (PEEM)
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft
URL: http://www.dpg-verhandlungen.de/year/2004/conference/regensburg/part/syoh/session/5/contribution/74?lang=de
: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Band 39

Investigations of Pr2O3 growth modes on 4H-SiC(0001) Surfaces

Author(s): Goryachko, Andriy, Beuckert, Guido, Zaumseil, Peter, Wagner, Guenter, Schmeißer, Dieter
Type: conference publication
Year of publication: 2004
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: SiC; Pr2O3; X-ray photoelectron spectroscopy (XPS); X-Ray diffraction
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft
ISBN: ISSN 0420-0195
URL: http://www.dpg-verhandlungen.de/year/2004/conference/regensburg/part/ds/session/9/contribution/4?lang=de
: Verhandlungen der Deutschen Physikalischen Gesellschaft : Reihe 6, Band 39

Growth of oxynitrides on Si-rich 4H-SiC(0001) surfaces

Author(s): Hoffmann, Patrick, Schmeißer, Dieter
Type: conference publication
Year of publication: 2004
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: oxynitride; 4H-SiC; X-ray photoelectron spectroscopy (XPS); Atomic foce microscopy (AFM); scanning tunneling microscopy (STM)
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft
URL: http://www.dpg-verhandlungen.de/year/2004/conference/regensburg/part/hl/session/40/contribution/4?lang=de
: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Band 39

The Si(001)/C2H2 interaction to form a buffer layer for 3C-SiC growth

Author(s): Goryachko, Andriy, Yeromenko, Y., Henkel, Karsten, Wollweber, Jürgen, Schmeißer, Dieter
Type: article
Year of publication: 2004
Source: Physica status solidi / A, S. 245 - 248
Volume: 201
Issue/Journal number: 2
ISSN: 0031-8965

Generation of Nanostructured Materials from Thin Films of Block Copolymer Assembles

Author(s): Sidorenko, Alexander, Tokarev, Igor, Krenek, Radim, Burkov, Yevgen, Schmeißer, Dieter, Minko, S., Stamm, Manfred
Editor(s): Champion, Yannick, Fecht, Hans-Jörg
Type: conference publication
Year of publication: 2004
Publisher name: Weinheim : Wiley-VCH
Source: Nano-architectured and manostructured materials, fabrication, control and properties, EUROMAT 2003, S. 143 - 150
ISBN: 3-527-31008-8

Silicate Layer Formation at the Pr2O3 / Si(001) Interfaces

Author(s): Schmeißer, Dieter, Müssig, Hans-Joachim, Dabrowski, Jarek Marek
Type: Scientific Article ref.
Year of publication: 2004
Source: Applied Physics Letters, S. 88 - 90
Volume: 85
Issue/Journal number: 1
ISSN: 1077-3118

Solid-state reaction between Pr and SiO2 studied by photoelectron spectroscopy and ab initio calculations

Author(s): Lupina, Grzegorz, Dabrowski, Jarek Marek, Formanek, Peter, Schmeißer, Dieter, Sorge, Roland, Wenger, Christian, Zaumseil, Peter, Müssig, Hans-Joachim
Type: Scientific Article not ref.
Year of publication: 2004
: High-k dielectrics; Photoelectron spectroscopy; Interface reaction
Source: Materials Science in Semiconductor Processing, S. 215 - 220
Volume: 7
Issue/Journal number: 4-6
ISSN: 1369-8001

Mechanisms to inhibit corrosion of Al alloys by polymeric conversion coatings

Author(s): Paloumpa, Ioanna, Yfantis, Alexandros D., Hoffmann, Patrick, Burkov, Yevgen, Yfantis, Alexandros D., Schmeißer, Dieter
Type: article
Year of publication: 2004
: Polypyrrole; Fluorozirconates; Fluorotitanates; Aluminium; Corrosion
Source: Surface and Coatings Technology 180-181 (2004) 308-312, 0257-8972

The Interaction of Pr2O3 with 4H-SiC(0001)surface

Author(s): Goryachko, Andriy, Paloumpa, Ioanna, Beuckert, Guido, Burkov, Yevgen, Schmeißer, Dieter
Type: article
Year of publication: 2004
Source: Physica status solidi / C, S. 265 - 268
Volume: 1
Issue/Journal number: 2
ISSN: 1610-1634

Covalent and localized contributions of Pr4f states at the interface of Pr2O3 to Si(001)

Author(s): Schmeißer, Dieter
Type: article
Year of publication: 2004
Source: Materials Science in Semiconductor Processing 7(2004)4-6, S. 221 - 226

Stability and electronic properties of silicates in the system SiO2 - Pr2O3 - Si(001)

Author(s): Schmeißer, Dieter, Müssig, Hans-Joachim
Type: Scientific Article ref.
Year of publication: 2004
Source: Journal of Physics: Condensed Matter, S. 153 - 160
Volume: 16
Issue/Journal number: 2
ISSN: 1361-648X

Preparation of stoichiometric CuInS2-Surfaces

Author(s): Müller, Klaus, Scheer, R., Schmeißer, Dieter, Burkov, Yevgen
Type: article
Year of publication: 2004
: preparation
Source: Thin Solid Films, S. 120 - 123
Volume: 451–452
ISSN: 0040-6090

Dynamische Modifizierung von Silizium-Elektrolyt-Grenzflächen und deren oberflächenphysikalischen Eigenschaften

Author(s): Rauscher, Stefan
Type: doctoralthesis
Year of publication: 2004
Publisher name: Cottbus : Brandenburgische Techn. Univ.

Scanning Kelvin Probe Microscopy and Photoemission electron microscopy of organic source-drain structures

Author(s): Müller, Klaus, Goryachko, Andriy, Burkov, Yevgen, Schwiertz, Carola, Ratzke, Markus, Köble, J., Reif, Jürgen, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2004
: Photoemission electron microscopy (PEEM); Scanning Kelvin probe microscopy (SKPM); OFET
Source: Synthetic Metals, S. 377 - 382
Volume: 146
Issue/Journal number: 3
ISSN: 0379-6779

Ultrathin Dielectric Films Grown by Solid Phase Reaction of Pr with SiO2

Author(s): Müssig, Hans-Joachim, Dabrowski, Jarek Marek, Wenger, Christian, Lupina, Grzegorz, Sorge, Roland, Formanek, Peter, Zaumseil, Peter, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2004
Source: MRS Proceedings
Volume: 811
ISSN: 1946-4274

Dynamisches Verhalten von Silizium-Elektroden in Fluor-haltigen Elektrolyten

Author(s): Schweizer, Stefan
Type: doctoralthesis
Year of publication: 2004
Publisher name: Cottbus : Brandenburgische Techn. Univ.
: Silizium; Oxidation; Voltammogramme; Injektion; AFM
URL: http://opus4.kobv.de/opus4-btu/frontdoor/index/index/docId/80
URN: urn:nbn:de:kobv:co1-000000526

Comparison on Focus-PEEM and Elmitec-PEEM

Author(s): Burkov, Yevgen
Type: article
Year of publication: 2004
Source: BESSY annual report 2003, pp. 504-505

Pr4f occupancy and VB/CB band offsets of Pr2O3 at the interface to Si(001) and SiC(0001) surfaces

Author(s): Schmeißer, Dieter, Müssig, Hans-Joachim
Type: Scientific Article ref.
Year of publication: 2004
Source: MRS Proceedings
Volume: 811
ISSN: 1946-4274

Corrosion Protection by Conductive Polymers for Magnesium Alloys

Author(s): Yfantis, Alexandros D., Paloumpa, Ioanna, Schmeißer, Dieter
Editor(s): Kainer, Karl Ulrich
Type: Scientific Article not ref.
Year of publication: 2004
Publisher name: Weinheim : Wiley-VCH
: corrosion protection; conductive polymers for magnesium alloys; polypyrrole
Source: Magnesium, proceedings of the 6th International Conference on Magnesium Alloys and their Applications, November 2003 in Wolfsburg, S. 605 - 610
ISBN: 3-527-30975-6

Promieniowanie synchrotronowe jako uniwersalne narzedzie badawcze - Proby jego wykorzystania w badaniach struktury zeliwa

Author(s): Hoffmann, Patrick, Schmeißer, Dieter, Soinski, M. S.
Type: article
Year of publication: 2004
Source: Archives of Foundry 4( 2004)14, S. 169 - 175, 1642-5308

Pr2O3/Si(001) interface reactions and stability

Author(s): Schmeißer, Dieter
Type: article
Year of publication: 2004
: High-k-material; Pr2O3/Si(0 0 1) interface; Photoelectron spectroscopy; Ab initio calculations; CMOS
Source: Materials Science and Engineering B 109/1-3 (2004) 30-33

An FTIR study of the role of H2O and D2O in the aging mechanism of conductive polypyrroles

Author(s): Lamprakopoulos, Stelios, Schmeißer, Dieter, Anastassopoulou, Jane, Theophanides, Theophile, Yfantis, Alexandros D.
Type: Scientific Article not ref.
Year of publication: 2004
: Polypyrrole; Conductivity; FTIR; Isotopic effect
Source: Synthetic Metals, S. 229 - 234
Volume: 144
Issue/Journal number: 3
ISSN: 0379-6779
DOI: https://doi.org/10.1016/j.synthmet.2004.03.006

XPEEM investigations of 2D hierachical array of Ni nanorods using block copolymer templates

Author(s): Sidorenko, Alexander, Tokarev, Igor, Krenek, Radim, Burkov, Yevgen, Schmeißer, Dieter, Stamm, Manfred
Type: Scientific Article not ref.
Year of publication: 2004
Source: BESSY annual report 2003, pp. 85-87

Chemical state depth profiling of ultra-thin oxynitride layers by photoelectron spectroscopy

Author(s): Hoffmann, Patrick
Type: article
Year of publication: 2004
Source: BESSY annual report 2003, pp. 356-357

Grenzflächenverhalten und Morphologie des ZnO/Si-Heterokontaktes: Eine Photoemissionsstudie

Author(s): Meier, Ulrich
Type: doctoralthesis
Year of publication: 2004
: ZnO; Si; interface reaction; xPS; PES; photoelectron spectroscopy; solar cells; thin film; Zn(OH)2; hydrogen; chemical beam deposition; magnetron sputtering; MOCBD
URL: http://opus4.kobv.de/opus4-btu/frontdoor/index/index/docId/71
URN: urn:nbn:de:kobv:co1-000000551

A PEEM study of lateral inhomogeneities on etched CdTe(110) surfaces

Author(s): Traeger, S.
Type: article
Year of publication: 2004
Source: BESSY annual report 2003, pp. 369-370

Cooper minimum observed for the Pr5s and Pr5p states in Pr2O3

Author(s): Schmeißer, Dieter
Type: article
Year of publication: 2004
Source: BESSY annual report 2003, pp. 224-225

High reactivity of Pr on oxide covered 4H-SiC

Author(s): Schmeißer, Dieter, Lupina, Grzegorz, Müssig, Hans-Joachim
Type: part of book (chapter)
Year of publication: 2004
Publisher name: Berlin : Bessy
Source: Bessy annual report 2003, S. 408 - 409

Interface Characterization of the High-k Gate Dielectric Pr2O3

Author(s): Müssig, Hans-Joachim, Dabrowski, Jarek Marek, Schmeißer, Dieter
Type: conference publication
Year of publication: 2003
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: high-k; Pr2O3; X-ray photoelectron spectroscopy (XPS); ab inito calculations; depth profiling; silicate
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft
URL: http://www.dpg-verhandlungen.de/year/2003/conference/dresden/part/hl/session/40/contribution/1?lang=de
: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Band 38

Elektronenspektroskopie an Kupferindiumdisulfid Oberflächen

Author(s): Müller, Klaus, Schmeißer, Dieter
Type: conference publication
Year of publication: 2003
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: CIS-Solarzellen; Röntgen-Absorptionsspektroskopie; Photoemissionselektronenmikroskopie
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft
URL: http://www.dpg-verhandlungen.de/year/2003/conference/dresden/part/hl/session/14/contribution/98?lang=de
: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Band 38

Depth Profiling of Ultrathin Oxynitride Layers Using Synchrotron Radiation

Author(s): Hoffmann, Patrick, Schmeißer, Dieter
Type: conference publication
Year of publication: 2003
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: oxynitride; X-ray photoelectron spectroscopy; depth profiling
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft
URL: http://www.dpg-verhandlungen.de/year/2003/conference/dresden/part/o/session/12/contribution/36?lang=de
: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Band 38

Non-destructive probing of interfacial oxidation and nitridation states at RTA Si-oxides

Author(s): Hoffmann, Patrick, Schmeißer, Dieter, Roters, G., Nenyei, Z.
Type: Scientific Article ref.
Year of publication: 2003
: Silicon; Oxynitride; N20; NH3; Photoelectron spectroscopy; Ultrathin oxide
Source: Thin Solid Films, S. 216 - 222
Volume: 428
Issue/Journal number: 1-2
ISSN: 0040-6090

PEEM and my-NEXAFS of Cu-In-S2-surfaces

Author(s): Müller, Klaus, Burkov, Yevgen, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2003
: CuInS2 films; Annealing-process; PEEM; small mu; NEXAFS
Source: Thin Solid Films, S. 307 - 311
Volume: 431-432
ISSN: 0040-6090

Preventing Corrosion of Aluminium Alloys by Polymeric Coatings

Author(s): Schmeißer, Dieter, Paloumpa, Ioanna, Hoffmann, Patrick, Burkov, Yevgen, Yfantis, Alexandros D., Yfantis, Alexandros D.
Type: article
Year of publication: 2003
Source: BESSY Highlights 2002 (2003) 24-25

Preparation of stoichiometric CuInS2-surfaces - an XPS, UPS-study

Author(s): Müller, Klaus, Milko, S., Schmeißer, Dieter
Type: article
Year of publication: 2003
: Stoichiometric CuInS2-films; Annealing; XPS; UPS
Source: Thin Solid Films, S. 312 - 316
Volume: 431-432
ISSN: 0040-6090

Initial stages of structure formation on silicon electrodes investigated by photoelectron spectroscopy using synchrotron radiation and in-situ atomic force microscopy

Author(s): Lewerenz, Hans-Joachim, Aggour, Mohammed, Murrell, Chris, Kanis, M., Jungblut, H., Jakubowicz, J., Cox, P. A., Campbell, S. A., Hoffmann, Patrick, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2003
Source: Journal of the Electrochemical Society, S. 185 - 189
Volume: 150
Issue/Journal number: 3
ISSN: 1945-7111

Carbon-plot-microstructuring for all-polymer-transistors

Author(s): Müller, Klaus, Paloumpa, Ioanna, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2003
: Ten micrometer carbon-plot; Organic field-effect-transistors; Low-cost-technique
Source: Synthetic Metals, S. 271 - 273
Volume: 138
Issue/Journal number: 1-2
ISSN: 0379-6779

Valence states of poly(3-hexyl-thiophene) as probed by photoelectron spectra at resonant excitation

Author(s): Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2003
: Resonant photoelectron spectroscopy; Semi-conducting polymers; Organic field effect
Source: Synthetic Metals, S. 135 - 140
Volume: 138
Issue/Journal number: 1-2
ISSN: 0379-6779

The Pr2O3 / Si (001) interface studied by synchrotron radiation photo-electron spectroscopy

Author(s): Schmeißer, Dieter, Müssig, Hans-Joachim
Type: Scientific Article ref.
Year of publication: 2003
: High-k dielectric material; Pr2O3; Interface; Silicate
Source: Solid State Electronics, S. 1607 - 1611
Volume: 47
Issue/Journal number: 10
ISSN: 0038-1101

Photoelectron spectra of Al dopants in 4H-SiC

Author(s): Schmeißer, Dieter, Irmscher, Klaus, Wagner, Gerd
Type: Scientific Article ref.
Year of publication: 2003
: Photoelectron; Spectra; 4H-SiC
Source: Materials Science & Engineering B, S. 284 - 288
Volume: 102
Issue/Journal number: 1-3
ISSN: 0921-5107; 1873-4944

Schnelle Biosensorik für die medizinische Diagnostik

Author(s): Bär, Werner
Type: article
Year of publication: 2003
Source: Forum der Forschung 15 (2003) 86-89, ISNN 0947-6989

Ge instabilities near interfaces in Si-SiGe-Si heterostructures

Author(s): Schmeißer, Dieter, Pressel, Klaus, Yamamoto, Yuji, Tillack, Bernd, Krüger, D.
Type: Scientific Article ref.
Year of publication: 2003
: SiGe; Depth profiling; Interfaces; XPS
Source: Materials Science & Engineering B, S. 208 - 211
Volume: 101
Issue/Journal number: 1-3
ISSN: 0921-5107; 1873-4944

Organic Materials for Device Applications - Preface

Author(s): Riess, W., Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2003
Source: Synthetic Metals
Volume: 138
Issue/Journal number: 1–2
ISSN: 0379-6779

Commissioning of the Solid/Liquid Analysis System SoLiAS

Author(s): Hunger, Ralf
Type: article
Year of publication: 2003
Source: BESSY annual report 2002, pp. 316-318

Resonant photoemission at the Pr2O3 /Si(001) interface

Author(s): Schmeißer, Dieter
Type: article
Year of publication: 2003
Source: BESSY annual report 2002, pp. 165-167

Conductive polymers precoats-application on metallisation of ABS

Author(s): Yfantis, Alexandros D., Bourdas, N., Lambrakopoulos, S., Yfantis, N., Paloumpa, Ioanna, Yfantis, Alexandros D.
Type: conference publication
Year of publication: 2003
Source: 4th Panhellenic Conference of Chemical Engineering, 29-31 May 2003, Patras, Greece Proceedings, (griechisch)

Organische Feldeffekttransistoren als Transducer in der Biosensorik

Author(s): Müller, Klaus, Bär, Werner, Henkel, Karsten, Jahnke, Agnes, Schwiertz, Carola, Schmeißer, Dieter
Type: part of book (chapter)
Year of publication: 2003
Publisher name: Dresden : w.e.b.-Univ.-Verl.
First page: 119
Last page: 223
ISBN: 3-935712-92-8
: Dresdner Beiträge zur Sensorik ; 20

Partikel- und Tropfendetektion im Mikrometerbereich mittels Schwingquarzen

Author(s): Henkel, Karsten, Schwiertz, Carola, Wagner, S., Valdeig, A., List, M., Schmeißer, Dieter
Type: part of book (chapter)
Year of publication: 2003
Publisher name: Dresden : w.e.b.-Univ.-Verl.
First page: 291
Last page: 294
ISBN: 3-935712-92-8
: Dresdner Beiträge zur Sensorik ; 20

Orientation studies of Si-Phthalocyanines sulfonic acids cast on SiOx substrates

Author(s): Appel, Günter, Ade, H., Gürek, A. G., Stadler, S., Mikalo, Ricardo Pablo, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2003
Source: Applied Physics / A, S. 177 - 182
Volume: 76
Issue/Journal number: 2
ISSN: 1432-0630
DOI: https://doi.org/10.1007/s003390201320

High Resolution Surface analysis of Si Roughenning in Dilute Ammonium Fluoride Solution

Author(s): Lewerenz, Hans-Joachim, Murrell, Chris, Jakubowicz, J., Aggour, Mohammed, Kanis, M., Campbell, S. A., Cox, P. A., Hoffmann, Patrick, Jungblut, H., Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2003
: Porous Si; transistors; Electropolishing; Photoelectron spectroscopy; AFM; Synchrotron radiation
Source: Journal of Electroanalytical Chemistry, S. 3 - 6
Volume: 540
ISSN: 1873-2569

Organische Feldeffekttransistoren als Transducer in der Biosensorik

Author(s): Müller, Klaus, Bär, Werner, Henkel, Karsten, Jahnke, Agnes, Schwiertz, Carola, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2003
: Feldeffekttransistor; Biosensorik; Helicobacter pylori; Field effect transistors; biosensors; helicobacter pylori
Source: Technisches Messen, S. 565 - 568
Volume: 70
Issue/Journal number: 12
ISSN: 0171-8096
DOI: https://doi.org/10.1524/teme.70.12.565.20261

Untersuchungen zu Inhomogenitäten an der Halbleitergrenzfläche Silizium-Siliziumoxynitrid

Author(s): Hoffmann, Patrick
Type: doctoralthesis
Year of publication: 2003
Publisher name: Aachen : Shaker-Verlag
: Grenzflächeneigenschaften; SiO2; SiON; Synchrotron-basierte Röntgen-Spektroskopie; XPS; XAS
ISBN: 3-8322-1982-X

Elektronische Eigenschaften von leitfähigen konjugierten Polymeren und deren Grenzflächenreaktionen im elektrischen Kontakt mit Metallen

Author(s): Mikalo, Ricardo Pablo
Type: doctoralthesis
Year of publication: 2003
Publisher name: Osnarbrück : Der Andere Verlag
: konjugierte Polymere; Photoelektronenspektroskopie; XPS; XAS
ISBN: 3-89959-115-1

Primers of conductive polymers-application in powder coatings technology

Author(s): Yfantis, Alexandros D., Bourdas, N., Lambrakopoulos, S., Yfantis, N., Paloumpa, Ioanna, Yfantis, Alexandros D.
Type: conference publication
Year of publication: 2003
Source: 4th Panhellenic Conference of Chemical Engineering, 29-31 May 2003, Patras, Greece Proceedings, (griechisch)

Si(001) surface oxidation by N2O

Author(s): Hoffmann, Patrick, Mikalo, Ricardo Pablo, Schmeißer, Dieter
Type: article
Year of publication: 2002
: SI(100); dielectric; Oxynitride; Interface; SI; NO
Source: Journal of Non-Crystalline Solids 303(2002)1, S. 6-11, 0022-3093

Characterisation of the PrOx/Si(001) Interface by Photoelectron Spectroscopy

Author(s): Schmeißer, Dieter, Hoffmann, Patrick
Type: article
Year of publication: 2002
Source: BESSY annual report 2001, pp. 164-165, 0179-4159

Molekulare Resonanzen im Wirkungsquerschnitt der Photoemission in den Valenzzuständen der stöchiometrischen und der mit Natrium belegten WO3 und TiO2 (110) 1x1 Oberfläche

Author(s): Heller, Thomas
Type: doctoralthesis
Year of publication: 2002
Publisher name: Aachen : Shaker
: WO3; TiO2; Photoelektronenspektroskopie; Natriumadsorption
ISBN: 3-8322-0742-2
: Berichte aus der Physik

Mischkristalle des Systems ZnS-CuInS2 für multispektrale Solarzellen

Author(s): Müller, Klaus, Milko, Sergey, Burkov, Yevgen, Schmeißer, Dieter
Type: conference publication
Year of publication: 2002
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: CIS-Solarzellen; Röntgen-Photoelektronenspektroskopie; Tiefenprofilierung
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft
: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Band 37

Carbon-plot-microstructuring for all-polymer-transistors

Author(s): Müller, Klaus, Schmeißer, Dieter
Type: conference publication
Year of publication: 2002
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: organic field effect transistor; low cost printing; microstructuring
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft
URL: http://www.dpg-verhandlungen.de/year/2002/conference/regensburg/part/syoh/session/7/contribution/34?lang=de
: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Band 37

Synchrotron-induced photoemission of GaAs electrodes after electrochemical treatment in aqueous electrolytes

Author(s): Beerbom, Martin, Mayer, Thomas, Jaegermann, Wolfram, Batchelor, David R., Schmeißer, Dieter
Type: Scientific Article not ref.
Year of publication: 2002
: GAAS(110); GaAs; Electrochemistry; Aqueous electrolytes; Surface engineering
Source: Analytical and Bioanalytical Chemistry 374(2002)4, S. 650 - 653, 1618-2642

Investigations of perspective materials for aggressively scaled gate stacks and contact structures of MOS devices

Author(s): Goryachko, Andriy
Type: doctoralthesis
Year of publication: 2002
: silicon; praseodymium oxide; tungsten nitride; tungsten silicide; cobalt silicide; scanning tunneling microscopy; Angerelection spectroscopy
URL: http://opus4.kobv.de/opus4-btu/frontdoor/index/index/docId/59
URN: urn:nbn:de:kobv:co1-000000342

A vibrational study of the adsorption of glycine on clean and Na modified Si (100)-2x1 surfaces

Author(s): Lopez, Alberto, Heller, Thomas, Bitzer, Thomas, Richardson, Neville V.
Type: Scientific Article not ref.
Year of publication: 2002
: Silicon; Glycine; Sodium; Ab initio; HREELS
Source: Chemical physics, S. 1 - 8
Volume: 277
Issue/Journal number: 1
ISSN: 0301-0104

XAS investigation of texture in TiO2 thin films prepared by IBICVD

Author(s): Gracia, F., Martin-Concepcion, A. I., Barranco, A., Holgado, J. P., Espinos, J. P., Yubero, F., Batchelor, David R., Schmeißer, Dieter, Gonzalez-Elipe, A. R.
Type: article
Year of publication: 2002
Source: BESSY annual report 2001, pp. 176-178, 0179-4159

New chrome free, environmentally friendly methods in chemical processes

Author(s): Yfantis, Alexandros D., Tzalas, B., Lambrakopoulos, S., Anagnostaki, E., Schmeißer, Dieter
Type: Scientific Article not ref.
Year of publication: 2002
: Alloys; Polypyrrole; Polymers
Source: Environmental Science & Pollution Research, Special Issue 3 (2002) 121

Back-propagation based neural network with a two sensor system for monitoring of carbon dioxide and relative humidity

Author(s): Henkel, Karsten, Schmeißer, Dieter
Type: article
Year of publication: 2002
Source: Analytical and Bioanalytical Chemistry 374(2002)2, S. 329-3374, 1618-2642

Method of chemical deposition of compose conductive polymer coatings on aluminium alloy surfaces

Author(s): Yfantis, Alexandros D., Schmeißer, Dieter
Type: patent
Year of publication: 2002
Patent number: 100 37 63

A study of anticorrosive conversion coatings based on conductive polymers of pyrrole

Author(s): Yfantis, Alexandros D., Bourdas, N., Yfantis, N., Yfantis, Alexandros D., Lambrakopoulos, S., Paloumpa, Ioanna, Schmeißer, Dieter
Type: conference publication
Year of publication: 2002
Source: 19th Panhellenic Conference of Chemistry, 6-10 November 2002, Crete, Greece

Interface engineering of photoelectrochemically prepared Si surfaces

Author(s): Lewerenz, Hans-Joachim, Aggour, Mohammed, Murrell, Chris, Kanis, M., Hoffmann, Patrick, Jungblut, H., Schmeißer, Dieter
Type: Scientific Article not ref.
Year of publication: 2002
: Mean Free Paths; Silicon; Range
Source: Journal of Non-Crystalline Solids 303(2002)1, S. 1-5, 0022-3093

Electric contacts on conductive polymers: sodium on poly(3-hexylthiophene-2,5-diyl)

Author(s): Mikalo, Ricardo Pablo, Schmeißer, Dieter
Type: article
Year of publication: 2002
Source: Synthetic Metals 127 (2002) S. 273-277, 0379-6779

Novel corrosion-resistant films for Mg alloys

Author(s): Yfantis, Alexandros D., Paloumpa, Ioanna, Schmeißer, Dieter, Yfantis, Alexandros D.
Type: article
Year of publication: 2002
: polypyrrole; polyacrylic; coating; magnesium; corrosion inhibition
Source: Surface and Coatings Technology 151-152(2002) S. 400-404, 0257-8972

Wet-chemical preparation of silicate adlayer reconstructed SiC(0001) surfaces as studied by PIES and LEED

Author(s): Sieber, N., Seyller, Th., Graupner, R., Ley, L., Mikalo, Ricardo Pablo, Hoffmann, Patrick, Batchelor, David R., Schmeißer, Dieter
Type: article
Year of publication: 2002
: Core level; Photoelectron spectroscopy; Synchrotron radiation; Wet-chemical preparation OXIDE
Source: Materials science forum 389-393(2002) pp. 717-720, 0255-5476

Präparation und in-situ Charakterisierung MBE-gewachsener Kupferindiumdisulfid-Schichten

Author(s): Calvet, Wolfram
Type: doctoralthesis
Year of publication: 2002
: Halbleitergrenzflächen; Photovoltaik; Dünne Schichten; Chalkopyrite; CuInS2; MBE
URL: http://opus4.kobv.de/opus4-btu/frontdoor/index/index/docId/47
URN: urn:nbn:de:kobv:co1-000000242

Electrochemical interface modification of CuInS2 thin films

Author(s): Aggour, Mohammed, Stoerkel, Ulrich, Murrell, Chris, Campbell, S. A., Jungblut, H., Hoffmann, Patrick, Mikalo, Ricardo Pablo, Schmeißer, Dieter, Lewerenz, Hans-Joachim
Type: Scientific Article not ref.
Year of publication: 2002
: thin-film solar cells; copper indium disulfide; atomic force microscopy (AFM); photoelectron spectroscopy; synchrotron radiation; Solar-Cell
Source: Thin Solid Films 403-404 (2002)S. 57-61, 0040-6090

Elektronik mit organischen Materialien

Author(s): Müller, Klaus, Henkel, Karsten, Mikalo, Ricardo Pablo, Paloumpa, Ioanna, Schmeißer, Dieter
Type: Scientific Article not ref.
Year of publication: 2002
Publisher name: BTU Cottbus, Eigenverlag
Source: Forum der Forschung, 6(2002)13, S. 117-121, 0947-6989

PEEM - a spectromicroscopic tool for mc-Si surface evaluation

Author(s): Hoffmann, Patrick, Mikalo, Ricardo Pablo, Schmeißer, Dieter
Type: article
Year of publication: 2002
: multicrystalline silicon; photoelectron spectroscopy; PEEM
Source: Solar Energy Materials and Solar Cells 72 (2002)1-4, S. 517-523, 0927-0248

Sensorsystem zur Unterscheidung von Geruchsmustern in Tierställen

Author(s): Schwiertz, Carola, Henkel, Karsten, Paloumpa, Ioanna, Schmeißer, Dieter
Type: part of book (chapter)
Year of publication: 2002
Source: Sensoren im Fokus neuer Anwendungen. - Dresden : w.e.b.-Univ.-Verl.,2002, S. 88- 91, 3-935712-71-5 (Dresdner Beiträge zur Sensorik ; 16)

The Pr2O3/Si(001) interface: a mixed Si-Proxide

Author(s): Schmeißer, Dieter, Hoffmann, Patrick, Müssig, Hans-Joachim
Type: part of book (chapter)
Year of publication: 2002
Publisher name: Berlin : Bessy
Source: BESSY annual report 2001, S. 171 - 173

Low-cost-Plot-Technologie fur die Mikrostrukturierung von Gassensoren

Author(s): Müller, Klaus, Henkel, Karsten, Paloumpa, Ioanna, Schmeißer, Dieter
Type: conference publication
Year of publication: 2002
Publisher name: Dresden : w.e.b. Universitätsverlag
Source: Sensoren im Fokus neuer Anwendungen, 5. Dresdner Sensor-Symposium, 10. - 12. Dezember 2001, Dresden, S. 166 - 169
ISBN: 3-935712-71-5
: Dresdner Beiträge zur Sensorik Band ; 16

PEEM and µ-NEXAFS of Cu-In-S-Surfaces

Author(s): Müller, Klaus, Hoffmann, Patrick, Milko, S., Burkov, Yevgen, Schmeißer, Dieter
Type: article
Year of publication: 2002
Source: BESSY annual report 2001, pp. 162-163, 0179-4159

Backpropagation-Netzwerke für ein Zweisensorsystem zur Erfassung von Kohlendioxidkonzentrationen und relativer Luftfeuchte

Author(s): Henkel, Karsten, Hoffmann, Patrick, Schmeißer, Dieter
Type: part of book (chapter)
Year of publication: 2002
Publisher name: Dresden : w.e.b. Universitätsverlag
Source: Dresdner Beiträge zur Sensorik ; Band 16
Source: Sensoren im Fokus neuer Anwendungen : Verbraucherschutz und Lebensmittelkontrolle, Biosysteme und Nanobiotechnologie, Umweltmesstechnik, neue Sensormaterialien, Mess- und Eichwesen, S. 104 - 107
ISBN: 3-935712-71-5; 978-3-935712-71-2

Photoemission study of Aluminium Steel cold welded joints

Author(s): Batchelor, David R., Hoffmann, Patrick, Schmeißer, Dieter
Type: article
Year of publication: 2002
Source: BESSY annual report 2001, pp. 273-274, 0179-4159

Focus IS-PEEM investigations at U49/II: experimental determination of a magnification function, the contrast mechanism and the spectral resolution

Author(s): Jäckel, B., Thißen, A., Hunger, Ralf, Klein, A., Jaegermann, Wolfram, Hoffmann, Patrick, Schmeißer, Dieter
Type: article
Year of publication: 2002
Source: BESSY annual report 2001, pp. 287-288, 0179-4159

Copper Satellite Structure in Porphyrazine Compounds

Author(s): Pop, D., Winter, B., Batchelor, David R., Freyer, W., Weber, R., Bröcker, D., Hertel, I. V., Schmeißer, Dieter, Widdra, Wolf
Type: article
Year of publication: 2002
Source: BESSY annual report 2001, pp. 121-123, 0179-4159

High Resolution Photoelectron Spectroscopy on SiC Surfaces

Author(s): Seyller, Th., Sieber, N., Graupner, R., James, D., Riley, J., Leckey, R., Polcik, M., Schmeißer, Dieter
Type: article
Year of publication: 2002
Source: BESSY annual report 2001, pp. 116-118, 0179-4159

A Spectro-Microscopic Approach for Thin Film Analysis Grain Boundaries in mc-Si and Sn/SnO2 Nano Particles

Author(s): Hoffmann, Patrick, Mikalo, Ricardo Pablo, Yfantis, Alexandros D., Batchelor, David R., Appel, Günter, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2001
Source: Microchimica Acta, S. 109 - 113
Volume: 136
Issue/Journal number: 3-4
ISSN: 1436-5073; 0026-3672

Adsorption of water on alkoxy modified Si(1 0 0), Si(1 1 3) and Si(1 1 5) surfaces

Author(s): Lopez, A., Bitzer, Thomas, Heller, Thomas, Richardson, Neville V.
Type: article
Year of publication: 2001
Source: Surface Science, Vol. 473, 108-116.

The influence of sodium on the adsorption of water on SrTiO3(100)-1x1 surfaces

Author(s): Lopez, A., Heller, Thomas, Bitzer, Thomas, Chen, Q., Richardson, Neville V.
Type: article
Year of publication: 2001
Source: Surface Science 494(2001)3, L811-L814, 0039-6028

Selective polypyrrole electrodes for quartz microbalances : NO2 and gas flux sensitivities

Author(s): Henkel, Karsten, Oprea, A., Paloumpa, Ioanna, Appel, Günter, Schmeißer, Dieter, Kamieth, P.
Type: Scientific Article ref.
Year of publication: 2001
Source: Sensors and Actuators : B, Chemical 76(2001)1-3, S. 124 - 129
Volume: 76
Issue/Journal number: 1-3
ISSN: 0925-4005

Depth profiling using synchrotron radiation with high energetic resolution as demonstrated for Si-, SiC-, SiGe-, and SiGeC-samples

Author(s): Mikalo, Ricardo Pablo, Hoffmann, Patrick, Schmeißer, Dieter, Lloyd Spetz, Anita, Lundström, Ingemar, Wawra, Herbert, Pressel, Klaus, Ourmazd, Abbas
Type: conference publication
Year of publication: 2001
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: X-Ray photoelectron spectroscopy (XPS); synchrotron; depth profiling
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft
URL: http://www.dpg-verhandlungen.de/year/2001/conference/hamburg/part/o/session/13/contribution/74?lang=de
: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Band 36

Si(001) surface oxidation

Author(s): Hoffmann, Patrick, Mikalo, Ricardo Pablo, Schmeißer, Dieter
Type: conference publication
Year of publication: 2001
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: oxynitride; X-ray photoelectron spectroscopy (XPS); photoemssion electron spectroscopy (PEEM)
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft
URL: http://www.dpg-verhandlungen.de/year/2001/conference/hamburg/part/o/session/13/contribution/75?lang=de
: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Band 36

Conductive polymers of pyrrole as pigments in organic anticorrosive coatings-application for aluminium alloys

Author(s): Yfantis, Alexandros D., Tsiniarakis, G., Labrakopoulos, S., Yfantis, Alexandros D., Schmeißer, Dieter
Type: conference publication
Year of publication: 2001
Source: Proceedings of 18th Panhellenic Congress of Chemistry, Athens, 10-13 March 2001.

Piezoelectric polymer sensor for high pressures in forming machines

Author(s): Henkel, Karsten, Elling, B., Danz, R., Büchtemann, A., Straube, Oliver, Paloumpa, Ioanna, Yfantis, Alexandros D., Schmeißer, Dieter
Type: conference publication
Year of publication: 2001
Source: Materials Week 2000, proceedings CD-ROM
URL: http://www.materialsweek.org/proceedings/index.htm

Elementary Processes at Solid/Electrolyte Interfaces

Author(s): Jaegermann, Wolfram, Schmeißer, Dieter
Type: conference publication
Year of publication: 2001
Source: BESSY - Visions of Science The BESSY SASE-FEL Workshop Holzhau, Januar 2001, Seite 137-140.

The interface of friction-welded Al-Fe joints. ATB Metallurgy

Author(s): Hulea, Iulian, Hoffmann, Patrick, Brinza, Monica, Batchelor, David R., Schmeißer, Dieter
Type: conference publication
Year of publication: 2001
Source: Proceedings of Aluminium Surface Science and Technology Symposium 2000 Umist/Manchester, Vol. 40 (2000) / Vol. 41, 157-162.

The chromatic aberration of PEEM - demonstration on graphite inclusions in cast iron, Kategrorie: Microscopy - Spectromicroscopy

Author(s): Hoffmann, Patrick, Mikalo, Ricardo Pablo, Batchelor, David R., Schmeißer, Dieter, Soinski, M. S., Follath, Rolf
Type: article
Year of publication: 2001
Source: BESSY annual report 2000, pp. 272-273, 0179-4159

Electrochemically Induced Redox-Reactions on GaAs-Surfaces: High Resolution Photoemission Spectra Taken at the U49/2 Beamline

Author(s): Beerbom, Martin, Mayer, Thomas, Jaegermann, Wolfram, Batchelor, David R., Schmeißer, Dieter
Type: Scientific Article not ref.
Year of publication: 2001
Source: BESSY annual report 2000, pp. 289-290, 0179-4159

Valence band spectroscopy of semiconducting regioregular Poly(3-Hexylthiophene)-2,5-diyl

Author(s): Mikalo, Ricardo Pablo, Hoffmann, Patrick, Batchelor, David R., Schmeißer, Dieter
Type: article
Year of publication: 2001
Source: BESSY annual report 2000, pp. 145-146, Kategorie: Solids, 0179-4159

Structural, electronic and chemical properties of hydrogen terminated 6H-SiC

Author(s): Sieber, N., Mantel, B. F., Seyller, Th., Ristein, J., Ley, L., Heller, Thomas, Batchelor, David R., Schmeißer, Dieter
Type: article
Year of publication: 2001
Source: BESSY annual report 2000, pp. 179-180, 0179-4159

PEEM Investigation of CVD-Diamond grown on Si

Author(s): Graupner, R., Seyller, Th., Ley, L., Mikalo, Ricardo Pablo, Hoffmann, Patrick, Batchelor, David R., Schmeißer, Dieter
Type: article
Year of publication: 2001
Source: BESSY annual report 2000, pp. 270-271, 0179-4159

N2O-Oxidation of Si(100)

Author(s): Hoffmann, Patrick, Mikalo, Ricardo Pablo, Batchelor, David R., Schmeißer, Dieter, Follath, Rolf
Type: article
Year of publication: 2001
Source: BESSY annual report 2000, pp. 165-166, 0179-4159

Carbon-Plot-Micostructuring for All-Polymer-Transistors

Author(s): Müller, Klaus, Paloumpa, Ioanna, Schmeißer, Dieter
Type: conference publication
Year of publication: 2001
Source: Proceedings of European Conference on Organic Electronics and Related Phenomena (2001) 125-127

Polypyrrole based conversion coatings for aluminium alloys

Author(s): Yfantis, Alexandros D., Schmeißer, Dieter, Kompotiatis, L.
Type: article
Year of publication: 2001
Source: ATB Metallurgy, Proceedings of Aluminium Surface Science and Technology Symposium 2000, Umist/Manchester, 40 (2000) / 41 (2001) 527-532

Functional group selectivity in adsorption of 4-aminobenzoic acid on clean and Na modified Si(100)-2 x 1 surfaces

Author(s): Lopez, A., Bitzer, Thomas, Heller, Thomas, Richardson, Neville V.
Type: article
Year of publication: 2001
Source: Surface Science 480(2001)1-2, S. 65-72, 0039-6028

Kraftsensoren aus Polymerfolien-Piezoelektrische Polymersensoren für Hochdruckanwendungen

Author(s): Henkel, Karsten, Paloumpa, Ioanna, Schwiertz, B., Elling, B., Danz, R., Büchtemann, A., Straube, Oliver, Schmeißer, Dieter
Type: article
Year of publication: 2001
Source: Abschlussbericht zum BMBF-Forschungsprojekt 03N5020 9, Juni 2001

Gezielte Entwicklung von Sensormaterialien und Sensoren zur spezifischen Detektion von schwefel- und stickstoffhaltigen Stoffgruppen

Author(s): Henkel, Karsten, Paloumpa, Ioanna, Schwiertz, D., Schmeißer, Dieter, Kamieth, P., Schengber, P.
Type: report
Year of publication: 2001
Source: Abschlussbericht zum Forschungsprojekt 80 08 10 33, Juni 2001

Backcontact Formation on CdTe Thin Film Solar Cells

Author(s): Kraft, D., Thißen, A., Mayer, Thomas, Klein, A., Jaegermann, Wolfram, Hoffmann, Patrick, Batchelor, David R., Schmeißer, Dieter
Type: article
Year of publication: 2001
Source: BESSY annual report 2000, pp. 296-297, ISSN 0179-4159

Aufbau eines Sensorarrays zur Detektion von umwelt- und tierphysiologisch relevanten Komponenten

Author(s): Schwiertz, Carola, Henkel, Karsten, Paloumpa, Ioanna, Schmeißer, Dieter, Kamieth, P., Schnegber, P.
Type: report
Year of publication: 2001
Source: Abschlussbericht zum Forschungsprojekt 80 08 08 36, Juni 2001

PES and LEED study of hydrogen and oxygen terminated 6H-SiC(0001) and (000-1) surfaces

Author(s): Sieber, N., Seyller, Th., Graupner, R., Ley, L., Mikalo, Ricardo Pablo, Batchelor, David R., Schmeißer, Dieter
Type: article
Year of publication: 2001
Source: Applied Surface Science 184(2001)1-4, S. 278-283, 0169-4332

Commissioning Results of the BTUC-PGM beamline

Author(s): Batchelor, David R., Follath, Rolf, Mikalo, Ricardo Pablo, Hoffmann, Patrick, Schmeißer, Dieter
Type: article
Year of publication: 2001
Source: Beesy annual report 2000, pp. 303 - 304, 0179-4159

Development and Characterisation of Corrosion Resistent Layers of Conducting Polymers on Aluminium Alloys

Author(s): Yfantis, Alexandros D.
Type: doctoralthesis
Year of publication: 2001
Publisher name: Athen : Parissianou
: corrosion protection; conducting polymers; X-ray photoelectron spectroscopy
ISBN: 960-394-115-8

Nanoparticles as the Active Element of High-Temperature Metal-Insulator-Silicon Carbide Gas Sensors

Author(s): Böhme, O., Lloyd Spetz, Anita, Lundström, Ingemar, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2001
Source: Advanced Materials, S. 597 - 601
Volume: 13
Issue/Journal number: 8
ISSN: 1521-4095; 0935-9648

Adsorption of maleic anhydride on Si(1 0 0)-2 x 1

Author(s): Lopez, A., Bitzer, Thomas, Heller, Thomas, Richardson, Neville V.
Type: article
Year of publication: 2001
Source: Surface Science, S. 219 - 226
Volume: 477
ISSN: 0039-6028

Synthesis of dihydroxy silicon phthalocyanine tetrasulfonic acid and poly-µ-oxo silicon phthalocyanine tetrasulfonic acid

Author(s): Gürek, A. G., Appel, Günter, Mikalo, Ricardo Pablo, Schmeißer, Dieter
Type: Scientific Article ref.
Year of publication: 2001
Source: Journal of Porphyrins and Phthalocyanines, S. 751 - 757
Volume: 5
Issue/Journal number: 10
ISSN: 1099-1409; 1088-4246

Band Bending in Doped Conducting Polypyrrole Interaction with Silver

Author(s): Mikalo, Ricardo Pablo, Appel, Günter, Hoffmann, Patrick, Schmeißer, Dieter
Type: article
Year of publication: 2001
Source: Synthetic Metals, Vol. 122 Iss. 2, 249-261.

Commissioning Results of the BTUC-PGM beamline

Author(s): Batchelor, David R., Follath, Rolf, Schmeißer, Dieter
Type: article
Year of publication: 2001
Source: Nuclear Instruments and Methods in Physics Research, Vol. A 467-468, 470-473.

Oxide growth on SiC (0001) surfaces

Author(s): Schmeißer, Dieter, Mikalo, Ricardo Pablo, Hoffmann, Patrick, Seyller, Th., Ley, L., Lloyd Spetz, Anita
Type: article
Year of publication: 2001
Source: Applied Surface Science Vol. 184, 342-347.

Comparison of HF and ozone treated SiC surfaces

Author(s): Mikalo, Ricardo Pablo, Hoffmann, Patrick, Batchelor, David R., Schmeißer, Dieter, Lloyd Spetz, Anita, Lundström, Ingemar
Type: article
Year of publication: 2001
Source: Materials Science Forum, Vol. 353-356, 219-222 2001

Conductivity of Silver exposed Polypyrrole Films

Author(s): Mikalo, Ricardo Pablo, Appel, Günter, Schmeißer, Dieter
Type: article
Year of publication: 2001
Source: Synthetic Metals, Vol. 122 Iss. 1, 91-93 2001

Electronic and chemical passivation of hexagonal 6H-SiC surfaces by hydrogen termination

Author(s): Sieber, N., Mantel, B. F., Seyller, Th., Ristein, J., Ley, L., Heller, Thomas, Batchelor, David R., Schmeißer, Dieter
Type: article
Year of publication: 2001
Source: Applied Physics Letters 78(2001) S. 1216-1218, 0003-6951

Development of Joining Techniques through Pressforming of Steel and Aluminium

Author(s): Batchelor, David R., Berg, A., Simon, Sylvio, Wagner, Lothar, Viehweger, Bernd, Schmeißer, Dieter
Type: conference publication
Year of publication: 2001
Source: Materials Week 2000, proceedings CD-ROM
URL: http://www.materialsweek.org/proceedings/index.htm

The Adsorption of Maleic Anhydride on Si(100)-2x1: A Combined HREELS and NEXAFS Study

Author(s): Heller, Thomas, Lopez, Alberto, Bitzer, Thomas, Richardson, Neville V., Schmeißer, Dieter
Type: conference publication
Year of publication: 2000
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: adsorption; maleic anhydride; High resolution electron energy loss spectroscopy (HREELS); low-energy electron diffraction (LEED); Near-edge X-Ray absorption spectroscopy (NEXAFS)
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft
URL: http://www.dpg-verhandlungen.de/year/2000/conference/regensburg/part/o/session/11/contribution/56?lang=en
: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Band 35

Spektro-Mikroskopie auf multikristallinem Silizium

Author(s): Hoffmann, Patrick, Mikalo, Ricardo Pablo, Schmeißer, Dieter, Kittler, Martin
Type: conference publication
Year of publication: 2000
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: mc-Si; Solarzellen; Röntgen-Photoelektronenspektroskopie (XPS); Röntgen-Absorptionsspektroskopie (XAS, NEXAFS); Photoemissionselektronenspektroskopie (PEEM)
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft
URL: http://www.dpg-verhandlungen.de/year/2000/conference/regensburg/part/hl/session/16/contribution/10?lang=en
: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Band 35

Conducting Polypyrrole doped with Phthalocyaninesulfonates - new materials for chemical sensors

Author(s): Mikalo, Ricardo Pablo, Appel, Günter, Hoffmann, Patrick, Schmeißer, Dieter
Type: conference publication
Year of publication: 2000
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: polypyrrole; conducting polymer; X-ray photoelectron spectroscopy (XPS); X-Ray absorption spectroscopy (XAS); photo emission electron spectroscopy (PEEM); transmission electron microscopy (TEM); quartz crystal micro ballance (QMB); gas sensor
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft
URL: http://www.dpg-verhandlungen.de/year/2000/conference/regensburg/part/o/session/15/contribution/1?lang=en
: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Band 35

The Al-Fe interface of friction-welded joints

Author(s): Batchelor, David R., Hoffmann, Patrick, Schmeißer, Dieter, Hulea, Iulian, Brinza, Monica
Type: conference publication
Year of publication: 2000
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: Fe-Al interface; friction-welded; X-ray photoelectron spectroscopy (XPS); photoemission electron microscopy (PPEM); scanning Auger spectroscopy; electron probe micro-analysis (EPMA)
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft
: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Band 35

Isopropoxy induced stabilisation of the 2x1 reconstruction of Si(100)

Author(s): Heller, Thomas, Lopez, Alberto, Bitzer, Thomas, Richardson, Neville V., Schmeißer, Dieter
Type: conference publication
Year of publication: 2000
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: alcohol adsorption; anisotropic etching; high resolution electron energy loss spectroscopy (HREELS); low-energy electron diffraction (LEED)
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft
URL: http://www.dpg-verhandlungen.de/year/2000/conference/regensburg/part/o/session/11/contribution/55?lang=en
: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Band 35

Molecular Resonances in the Photoionization Cross Section (PIX) of Oxidic Semiconductors

Author(s): Heller, Thomas, Böhme, Oliver, Schmeißer, Dieter
Type: conference publication
Year of publication: 2000
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: X-Ray photoelectron spectroscopy; X-Ray absorption spectroscopy; Photoionization Cross Section (PIX); defect states
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft
URL: http://www.dpg-verhandlungen.de/year/2000/conference/regensburg/part/o/session/15/contribution/3?lang=en
: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Band 35

The Adsorption of maleic anhydride on Si(100)-2x1: A combined HREELS and NEXAFS study

Author(s): Bitzer, Thomas, Lopez, A., Heller, Thomas, Richardson, Neville V.
Type: article
Year of publication: 2000
Source: BESSY anual report 1999, pp. 384-385, 0179-4159

Entwicklung von Sensoren mit Elektroden aus leitfähigen Polymeren

Author(s): Henkel, Karsten, Paloumpa, Ioanna, Oprea, A., Appel, Günter, Schmeißer, Dieter, Frandsen, W., Schölzel, Mario
Type: report
Year of publication: 2000

Solare Energieumwandlung in dünnen Schichten

Author(s): Hoffmann, Patrick, Mikalo, Ricardo Pablo, Batchelor, David R., Beuckert, Guido, Schmeißer, Dieter, Kittler, Martin, Ourmazd, A., Lewerenz, Hans-Joachim
Type: conference publication
Year of publication: 2000
Source: Materials Week 2000, proceedings CD-ROM

Multi-Atom Resonant Photoemission applied to study the silver to nitrogen interaction in polypyrrole films

Author(s): Mikalo, Ricardo Pablo, Appel, Günter, Hoffmann, Patrick, Schmeißer, Dieter, Mast, M.
Type: article
Year of publication: 2000
Source: BESSY anual report 1999, pp. 308-310, 0179-4159

Spectro-Microscopy with PEEM / µESCA

Author(s): Hoffmann, Patrick, Schmeißer, Dieter, Klein, A., Jaegermann, Wolfram, Pettenkofer, Christian, Follath, Rolf
Type: article
Year of publication: 2000
Source: BESSY anual report 1999, pp. 443-444, 0179-4159

WAVE Calculations of Off Axis Undulator Radiation for the BESSY II U49 Undulator

Author(s): Batchelor, David R., Scheer, M., Schmeißer, Dieter
Type: article
Year of publication: 2000
Source: BESSY anual report 1999, pp. 473-475, ISSN 0179-4159

Spectro-Microscopic analyses in metallurgical systems: spheroidic graphite in cast iron and the interface of friction-welded Al-Fe joints

Author(s): Hoffmann, Patrick, Batchelor, David R., Schmeißer, Dieter
Type: conference publication
Year of publication: 2000
Source: Proceedings of the Polish-German Symposium on Science Research Education SRE' 2000, Part 1 (2000), S. 419-423, ISBN 83-85911-86-3

Nanoparticles and polarons: active centers in thin film sensor devices

Author(s): Schmeißer, Dieter, Appel, Günter, Böhme, O., Heller, Thomas, Mikalo, Ricardo Pablo, Hoffmann, Patrick, Batchelor, David R.
Type: article
Year of publication: 2000
Source: Sensors and actuators B 70(2000)1-3, S. 131-138, 0925-4005

A spectro-microscopic approach for spatially resolved characterisation of semiconductor structures in PEEM

Author(s): Hoffmann, Patrick, Mikalo, Ricardo Pablo, Schmeißer, Dieter
Type: article
Year of publication: 2000
Source: Solid State Electronics 44(2000)5, S. 837-843, 0038-1101

Polymeric Electrodes

Author(s): Appel, Günter, Mikalo, Ricardo Pablo, Henkel, Karsten, Oprea, A., Yfantis, Alexandros D., Paloumpa, Ioanna, Schmeißer, Dieter
Type: article
Year of publication: 2000
Source: Solid State Electronics 44(2000)5, S. 855-861, 0038-1101

E-MRS 1999 Spring Meeting, Strasbourg, June1-4,1999-Preface

Author(s): Schmeißer, Dieter, Richter, H., Pfitzner, L., Prasad, S.
Type: article
Year of publication: 2000
Source: Solid State Electronics 44(2000)5, V-V

A new chrome - free passivation method of tinplate used in the canning industry

Author(s): Yfantis, Alexandros D., Yfantis, Alexandros D., Tzalas, B., Schmeißer, Dieter
Type: article
Year of publication: 2000
Source: Corrosion 56(2000)7, S. 700-708, 0010-9312

Einfluß von Nanopartikeln auf die Funktion von Hochtemperatursensoren

Author(s): Hoffmann, Patrick, Böhme, Oliver, Schmeißer, Dieter, Lloyd Spetz, Anita, Mårtenson, Per
Type: conference publication
Year of publication: 1999
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: Hochtemperatursensoren; Röntgen-Photoelektronenspektroskopie (XPS); Tiefenprofilierung
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft
URL: http://www.dpg-verhandlungen.de/year/1999/conference/muenster/part/o/session/16/contribution/1?lang=en
: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Band 34

Leitfähiges Polypyrrol als Elektrodenmaterial: Wechselwirkungen mit Silber

Author(s): Mikalo, Ricardo Pablo, Appel, Günter, Hoffmann, Patrick, Schmeißer, Dieter
Type: conference publication
Year of publication: 1999
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: Polypyrrol; leifähiges Polymer; Röntgen-Photoelektronenspektroskopie (XPS); Röntgen-Absoprtionsspektroskopie (XAS, NEXAFS)
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft
URL: http://www.dpg-verhandlungen.de/year/1999/conference/muenster/part/o/session/11/contribution/57?lang=en
: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Band 34

Polaronen in SrTiO3(100)

Author(s): Heller, Thomas, Schmeißer, Dieter
Type: conference publication
Year of publication: 1999
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: Polaron; Röntgen-Photoelektronenspektroskopie; Gapzustände
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft
URL: http://www.dpg-verhandlungen.de/year/1999/conference/muenster/part/o/session/21/contribution/8?lang=en
: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Band 34

On the charge transfer process in ZnS based ac powder electroluminescent devices

Author(s): Oprea, Alexandru, Schmeißer, Dieter, Goldenblum, A.
Type: conference publication
Year of publication: 1999
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: ZnS; charge transfer process; ac powder electroluminescent device; time and brightness dependence; Monte Carlo simulation
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft
: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Band 34

Design of a PGM for the U49/2 Undulator at BESSY II

Author(s): Batchelor, David R., Follath, Rolf, Schmeißer, Dieter
Type: conference publication
Year of publication: 1999
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: Bessy II; undulator beamline U49/2; design
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft
URL: http://www.dpg-verhandlungen.de/year/1999/conference/muenster/part/o/session/36/contribution/81?lang=en
: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Band 34

The formation of oligomers in the electrolyte upon polymerization of pyrrole

Author(s): Appel, Günter, Schmeißer, Dieter, Bauer, Jakob, Bauer, Monika, Egelhaaf, H. J., Oelkrug, D.
Type: article
Year of publication: 1999
Source: Synthetic Metals 99(1999)1, S. 69-77, 0379-6779

Polypyrrole doped with fluoro-metal complexes: thermal stability and structural properties

Author(s): Yfantis, Alexandros D., Appel, Günter, Schmeißer, Dieter, Yfantis, Alexandros D.
Type: article
Year of publication: 1999
Source: Synthetic Metals 106(1999)3, S. 187-195, 0379-6779

Untersuchungen zur mesoskopischen und elektronischen Struktur von Polypyrroltosylat und Polypyrrolkupferphthalocyaninsulfonat

Author(s): Appel, Günter
Type: doctoralthesis
Year of publication: 1999
Publisher name: Aachen : Shaker
: Polypyrroltosylat; Polypyrrolkupferphthalocyaninsulfonat; elektronische Struktur; XPS; XAS
ISBN: 3-8265-4830-2

Doping and defect inhomogeneities of polypyrrole tosylate films as revealed by ?-NEXAFS

Author(s): Mikalo, Ricardo Pablo, Hoffmann, Patrick, Heller, Thomas, Batchelor, David R., Appel, Günter, Schmeißer, Dieter
Type: article
Year of publication: 1999
Source: Materials Science and Engineering C (1999)8-9, S. 257-265, 0928-4931

Increased sensor sensitivities obtained by polymer coated quartz microbalances

Author(s): Oprea, A., Henkel, Karsten, Oehmgen, R., Appel, Günter, Schmeißer, Dieter, Lauer, H., Hausmann, P.
Type: article
Year of publication: 1999
Source: Materials Science and Engineering C (1999)8-9, S. 509-512, 0928-4931

A spectro-microscopic approach to study the morphology and elemental distribution of mc-Si surfaces

Author(s): Hoffmann, Patrick, Mikalo, Ricardo Pablo, Schmeißer, Dieter, Kittler, Martin
Type: article
Year of publication: 1999
Source: Physica Status Solidi B 215 (1999)1, S. 743-749, 0031-8957

Determination of the Vacuum Level in NEXAFS-spectra by Selected-Yield-NEXAFS

Author(s): Mikalo, Ricardo Pablo, Appel, Günter, Hoffmann, Patrick, Schmeißer, Dieter
Type: article
Year of publication: 1999
Source: BESSY anual report 1998, pp. 255 - 257, 0179-4159

The BTU Cottbus Beamline at BESSY II

Author(s): Batchelor, David R., Schmeißer, Dieter, Follath, Rolf
Type: Scientific Article not ref.
Year of publication: 1999
Source: Forum der Forschung 8 (1999) 66-69, ISSN 0947-6989

Photoemissionselektronenmikroskopie - ein Instrument für die Materialforschung

Author(s): Hoffmann, Patrick, Mikalo, Ricardo Pablo, Schmeißer, Dieter
Type: article
Year of publication: 1999
Source: Forum der Forschung 8 (1999) 61-65, 0947-6989

Polarons in oxidic semiconductors - the SrTiO3 case

Author(s): Heller, Thomas, Böhme, O., Schmeißer, Dieter
Type: article
Year of publication: 1999
Source: BESSY anual report 1998, pp. 289-290, 0179-4159

Dipole moment of nanoparticles at interfaces

Author(s): Schmeißer, Dieter, Böhme, O., Yfantis, Alexandros D., Heller, Thomas, Batchelor, David R., Lundström, Ingemar, Lloyd Spetz, Anita
Type: article
Year of publication: 1999
Source: Chemical Physics Letters 313(1999)3-4, S. 411-415, 0009-2614

The polaron and bipolaron contributions to the electronic structure of polypyrrole films

Author(s): Appel, Günter, Böhme, O., Mikalo, Ricardo Pablo, Schmeißer, Dieter
Type: article
Year of publication: 1999
Source: Chemical Physics Letters 313(1999)3-4, S. 411-415, 0009-2614

Gap - Zustände in Wolframoxid WO3 - relaxierten Oberflächen

Author(s): Heller, Thomas, Böhme, Oliver, Schmeißer, Dieter
Type: conference publication
Year of publication: 1998
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: WO3; Röntgen-Photoelektronenspektroskopie (XPS); Gapzustände
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft
URL: http://www.dpg-verhandlungen.de/year/1998/conference/regensburg/part/o/session/11/contribution/102?lang=en
: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Band 33

PEEM-Untersuchung an Spaltflächen von MoTe2-(0001)

Author(s): Hoffmann, Patrick, Mikalo, Ricardo Pablo, Schmeißer, Dieter
Type: conference publication
Year of publication: 1998
Publisher name: Bad Honnef : Deutsche Physikalische Gesellschaft
: MoTe2; Photoemissionselektronenspektroskopie (PEEM); Austrittsarbeit
Source: Verhandlungen der Deutschen Physikalischen Gesellschaft
URL: http://www.dpg-verhandlungen.de/year/1998/conference/regensburg/part/o/session/5/contribution/5?lang=en
: Verhandlungen der Deutschen Physikalischen Gesellschaft ; Reihe 6, Band 33

The optical design of a PGM for the Undulator U49/2 at BESSY II

Author(s): Batchelor, David R., Follath, Rolf, Schmeißer, Dieter
Type: article
Year of publication: 1998
Source: BESSY anual report 1997, pp. 517-519, 0179-4159

Na interaction with relaxed WO3 thin films

Author(s): Heller, Thomas, Böhme, O., Tonti, D., Klein, A., Jaegermann, Wolfram, Schmeißer, Dieter
Type: article
Year of publication: 1998
Source: BESSY anual report 1997, pp. 421-422, 0179-4159

PEEM-investigations on cleaved MoTe2-surfaces

Author(s): Hoffmann, Patrick, Mikalo, Ricardo Pablo, Böhme, O., Schmeißer, Dieter
Type: article
Year of publication: 1998
Source: BESSY anual report 1997, pp. 484-485, 0179-4159

NEXAFS-Spectroscopy of Differently Doped Polypyrroles

Author(s): Appel, Günter, Böhme, O., Schmeißer, Dieter
Type: article
Year of publication: 1998
Source: BESSY anual report 1997, S. 253-254, 0179-4159

Electronic and magnetic properties of polypyrrole films depending on their 1-dimensional and 2-dimensional microstructures

Author(s): Naarmann, H., Schmeißer, Dieter, Bartl, A., Dunsch, L., Göpel, W.
Type: article
Year of publication: 1998
Source: Synthetic Metals 93(1998)1, S. 43-58, 0379-6779

Doping inhomogenities in Polypyrrole films: a Photoemission Electron Microscope (PEEM) and Spectro-Microscopic Study

Author(s): Mikalo, Ricardo Pablo, Hoffmann, Patrick, Böhme, O., Schmeißer, Dieter
Type: article
Year of publication: 1998
Source: BESSY anual report 1997, pp. 482-483, 0179-4159

Lateral Doping Inhomogeneities as Revealed by ?-NEXAFS and ?-PES

Author(s): Mikalo, Ricardo Pablo, Hoffmann, Patrick, Heller, Thomas, Schmeißer, Dieter
Type: article
Year of publication: 1998
Source: Solid State Phenomena 63(1998)4, S. 317-325, 1012-0394

X-ray photoemission and Auger electron spectroscopy analysis of fast responding activated metal oxide silicon carbide gas sensors

Author(s): Lloyd Spetz, Anita, Schmeißer, Dieter, Baranzahi, A., Wälivaare, B., Göpel, W., Lundström, Ingemar
Type: article
Year of publication: 1997
Source: Thin Solid Films 299(1997)1-2, S. 183-189, 0040-6090

Highly conductive polypyrrole films on nonconductive substrates

Author(s): Appel, Günter, Yfantis, Alexandros D., Göpel, W., Schmeißer, Dieter
Type: article
Year of publication: 1996
Source: Synthetic Metals 83(1996)3, S. 197-200, 0379-6779

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