Research activities
The research of the Department of Semiconductor Technology is carried out in joint appointment and close cooperation with IHP - Leibniz Institute for High Performance Microelectronics in Frankfurt (Oder).
The research work is concerned with the continuous development of state-of-the-art SiGe BiCMOS semiconductor technologies as a basis for ultrahigh-frequency applications, for example, in the fields of wireless communication systems, sensor technology, space travel and signal generation & analysis. A "More Than Moore" approach orthogonal to CMOS scaling (More Moore) is being pursued, i.e., increasing performance and functionality by adding technology modules and functions to the SiGe BiCMOS base technology.
- Functional and performance expansion by adding further process modules, such as PIC for Si photonics, through silicon vias
- III / V materials on Si to increase circuit performance or extend optical functionality
- Heterointegration & Assembly
Another research focus is in the field include RF mixed-signal and "slew-rate-limited" integrated circuits, whose characteristics and performance depend significantly on the switching speed of the semiconductor technology used. Typical "slew rate" limited circuits include
- Ultra-fast differential digital logic down to the sub-THz range
- Synthesizer components such as frequency dividers, phase detectors and ultra-low phase noise VCOs
- Ultra-fast high-resolution DACs for digital generation of high dynamic range RF signals
- Ultra-fast ADCs for direct sampling of RF signals
As part of the research into "slew rate"-limited circuits, we continue to research how the addition of other modules, such as Si photonics or III/V components, to the SiGe BiCMOS base technology can further increase the performance of these circuits. An end-to-end design methodology and consideration of different semiconductor technologies as well as aspects of heterogeneous integration are also part of the work.
State-of-the-art SiGe BiCMOS technologies fabricated in IHP's pilot line are used in the research work. For material and circuit characterization, state-of-the-art characterization technologies and metrology are available at IHP. Research work is carried out in close cooperation with national and international partners.