Embedded computer systems : architectures, modeling, and simulation : 22nd International Conference, SAMOS 2022, Samos, Greece, July 3-7, 2022, proceedings, S. 43 - 60
ISBN
978-3-031-15073-9
978-3-031-15074-6
Lecture notes in computer science ; 13511
ICU4SAT: A General-Purpose Reconfigurable Instrument Control Unit Based on Open Source Components
Embedded computer systems : architectures, modeling, and simulation : 22nd International Conference, SAMOS 2022, Samos, Greece, July 3-7, 2022, proceedings, S. 235 - 249
Technologien für die intelligente Automation book series ; volume 12
Hardware Module Design and Software Implementation of Multisensor Fire Detection and Notification System Using Fuzzy Logic and Convolutional Neural Networks (CNNs)
Author(s)
Sowah, Robert A., Apeadu, Kwaku, Gatsi, Francis, Ampadu, Kwame Owusu, Mensah, Baffour S.
Medeiros, Thiarles S., Berned, Gustavo P., Navarro, Antoni, Rossi, Fábio D., Luizelli, Marcelo C., Brandalero, Marcelo, Hübner, Michael, Beck, Antonio Carlos Schneider, Lorenzon, Arthur F.
Reactive current compensation method for PFC applications based on SOGI-PLL
Author(s)
Korte, Jan, Hübner, Michael
Type
Scientific Article ref.
Year of publication
2019
Source
VLSI Circuits and Systems Letter
Volume
5
Issue/Journal number
2
Configurable Fault Tolerant Circuits and System Level Integration for Self-Awareness
Author(s)
Segabinazzi Ferreira, Raphael, George, Nevin, Chen, Junchao, Hübner, Michael, Krstic, Milos, Nolte, Jörg, Vierhaus, Heinrich Theodor
Type
Conference Proceeding refering
Year of publication
2019
Publisher name
Kallithea, Chalkidiki (Greece) : SEA-Publications
Source
Proceedings of the Work in Progress Session held in connection with SEAA 2019, the 45th EUROMICRO Conference on Software Engineering and Advanced Applications and DSD 2019, the 22nd EUROMICRO Conference on Digital System Design
Improving Software-based Techniques for Soft Error Mitigation in OoO Superscalar Processors
Author(s)
Cardoso, Douglas Maciel, Tonetto, Rafael Billig, Brandalero, Marcelo, Agostini, Luciano, Nazar, Gabriel L., Azambuja, José Rodrigo, Beck, Antonio Carlos Schneider
Type
Conference Proceeding refering
Year of publication
2019
Source
2019 26th IEEE International Conference on Electronics, Circuits and Systems (ICECS), S. 201 - 204
A Knapsack Methodology for Hardware-based DMR Protection against Soft Errors in Superscalar Out-of-Order Processors
Author(s)
Tonetto, Rafael Billig, Cardoso, Douglas Maciel, Brandalero, Marcelo, Agostini, Luciano, Nazar, Gabriel L., Azambuja, José Rodrigo, Beck, Antonio Carlos Schneider
Type
Conference Proceeding refering
Year of publication
2019
Source
2019 IFIP/IEEE 27th International Conference on Very Large Scale Integration (VLSI-SoC), S. 287 - 292
Efficient Local Memory Support for Approximate Computing
Author(s)
Brandalero, Marcelo, Malfatti, Guilherme Meneguzzi, Oliveira, Geraldo Francisco, Silveira, Leonardo Almeida da, Gonçalves, Larissa Rozales, Da Silva, Bruno Castro, Carro, Luigi, Beck, Antonio Carlos Schneider
Type
Conference Proceeding refering
Year of publication
2018
Source
2018 VIII Brazilian Symposium on Computing Systems Engineering (SBESC), S. 122 - 129
32nd International Parallel and Distributed Processing Symposium workshops, IPDPSW 2018, proceedings, 21-25 May 2018, Vancouver, British Columbia, Canada, S. 154 - 161
A Dynamic Partial Reconfigurable Overlay Framework for Python
Author(s)
Janßen, Benedikt, Kästner, Florian, Wingender, Tim, Hübner, Michael
Editor(s)
Voros, Nikolaos, Hübner, Michael, Keramidas, Georgios, Göhringer, Diana, Antonopoulos, Christos, Diniz, Pedro C.
Type
conference publication
Year of publication
2018
Publisher name
Cham : Springer
Source
Proceedings, 14th International Symposium on Applied Reconfigurable Computing, Santorini, Greece, May 2-4, 2018, S. 331 - 342
ISBN
978-3-319-78889-0
978-3-319-78890-6
Lecture Notes in Computer Science ; 10824
Exploring Deep Neural Networks for Regression Analysis
Author(s)
Janßen, Benedikt, Kästner, Florian, Kautz, Frederik, Hübner, Michael
Editor(s)
Hübner, Michael, Rückemann, Claus-Peter
Type
conference publication
Year of publication
2018
Publisher name
[Wilmington] : IARIA
Source
PESARO 2018, the Eighth International Conference on Performance, Safety and Robustness in Complex Systems and Applications, April 22-26, 2018, Athens, Greece /
ISBN
978-1-61208-628-6
Runtime Adaptive Cache for the LEON3 Processor
Author(s)
Guzman, Osvaldo Navarro, Hübner, Michael
Editor(s)
Voros, Nikolaos, Hübner, Michael, Keramidas, Georgios, Göhringer, Diana, Antonopoulos, Christos, Diniz, Pedro C.
Type
conference publication
Year of publication
2018
Publisher name
Cham : Springer
Source
Proceedings, 14th International Symposium on Applied Reconfigurable Computing, Santorini, Greece, May 2-4, 2018, S. 343 - 354
CGRA Tool Flow for Fast Run-Time Reconfiguration
Author(s)
Fricke, Florian, Werner, André, Shahin, Keyvan, Hübner, Michael
Editor(s)
Voros, Nikolaos, Hübner, Michael, Keramidas, Georgios, Göhringer, Diana, Antonopoulos, Christos, Diniz, Pedro C.
Type
conference publication
Year of publication
2018
Publisher name
Cham : Springer
Source
Proceedings, 14th International Symposium on Applied Reconfigurable Computing, Santorini, Greece, May 2-4, 2018, S. 661 - 672
A Low-Cost BRAM-Based Function Reuse for Configurable Soft-Core Processors in FPGAs
Author(s)
Exenberger Becker, Pedro H., Sartor, Anderson L., Brandalero, Marcelo, Jost, Tiago Trevisan, Wong, Stephan, Carro, Luigi, Beck, Antonio Carlos Schneider
Type
Conference Proceeding refering
Year of publication
2018
Publisher name
Cham : Springer
Source
Applied Reconfigurable Computing. Architectures, Tools, and Applications14th International Symposium, ARC 2018, Santorini, Greece, May 2-4, 2018, Proceedings, S. 499 - 510
Hoffmann, Javier Eduardo, Guzman, Osvaldo Navarro, Kästner, Florian, Janßen, Benedikt, Hübner, Michael
Type
Conference Proceeding refering
Year of publication
2017
Publisher name
Wilmington, DE, USA : IARIA
Source
PESARO 2017, The Seventh International Conference on Performance, Safety and Robustness in Complex Systems and Applications, S. 33 - 39
ISBN
978-1-61208-549-4
A machine learning methodology for cache recommendation
Author(s)
Guzman, Osvaldo Navarro, Mori, Jones, Hoffmann, Javier Eduardo, Stuckmann, Fabian, Hübner, Michael
Type
Conference Proceeding refering
Year of publication
2017
Publisher name
Cham : Springer
Source
Applied Reconfigurable Computing : 13th International Symposium, ARC 2017, Delft, The Netherlands, April 3-7, 2017, Proceedings, S. 311 - 322
Fast Power Overhead Prediction for Hardware Redundancy-based Fault Tolerance
Author(s)
Scharoba, Stefan, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2017
Publisher name
Piscataway, NJ : IEEE
Source
IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS), 3-5 July 2017, Hotel Makedonia Palace, Thessaloniki, Greece, S. 265 - 270
ISBN
978-1-5386-0351-2
978-1-5386-0352-9
Extended Hsiao-Code Error Correction Considering Double and Triple Bit Errors
Author(s)
Pfeifer, Petr, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2017
Source
RESCUE 2017, Workshop on Reliability, Security and Quality, ETS17 Fringe Workshop, At Limassol, Cyprus
Enabling indoor object localization through Bluetooth beacons on the RADIO robot platform
Author(s)
Schwiegelshohn, Fynn, Wehner, Philipp, Werner, Florian, Gohringer, Diana, Hübner, Michael
Type
conference publication
Year of publication
2016
Publisher name
Piscataway, NJ : IEEE
Source
Proceedings, 2016 International Conference on Embedded Computer Systems, Architectures, Modeling and Simulation (SAMOS XVI), July 17-21, 2016, Samos, Greece, S. 328 - 333
Al Kadi, Muhammed Soubhi, Janßen, Benedikt, Hübner, Michael
Type
conference publication
Year of publication
2016
Publisher name
New York, NY : ACM, Association for Computing Machinery
Source
FPGA '16 Proceedings of the 2016 ACM/SIGDA International Symposium on Field-Programmable Gate Arrays, Monterey, California, USA — February 21 - 23, 2016, S. 254 - 263
ISBN
978-1-4503-3856-1
978-1-4503-4468-5
Integer Computations with Soft GPGPU on FPGAs
Author(s)
Al Kadi, Muhammed Soubhi, Hübner, Michael
Type
conference publication
Year of publication
2016
Publisher name
Piscataway, NJ : IEEE
Source
Proceedings of the 2016 International Conference on Field-Programmable Technology (FPT), Dec. 07-09, 2016, Xi'an China
A Multi-Layer Software Based Fault-Tolerance Approach for Heterogenous Multi-Core Systems
Author(s)
Schölzel, Mario, Koal, Tobias, Scharoba, Stefan, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2015
Publisher name
Piscataway, NJ : IEEE
Source
16th Latin-American Test Symposium (LATS 2015), Puerto Vallarta, Mexico, 25-27 March 2015, S. 1 - 6
ISBN
978-1-4673-6710-3
Exploring diagnostic capabilities of software-based self-tests for production and in-field application
Author(s)
Koal, Tobias, Scharoba, Stefan, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2015
Publisher name
Piscataway, NJ : IEEE
Source
Proceedings of the 2015 IEEE International Workshop of Electronics, Control, Measurement, Signals and Their Application to Mechatronics (ECMSM), June 22-24, 2015, Liberec, Czech Republic, S. 1 - 6
ISBN
978-1-4799-6970-8
978-1-4799-6973-9
Redundancy evaluation process of processor components for permanent fault compensation
Author(s)
Koal, Tobias, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2015
Publisher name
Piscataway, NJ : IEEE
Source
2015 NASA/ESA Conference on Adaptive Hardware and Systems (AHS 2015), Montréal, Quebec, Canada, 15-18 June 2015, S. 1 - 6
ISBN
978-1-4673-7501-6
978-1-4673-7502-3
Smarte Sensoren in der Feldebene
Author(s)
Glock, Thomas, Hillenbrand, Martin, Hübner, Michael
Type
Scientific Article ref.
Year of publication
2015
Source
atp edition, S. 32 - 42
Volume
57
Issue/Journal number
11
ISSN
2364-3137
Automating the Evaluation of Design Choices for Dependable Integrated Circuits
Author(s)
Scharoba, Stefan, Vierhaus, Heinrich Theodor
Type
Conference Proceeding refering
Year of publication
2015
Source
MEDIAN Finale - Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale (MEDIAN 2015)
Erzeugung diagnostischer Testmuster unter komplexen Contraints
Author(s)
Koal, Tobias, Eggersglüß, S., Schölzel, Mario
Type
conference publication
Year of publication
2015
Publisher name
Reutlingen : Robert Bosch GmbH
Source
Testmethoden und Zuverlässigkeit von Schaltungen und Systemen, 27. GI/GMM/ITG-Workshop, 1.-3. März 2015,
Towards an Interactive Dependability-Aware Design Space Exploration
Author(s)
Scharoba, Stefan, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2015
Publisher name
Linz : Johannes Kepler Universität
Source
Proceedings of the work in progress session held in connection with SEAA 2015, the 41st EUROMICRO Conference on Software Engineering and Advanced Applications and DSD 2015, the 18th EUROMICRO Conference on Digital System Design, Funchal, Madeira
ISBN
978-3-902457-44-8
Combined Detection and Correction of Transient Faults and Delay Faults
Author(s)
Scharoba, Stefan, Koal, Tobias, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2015
Publisher name
Berlin : VDE-Verlag
Source
ZuE 2015, Zuverlässigkeit und Entwurf, Beiträge der 8. GMM/ITG/GI-Fachtagung 21. – 23. September 2015 in Siegen
ISBN
978-3-8007-4071-0
Error Resilience in Digital Integrated Circuits
Author(s)
Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2015
Publisher name
Piscataway, NJ : IEEE
Source
Proceedings of the 2015 IEEE International Workshop of Electronics, Control, Measurement, Signals and Their Application to Mechatronics (ECMSM), June 22-24, 2015, Liberec, Czech Republic
ISBN
978-1-4799-6970-8
Test eingebetteter Prozessoren im Zielsystem mit hoher diagnostischer Auflösung
Author(s)
Gleichner, Christian, Vierhaus, Heinrich Theodor
Editor(s)
Cunningham, Douglas W., Hofstedt, Petra, Meer, Klaus, Schmitt, Ingo
Type
conference publication
Year of publication
2015
Publisher name
Bonn : Gesellschaft für Informatik
Source
Informatik 2015, Tagung vom 28. September – 2. Oktober 2015 in Cottbus, S. 1399 - 1414
ISBN
978-3-88579-640-4
GI-Edition : Lecture Notes in Informatics ; 246
Detection and Correction of Logic Errors Using Extra Time Slots
Author(s)
Dicorato, Davide, Vierhaus, Heinrich Theodor
Editor(s)
Cunningham, Douglas W., Hofstedt, Petra, Meer, Klaus, Schmitt, Ingo
Type
conference publication
Year of publication
2015
Publisher name
Bonn : Gesellschaft für Informatik
Source
Informatik 2015, Tagung vom 28. September – 2. Oktober 2015 in Cottbus, S. 1431 - 1444
ISBN
978-3-88579-640-4
GI-Edition : Lecture Notes in Informatics ; 246
Compiler-Centred Microprocessors Design (CoMet) - From C-Code to a VHDL Model of an ASIP
18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2015, 22-24 April 2015, Belgrade, Serbia, proceedings, S. 17 - 22
ISBN
978-1-4799-6779-7
978-1-4799-6780-3
Combining Correction of Delay Faults and Transient Faults
Author(s)
Koal, Tobias, Scharoba, Stefan, Vierhaus, Heinrich Theodor
Type
Scientific Article not ref.
Year of publication
2015
Publisher name
Piscataway, NJ : IEEE
Source
18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS 2015, S. 99 - 102
ISBN
978-1-4799-6780-3
Systematic Generation of Diagnostic Software-Based Self-Test Routines for Processor Components
Author(s)
Schölzel, Mario, Koal, Tobias, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2014
Publisher name
IEEE
Source
19th IEEE European Test Symposium (ETS), 26 May - 30 May 2014, Paderborn
ISBN
978-1-4799-3415-7
Potential of Using a Reconfigurable System on a Superscalar Core for ILP Improvements
Author(s)
Brandalero, Marcelo, Beck, Antonio Carlos Schneider
Type
Conference Proceeding refering
Year of publication
2014
Source
2014 Brazilian Symposium on Computing Systems Engineering, S. 43 - 48
Müller, Sebastian, Koal, Tobias, Schölzel, Mario, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2014
Source
IOLTS 2014, 20th IEEE International On-Line Testing Symposium Hotel Cap Roig, Platja d'Aro, Catalunya, Spain July 7-9, 2014
ISBN
978-1-4799-5324-0
Combining Fault Tolerance and Self Repair at Minimum Cost in Power and Hardware
Author(s)
Koal, Tobias, Schölzel, Mario, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2014
Publisher name
IEEE CS Press
Source
IEEE International Symposium DDECS 2014, Warschau, S. 153 - 159
ISBN
978-1-4799-4560-3
Vergleich der Beschreibung und Simulation einer Befehlssatzarchitektur in LISA und CoMet
Author(s)
Urban, Roberto, Lehniger, Kai, Heyne, Maximilian, Schölzel, Mario, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2014
Publisher name
Göttingen : Cuvillier Verlag
Source
MBMV 2014, Böblingen, Methoden und Beschreibungssprachen zur Modellierung und Verifikation von Schaltungen und Systemen, S. 101 - 112
ISBN
978-3-95404-637-9
Reconfigurable High Performance Architectures
Author(s)
Schölzel, Mario, Koal, Tobias, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2014
Publisher name
IEEE
Source
19th IEEE European Test Symposium (ETS), 26 May - 30 May 2014, Paderborn
ISBN
978-1-4799-3415-7
Entwicklungsumgebung für den compilerzentrierten Mikroprozessorentwurf (CoMet)
Author(s)
Urban, Roberto, Schölzel, Mario, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2014
Publisher name
Stuttgart : Fraunhofer Verlag
Source
DASS 2014, Dresdner Arbeitstagung Schaltungs- und Systementwurf, Tagungsband
ISBN
978-3-8396-0738-1
Probleme bei Erzeugung und simulationsbasierten Validierung softwarebasierter Selbsttests zur feingranularen Diagnose
Author(s)
Koal, Tobias, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2014
Publisher name
Stuttgart : Fraunhofer Verlag
Source
DASS 2014, Dresdner Arbeitstagung Schaltungs- und Systementwurf, Tagungsband
ISBN
978-3-8396-0738-1
Diagnostics self-test for dynamically scheduled superscalar processors based on reconfiguration techniques for handling permanent faults
Author(s)
Schölzel, Mario, Koal, Tobias, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2014
Publisher name
Piscataway, NJ : IEEE
Source
International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2014), Amsterdam, Netherlands, 1 - 3 October 2014, S. 27 - 32
ISBN
978-1-4799-6155-9
978-1-4799-6156-6
On reliability Estimation for Combined Transient and Permanent Fault Handling
Author(s)
Scharoba, Stefan, Schölzel, Mario, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2014
Publisher name
Piscataway, NJ : IEEE
Source
14th Biennial Baltic Electronic Conference (BEC), Tallinn, Estonia, 6-8 October 2014, S. 73 - 76
ISBN
978-1-4673-9539-7
978-1-4673-9540-3
A Multiple-ISA Reconfigurable Architecture
Author(s)
Capella, Fernanda M., Brandalero, Marcelo, Junior, Jair Fajardo, Beck, Antonio Carlos Schneider, Carro, Luigi
Type
Conference Proceeding refering
Year of publication
2013
Source
2013 III Brazilian Symposium on Computing Systems Engineering (SBESC), Dec. 4 2013 to Dec. 8 2013, Niteroi, Rio De Janeiro, Brazil, S. 71 - 76
Kombinierte On-Line-Fehlerkompensation und Selbstreparatur für Logik-Baugruppen
Author(s)
Koal, Tobias, Ulbricht, Markus, Engelke, Piet, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2013
Publisher name
Dresden : Fraunhofer-Institut
Source
Testmethoden und Zuverlässigkeit von Schaltungen und Systemen, 25. GI/GMM/ITG-Workshop, 24. bis 26. Februar 2013, Dresden
Virtual TMR Schemes Combining Fault Tolerance and Self Repair
Author(s)
Koal, Tobias, Ulbricht, Markus, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2013
Publisher name
IEEE
Source
16th IEEE International Euromicro Conference on Digital System Design, DSD 2013, 4-6 Sep 2013, Santander, Spain, S. 235 - 242
ISBN
978-0-7695-5074-9
Towards a Graceful Degradable Multicore-System by hierarchical Handling of Hard Errors
Author(s)
Müller, Sebastian, Schölzel, Mario, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2013
Publisher name
Piscataway : IEEE
Source
DaRMuS 2013, Special Session on Dynamic and Reliable Multicore Systems, Hosted by 21st EuromicroPDP Conference, S. 302 - 309
ISBN
978-146-735-321-2
Compilerzentrierter Mikroprozessor
Author(s)
Urban, Roberto, Schölzel, Mario, Vierhaus, Heinrich Theodor
Editor(s)
Dietrich, Manfred
Type
conference publication
Year of publication
2013
Publisher name
Stuttgart : Fraunhofer-Verl.
Source
Tagungsband Dredner Arbeitstagung für Schaltungs- und Systementwurf (DASS 2013)
ISBN
978-3-8396-0545-5
Ein konfigurierbarer Zwischencodesimulator zum compilerzentrierten Mikroprozessorentwurf
Author(s)
Urban, Roberto, Schölzel, Mario, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2013
Publisher name
Rostock : Univ., ITMZ
Source
Tagungsband Workshop Methoden und Beschreibungssprachen zur Modellierung und Verifikation von Schaltungen und Systemen (MBMV 2013)
On-Line-Test, Fehlerkorrektur znd Selbstreparatur mit Time-Shared TMR
Author(s)
Koal, Tobias, Ulbricht, Markus, Engelke, Piet, Vierhaus, Heinrich Theodor
Editor(s)
Dietrich, Manfred
Type
conference publication
Year of publication
2013
Publisher name
Stuttgart : Fraunhofer-Verl.
Source
Tagungsband Dresdner Arbeitstagung für Schaltungs- und Systementwurf (DASS), April 2013
ISBN
978-3-8396-0545-5
On the Feasibility of Combining On-Line-Test and Self Repair for Logic Circuits
Author(s)
Koal, Tobias, Ulbricht, Markus, Engelke, Piet, Vierhaus, Heinrich Theodor
Editor(s)
Sekanina, Lukas
Type
conference publication
Year of publication
2013
Publisher name
IEEE Computer Society
Source
16th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS 2013), Karlovny Vary, April 2013
ISBN
978-1-4673-6135-4
Towards an Automatic Generation of Diagnostic In-Field SBST for Processor Components
Author(s)
Schölzel, Mario, Koal, Tobias, Röder, Stephanie, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2013
Publisher name
Piscataway : IEEE
Source
Proceedings, 14th IEEE Latin American Test Workshop (LATW 2013)
Combining On-Line Fault Detection and Logic Self Repair
Author(s)
Koal, Tobias, Ulbricht, Markus, Vierhaus, Heinrich Theodor
Editor(s)
Raik, Jaan
Type
conference publication
Year of publication
2012
Publisher name
Piscataway, NJ : IEEE
Source
IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS 2012), Tallin, Estonia, 18 - 20 April 2012, S. 288 - 293
ISBN
978-1-4673-1185-4
Selbstreparatur für Logik-Baugruppen mit erweiterten Fähigkeiten für die Kompensation von Fertigungsfehlern und Frühausfällen
Author(s)
Koal, Tobias, Ulbricht, Markus, Engelke, Piet, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2012
Publisher name
Dresden : Fraunhofer IIS, Institutsteil EAS [u.a.]
Source
Dresdner Arbeitstagung für Schaltungs- und Systementwurf (DASS), Dresden, Mai 2012, Tagungsband
ISBN
978-3-8396-0404-5
Activity Migration in M-of-N-Systems by Means of Loading-Balancing
Author(s)
Ulbricht, Markus, Koal, Tobias, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2012
Publisher name
Piscataway : IEEE
Source
15th Euromicro Conference on Digital Systems Design (DSD), September 2012, S. 258 - 263
ISBN
978-1-4673-2498-4
Hierarchical Self-repair in Heterogenous Multi-core Systems by Means of a Software-based Reconfiguration
Author(s)
Müller, Sebastian, Schölzel, Mario, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2012
Publisher name
Piscataway : IEEE
Source
VEFRE 8th Workshop on Dependability and Fault-Tolerance, Proceedings of ARCS 2012 Workshops
ISBN
978-1-4673-1913-3
Logic Self Repair Architecture with Self Test Capabilities
Author(s)
Koal, Tobias, Ulbricht, Markus, Engelke, Piet, Vierhaus, Heinrich Theodor
Editor(s)
Drechsler, Rolf
Type
conference publication
Year of publication
2012
Publisher name
Berlin [u.a.] : VDE-Verl.
Source
Zuverlässigkeit und Entwurf, 6. GMM/GI/ITG-Fachtagung vom 25. bis 27. September 2012 in Bremen
ISBN
978-3-8007-3445-0
A Satellite Internal Communication Controller: Design and Implementation
Advances in Circuits, Systems, Automation and Mechanics : 11th WSEAS International Conference on Circuits, Systems Electronics, Control and Signal Processing, Montreux, S. 87 - 90
A New Hierarchical Built-In Test with On-Chip Diagnosis for VLIW Processors
Author(s)
Ulbricht, Markus, Schölzel, Mario, Koal, Tobias, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2011
Prozessoren; Test; Zuverlässigkeit
Source
IEEE 14th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS 2011), Cottbus, Germany, 13 - 15 April 2011, S. 143 - 146
5. GI /GMM/ITG-Fachtagung "Zuverlässigkeit und Entwurf"
Design and test technology for dependable systems-on-chip
Type
book
Year of publication
2011
Publisher name
Hershay, Pa. [u.a.] : Information Science Reference
Systems-on-Chip; Test; Zuverlässigkeit
ISBN
978-1-6096-0212-3
Dependability and Life Time Enhancement for Nano-Electronic Systems
Author(s)
Koal, Tobias, Schölzel, Mario, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2011
Publisher name
Poznan : Univ. of Technology, Fac. of Computing, Chair of Control and System Engineering
ICs; Mikroelektronik; Zuverlässigkeit
Source
Signal processing, SPA 2011, Poznan, 29 - 30th September 2011, conference proceedings, S. 61 - 67
ISBN
978-83-62065-02-8
On the Feasibility of Built-in Self Repair for Logic Circuits
Author(s)
Koal, Tobias, Scheit, Daniel, Schölzel, Mario, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2011
Publisher name
Piscataway, NJ : IEEE
ICs; Test; Zuverlässigkeit; Selbstreparatur
Source
2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2011), Vancouver, British Columbia, Canada, 3 - 5 October 2011, S. 316 - 324
ISBN
978-1-4577-1713-0
Fine-Grained Software-Based Self Repair of VLIW Processors
2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2011), Vancouver, British Columbia, Canada, 3 - 5 October 2011, S. 41 - 49
ISBN
978-1-4577-1713-0
Self Repair Technology for Global Interconnects on SoCs
Author(s)
Scheit, Daniel, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2011
Publisher name
Hershay, Pa. [u.a.] : Information Science Reference
Source
Design and test technology for dependable systems-on-chip, S. 195 - 215
ISBN
978-1-6096-0212-3
Built-in Self Repair for Logic Structures
Author(s)
Koal, Tobias, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2011
Publisher name
Hershay, Pa. [u.a.] : Information Science Reference
Source
Design and test technology for dependable systems-on-chip
ISBN
978-1-6096-0212-3
SoC Self Test Based on a Test Processor
Author(s)
Koal, Tobias, Kothe, René, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2011
Publisher name
Hershey [u.a.] : IGI Global
Source
Design an Test Technology for Dependable Systems on Chip, S. 360 - 375
ISBN
978-1-6096-0212-3
Self Repair by Program Reconfiguration in VLIW Processor Architectures
Author(s)
Schölzel, Mario, Pawlowski, Pawel, Dabrowski, Adam
Type
conference publication
Year of publication
2011
Publisher name
Hershay, Pa. [u.a.] : Information Science Reference
Source
Design and test technology for dependable systems-on-chip, S. 241 - 266
ISBN
978-1-6096-0212-3
Fault-tolerant integrated interconnections based on built-in self-repair and codes
HW / SW Co-Detection of Transient and Permanent Faults with Fast Recovery in Statically Scheduled Data Paths
Author(s)
Schölzel, Mario
Type
conference publication
Year of publication
2010
Publisher name
Piscataway, NJ : IEEE
Source
2010 Design, Automation & Test in Europe Conference & Exhibition, DATE 2010, Dresden, Germany, 8 - 12 March 2010, S. 723 - 728
ISBN
978-1-4244-7054-9
Software-Based Self-Repair of Statically Scheduled Superscalar Data Paths
Author(s)
Schölzel, Mario
Type
conference publication
Year of publication
2010
Source
Proceedings of the 13th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems, Vienna, April 2010, pp. 66-71
Eingebaute Selbstreparatur zur Kompensation von Produktions- und Alterungsfehlern
Author(s)
Koal, Tobias, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2010
Source
Elst, Günter (Hrsg.): DASS 2010, Dresdner Arbeitstagung Schaltungs- und Systementwurf. - Stuttgart : Fraunhofer-Verl., 2010 S. 73-78, 978-3-8396-0126-6
Möglichkeiten und Grenzen der Software-basierten Selbstreparatur in statisch geplanten superskalaren Prozessorarchitekturen
Author(s)
Schölzel, Mario
Type
conference publication
Year of publication
2010
Source
Elst, Günter (Hrsg.): DASS 2010, Dresdner Arbeitstagung Schaltungs- und Systementwurf. - Stuttgart : Fraunhofer-Verl., 2010 S. 79-84, 978-3-8396-0126-6
Schwachstellen und Engpässe bei Verfahren zur Fehlerkompensation und Selbstreparatur für hochintegrierte Schaltungen
Author(s)
Koal, Tobias, Scheit, Daniel, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2010
Publisher name
Berlin [u.a.] : VDE-Verlag
ICs; Fehler; Test; Selbstreparatur
Source
Zuverlässigkeit und Entwurf, 4. GMM/GI/ITG-Fachtagung vom 13. bis 15. September 2010 in Wildbad Kreuth, S. 57 - 62
ISBN
978-3-8007-3299-9
A Software Based Self Test and Hardware Reconfiguration Solution for VLIW Processors
Author(s)
Koal, Tobias, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2010
Publisher name
Piscataway, NJ : IEEE
Prozessoren; Zuverlässigkeit; Selbstreparatur
Source
2010 IEEE 13th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS 2010), Vienna, Austria, 14 - 16 April 2010, S. 40 - 43
ISBN
978-1-4244-6612-2
Combining De-Stressing and Self Repair for Long-Term Dependable Systems
Author(s)
Koal, Tobias, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2010
Publisher name
Piscataway, NJ : IEEE
ICs; Zuverlässigkeit; Test; Selbstreparatur
Source
2010 IEEE 13th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS 2010), Vienna, Austria, 14 - 16 April 2010, S. 99 - 104
ISBN
978-1-4244-6613-9
Effiziente Verfahren der Selbstreparatur von Logik
Author(s)
Gleichner, Christian, Koal, Tobias, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2010
ICs; Zuverlässigkeit; Selbstreparatur
Source
Hellebrand, S. (Hrsg.): Tagungsband TuZ 2010, Paderborn
Effective Logic Self Repair Based on Extracted Logic Clusters
Author(s)
Gleichner, Christian, Koal, Tobias, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2010
Publisher name
IEEE
ICs; SoCs; Zuverlässigkeit; Selbstreparatur
Source
Signal Processing Algorithms, Architectures, Arrangements, and Applications Conference Proceedings (SPA), 2010, Poznan
ISBN
978-1-4577-1485-6
Combining Hardware and Software Based Self Repair Methods for Statically Scheduled Data Paths
Author(s)
Müller, Sebastian, Schölzel, Mario
Type
conference publication
Year of publication
2010
Publisher name
Piscataway, NJ : IEEE
Prozessoren; Zuverlässigkeit; Selbstreparatur
Source
2010 IEEE 25th International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2010), Kyoto, Japan, 6 - 8 October 2010, S. 90 - 98
ISBN
978-1-424-48447-8
Effiziente Verfahren der Selbstreparatur von Logik
Author(s)
Gleichner, Christian, Koal, Tobias, Vierhaus, Heinrich Theodor
Type
Scientific Article ref.
Year of publication
2010
Source
TuZ (2010)pp. 79-84
Test Data and Power Reductions for Transition Delay Tests for Massive Parallel Scan Structures
Author(s)
Kothe, René, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2010
Publisher name
Piscataway, NJ : IEEE
ICs; Test; low-power
Source
2010 13th Euromicro Conference on Digital System Design, Architectures, Methods and Tools (DSD 2010), Lille, France, 1 - 3 September 2010, S. 283 - 290
Scaling the Discrete Cosine Transformation for Fault-Torelant Real-Time Execution
Author(s)
Schölzel, Mario
Type
conference publication
Year of publication
2009
Publisher name
Poznan : Univ. of Technology, Fac. of Computing Science and Management
Source
Signal processing, SPA 2009, Poznan, 24th - 26th September 2009, conference proceedings, S. 19 - 24
ISBN
978-83-62065-00-4
A Comprehensive Scheme for Logic Self Repair
Author(s)
Koal, Tobias, Scheit, Daniel, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2009
Publisher name
Poznan : Univ. of Technology, Fac. of Computing Science and Management
ICs; SoCs; Zuverlässigkeit; Selbstreparatur
Source
Signal processing, SPA 2009, Poznan, 24th - 26th September 2009, conference proceedings, S. 13 - 18
ISBN
978-83-62065-00-4
A Concept for Logic Self Repair
Author(s)
Koal, Tobias, Scheit, Daniel, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2009
Publisher name
Piscataway, NJ : IEEE
ICs; SoCs; Zuverlässigkeit; Selbstreparatur
Source
12th Euromicro Conference on Digital System Design, DSD '09, 27 - 29 Aug. 2009, Patras, Greece, S. 621 - 624
ISBN
978-1-424-44768-8
Reliability Estimation Process
Author(s)
Koal, Tobias, Scheit, Daniel, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2009
Publisher name
Piscataway, NJ : IEEE
ICs; SoCs; Zuverlässigkeit; Fehlertoleranz
Source
12th Euromicro Conference on Digital System Design, DSD '09, 27 - 29 Aug. 2009, Patras, Greece, S. 221 - 224
ISBN
978-1-424-44768-8
Selbstreparatur durch Regularisierung von Logik-Strukturen
Author(s)
Koal, Tobias, Scheit, Daniel, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2009
ICs; SoCs; Zuverlässigkeit; Selbstreparatur
Source
Zuverlässigkeit und Entwurf, 3. GMM/GI/ITG-Fachtagung vom 21. bis 23. September 2009 in Stuttgart, S. 29 - 36
ISBN
978-3-8007-3178-7
A Scheme of Logic Self Repair Including Local Interconnects
Author(s)
Koal, Tobias, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2009
Publisher name
Piscataway, NJ : IEEE
ICs; SoCs; Zuverlässigkeit; Selbstreparatur
Source
12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, DDECS, Liberec, Czech Republic, 15 - 17 April 2009
ISBN
978-1-4244-3339-1
A Delay Estimation of Rescheduling Schemes for Statically Scheduled Processors
Author(s)
Schölzel, Mario
Type
conference publication
Year of publication
2009
Publisher name
Berlin [u.a.] : VDE-Verlag
Prozessoren; Fehlertoleranz
Source
Workshop proceedings, ARCS 2009, 22th International Conference on Architecture of Computing Systems, March 11, 2009, Delft, The Netherlands, S. 117 - 124
ISBN
978-3-8007-3133-6
Logik-Selbstreparatur auf der Basis elementarer Logik-Blöcke mit lokaler Redundanz
Author(s)
Koal, Tobias, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2009
ICs; SoCs; Zuverlässigkeit; Selbstreparatur
Source
Drechsler, R. (Hrsg.): Proc. TUZ 2009, U. Bremen
Logic Self Repair Based on Regular Buidling Blocks
Author(s)
Koal, Tobias, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2009
ICs; SoCs; Zuverlässigkeit; Selbstreparatur
Source
Proc. ARCS2009 Workshop on Fault Tolerance,VDI / VDE
Logic Self Repair Based on Regular Building Blocks
Author(s)
Koal, Tobias, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2009
Publisher name
Berlin [u.a.] : VDE-Verl.
Source
Workshop proceedings, ARCS 2009, 22th International Conference on Architecture of Computing Systems, March 11, 2009, Delft, The Netherlands, S. 71 - 76
ISBN
978-3-8007-3133-6
Zentrale und dezentrale Selbstreparatur von Bussen
Author(s)
Scheit, Daniel, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2009
ICs; SoCs; Zuverlässigkeit; Selbstreparatur
Source
Drechsler, R. (Hrsg.): Proceedings TUZ 2009, Bremen
Zentrale und dezentrale Selbstreparatur von Bussen
Author(s)
Scheit, Daniel, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2009
Publisher name
Berlin [u.a.] : VDE-Verlag
ICs; SoCs; Zuverlässigkeit; Fehlertoleranz
Source
Proceedings, EdaWorkshop 09, Dresden (Germany), May 26 - 28, 2009, S. 37 - 42
ISBN
978-3-8007-3165-7
Basic Architecture for Logic Self Repair
Author(s)
Koal, Tobias, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2008
Source
14th IEEE International On-Line Testing Symposium, 2008. - Piscataway : IEEE, 2008, S. 177-178, 978-0-7695-3264-6
Simulated fault injections and their acceleration in system C
Author(s)
Misera, Silvio Andre, Vierhaus, Heinrich Theodor
Type
article
Year of publication
2008
Fehlersimulation
Source
Journal of Microprocessors and Microsystems 32(2008)5-6, pp. 270-278, 0141-9331
Test Technology for Sequential Circuits
Author(s)
Vierhaus, Heinrich Theodor, Stamenković, Zoran
Editor(s)
Oklobdzija, Vojin G.
Type
part of book (chapter)
Year of publication
2008
Publisher name
Boca Raton : CRC Press
Test; Testable Design
Source
The Computer Engineering Handbook, Part 1, Digital design and fabrication
ISBN
978-0-8493-8602-2
Embedded Diagnostic Logic Test Exploiting Regularity
Author(s)
Kothe, René, Vierhaus, Heinrich Theodor
Editor(s)
Fanucci, Luca
Type
conference publication
Year of publication
2008
Publisher name
Piscataway, NJ : IEEE
IC-Test
Source
Proceedings, 11th EUROMICRO Conference on Digital System Design: Architectures, Methods and Tools, 2008, DSD '08, 3 - 5 Sept. 2008, Parma, Italy, S. 873 - 879
Möglichkeiten und Grenzen der Selbstreparatur für Logik
Author(s)
Koal, Tobias, Scheit, Daniel, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2008
Publisher name
Dresden : Fraunhofer Institut für integrierte Schaltungen
ICs; SoCs; Zuverlässigkeit; Selbstreparatur
Source
Dresdner Arbeitstagung Schaltungs- und Systementwurf - (DASS'2008), Workshop Entwurf integrierter Schaltungen (WEIS'08) 15. - 16. Mai 2008
ISBN
3-9810287-2-4
Ein hybrides Selbsttest- und Reparaturkonzept für VLIW-Prozessoren
Author(s)
Schölzel, Mario
Type
conference publication
Year of publication
2008
Prozessoren; Test; Zuverlässigkeit
Source
Steininger, A. (Hrsg.): Proc. 20th ITG-GI-GMM-Workshop "Test und Zuverlässigkeit" 2008, TU Wien, Februar 2008
Logic Self Repair based on Regular Building Blocks
Author(s)
Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2008
ICs; SoCs; Zuverlässigkeit; Selbstreparatur
Source
Dabrowksi, A. (Hrsg.): Proc. IEEE NTAV /SPA 2008, Poznan
Möglichkeiten und Grenzen der Selbstreparatur für Logik
Author(s)
Koal, Tobias, Scheit, Daniel, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2008
Publisher name
Berlin [u.a.] : VDE-Verl.
ICs; SoCs; Zuverlässigkeit; Fehlertoleranz
Source
Zuverlässigkeit und Entwurf, 2. GMM/GI/ITG-Fachtagung vom 29. September bis 1. Oktober 2008 in Ingolstadt, S. 57 - 64
ISBN
978-3-8007-3119-0
GMM Fachbericht ; 57
Angepasste Fehlerdiagnose für die Selbstreparatur in logischen Schaltungen
Author(s)
Kothe, René, Scheit, Daniel, Vierhaus, Heinrich Theodor
Editor(s)
Elst, G.
Type
conference publication
Year of publication
2008
Publisher name
Dresden : Fraunhofer Institut für integrierte Schaltungen
Source
Dresdner Arbeitstagung Schaltungs- und Systementwurf, (DASS'2008), Workshop Entwurf integrierter Schaltungen (WEIS'08) 15. - 16. Mai 2008
ISBN
3-9810287-2-4
Fault Diagnosis in Logic Circuits Exploiting Regularity
Author(s)
Kothe, René, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2008
Publisher name
Berlin [u.a.] : VDE-Verl.
Source
Tagungsband, edaWorkshop 08, Hannover, 6. - 7. Mai 2008, S. 57 - 62
ISBN
978-3-8007-3101-5
Fehlertolerante integrierte Verbindungsstrukturen
Author(s)
Scheit, Daniel, Vierhaus, Heinrich Theodor
Editor(s)
Elst, G.
Type
conference publication
Year of publication
2008
Publisher name
Dresden : Fraunhofer Institut für integrierte Schaltungen
Source
Dresdner Arbeitstagung Schaltungs- und Systementwurf - (DASS'2008), S. 15 - 16
ISBN
3-9810287-2-4
Fehlertoleranz und Selbstreparatur von Verbindungsstrukturen auf SoCs
Author(s)
Scheit, Daniel, Vierhaus, Heinrich Theodor
Editor(s)
Steininger, Andreas
Type
conference publication
Year of publication
2008
Publisher name
Wien : Techn. Univ.
Source
20. ITG-GI-Workshop, Wien, TUZ 2008, S. 121 - 126
Fehlertolerante Busse basierend auf Codes und Selbstreparatur
Author(s)
Scheit, Daniel, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2008
ICs; SoCs; Zuverlässigkeit; Selbstreparatur
Source
Zuverlässigkeit und Entwurf : 2. GMM/GI/ITG-Fachtagung in Ingolstadt, September 2008. - Offenbach : VDI/VDE-Verlag, 2008, S. 157 - 158, 978-3-8007-3119-0 (GMM-Fachbericht ; 57)
A Scan Controller Concept for Low-Power Scan Test
Author(s)
Kothe, René, Vierhaus, Heinrich Theodor
Type
article
Year of publication
2008
Test; Low-Power
Source
Journal of Low-Power Electronis Vol. 4(2008) 1-9, 1546-1998
Simulation von Fehlern in digitalen Schaltungen mit SystemC
Flip-Flops and Scan Path Elements for Nanoelectronics
Author(s)
Kothe, René, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2007
Publisher name
IEEE
ICs; Test; Zuverlässigkeit; Fehlertoleranz
Source
Proceedings, Design and Diagnostics of Electronic Circuits and Systems DDECS '07, Krakow, 11 - 13 April 2007
ISBN
1-4244-1162-9
Hardware-nahe Fehlersimulation mit effektiven SystemC-Modellen
Author(s)
Misera, Silvio Andre, Sieber, André
Type
conference publication
Year of publication
2007
Publisher name
Aachen : Shaker
ICs; Fehler; Test; Fehlersimulation
Source
Methoden und Beschreibungssprachen zur Modellierung und Verifikation von Schaltungen und Systemen, 10. GI/ITG/GMM-Workshop Modellierung und Verifikation, S. 39 - 48
Reparaturfunktionen für Bus-Strukturen auf SoCs
Author(s)
Kothe, René, Vierhaus, Heinrich Theodor
Editor(s)
Sattler, Sebastian
Type
conference publication
Year of publication
2007
Publisher name
Berlin [u.a.] : VDE-Verl.
ICs; SoCs; Test; Selbstreparatur
Source
Zuverlässigkeit und Entwurf, 1. GMM/GI/ITG-Fachtagung vom 26. bis 28. März 2007 in München, S. 77 - 84
ISBN
978-3-8007-3023-0
3-8007-3023-5
GMM-Fachbericht ; 52
Repair Functions and Redundancy Management for Bus Structures
Author(s)
Kothe, René, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2007
Publisher name
Berlin [u.a.] : VDE-Verlag
ICs; Zuverlässigkeit; Fehlertoleranz
Source
Workshop proceedings, ARCS 2007, 20th International Conference on Architecture of Computing Systems, March 15, 2007, Zurich, Switzerland
ISBN
978-3-8007-3015-5
Reduced Triple Modular Redundancy for Built-in Self Repair in VLIW Processors
Author(s)
Schölzel, Mario
Type
conference publication
Year of publication
2007
Prozessoren; Zuverlässigkeit; Selbstreparatur
Source
Dabrowski, A. (Hrsg.): Proc. IEEE SPA 2007, Poznan, 2007
Timing / Power Optimization for Digital Logic Based on Standard Cells
Author(s)
Misera, Silvio Andre, Rossmann, Helmut, Vierhaus, Heinrich Theodor
Fault Injection Techniques and their Acccelerated Simulation in SystemC
Author(s)
Sieber, André, Misera, Silvio Andre, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2007
Publisher name
Los Alamitos, Calif. [u.a.] : IEEE Computer Society
ICs; Test; Fehlersimulation
Source
Proceedings, 10th Euromicro Conference on Digital System Design: Architectures, Methods and Tools, DSD 2007, 29 - 31 August 2007, Lübeck, Germany, S. 587 - 595
ISBN
978-0-7695-2978-3
A Configurable Modular Test Processor and Scan Controller Architecture
Author(s)
Frost, Raik, Rudolph, D., Galke, Christian, Kothe, René, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2007
Publisher name
Piscataway, NJ : IEEE
ICs; SoCs; Test; Selbsttest
Source
Proceedings, IOLTS 2007, 13th IEEE International On-Line Testing Symposium, Heraklion, Crete, Greece, 8 - 11 July 2007, S. 277 - 284
ISBN
0-7695-2918-6
Möglichkeiten und Grenzen der automatischen SBST-Generierung für einfache Prozessoren
Author(s)
Galke, Christian, Koal, Tobias, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2007
Publisher name
Dresden : TUDpress, Verl. der Wissenschaften
Prozessoren; Test; Zuverlässigkeit
Source
Dresdner Arbeitstagung Schaltungs- und Systementwurf - (DASS' 2007), 8. - 9. Mai 2007, S. 39 - 44
Galke, Christian, Kothe, René, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2006
Publisher name
Bonn : Ges. für Informatik
Source
Workshop proceedings, ARCS '06, 19th International Conference on Architecture of Computing Systems, March 16, 2006, Frankfurt am Main, S. 36 - 44
ISBN
978-3-88579-175-1
Evaluating Coverage of Error Detection Logic for Soft Errors using Formal Methods
Author(s)
Krautz, U., Pflanz, Matthias, Vierhaus, Heinrich Theodor, Jacobi, C., Tast, H. W.
Type
conference publication
Year of publication
2006
Publisher name
Piscataway, NJ : IEEE
Source
Design, automation and test in Europe, Munich, Germany, March 6 - 10, 2006, proceedings, vol. 1, S. 176 - 181
ISBN
3-9810801-1-4
Embedded Self Repair by Transistor and Gate Level Reconfiguration
Author(s)
Kothe, René, Vierhaus, Heinrich Theodor, Coym, Torsten, Vermeiren, W., Straube, B.
Type
conference publication
Year of publication
2006
Publisher name
IEEE
ICs; SoCs; Zuverlässigkeit; Selbstreparatur
Source
Design and Diagnostics of Electronic Circuits and systems, (DDECS 2006), Prag, April 2006, S. 208 - 213
ISBN
1-4244-0185-2
Built-in Self Repair by Reconfiguration of FPGAs
Author(s)
Habermann, Sven, Kothe, René, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2006
Publisher name
Los Alamitos, Calif [u.a.] : IEEE Computer Society
ICs; FPGAs; Zuverlässigkeit; Selbstreparatur
Source
Proceedings - IOLTS 2006, 12th IEEE International On-Line Testing Symposium, Lake of Como, Italy, July 10 - 12, 2006, S. 187 - 188
ISBN
978-0-7695-2620-1
Timing-Power-getriebener Layout-Entwurf für Zellen-basierte Digitalschaltungen
Author(s)
Vick, Axel, Rossmann, Helmut, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2006
ICs; Layout; Synthese; Timing; Power
Source
Methoden und Beschreibungssprachen zur Modellierung und Verifikation von Schaltungen und Systemen, 9. ITG/GI/GMM Workshop, 20. - 22. Februar 2006, Dresden, S. 61 - 69
An Embedded Test Strategy for Global and Regiional Interconnects on SoCs
Author(s)
Kothe, René, Vierhaus, Heinrich Theodor
Editor(s)
Dabrowski, Adam
Type
conference publication
Year of publication
2006
Bus-Test; ICs; Test
Source
Signal processing '2006, workshop proceedings, Poznan, 29th September 2006, S. 65 - 70
ISBN
83-913251-7-2
A Mixed Level Fault Simulation of VHDL and SystemC
Author(s)
Misera, Silvio Andre, Breitenfeld, Lars, Sieber, André, Vierhaus, Heinrich Theodor
Eine Mixed-Language-Fault-Simulation von VHDL- und SystemC-Modellen
Author(s)
Misera, Silvio Andre, Sieber, André, Breitenfeld, Lars, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2006
Publisher name
Dresden : Fraunhofer-Institut
ICs; SoCs; Zuverlässigkeit; Fehlersimulation
Source
Dresdner Arbeitstagung Schaltungs- und Systementwurf (DASS'2006), 10. - 11. Mai 2006
Selbstreparatur von Logik-Baugruppen in hochintegrieten Schaltungen- Möglichkeiten und Grenzen
Author(s)
Kothe, René, Habermann, Sven, Vierhaus, Heinrich Theodor, Coym, Torsten, Vermeiren, W., Straube, B.
Type
conference publication
Year of publication
2006
Publisher name
Dresden : Fraunhofer-Institut
ICs; SoCs; Fehlertoleranz; Selbstreparatur
Source
Dresdner Arbeitstagung Schaltungs- und Systementwurf (DASS'2006), 10. - 11. Mai 2006
Hierarchische Fehlersimulation mit effektiven SystemC-Modellen
Author(s)
Misera, Silvio
Editor(s)
Bachmann, Peter, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2006
Publisher name
Cottbus : BTU, Inst. of Computer Science
Source
1st Cooperation Workshop of Computer Science, 2006, Cottbus, S. 31 - 36
Computer science reports ; 2006,3
Hardware/Software Based Hierarchical Self Test for SoCs
Author(s)
Kothe, René, Galke, Christian, Schultke, Sabine, Fröschke, Henry, Gaede, Steffen, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2006
Publisher name
Piscataway, NJ : IEEE Service Center
Source
Proceedings of the 2006 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, April 18-21, 2006, Prague, Czech Republic, S. 157 - 158
ISBN
1-4244-0185-2
Embedded Scan Test with Diagnostic Features for Self-Testing SoCs
Author(s)
Galke, Christian, Kothe, René, Schultke, Sabine, Winkler, Christin, Honko, Jeanette, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2006
Publisher name
Los Alamitos, Calif. [u.a.] : IEEE Computer Society
ICs; Test; Selbsttest
Source
Proceedings - IOLTS 2006, 12th IEEE International On-Line Testing Symposium, Lake of Como, Italy, July 10 - 12, 2006, S. 181 - 182
ISBN
978-0-7695-2620-1
Scan-Based SoC Test Using Space / Time Pattern Compaction Schemes
Author(s)
Galke, Christian, Gätzschmann, Uwe, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2006
ICs; SoCs; Test; Test Compression
Source
Proceedings / 9th EUROMICRO Conference on Digital System Design: Architectures, Methods and Tools, DSD 2006. - Los Alamitos, Calif. [u.a.] : IEEE Computer Society, 2006, S. 433 - 438, 0-7695-2609-8
Redundanz-Management und Fehlerisolierung für die Selbstreparatur in digitalen und analogen Schaltungen
Author(s)
Kothe, René, Galke, Christian, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2006
Publisher name
Berlin [u.a] : VDE-Verlag
ICs; SoCs; Zuverlässigkeit; Selbstreparatur
Source
ANALOG '06, Vorträge der 9. ITG/GMM-Fachtagung vom 27. bis 29. September 2006 in Dresden, S. 57 - 62
ISBN
978-3-8007-2988-3
ITG-Fachbericht ; 196
Selbstreparatur von Logik-Baugruppen in hochintegrierten Schaltungen - Möglichkeiten und Grenzen
Author(s)
Kothe, René, Habermann, Sven, Vierhaus, Heinrich Theodor
Type
Scientific Article not ref.
Year of publication
2006
Source
Forum der Forschung, S. 125 - 130
Volume
10
Issue/Journal number
19
ISSN
0947-6989
Power-Timing Optimierung für Zellen-basierte Digitalschaltungen in Submikron-Technologien
Author(s)
Vierhaus, Heinrich Theodor, Rossmann, Helmut
Type
conference publication
Year of publication
2005
Publisher name
Bonn : Gesellschaft für Informatik
Source
Informatik 2005 - Informatik LIVE!, Beiträge der 35. Jahrestagung der Gesellschaft für Informatik e.V., 19. - 22. September 2005 in Bonn, Bd. 1, S. 339 - 343
ISBN
3-88579-396-2
GI-Edition : Proceedings ; 67
A Multi-Purpose Concept for SoC Self Test Including Diagnostics Features
Author(s)
Kothe, René, Galke, Christian, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2005
Publisher name
IEEE Computer Society : Los Alamitos, Calif. [u.a.]
Source
11th IEEE International On-Line Testing Symposium, 2005, IOLTS 2005, 6 - 8 July 2005, [Saint Raphael, French Riviera, France, proceedings], S. 241 - 246
ISBN
0-7695-2406-0
Eine Simulationsumgebung zur Validierung des Fehlerverhaltens für Prozessor-basierte Systeme
Author(s)
Galke, Christian, Misera, Silvio, Fröschke, Henry, Vierhaus, Heinrich Theodor
Editor(s)
Hellebrand, Sybille
Type
conference publication
Year of publication
2005
Source
Testmethoden und Zuverlässigkeit von Schaltungen und Systemen, 17. ITG/GI/GMM Workshop, 27. Febr. - 1. März 2005, Hilton Innsbruck, Österreich
Parallele hierarchische Fehlersimulation zur Validierung des Fehlerverhaltens für SoCs
Author(s)
Galke, Christian, Vierhaus, Heinrich Theodor, Misera, Silvio, Fröschke, Henry
Type
conference publication
Year of publication
2005
Source
GI/ITG/GMM-Workshop Modellierung und Verifikation, 2005 an der TU München
Ein flexibler Ansatz für den Scan-Test von SoCs
Author(s)
Gätzschmann, Uwe, Galke, Christian, Vierhaus, Heinrich Theodor, Kaibel, M.
Type
conference publication
Year of publication
2005
Source
17. ITG-GI-GMM-Workshop Test und Zuverlässigkeit von Schaltungen und Systemen, Inssbruck, Febr./März 2005, S. 32-36
Transistor- and Gate Level Self Repair for Logic Circuits
Author(s)
Vierhaus, Heinrich Theodor, Dabrowski, Adam
Type
conference publication
Year of publication
2005
Source
Signal processing '2005, workshop proceedings, Poznan, 30th September 2005, S. 7 - 12
ISBN
83-913251-6-4
Application Specific Processor Design for Digital Signal Processing
Author(s)
Schölzel, Mario, Bachmann, Peter, Vierhaus, Heinrich Theodor
Editor(s)
Dabrowski, Adam
Type
conference publication
Year of publication
2004
Publisher name
Poznan : Poznan Univ. of Technology
Source
Signal processing '2004, workshop proceedings, Poznan, 24th September 2004, S. 7 - 15
ISBN
83-913251-5-6
A Hierarchical Self Test Scheme for SoCs
Author(s)
Kretzschmar, Claudia, Galke, Christian, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2004
Source
Metra, Cecilia (Hrsg.): Proceedings / 10th IEEE International On-Line Testing Symposium, IOLTS 2004 : 12 - 14 July 2004, Funchal, Madeira Island, Portugal. - Los Alamitos, Calif. [u.a.] : IEEE Computer Society, 2004, S. 37-42, 0-7695-2180-0
Ein funktionales Selbsttest-Konzept für Prozessor-Strukturen am Beispiel des Testprozessors T5016p
Author(s)
Schwabe, Hanko, Galke, Christian, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2004
Source
Straube, Bernd (Red.): Testmethoden und Zuverlässigkeit von Schaltungen und Systemen : 16. ITG/GI/GMM Workshop, 29. Februar - 2. März 2004 in Dresden, Dresden : Fraunhofer IIS/EAS, 2004
Ein flexibles Verfahren zur Testdaten-Kompaktierung und -Dekompaktierung für den Scan-Test
Author(s)
Gätzschmann, Uwe, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2004
Source
Straube, Bernd (Red.): Testmethoden und Zuverlässigkeit von Schaltungen und Systemen : 16. ITG/GI/GMM Workshop, 29. Februar - 2. März 2004 in Dresden, Dresden : Fraunhofer IIS/EAS, 2004
FIT - a parallel hierarchical fault simulator
Author(s)
Misera, Silvio Andre, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2004
Publisher name
Los Alamitos, Calif. [u.a.] : IEEE Computer Society
Source
PARELEC 2004, International Conference on Parallel Computing in Electrical Engineering, and Workshop on System Design Automation (SDA), 7 - 10 September 2004, Dresden, Germany, S. 289 - 296
ISBN
0-7695-2080-4
Control Signal Protection - A New Challenge for High Performance Processors
Author(s)
Pflanz, Matthias, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2003
Publisher name
Los Alamitos, Calif. [u.a.] : IEEE Computer Society
Source
Proceedings, 9th IEEE International On-Line Testing Symposium, IOLTS 2003, 7 - 9 July 2003, Kos International Convention Center, Kos Island, Greece, S. 173 - 177
ISBN
0-7695-1968-7
Kompaktierung von Testmustern für den Test von SoCs mittels einer Testprozessor-Architektur
Author(s)
Galke, Christian, Grabow, M., Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2003
Source
15. ITG-GI-GMM-Workshop: Test und Zuverlässigkeit von Schaltungen und Systemen, Timmendorfer Strand, März 2003 (Poster-Session)
Test Pattern De-/Compaction for SoC Test in a Test Processor Environment
Author(s)
Galke, Christian, Grabow, M., Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2003
Source
8th IEEE European Test Workshop, Maastricht, May 2003 (Poster-Session)
Perspectives of combining online and offline test technology for dependable systems on a chip
Author(s)
Galke, Christian, Grabow, M., Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2003
Publisher name
Los Alamitos, Calif. [u.a.] : IEEE
Source
Proceedings, 9th IEEE International On-Line Testing Symposium, IOLTS 2003, 7 - 9 July 2003, Kos International Convention Center, Kos Island, Greece, S. 183 - 187
ISBN
0-7695-1968-7
Detection and Compensation of Transient Errors in Processor Structures
Author(s)
Galke, Christian, Pflanz, Matthias, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2003
Source
6th IEEE Intern. Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS), Poznan, April 2003
Online error detection and fast recover techniques for dependable embedded processors
Author(s)
Pflanz, Matthias
Type
doctoralthesis
Year of publication
2002
Publisher name
Berlin [u.a.] : Springer
ISBN
3-540-43318-X
Lecture notes in computer science ; 2270
A Test Processor Concept for Systems-on-a-Chip
Author(s)
Galke, Christian, Pflanz, Matthias, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2002
Source
Proceeding IEEE International Conference on Computer Design (ICCD), Freiburg, pp. 210-213, 0-7695-1700-5
Testing of Synchronous Sequential Digital Circuits
Author(s)
Gläser, Uwe, Stamenković, Zoran, Vierhaus, Heinrich Theodor
Editor(s)
Oklobdzija, Vojin G.
Type
part of book (chapter)
Year of publication
2002
Publisher name
Boca Raton [u.a.] : CRC Press
Source
The Computer Engineering Handbook, S. 45-1 - 45-22
ISBN
0-8493-0885-2
On-Line Error Detection and Correction in Storage Elements with Cross-Parity Check
Author(s)
Pflanz, Matthias, Walther, Karsten, Galke, Christian, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2002
Publisher name
Los Alamitos, Calif. [u.a.] : IEEE Computer Society
Source
Proceedings of the Eighth IEEE International On-Line Testing Workshop, (IOLTW 2002), 8 - 10 July 2002, Isle of Bendor, France, S. 69 - 73
ISBN
0-7695-1641-6
On-Line Detection and Compensation of Transient Errors in Processor Pipeline Structurs
Author(s)
Galke, Christian, Pflanz, Matthias, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2002
Publisher name
Los Alamitos, Calif. [u.a.] : IEEE Computer Society
Source
Proceedings of the Eighth IEEE International On-Line Testing Workshop, (IOLTW 2002), 8 - 10 July 2002, Isle of Bendor, France
ISBN
0-7695-1641-6
Hardware/Software Based Test Techniques for Systems on a Chip with Embedded Processors
Author(s)
Galke, Christian, Mohaupt, Thomas, Pflanz, Matthias, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2002
Source
BTU Computer Science Reports No. 05/02
Hardware/Software basierter Selbsttest für System on a Chip (SOCs) mit eingebetteten Prozessoren
Author(s)
Galke, Christian, Pflanz, Matthias, Hennig, Hardy, Vierhaus, Heinrich Theodor
Editor(s)
Wagner, Ralph
Type
conference publication
Year of publication
2002
Source
Proceeding 14. ITG-Gi-Workshop "Test und Zuverlässigkeit von Schaltungen und Systemen", Bad Herrenalb
On-Line Built-In Self-Check Techniken für zuverlässige eingebettete Prozessoren mit hoher Konplexität
Author(s)
Pflanz, Matthias, Walther, Karsten, Vierhaus, Heinrich Theodor
Editor(s)
Alt, Jürgen
Type
conference publication
Year of publication
2001
Source
Procedding 13. ITG-GI-Workshop "Test und Zuverlässigkeit von Schaltungen und Systeme", Miesbach
On-line Error Detection Techniques for Depandable Embedded Processors with High Complexity
Author(s)
Pflanz, Matthias, Walther, Karsten, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2001
Source
Proceeding 7th IEEE International On-Line Test Workshop
Source
Proceedings, Seventh International On-Line Testing Workshop, 9 - 11 July 2001, Giardini Naxos, Taormina, Italy, S. 51 - 53
ISBN
0-7695-1290-9
Online Check and Recovery Techniques for Depandable Embedded Processors
Author(s)
Pflanz, Matthias, Vierhaus, Heinrich Theodor
Type
Scientific Article ref.
Year of publication
2001
Source
IEEE micro, S. 24 - 40
Volume
21
Issue/Journal number
5
ISSN
0272-1732
A Register Transfer Fault Simulator for Permanent and Transient Faults in Embedded Processors
Author(s)
Rousselle, Christian, Pflanz, Matthias, Behling, A., Mohaupt, Thomas, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2001
Source
Proceedings, Design, Automation and Test in Europe, Conference and Exhibition 2001, Munich, Germany, March 13 - 16, 2001, S. 811
ISBN
0-7695-0993-2
0-7695-0994-0
Design and Architecture of Dependable Computer-Based Systems
Author(s)
Vierhaus, Heinrich Theodor, Pflanz, Matthias, Mohaupt, Thomas
Type
Scientific Article not ref.
Year of publication
2000
Source
Proceedings of the Polish-German Symposium on Science-Research-Education (SRE), Sept. 2000, S.183-192, 83-85911-86-3
A New Method for On-Line State Machine Observation for Embedded Microprocessors
Author(s)
Pflanz, Matthias, Galke, Christian, Vierhaus, Heinrich Theodor
Type
conference publication
Year of publication
2000
Source
Proceedings / IEEE International High-Level Design Validation and Test Workshop : 8 - 10 November 2000, Berkeley, California. - Los Alamitos, Calif. [u.a.] : IEEE Computer Society, 2000, S. 34-39, 0-7695-0786-7
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