Chair of
Microelectronics
Prof. Dr.-Ing. Dirk Killat
Laboratory Equipment
Measurement Equipment
Applicos ATX 7006 ADC Test System, 16-Bit, 200MHz, build in references, supply and AWG, fully automated mixed-signal ADC test controlled by PC, static and dynamic characterization.
Pulse Function AWG Noise Generator Agilent 81150A 120MHz, 2 outputs, pattern gen.
Keithley Source Meter 2400 (3pcs., Interface & control by LabView)
Keithley Source Meter 2420 (2pcs., Interface & control by LabView)
Keithley Source Meter 2601A (Interface & control by LabView)
2x Le Croy AP034 Differential Probe, 5V/50V common mode
2x Le Croy HFP 2500 Active Probes, 2.5 GHz
LeCroy Logic Extension MS500 36-chan., Logik Erweiterung Oszilloskop, 36-Kanal digital
Development systems
Xilinx Spartan-6 FPGA development system
ARM Cortex-M3 development systems from Keil, MCBSTM32 with STM32F103
Misc.
Precision temperature chamber CTS 65/50 -40…+160degC (Interface & control by LabView)
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