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Module Number:
| 14490
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| Module Title: | Advanced Laboratory Techniques and Metrology |
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Fortgeschrittene Labor- und Messtechnik
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| Department: |
Faculty 1 - Mathematics, Computer Science, Physics, Electrical Engineering and Information Technology
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| Responsible Staff Member: | -
Prof. Dr.-Ing. Dr. rer. nat. habil. Schenk, Harald
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| Language of Teaching / Examination: | English |
| Duration: | 1 semester |
| Frequency of Offer: |
Every summer semester
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| Credits: |
6
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| Learning Outcome: | Upon successful completion of the module, students will have a thorough and organized understanding of advanced techniques for characterizing nanostructures, ultrathin films, and nanocomposites, as well as their essential role in modern micro/nano systems and semiconductor devices. They can recognize how the performance, functionality, and reliability of these devices are closely tied to the quality of these components. |
| Contents: | - Fundamentals and importance of various advance measurement techniques
- Principles, properties and Application of e.g.
- X-Ray Diffractometer
- Raman Spectroscopy
- Optical Coherence Tomography
- Ultrasound Spectroscopy
- Mass Spectroscopy
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| Recommended Prerequisites: | - Basic knowledge in physics (optics, electromagnetism) and electrical engineering
- Knowledge of the topics of module 13020 Laboratory Techniques and Metrology
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| Mandatory Prerequisites: | None |
| Forms of Teaching and Proportion: | -
Lecture
/ 2 Hours per Week per Semester
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Seminar
/ 1 Hours per Week per Semester
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Self organised studies
/ 135 Hours
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| Teaching Materials and Literature: | - Suryanarayana, C., et al., X-ray diffraction: A practical approach, Springer New York, NY (1998).
- Ferraro, John R. Introductory raman spectroscopy. Elsevier, 2003.
- Schneider, Simon. Optical coherence tomography for characterization of nanocomposite materials. KIT Scientific Publishing, 2021.
- Gericke, OTTO R. "Ultrasonic spectroscopy." Nondestructive Evaluation of Materials. Boston, MA: Springer US, 1979. 299-320.
- Watson, J. Throck, and O. David Sparkman. Introduction to mass spectrometry: instrumentation, applications, and strategies for data interpretation. John Wiley & Sons, 2007.
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| Module Examination: | Continuous Assessment (MCA) |
| Assessment Mode for Module Examination: | - seminar talk, 20 minutes, with written part, 10 pages (50%)
- written exam, 75 minutes (50%)
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| Evaluation of Module Examination: | Performance Verification – graded |
| Limited Number of Participants: | 10 |
| Part of the Study Programme: | -
Master (research-oriented) /
Micro- and Nanoelectronics /
PO 2024
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Master (research-oriented) /
Physics /
PO 2021
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| Remarks: | - Study programme Physics M.Sc.: Compulsory elective module in complex „Physical Specialization with Experimental Focus“, topic area „Nanophysics“
- Study programme Micro- and Nanoelectronics M.Sc.: Compulsory elective module in complex „Technology and Devices“
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| Module Components: | - Lecture: Advanced Laboratory Techniques and Metrology
- Accompanying seminar
- Related examination
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| Components to be offered in the Current Semester: | |
