The main research area of our department is the spectroscopic, microscopic, and spectro-microscopic investigation of materials to get information about their electronic and structural properties.
For this purpose we use electron spectroscopic methods as XPS, UPS, WDX, AES, resPES, EELS, NEXAFS and spectromicroscopic mapping (LEEM, PEEM, Raman microscopy) as well as microscopic techniques (AFM, STM, optical).
The department works closely with the Nanomaterials department.