The main research area of our department is the spectroscopic, microscopic, and spectro-microscopic investigation of materials to get information about their electronic and structural properties.
For this purpose we use electron spectroscopic methods as XPS, UPS, WDX, AES, resPES, EELS, NEXAFS and spectromicroscopic mapping (LEEM, PEEM) as well as microscopic techniques (AFM, STM, optical).
This website uses cookies. Those have two functions: On the one hand they are providing basic functionality for this website. On the other hand they allow us to improve our content for you by saving and analyzing anonymized user data. You can redraw your consent to using these cookies at any time. Find more information regarding cookies on our Data Protection Declaration and regarding us on the Imprint.
