UHV-Spectro-microscopy

• XPS/UPS: X-ray Photoelectron Spectroscopy
• PEEM: Photo Emission Electron Microscopy
• NEXAFS-Spectroscopy chamber for ultra-high vacuum (UHV)
• AFM-STM: Combined Atomic Force and Scanning Tunneling Microscopy (Omicron) for measurements in UHV

Spectro-microscopy

• Raman-Microscope

Microscopy 

• Atomic Force Microscope (AFM)
• Interference Microscope Epival Interphako (Carl Zeiss)
• Reflected-Light Microscope Epityp (Carl Zeiss)
• MicroViewer (Kappa) (Video Microscope 1000 times Magnification)

Diffraction

• LEED (BDL800 LEED Scienta Omicron)

Layer Deposition and Surface Treatment

• Atomic layer depsoition (ALD)
  • in-situ ALD
  • ex-situ ALD
• Glove-Box
• UV Ozone Cleaner

Catalysis

• Flow Reactor (atmospheric pressure) for the Methanisation of CO₂ (Sabatier-Reaction)
• Reactor for the direct CO₂ conversion to methanol

Electrical Characterization

• Oscilloscop HP 54616 (500 MHz, 2 Gsa/s, single shot)
• Generators, Frequency Counter, Multimeter, Power Supplies (HP, Hameg, Keithley, Prema)
• LCR-Meter Agilent 4284A, LCR-817 (instek)
• Network Analyzer Agilent E5100A
• CV Set-Up, IV Set-up

Further Equipment

• Pyrometer (Temperature Recording ) Modline plus icron 400-1200°C