Paper published in »Applied Surface Science« - Chair of Applied Physics and Semiconductor Spectroscopy

A manuscript with co-authors from Italy, Czech Republic, Reseach Center Jülich, and University of Duisburg-Essen has been published in the journal »Applied Surface Science«.

M. Jugovac, T. O. Menteş, F. Genuzio, J. Lachnitt, V. Feyer, J. I. Flege, A. Locatelli
Sensitivity to crystal stacking in low-energy electron microscopy
Applied Surface Science 566 (2021) 150656
Online (DOI)

Contact person

Prof. Dr. rer. nat. habil. Ingo Flege
Angewandte Physik und Halbleiterspektroskopie
T +49 (0) 355 69-5352
flege(at)b-tu.de

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