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Faculty 1
Chair of Applied Physics and Semiconductor Spectroscopy Prof. Dr. rer. nat. habil. Jan Ingo Flege

Publications 2026

  • 26_09
    Formation and role of the interface region in ultrathin metal oxide layers for resistive gas sensors 
    C. Morales, R. Tschammer, D. Guttmann, K. Henkel, J. I. Flege, C. Alvarado, C. Wenger
    Proceedings of iCampus Conference Cottbus 2026. AMA Service GmbH (Ed.), Wunstorf, 2026, ISBN 978-3-910600-10-2, pp. 290-293
    Online (DOI)
  • 26_08
    Defect Engineering in Atomic-Layer Deposited Cerium Oxide
    R. Tschammer, M. Schmickler, Y. Kosto, K. Henkel, P. Kaur, A. Devi, C. Morales, J. I. Flege
    ACS Applied Materials & Interfaces 18 (2026) 18380-18393
    Online (DOI)
  • 26_07
    Intrinsic electrocatalytic activity of nitrogen-doped monolayer graphene observed using a Janus bilayer design
    G. Alexander, T. Grosser, C. Sulaiman, R. Sánchez-Barquilla, E. Fuhry, I. Wachta, R. Jungnickel, J. I. Flege, K. Balasubramanian
    Nanoscale 18 (2026) 7080-7089
    Online (DOI)
  • 26_06
    Correlation between electron beam evaporation conditions and sensor response of cerium oxide coatings
    P. Kapuścik, J. Domaradzki, A. Obstarczyk, M. Kot, J. I. Flege, E. Keel, D. Gibson, D. Wojcieszak
    International Journal of Hydrogen Energy 202 (2026) 154101
    Online (DOI)
  • 26_05
    Surface termination of β-Ga2O3(100) as-cleaved single crystals
    M.-C. Kao, L. P. Schewe, A. Akhtar, A. Vlad, T. Keller, K. Henkel, S. B. Anooz, A. Popp, Z. Galazka, J. I. Flege, A. Stierle, V. Vonk
    Applied Physics Letters 128 (2026) 071601
    Online (DOI)
  • 26_04
    Development of Detailed Surface Reaction Mechanism for Methanation Process Based on Experiments
    R. Verma, V. Günther, E. Charlafti, F. Rachow, B. R. Giri, A. Hemaizia, D. Thévenin, J. I. Flege, F. Mauss
    PAMM 26 (2026) e70061
    Online (DOI)
  • 26_03
    Growth, structure, and morphology of ultra-thin tin oxide phases forming on Pt3Sn(111) single crystals upon exposure to oxygen
    N. Braud, H. Wallander, L. Buss, M. Löfstrand, J. Blomqvist, C. Berschauer, A. Morales Rodriguez, P. M. Kofoed, A. Resta, J.-O. Krisponeit, T. Schmidt, E. Lundgren, J. I. Flege, J. Falta, L. Merte
    Surface Science 767 (2026) 122927
    Online (DOI)
  • 26_02
    Deposition of CeOx/SnOx-based thin films via RF magnetron sputtering for resistive gas sensing applications
    A. Kalra, C. Alvarado Chavarin, P.-G. Nitsch, R. Tschammer, J. I. Flege, M. Ratzke, M. H. Zoellner, M. A. Schubert, C. Wenger, I. A. Fischer
    Physica B: Condensed Matter 723 (2026) 418098
    Online (DOI)
  • 26_01
    Influence of thermal modification on the gasochromic properties of WO3 thin films fabricated by electron beam evaporation
    W. Weichbrodt, J. Domaradzki, A. Obstarczyk, M. Kot, J. I. Flege, M. Mazur
    Applied Optics 65 (2026) A58-A67
    Online (DOI)