BTU overview
Faculty 1
Chair of Applied physics / sensor technology Prof. Dr. rer. nat. habil. Dieter Schmeißer

Publications 2005

  • 05_18
    Grenzflächenoptimierung für funktionale Dünnschichtsysteme: Oxide und Polymere
    K. Henkel, R. Sohal, M. Torche, I. Paloumpa, K. Müller, P. Hoffmann, D. Schmeißer
    Forum der Forschung 18 (2005) 49-56, ISSN 0947-6989
    Online (pdf)
  • 05_17
    Resonante Photoemission an der Cu2p Kante von Cu und CuO
    D. Schmeißer, F. J. Himpsel, J. Denlinger, D. Ederer
    Forum der Forschung 18 (2005) 57-62, ISSN 0947-6989
    Online (pdf)
  • 05_16
    Advanced MOSFET gate dielectrics for high-performance microprocessors: Materials selection and analytical challenges
    E. Zschech, H. J. Engelmann, S. Ohsiek, B. Tracy, E. Adem, S. Robie, J. Bernard, D. Schmeißer
    Advances in Solid State Physics 45 (2005) 375-388
    Online (DOI)
  • 05_15
    Electronic Properties of the Interface formed by Pr2O3 growth on Si(001), Si(111) and SiC(0001) surfaces
    D.Schmeißer, P.Hoffmann, G.Beuckert
    In: E. Zschech, C. Whelan, T. Mikolajick (Eds.): Materials for Information Technology, Devices, Interconnects and Packaging,
    Series: Engineering Materials and Processes, pp. 449-459, Springer (2005), ISBN 1-85233-941-1
    Online (DOI)
  • 05_14
    A polymer high-k dielectric insulator for organic field-effect transistors
    K. Müller, I. Paloumpa, K. Henkel, D. Schmeißer
    Journal of Applied Physics 98 (2005) 056104
    Online (DOI)
  • 05_13
    Praseodymium silicate layers with atomically abrupt interface on Si(100)
    G. Lupina, T. Schroeder, J. Dabrowski, Ch. Wenger, A. Mane, G. Lippert, H.-J. Müssig, P. Hoffmann, D. Schmeißer
    Applied Physics Letters 87 (2005) 092901
    Online (DOI)
  • 05_12
    Spatio-temporal patterns of external noise induced transitions in a bistable reaction-diffusion system: PEEM experiments and modeling
    S. Wehner, P. Hoffmann, D. Schmeißer, H.R. Brand, J. Küppers
    Physical Review Letters 95/3 (2005) 038301
    Online (DOI)
  • 05_11
    Pr-silicate formation on SiO2 covered 3C-SiC(111)
    D. Schmeißer, H.-J. Müssig
    AIP Conference Proceedings 772 (2005) 75, ISBN 0-7354-0257-4
  • 05_10
    Spectro-Microscopic Characterisation of CuInS2 Surfaces
    K. Müller, Y. Burkov, D. Schmeißer
    Thin Solid Films 480-481 (2005) 291-294
    Online (DOI)
  • 05_09
    Oxynitride Grotwth on 4H-SiC(0001) by N2O
    P. Hoffmann, A. Goryachko, D. Schmeißer
    BESSY annual report 2004, pp. 397-399
  • 05_08
    The interaction of titanium to Pr2O3 thin films dielectrics
    M. Torche, D. Schmeißer
    BESSY annual report 2004, pp. 395-396
  • 05_07
    Pr-Silicate formation on SiO2 covered SiC surfaces
    R. Sohal, K. Henkel, D. Schmeißer, H.-J. Müssig
    BESSY annual report 2004, pp. 393-394
  • 05_06
    Photoelectron spectroscopy and microscopy on Cr nano particels embedded into block copolymers
    O. Seifarth, Y. Burkov, A. Goryachko, D. Schmeißer, A. Sydorenko, R. Krenek, M. Stamm
    BESSY annual report 2004, pp. 195-197
  • 05_05
    Pr4f occupancy and origin of gap states at the Pr2O3 / Si (001) interface
    D. Schmeißer, H.-J. Müssig
    BESSY annual report 2004, pp. 192-194
  • 05_04
    PEEM imaging contrast in an operating organic electronic device
    K. Müller, Y. Burkov, D. Schmeißer
    BESSY annual report 2004, pp. 187-189
  • 05_03
    Interface reactivity of Pr and SiO2 at 4H-SiC(0001)
    D. Schmeißer, G. Lupina, H.-J. Müssig
    Materials Science and Engineering B 118/1-3 (2005) 19-22
    Online (DOI)
  • 05_02
    Oxynitride on 4H-SiC (0001)
    P. Hoffmann, A. Goryachko, D. Schmeißer
    Materials Science and Engineering B 118/1-3 (2005) 270-274
    Online (DOI)
  • 05_01
    Microphase separation in thin films of poly(styrene-block-4-vinylpyridine) Copolymer-2-(4'-Hydroxybenzeneazo)benzoic Acid Assembly
    I. Tokarev, R. Krenek, Y. Burkov, D. Schmeißer, A. Sidorenko, S. Minko, M. Stamm
    Macromolecules 38/2 (2005) 507-516
    Online (DOI)