Chair of
Applied physics / sensor technology
Prof. Dr. rer. nat. habil. Dieter Schmeißer
Publications 2005
05_18 Grenzflächenoptimierung für funktionale Dünnschichtsysteme: Oxide und Polymere K. Henkel, R. Sohal, M. Torche, I. Paloumpa, K. Müller, P. Hoffmann, D. Schmeißer Forum der Forschung 18 (2005) 49-56, ISSN 0947-6989 Online (pdf)
05_17 Resonante Photoemission an der Cu2p Kante von Cu und CuO D. Schmeißer, F. J. Himpsel, J. Denlinger, D. Ederer Forum der Forschung 18 (2005) 57-62, ISSN 0947-6989 Online (pdf)
05_16 Advanced MOSFET gate dielectrics for high-performance microprocessors: Materials selection and analytical challenges E. Zschech, H. J. Engelmann, S. Ohsiek, B. Tracy, E. Adem, S. Robie, J. Bernard, D. Schmeißer Advances in Solid State Physics 45 (2005) 375-388 Online (DOI)
05_15 Electronic Properties of the Interface formed by Pr2O3 growth on Si(001), Si(111) and SiC(0001) surfaces D.Schmeißer, P.Hoffmann, G.Beuckert In: E. Zschech, C. Whelan, T. Mikolajick (Eds.): Materials for Information Technology, Devices, Interconnects and Packaging, Series: Engineering Materials and Processes, pp. 449-459, Springer (2005), ISBN 1-85233-941-1 Online (DOI)
05_14 A polymer high-k dielectric insulator for organic field-effect transistors K. Müller, I. Paloumpa, K. Henkel, D. Schmeißer Journal of Applied Physics 98 (2005) 056104 Online (DOI)
05_13 Praseodymium silicate layers with atomically abrupt interface on Si(100) G. Lupina, T. Schroeder, J. Dabrowski, Ch. Wenger, A. Mane, G. Lippert, H.-J. Müssig, P. Hoffmann, D. Schmeißer Applied Physics Letters 87 (2005) 092901 Online (DOI)
05_12 Spatio-temporal patterns of external noise induced transitions in a bistable reaction-diffusion system: PEEM experiments and modeling S. Wehner, P. Hoffmann, D. Schmeißer, H.R. Brand, J. Küppers Physical Review Letters 95/3 (2005) 038301 Online (DOI)
05_11 Pr-silicate formation on SiO2 covered 3C-SiC(111) D. Schmeißer, H.-J. Müssig AIP Conference Proceedings 772 (2005) 75, ISBN 0-7354-0257-4
05_10 Spectro-Microscopic Characterisation of CuInS2 Surfaces K. Müller, Y. Burkov, D. Schmeißer Thin Solid Films 480-481 (2005) 291-294 Online (DOI)
05_09 Oxynitride Grotwth on 4H-SiC(0001) by N2O P. Hoffmann, A. Goryachko, D. Schmeißer BESSY annual report 2004, pp. 397-399
05_08 The interaction of titanium to Pr2O3 thin films dielectrics M. Torche, D. Schmeißer BESSY annual report 2004, pp. 395-396
05_07 Pr-Silicate formation on SiO2 covered SiC surfaces R. Sohal, K. Henkel, D. Schmeißer, H.-J. Müssig BESSY annual report 2004, pp. 393-394
05_06 Photoelectron spectroscopy and microscopy on Cr nano particels embedded into block copolymers O. Seifarth, Y. Burkov, A. Goryachko, D. Schmeißer, A. Sydorenko, R. Krenek, M. Stamm BESSY annual report 2004, pp. 195-197
05_05 Pr4f occupancy and origin of gap states at the Pr2O3 / Si (001) interface D. Schmeißer, H.-J. Müssig BESSY annual report 2004, pp. 192-194
05_04 PEEM imaging contrast in an operating organic electronic device K. Müller, Y. Burkov, D. Schmeißer BESSY annual report 2004, pp. 187-189
05_03 Interface reactivity of Pr and SiO2 at 4H-SiC(0001) D. Schmeißer, G. Lupina, H.-J. Müssig Materials Science and Engineering B 118/1-3 (2005) 19-22 Online (DOI)
05_02 Oxynitride on 4H-SiC (0001) P. Hoffmann, A. Goryachko, D. Schmeißer Materials Science and Engineering B 118/1-3 (2005) 270-274 Online (DOI)
05_01 Microphase separation in thin films of poly(styrene-block-4-vinylpyridine) Copolymer-2-(4'-Hydroxybenzeneazo)benzoic Acid Assembly I. Tokarev, R. Krenek, Y. Burkov, D. Schmeißer, A. Sidorenko, S. Minko, M. Stamm Macromolecules 38/2 (2005) 507-516 Online (DOI)
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