Chair of
Applied physics / sensor technology
Prof. Dr. rer. nat. habil. Dieter Schmeißer
Publications 2004
04_26 Generation of Nanostructured Materials from Thin Films of Block Copolymer Assembles A. Sidorenko, I. Tokarev, R. Krenek, Y. Burkov, D. Schmeißer, S. Minko, M. Stamm Nano-Architectured and Nanostructured Materials: Fabrication, Control and Properties. pp 143-150. Wiley-VCH, Weinheim, 2004, ISBN 3-527-31008-8 Online (DOI)
04_25 Corrosion Protection by Conductive Polymers for Magnesium Alloys A. Yfantis, I. Paloumpa, D.Schmeißer, D. Yfantis Magnesium, Proceedings of 6th International Conference on Magnesium Alloys and their applications. pp 605-610, Wiley VCH, Weinheim, ISBN 3-527-30975-6 Online (DOI)
04_24 Promieniowanie synchrotronowe jako uniwersalne narzedzie badawcze - Proby jego wykorzystania w badaniach struktury zeliwa P. Hoffmann, D. Schmeißer, M. S. Soinski, T. Warchala Archives of Foundry 2004, Vol. 4, Nr. 14, S. 169-175. ISSN: 1642-5308
04_23 Pr4f occupancy and VB/CB band offsets of Pr2O3 at the interface to Si(001) and SiC(0001) surfaces D.Schmeißer, H.-J. Müssig Materials Research Society Symposium Proceedings 811 (2004) D6.7 Online (DOI)
04_22 Ultrahthin Dielectric Films Grown by Solid Phase Reaction of Pr with SiO2 H.-J. Müssig, J. Dabrowski, C. Wenger, G. Lupina, R. Sorge, P. Formanek, P. Zaumseil, D. Schmeißer Materials Research Society Symposium Proceedings 811 (2004) D7.10 Online (DOI)
04_21 Scanning Kelvin Probe Microscopy and Photoemission electron microscopy of organic source-drain structures K. Müller, A. Goryachko, Y. Burkov, C. Schwiertz, M. Ratzke, J. Köble, J. Reif, D. Schmeißer Synthetic Metals 146/3 (2004) 377-382 Online (DOI)
04_20 Photoemission studies of very thin (<10nm) silicon oxynitride (SiOxNy) layers formed by PECVD P. Hoffmann, D. Schmeißer, R.B.Beck, M.Cuch, M.Giedz, A.Jakubowski Journal of Alloys and Compounds 382/1-2 (2004) 228-233 Online (DOI)
04_19 Comparison on Focus-PEEM and Elmitec-PEEM Y. Burkov, P. Hoffmann, D. Schmeißer BESSY annual report 2003, pp. 504-505
04_18 Solid-state reaction between Pr and SiO2 studied by photoelectron spectroscopy G. Lupina, H.-J. Müssig, D. Schmeißer BESSY annual report 2003, pp. 415-416
04_17 PEEM studies of KCN-etched CuInS2 surfaces K. Müller, Y. Burkov, D. Schmeißer BESSY annual report 2003, pp. 413-414
04_16 High reactivity of Pr on oxide covered 4H-SiC D. Schmeißer, G. Lupina, H.-J. Müssig BESSY annual report 2003, pp. 408-409
04_15 A PEEM study of lateral inhomogeneities on etched CdTe(110) surfaces S. Traeger, D. Kraft, B. Jaeckel, P. Hoffmann, D. Schmeißer, A. Thißen, W. Jaegermann BESSY annual report 2003, pp. 369-370
04_14 Chemical state depth profiling of ultra-thin oxynitride layers by photoelectron spectroscopy P. Hoffmann, D. Schmeißer BESSY annual report 2003, pp. 356-357
04_13 Cooper minimum observed for the Pr5s and Pr5p states in Pr2O3 D. Schmeißer BESSY annual report 2003, pp. 224-225
04_12 XPEEM investigations of 2D hierachical array of Ni nanorods using block copolymer templates A. Sidorenko, I. Tokarev, R. Krenek, Y. Burkov, D. Schmeißer, M. Stamm BESSY annual report 2003, pp. 85-87
04_11 Pr2O3/Si(001) interface reactions and stability D. Schmeißer, J. Dabrowski, H.-J. Müssig Materials Science and Engineering B 109/1-3 (2004) 30-33 Online (DOI)
04_10 An FTIR study of the role of H2O and D2O in the aging mechanism of conductive polypyrroles S. Lamprakopoulos, D. Yfantis, A. Yfantis, D. Schmeißer, J. Anastassopoulou, T. Theophanides Synthetic Metals 144/3 (2004) 229-234 Online (DOI)
04_09 Solid-state reaction between Pr and SiO2 studied by photoelectron spectroscopy and ab initio calculations G. Lupina, J. Dabrowski, P. Formanek, D.Schmeißer, R. Sorge, C. Wenger, P. Zaumseil, H.-J. Müssig Materials Science in Semiconductor Processing 7/ 4-6 (2004) 215-220 Online (DOI)
04_08 Covalent and localized contributions of Pr4f states at the interface of Pr2O3 to Si(001) D.Schmeißer, H.-J.Müssig Materials Science in Semiconductor Processing 7/ 4-6 (2004) 221-226 Online (DOI)
04_07 Silicate Layer Formation at the Pr2O3 / Si(001) Interfaces D.Schmeißer, H.-J.Müssig, J. Dabrowski Applied Physics Letters 85/1 (2004) 88-90 Online (DOI)
04_06 The Interaction of Pr2O3 with 4H-SiC(0001) surface A. Goryachko, I. Paloumpa, G. Beuckert, Y. Burkov, D.Schmeißer Physica Status Solidi C 1/2 (2004) 265-268 Online (DOI)
04_05 Mechanisms to inhibit corrosion of Al alloys by polymeric conversion coatings I. Paloumpa, A. Yfantis, P. Hoffmann, Y. Burkov, D. Yfantis, D.Schmeißer Surface and Coatings Technology 180-181 (2004) 308-312 Online (DOI)
04_04 Preparation of stoichiometric CuInS2-Surfaces K. Müller, R. Scheer, Y. Burkov, D.Schmeißer Thin Solid Films 451-452 (2004) 120-123 Online (DOI)
04_03 The Si(001)/C2H2 interaction to form a buffer layer for 3C-SiC growth A. Goryachko, Y. Yeromenko, K. Henkel, J. Wollweber, D.Schmeißer Physica Status Solidi A 201 (2004) 245-248 Online (DOI)
04_02 Partikel- und Tropfendetektion in µm-Bereich K. Henkel, C. Schwiertz, D. Schmeißer, A. Valdeig, S. Wagner, M. List, J. Lang, M. Ulbrich, P.Schengber Abschlussbericht zum AiF-Forschungsprojekt KF 0342201KFK1, Februar 2004
04_01 Stability and electronic properties of silicates in the system SiO2 - Pr2O3 - Si(001) D.Schmeißer, H.-J. Müssig Journal of Physics: Condensed Matter 16 (2004) S153-S160 Online (DOI)
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