Chair of
Applied physics / sensor technology
Prof. Dr. rer. nat. habil. Dieter Schmeißer
Publications 2003
03_24 The Pr2O3 /Si(001) interface: a mixed Si-Pr oxide D.Schmeißer, J. Dabrowski, H.-J. Müssig Materials Research Society Symposium Proceedings 765 (2003) D3.24 Online
03_23 Organische Feldeffekttransistoren als Transducer in der Biosensorik K. Müller, W. Bär, K. Henkel, A. Jahnke, C. Schwiertz, D.Schmeißer Technisches Messen 70/12 (2003) 565-568 Online (DOI) pdf (432 kB)
03_22 Partikel- und Tropfendetektion im Mikrometerbereich mittels Schwingquarzen K. Henkel, C. Schwiertz, S. Wagner, A. Valdeig, M. List, D.Schmeißer Dresdner Beiträge zur Sensorik Band 20 (2003) 291-294, w.e.b. Universitätsverlag, Dresden, ISBN 3-935712-92-8
03_21 Organische Feldeffekttransistoren als Transducer in der Biosensorik K. Müller, W. Bär, K. Henkel, A. Jahnke, C. Schwiertz, D.Schmeißer Dresdner Beiträge zur Sensorik Band 20 (2003) 119-123, w.e.b. Universitätsverlag, Dresden, ISBN 3-935712-92-8
03_20 Commissioning of the Solid/Liquid Analysis System SoLiAS R. Hunger, M. Lebedev, Th. Mayer, W. Jaegermann, C. Pettenkofer, D. Schmeißer BESSY annual report 2002, pp. 316-318
03_19 Resonant photoemission at the Pr2O3 /Si(001) interface D. Schmeißer BESSY annual report 2002, pp. 165-167
03_18 Photoelectron spectra of Al dopants in 4H-SiC D. Schmeißer, K. Irmscher, G. Wagner Materials Science & Engineering B 102 (2003) 284-288 Online (DOI)
03_17 The Pr2O3 / Si (001) interface studied by synchrotron radiation photo-electron spectroscopy D. Schmeißer, H.-J. Müssig Solid State Electronics 47 (2003) 1607-1611 Online (DOI)
03_16 The Pr2O3 / Si (001) interface D. Schmeißer Materials Science in Semiconductor Processing 6 (2003) 59 - 70 Online (DOI)
03_15 Ge instabilities near interfaces in Si/SiGe/Si heterostructures D. Schmeißer, K. Pressel, Y. Yamamoto, B. Tillack, D. Krüger Materials Science & Engineering B 101 (2003) 208-211 Online (DOI)
03_14 Organic Materials for Device Applications - Preface W. Riess, D. Schmeißer Synthetic Metals 138 (2003) 1 Online (DOI)
03_13 Schnelle Biosensorik für die medizinische Diagnostik W. Bär, K. Müller, D. Schmeißer Forum der Forschung 15 (2003) 86-89, ISNN 0947-6989
03_12 Carbon-plot-microstructuring for all-polymer-transistors K. Müller, I. Paloumpa, D. Schmeißer Synthetic Metals 138 (2003) 271-273 Online (DOI)
03_11 Valence states of poly(3-hexyl-thiophene) as probed by photoelectron spectra at resonant excitation D. Schmeißer Synthetic Metals 138 (2003) 135-140 Online (DOI)
03_10 PEEM and µ-NEXAFS of Cu-In-S2-surfaces K. Müller, Y. Burkov, D. Schmeißer Thin Solid Films 431-432 (2003) 307-311 Online (DOI)
03_09 Preparation of stoichiometric CuInS2-surfaces: an XPS, UPS-study K. Müller, S. Milko, D. Schmeißer Thin Solid Films 431-432 (2003) 312-316 Online (DOI)
03_08 Conductive polymers precoats-application on metallisation of ABS D.Yfantis, N. Bourdas, S. Lambrakopoulos, N. Yfantis, I. Paloumpa, A. Yfantis 4th Panhellenic Conference of Chemical Engineering, 29-31 May 2003, Patras, Greece Proceedings, (griechisch)
03_07 Primers of conductive polymers-application in powder coatings technology D.Yfantis, N. Bourdas, S. Lambrakopoulos, N. Yfantis, I. Paloumpa, A. Yfantis 4th Panhellenic Conference of Chemical Engineering, 29-31 May 2003, Patras, Greece Proceedings, (griechisch)
03_06 Conductive polymers - applications in the industry D. Yfantis, N. Bourdas, A. Yfantis, St. Lambrakopoulos, N. Yfantis, D. Schmeißer 1st Panhellenic Conference of Plastics, 15-17 March 2003, Athens, Greece Proceedings (CD-ROM), (griechisch)
03_05 Preventing Corrosion of Aluminium Alloys by Polymeric Coatings D. Schmeißer, I. Paloumpa, P. Hoffmann, Y. Burkov, A. Yfantis, D. Yfantis BESSY Highlights 2002 (2003) 24-25
03_04 Non-destructive probing of interfacial oxidation and nitridation states at RTA Si-oxides P. Hoffmann, D. Schmeißer, G. Roters, Z. Nenyei Thin Solid Films 428/1-2 (2003) 216-222 Online (DOI)
03_03 Initial stages of structure formation on silicon electrodes investigated by photoelectron spectroscopy using synchrotron radiation and in-situ atomic force microscopy H.J. Lewerenz, M. Aggour, C. Murrell, M. Kanis, H. Jungblut, J. Jakubowicz, P.A. Cox, S.A. Campbell, P. Hoffmann, D. Schmeißer Journal of the Electrochemical Society 150/3 (2003) E185-E189 Online (DOI)
03_02 Orientation studies of Si-Phthalocyanines sulfonic acids cast on SiOx substrates G. Appel, H. Ade, A.G. Gürek, S. Stadler, R.P. Mikalo, D. Schmeißer Applied Physics A 76/2 (2003) 177-182 Online (DOI)
03_01 High Resolution Surface analysis of Si Roughenning in Dilute Ammonium Fluoride Solution H.J.Lewerenz, M.Aggour, C.Murrell, J.Jakubowicz, M.Kanis, S.A.Campbell, P.A.Cox, P.Hoffmann, H.Jungblut, D.Schmeißer Journal of Electroanalytical Chemistry 540 (2003) 3-6 Online (DOI)
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