Chair of
Applied physics / sensor technology
Prof. Dr. rer. nat. habil. Dieter Schmeißer
Publications 2012
12_21 III-V/oxide interfaces investigated with synchrotron radiation photoemission spectroscopy Massimo Tallarida Meeting Abstracts-Electrochemical Society MA2012-02(31) (2012) 2587 Online
12_20 Control of β- and γ-Phase formation in electroactive P(VDF-HFP) films by silver nano-particle doping D. Mandal, K. Henkel, S. Das, D. Schmeißer In: Frontiers in Electronic Materials: A Collection of Extended Abstracts of the Nature Conference Frontiers in Electronic Materials, June 17 to 20 2012, Aachen, Germany (eds J. Heber, D. Schlom, Y. Tokura, R. Waser and M. Wuttig), pp. 633-663, Wiley-VCH Verlag GmbH & Co. KGaA, Weinheim, Germany, 2012, ISBN 9783527411917 Online (DOI)
12_19 Intrinsic defects in TiO2 to explain resistive switching devices D. Schmeißer, M. Richter, M. Tallarida In: Frontiers in Electronic Materials: A Collection of Extended Abstracts of the Nature Conference Frontiers in Electronic Materials, June 17 to 20 2012, Aachen, Germany (eds J. Heber, D. Schlom, Y. Tokura, R. Waser and M. Wuttig), pp. 247-258, Wiley-VCH Verlag GmbH & Co. KGaA, Weinheim, Germany, 2012, ISBN 9783527411917 Online (DOI)
12_18 Multiple Auger Decay At Resonant Photo-Excitation In Carbon Thin Films M. Richter, D. Friedrich, D. Schmeißer Meeting Abstracts-Electrochemical Society MA2012-02(50) (2012) 3509 Online
12_17 The Co2p Oxidation State In Co-PI Catalysts M. Richter, D. Schmeißer Meeting Abstracts-Electrochemical Society MA2012-02(14) (2012) 1803 Online
12_16 GaAs clean up studied with synchrotron radiation photoemission M. Tallarida, C. Adelmann, A. Delabie, S. van Elshocht, M. Caymax, D. Schmeißer IOP Conference Series: Materials Science and Engineering 41 (2012) 012003 Online (DOI)
12_15 The Effect of X-ray Photoelectron Spectroscopy Measurement on P(VDF-TrFE) Copolymer Thin Films D. Mandal, K. Müller, K. Henkel, D. Schmeißer Applied Surface Science 261 (2012) 209-213 Online (DOI)
12_14 Electronic Structure of Cobalt-Nickel Mixed Oxides S. Schmidt, D. Schmeißer Solid State Ionics 225 (2012) 737-741 Online (DOI)
12_13 Structure of the catalytic sites in Fe/N/C-catalysts for O2-reduction in PEM fuel cells U.I. Kramm, J. Herranz, N. Larouche, T.M. Arruda, M. Lefèvre, F. Jaouen, P. Bogdanoff, S. Fiechter, I. Abs-Wurmbach, S, Mukerjee, J.-P. Dodelet Physical Chemistry Chemical Physics 14 (2012) 11673–11688 Online (DOI)
12_12 Multi-Technique Characterization of a Polyaniline-Iron-Carbon Oxygen Reduction Catalyst M. Ferrandon, A. J. Kropf, D. J. Myers, K. Artyushkova, U. I. Kramm, P. Bogdanoff, G. Wu, C. M. Johnston, P. Zelenay The Journal of Physical Chemistry C 116 (2012) 16001−16013 Online (DOI)
12_11 In-situ ALD experiments with synchrotron radiation photoelectron spectroscopy M. Tallarida, D. Schmeißer Semiconductor Science and Technology 27 (2012) 074010 Online (DOI)
12_10 Spectroscopic characterization of Cobalt-Phthalocyanine electrocatalysts for fuel cell applications K. Müller, M. Richter, D. Friedrich, I. Paloumpa, U.I. Kramm, D. Schmeißer Solid State Ionics 216 (2012) 78-82 Online (DOI) An author-created version (accepted status) may be downloaded here for personal use only. The final publication is available only at www.elsevier.com (see DOI link above).
12_09 Resonant Photoemission at the O1s threshold to characterize β-Ga2O3 single crystals M. Michling, D. Schmeißer IOP Conference Series: Materials Science and Engineering 34 (2012) 012002 Online (DOI)
12_08 Spectroscopic and capacitance-voltage characterization of thin aminopropylmethoxysilane films dopedwith copper phthalocyanine, tris(dimethylvinylsilyloxy)-POSS and fullerene cagesJ. Klocek, K. Henkel, K. Kolanek, E. Zschech, D. Schmeißer Applied Surface Science 258 (2012) 4213-4221 Online (DOI) An author-created version (accepted status) may be downloaded here for personal use only. The final publication is available only at www.elsevier.com (see DOI above).
12_07 Spectroscopic and atomic force microscopy investigations of hybrid materials composed of fullerenes and 3-aminopropyltrimethoxysilane J. Klocek, K. Kolanek, D. Schmeisser Journal of Physics and Chemistry of Solids 73 (2012) 699-706 Online (DOI) An author-created version (accepted status) may be downloaded here for personal use only. The final publication is available only at www.elsevier.com (see DOI above).
12_06 Annealing influence on siloxane based materials incorporated with fullerenes, phthalocyanines and silsesquioxanes J. Klocek, K. Henkel, K. Kolanek, E. Zschech, D. Schmeißer BioNanoScience 2 (2012) 52-58 Online (DOI) An author-created version may be downloaded here for personal use only. The final publication is available at www.springerlink.com (see DOI above).
12_05 Excited states in P3HT and P3HT/PCBM blends K. Müller, M. Richter, S. Philip, M. Kunst, D. Schmeißer BioNanoScience 2 (2012) 42-51 Online (DOI) An author-created version may be downloaded here for personal use only. The final publication is available at www.springerlink.com (see DOI above).
12_04 Valence and Conduction band states of PCBM as probed by photoelectron spectroscopy at resonant excitation M. Richter, D. Friedrich, D. Schmeißer BioNanoScience 2 (2012) 59-65 Online (DOI) An author-created version may be downloaded here for personal use only. The final publication is available at www.springerlink.com (see DOI above).
12_03 The electroactive β-phase formation in Poly(vinylidene fluoride) by gold nanoparticles doping D. Mandal, K. Henkel, D. Schmeißer Materials Letters 73 (2012) 123-125 Online (DOI) An author-created version (accepted status) may be downloaded here for personal use only. The final publication is available only at www.elsevier.com (see DOI link above).
12_02 Studies of the chemical and electrical properties of fullerene and 3-aminopropyltrimethoxysilane based low-k materials J. Klocek, K. Henkel, K. Kolanek, K. Broczkowska, D. Schmeißer, M. Miller, E. Zschech Thin Solid Films 520 (2012) 2498-2504 Online (DOI) An author-created version (accepted status) may be downloaded here for personal use only. The final publication is available only at www.elsevier.com (see DOI link above).
12_01 An In Situ Study of the Atomic layer deposition of HfO2 on Si K. Kolanek, M. Tallarida, M. Michling, D. Schmeisser Journal of Vacuum Science and Technology A 30 (2012) 01A143 Online (DOI) Copyright (2011/2012) American Institute of Physics. This article may be downloaded here for personal use only. Any other use requires prior permission of the author and the American Institute of Physics (for that use DOI link above).
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