Chair of
Applied physics / sensor technology
Prof. Dr. rer. nat. habil. Dieter Schmeißer
Publications 2007
07_14 Comparison of composition of ultra-thin silicon oxynitride layers fabricated by PECVD and ultrashallow rf plasma ion implantation R. Mroczyński, T. Bieniek, R. B. Beck, M. Ćwil, P. Konarski, P. Hoffmann, D. Schmeißer Journal of Telecommunications and Information Technology 3 (2007) 20-24, ISSN 1509-4553 Online
07_13 The influence of annealing (900°C) of ultra-thin PECVD silicon oxynitride layers R. Mroczyński, G. Głuszko, R. B. Beck, A. Jakubowski, M. Ćwil, P. Konarski, P. Hoffmann, D. Schmeißer Journal of Telecommunications and Information Technology 3 (2007) 16-19, ISSN 1509-4553 Online
07_12 Composition and electrical properties of ultra-thin SiOxNy layers formed by rf plasma nitrogen implantation/plasma oxidation processes T. Bieniek, R.B. Beck, A. Jakubowski, P. Konarski, M. Ćwil, P. Hoffmann, D. Schmeißer Journal of Telecommunications and Information Technology, 3 (2007) 9-15, ISSN 1509-4553 Online
07_11 Study of bulk and interface defects in silicon oxide with X-ray absorption spectroscopy M. Tallarida, D. Schmeißer Materials Science and Engineering B 144 (2007) 23-26 Online (DOI)
07_09 In-situ Atomic Layer Deposition growth of Hafnium oxide K. Karavaev, M. Tallarida, D. Schmeißer In: H.T. Vierhaus (Eds.): Computer Science Reports 03/07: DEDIS NANO DAYS. S. 13-19. BTU Cottbus (2007), ISSN: 1437-7969
07_08 Preparation and Characterization of TiO2 thin films and Cr and Co doped TiO2 thin films S. Müller, G. Seibold, D. Schmeißer In: H.T. Vierhaus (Eds.): Computer Science Reports 03/07: DEDIS NANO DAYS. S. 7-11. BTU Cottbus (2007), ISSN: 1437-7969
07_07 Influence of the substrate on the pattern formation of a surface reaction S. Wehner, P. Hoffmann, D. Schmeißer, H.R. Brand, J. Küppers AIP Conference Proceedings 913 (2007) 121-126 Online (DOI)
07_06 Ferromagnetic Semiconducting EuO Nanorods M.J. Bierman, K.M. Van Heuvelen, D. Schmeißer, T.C. Brunold, S. Jin Advanced Materials 19 (2007) 2677-2681 Online (DOI)
07_05 No Interfacial Layer for PEDOT Electrodes on PVDF: Characterization of Reactions at the Interface P(VDF/TrFE)/Al and P(VDF/TrFE)/PEDOT:PSS K. Müller, D. Mandal, D. Schmeißer Materials Research Society Symposium Proceedings 997 (2007) I06-02 In Materials and Processes for Nonvolatile Memories II, edited by T. Li, Y. Fujisaki, J. M. Slaughter, D. Tsoukalas (Mater. Res. Soc. Symp. Proc. Volume 997, Warrendale, PA, 2007), 0997-I06-02. Online (DOI)
07_04 Organic field effect transistors with ferroelectric hysteresis K. Müller, K. Henkel, I. Paloumpa, D. Schmeißer Thin Solid Films 515 (2007) 7683 - 7687 Online (DOI)
07_03 Al-Oxynitride Buffer Layer Facilities for PrOX/SiC Interfaces K. Henkel, R. Sohal, C. Schwiertz, Y. Burkov, M. Torche, D. Schmeißer Materials Research Society Symposium Proceedings 996 (2007) H5-23 Online (DOI)
07_02 Synchrotron radiation x-ray photoelectron spectroscopy study on the interface chemistry of high-k PrxAl2-xO3 (x=0-2) dielectrics on TiN for dynamic random access memory applications T. Schroeder, G. Lupina, R. Sohal, G. Lippert, Ch. Wenger, O. Seifarth, M.Tallarida, D. Schmeißer Journal of Applied Physics 102 (2007) 014103 Online (DOI)
07_01 Metallic Nickel nanorod arrays embedded into ordered block copolymer templates O. Seifarth, R. Krenek, I. Tokarev, Y. Burkov, A. Sidorenko, S. Minko, M. Stamm, D. Schmeißer Thin Solid Films 515 (2007) 6552-6556 Online (DOI)
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