Publikationen 2026
- 26_08
Defect Engineering in Atomic-Layer Deposited Cerium Oxide
R. Tschammer, M. Schmickler, Y. Kosto, K. Henkel, P. Kaur, A. Devi, C. Morales, J. I. Flege
ACS Applied Materials & Interfaces 18 (2026) 18380-18393
Online (DOI)
- 26_07
Intrinsic electrocatalytic activity of nitrogen-doped monolayer graphene observed using a Janus bilayer design
G. Alexander, T. Grosser, C. Sulaiman, R. Sánchez-Barquilla, E. Fuhry, I. Wachta, R. Jungnickel, J. I. Flege, K. Balasubramanian
Nanoscale 18 (2026) 7080-7089
Online (DOI)
26_06
Correlation between electron beam evaporation conditions and sensor response of cerium oxide coatings
P. Kapuścik, J. Domaradzki, A. Obstarczyk, M. Kot, J. I. Flege, E. Keel, D. Gibson, D. Wojcieszak
International Journal of Hydrogen Energy 202 (2026) 154101
Online (DOI)
- 26_05
Surface termination of β-Ga2O3(100) as-cleaved single crystals
M.-C. Kao, L. P. Schewe, A. Akhtar, A. Vlad, T. Keller, K. Henkel, S. B. Anooz, A. Popp, Z. Galazka, J. I. Flege, A. Stierle, V. Vonk
Applied Physics Letters 128 (2026) 071601
Online (DOI)
- 26_04
Development of Detailed Surface Reaction Mechanism for Methanation Process Based on Experiments
R. Verma, V. Günther, E. Charlafti, F. Rachow, B. R. Giri, A. Hemaizia, D. Thévenin, J. I. Flege, F. Mauss
PAMM 26 (2026) e70061
Online (DOI)
- 26_03
Growth, structure, and morphology of ultra-thin tin oxide phases forming on Pt3Sn(111) single crystals upon exposure to oxygen
N. Braud, H. Wallander, L. Buss, M. Löfstrand, J. Blomqvist, C. Berschauer, A. Morales Rodriguez, P. M. Kofoed, A. Resta, J.-O. Krisponeit, T. Schmidt, E. Lundgren, J. I. Flege, J. Falta, L. Merte
Surface Science 767 (2026) 122927
Online (DOI)
- 26_02
Deposition of CeOx/SnOx-based thin films via RF magnetron sputtering for resistive gas sensing applications
A. Kalra, C. Alvarado Chavarin, P.-G. Nitsch, R. Tschammer, J. I. Flege, M. Ratzke, M. H. Zoellner, M. A. Schubert, C. Wenger, I. A. Fischer
Physica B: Condensed Matter 723 (2026) 418098
Online (DOI)
- 26_01
Influence of thermal modification on the gasochromic properties of WO3 thin films fabricated by electron beam evaporation
W. Weichbrodt, J. Domaradzki, A. Obstarczyk, M. Kot, J. I. Flege, M. Mazur
Applied Optics 65 (2026) A58-A67
Online (DOI)