Joel Dunsmore, Keysight Technologies, Santa Rosa, USA
This workshop will present a workflow for Amplifier Linearity Characterization and System EVM analysis. The workflow starts with a characterization method based on the fundamental X-parameter characterization of an amplifier over power and operating voltage. From this, a non-linear simulation will be used to optimize the bias point for best EVM. The optimized amplifier will be evaluated using the new, precision EVM analysis capability of a VNA using frequency domain EVM characterization. This will be compared to the traditional demodulation approach using wide-band spectrum analysis.