BTU auf einen Blick
Fakultät 1
Fachgebiet Angewandte Physik/Sensorik Prof. Dr. rer. nat. habil. Dieter Schmeißer

Veröffentlichungen 2004

  • 04_26
    Generation of Nanostructured Materials from Thin Films of Block Copolymer Assembles
    A. Sidorenko, I. Tokarev, R. Krenek, Y. Burkov, D. Schmeißer, S. Minko, M. Stamm
    Nano-Architectured and Nanostructured Materials: Fabrication, Control and Properties. pp 143-150. Wiley-VCH, Weinheim, 2004, ISBN 3-527-31008-8
    Online (DOI)
  • 04_25
    Corrosion Protection by Conductive Polymers for Magnesium Alloys
    A. Yfantis, I. Paloumpa, D.Schmeißer, D. Yfantis
    Magnesium, Proceedings of 6th International Conference on Magnesium Alloys and their applications. pp 605-610, Wiley VCH, Weinheim, ISBN 3-527-30975-6
    Online (DOI)
  • 04_24
    Promieniowanie synchrotronowe jako uniwersalne narzedzie badawcze - Proby jego wykorzystania w badaniach struktury zeliwa
    P. Hoffmann, D. Schmeißer, M. S. Soinski, T. Warchala
    Archives of Foundry 2004, Vol. 4, Nr. 14, S. 169-175. ISSN: 1642-5308
  • 04_23
    Pr4f occupancy and VB/CB band offsets of Pr2O3 at the interface to Si(001) and SiC(0001) surfaces
    D.Schmeißer, H.-J. Müssig
    Materials Research Society Symposium Proceedings 811 (2004) D6.7
    Online (DOI)
  • 04_22
    Ultrahthin Dielectric Films Grown by Solid Phase Reaction of Pr with SiO2
    H.-J. Müssig, J. Dabrowski, C. Wenger, G. Lupina, R. Sorge, P. Formanek, P. Zaumseil, D. Schmeißer
    Materials Research Society Symposium Proceedings 811 (2004) D7.10
    Online (DOI)
  • 04_21
    Scanning Kelvin Probe Microscopy and Photoemission electron microscopy of organic source-drain structures
    K. Müller, A. Goryachko, Y. Burkov, C. Schwiertz, M. Ratzke, J. Köble, J. Reif, D. Schmeißer
    Synthetic Metals 146/3 (2004) 377-382
    Online (DOI)
  • 04_20
    Photoemission studies of very thin (<10nm) silicon oxynitride (SiOxNy) layers formed by PECVD
    P. Hoffmann, D. Schmeißer, R.B.Beck, M.Cuch, M.Giedz, A.Jakubowski
    Journal of Alloys and Compounds 382/1-2 (2004) 228-233
    Online (DOI)
  • 04_19
    Comparison on Focus-PEEM and Elmitec-PEEM
    Y. Burkov, P. Hoffmann, D. Schmeißer
    BESSY annual report 2003, pp. 504-505
  • 04_18
    Solid-state reaction between Pr and SiO2 studied by photoelectron spectroscopy
    G. Lupina, H.-J. Müssig, D. Schmeißer
    BESSY annual report 2003, pp. 415-416
  • 04_17
    PEEM studies of KCN-etched CuInS2 surfaces
    K. Müller, Y. Burkov, D. Schmeißer
    BESSY annual report 2003, pp. 413-414
  • 04_16
    High reactivity of Pr on oxide covered 4H-SiC
    D. Schmeißer, G. Lupina, H.-J. Müssig
    BESSY annual report 2003, pp. 408-409
  • 04_15
    A PEEM study of lateral inhomogeneities on etched CdTe(110) surfaces
    S. Traeger, D. Kraft, B. Jaeckel, P. Hoffmann, D. Schmeißer, A. Thißen, W. Jaegermann
    BESSY annual report 2003, pp. 369-370
  • 04_14
    Chemical state depth profiling of ultra-thin oxynitride layers by photoelectron spectroscopy
    P. Hoffmann, D. Schmeißer
    BESSY annual report 2003, pp. 356-357
  • 04_13
    Cooper minimum observed for the Pr5s and Pr5p states in Pr2O3
    D. Schmeißer
    BESSY annual report 2003, pp. 224-225
  • 04_12
    XPEEM investigations of 2D hierachical array of Ni nanorods using block copolymer templates
    A. Sidorenko, I. Tokarev, R. Krenek, Y. Burkov, D. Schmeißer, M. Stamm
    BESSY annual report 2003, pp. 85-87
  • 04_11
    Pr2O3/Si(001) interface reactions and stability
    D. Schmeißer, J. Dabrowski, H.-J. Müssig
    Materials Science and Engineering B 109/1-3 (2004) 30-33
    Online (DOI)
  • 04_10
    An FTIR study of the role of H2O and D2O in the aging mechanism of conductive polypyrroles
    S. Lamprakopoulos, D. Yfantis, A. Yfantis, D. Schmeißer, J. Anastassopoulou, T. Theophanides
    Synthetic Metals 144/3 (2004) 229-234
    Online (DOI)
  • 04_09
    Solid-state reaction between Pr and SiO2 studied by photoelectron spectroscopy and ab initio calculations
    G. Lupina, J. Dabrowski, P. Formanek, D.Schmeißer, R. Sorge, C. Wenger, P. Zaumseil, H.-J. Müssig
    Materials Science in Semiconductor Processing 7/ 4-6 (2004) 215-220
    Online (DOI)
  • 04_08
    Covalent and localized contributions of Pr4f states at the interface of Pr2O3 to Si(001)
    D.Schmeißer, H.-J.Müssig
    Materials Science in Semiconductor Processing 7/ 4-6 (2004) 221-226
    Online (DOI)
  • 04_07
    Silicate Layer Formation at the Pr2O3 / Si(001) Interfaces
    D.Schmeißer, H.-J.Müssig, J. Dabrowski
    Applied Physics Letters 85/1 (2004) 88-90
    Online (DOI)
  • 04_06
    The Interaction of Pr2O3 with 4H-SiC(0001) surface
    A. Goryachko, I. Paloumpa, G. Beuckert, Y. Burkov, D.Schmeißer
    Physica Status Solidi C 1/2 (2004) 265-268
    Online (DOI)
  • 04_05
    Mechanisms to inhibit corrosion of Al alloys by polymeric conversion coatings
    I. Paloumpa, A. Yfantis, P. Hoffmann, Y. Burkov, D. Yfantis, D.Schmeißer
    Surface and Coatings Technology 180-181 (2004) 308-312
    Online (DOI)
  • 04_04
    Preparation of stoichiometric CuInS2-Surfaces
    K. Müller, R. Scheer, Y. Burkov, D.Schmeißer
    Thin Solid Films 451-452 (2004) 120-123
    Online (DOI)
  • 04_03
    The Si(001)/C2H2 interaction to form a buffer layer for 3C-SiC growth
    A. Goryachko, Y. Yeromenko, K. Henkel, J. Wollweber, D.Schmeißer
    Physica Status Solidi A 201 (2004) 245-248
    Online (DOI)
  • 04_02
    Partikel- und Tropfendetektion in µm-Bereich
    K. Henkel, C. Schwiertz, D. Schmeißer, A. Valdeig, S. Wagner, M. List, J. Lang, M. Ulbrich, P.Schengber
    Abschlussbericht zum AiF-Forschungsprojekt KF 0342201KFK1, Februar 2004
  • 04_01
    Stability and electronic properties of silicates in the system SiO2 - Pr2O3 - Si(001)
    D.Schmeißer, H.-J. Müssig
    Journal of Physics: Condensed Matter 16 (2004) S153-S160
    Online (DOI)